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La ricerca find articoli where soggetti phrase all words 'scanning tunneling microscope (STM)' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 15 riferimenti
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    1. Yamada, I; Matsuo, J; Toyoda, N; Kirkpatrick, A
      Materials processing by gas cluster ion beams

      MATERIALS SCIENCE & ENGINEERING R-REPORTS
    2. Hyun, M; Rhee, CK
      STM study of 2-mercaptoethanol self-assembled monolayer on Au(111)

      BULLETIN OF THE KOREAN CHEMICAL SOCIETY
    3. Iwami, M; Uehara, Y; Ushioda, S
      Relation between the radius of tip curvature and the light emission efficiency from scanning tunneling microscope

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    4. Tanaka, H; Hamai, C; Kanno, T; Kawai, T
      High-resolution scanning tunneling microscopy imaging of DNA molecules on Cu(111) surfaces

      SURFACE SCIENCE
    5. Partridge, A; Reynolds, JK; Grade, JD; Kane, BJ; Maluf, NI; Kovacs, GTA; Kenny, TW
      An integrated controller for tunnel sensors

      IEEE JOURNAL OF SOLID-STATE CIRCUITS
    6. HUANG DH; GREY F; AONO M
      DEPENDENCE OF ELECTRIC-FIELD ON STM TIP PREPARATION

      Applied surface science
    7. YONEZAWA Y; MINAMIKAWA T; MATSUDA K; TAKEZAWA K; MORIMOTO A; SHIMIZU T
      SIZE DISTRIBUTION OF DROPLETS IN FILM PREPARED BY PULSED-LASER ABLATION

      Applied surface science
    8. OHTO M; TANAKA K
      SCANNING-TUNNELING-MICROSCOPE MODIFICATIONS OF CU(AG)-CHALCOGENIDE GLASSES

      Journal of non-crystalline solids
    9. RYU JT; KUBO O; TANI H; KATAYAMA M; SARANIN AA; ZOTOV AV; OURA K
      ATOMIC-HYDROGEN INTERACTION WITH THE SI(100)4X3-IN SURFACE STUDIED BYSCANNING-TUNNELING-MICROSCOPY

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    10. DIVISEK J; STEFFEN B; STIMMING U; SCHMICKLER W
      METAL-DEPOSITION NEAR THE TIP OF A SCANNING TUNNELING MICROSCOPE

      Journal of electroanalytical chemistry [1992]
    11. NAKAYAMA T; HUANG DH; AONO M
      EXTRACTION, DEPOSITION, AND DISPLACEMENT OF ATOMS BY STM

      Microelectronic engineering
    12. MIZUTANI W; OHI A; MOTOMATSU M; TOKUMOTO H
      STEP FORMATION ON AU (111) OBSERVED BY SCANNING TUNNELING MICROSCOPE

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    13. MIYAHARA K; MATSUOKA S; NAGASHIMA N; MASUDA H
      APPLICATION OF SURFACE FABRICATION TO STRAIN-MEASUREMENT IN NANOMETER-SCALE WITH THE SCANNING TUNNELING MICROSCOPE

      Journal of testing and evaluation
    14. KONDO S; LUTWYCHE M; WADA Y
      OBSERVATION OF THREEFOLD SYMMETRY IMAGES DUE TO A POINT-DEFECT ON A GRAPHITE SURFACE USING SCANNING TUNNELING MICROSCOPE (STM)

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    15. PENNER RM
      NANOMETER-SCALE SYNTHESIS AND ATOMIC-SCALE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE

      Scanning microscopy


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 28/10/20 alle ore 12:51:27