Catalogo Articoli (Spogli Riviste)

HELP
ATTENZIONE: attualmente gli articoli Current Contents (fonte ISI) a partire dall'anno 2002 sono consultabili sulla Risorsa On-Line

Le informazioni sugli articoli di fonte ISI sono coperte da copyright

La ricerca find articoli where soggetti phrase all words 'sequential testing' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 30 riferimenti
Selezionare un intervallo

Per ulteriori informazioni selezionare i riferimenti di interesse.

    1. Lai, TL
      Sequential analysis: Some classical problems and new challenges

      STATISTICA SINICA
    2. Fleuret, F; Geman, D
      Coarse-to-fine face detection

      INTERNATIONAL JOURNAL OF COMPUTER VISION
    3. Sargent, DJ; Chan, V; Goldberg, RM
      A three-outcome design for phase II clinical trials

      CONTROLLED CLINICAL TRIALS
    4. Tal, O; McCollin, C; Bendell, T
      Reliability demonstration for safety-critical systems

      IEEE TRANSACTIONS ON RELIABILITY
    5. Shaer, B; Al-Arian, SA; Landis, D
      Partitioning sequential circuits for pseudoexhaustive testing

      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
    6. Gallerani, G; Gasperi, F; Monetti, A
      Judge selection for hard and semi-hard cheese sensory evaluation

      FOOD QUALITY AND PREFERENCE
    7. Chakravarty, S; Zachariah, ST
      STBM: A fast algorithm to simulate I-DDQ tests for leakage faults

      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
    8. Fuh, CD; Hu, IC
      Asymptotically efficient strategies for a stochastic scheduling problem with order constraints

      ANNALS OF STATISTICS
    9. Peskir, G; Shiryaev, AN
      Sequential testing problems for Poisson processes

      ANNALS OF STATISTICS
    10. Sowelam, SM; Tewfik, AH
      Waveform selection in radar target classification

      IEEE TRANSACTIONS ON INFORMATION THEORY
    11. Iyengar, V; Chakrabarty, K; Murray, BT
      Deterministic built-in pattern generation for sequential circuits

      JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
    12. Rudnick, EM; Patel, JH
      Efficient techniques for dynamic test sequence compaction

      IEEE TRANSACTIONS ON COMPUTERS
    13. PAYNE RW
      CONSTRUCTION OF EFFICIENT IDENTIFICATION SCHEMES USING BATCHES OF DISCRETE-VALUED TESTS

      Journal of classification
    14. IYENGAR V; CHAKRABARTY K; MURRAY BT
      HUFFMAN ENCODING OF TEST SETS FOR SEQUENTIAL-CIRCUITS

      IEEE transactions on instrumentation and measurement
    15. NACHMAN L; SALUJA KK; UPADHYAYA SJ; REUSE R
      A NOVEL-APPROACH TO RANDOM PATTERN TESTING OF SEQUENTIAL-CIRCUITS

      I.E.E.E. transactions on computers
    16. GRAVES TL; LAI TL
      ASYMPTOTICALLY EFFICIENT ADAPTIVE CHOICE OF CONTROL LAWS IN CONTROLLED MARKOV-CHAINS

      SIAM journal on control and optimization
    17. RUDNICK EM; PATEL JH; GREENSTEIN GS; NIERMANN TM
      A GENETIC ALGORITHM FRAMEWORK FOR TEST-GENERATION

      IEEE transactions on computer-aided design of integrated circuits and systems
    18. JENNISON C; TURNBULL BW
      GROUP-SEQUENTIAL ANALYSIS INCORPORATING COVARIATE-INFORMATION

      Journal of the American Statistical Association
    19. FRANK R; WIEDERHOLT WC; KRITZSILVERSTEIN D; SALMON DP; BARRETTCONNOR E
      EFFECTS OF SEQUENTIAL NEUROPSYCHOLOGICAL TESTING OF AN ELDERLY COMMUNITY-BASED SAMPLE

      Neuroepidemiology
    20. LUECHT RM
      MULTIDIMENSIONAL COMPUTERIZED ADAPTIVE TESTING IN A CERTIFICATION OR LICENSURE CONTEXT

      Applied psychological measurement
    21. LEE CL; SHEU ML
      A MULTIPLE-SEQUENCE GENERATOR BASED ON INVERTED NONLINEAR AUTONOMOUS MACHINES

      I.E.E.E. transactions on computers
    22. SAXENA NR; MCCLUSKEY EJ
      COUNTING 2-STATE TRANSITION-TOUR SEQUENCES

      I.E.E.E. transactions on computers
    23. CHU CSJ; STINCHCOMBE M; WHITE H
      MONITORING STRUCTURAL-CHANGE

      Econometrica
    24. GANGE SJ; DEMETS DL
      SEQUENTIAL MONITORING OF CLINICAL-TRIALS WITH CORRELATED RESPONSES

      Biometrika
    25. LEE JW; DEMETS DL
      GROUP SEQUENTIAL COMPARISON OF CHANGES - AD-HOC VERSUS MORE EXACT METHOD

      Biometrics
    26. SUN X; LOMBARDI F
      DESIGN FOR TESTABILITY OF SEQUENTIAL-CIRCUITS

      IEE proceedings. Computers and digital techniques
    27. CHEN JD; HICKERNELL FJ
      A CLASS OF ASYMPTOTICALLY OPTIMAL SEQUENTIAL-TESTS FOR COMPOSITE HYPOTHESES

      Science in China. Series A, Mathematics, Physics, Astronomy & Technological Sciences
    28. SU CY; WU CW
      TESTING ITERATIVE LOGIC-ARRAYS FOR SEQUENTIAL FAULTS WITH A CONSTANT NUMBER OF PATTERNS

      I.E.E.E. transactions on computers
    29. EDELMAN D
      ON A TRUNCATION-FLEXIBLE REPEATED SIGNIFICANCE TEST

      Biometrics
    30. EECKMAN FH; COLVIN ME; AXELROD TS
      COMPARISON OF 3 DIFFERENT METHODS FOR TARGET DETECTION AND TRACKING

      Optical engineering


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/10/20 alle ore 20:34:37