Per ulteriori informazioni selezionare i riferimenti di interesse.
Evidence for 9R-SiC?
MICROSCOPY AND MICROANALYSIS
Influence of Fe substitutions on the deformation behavior and fault energies of Ni3Ge-Fe3Ge Ll(2) intermetallic alloys
ACTA MATERIALIA
HRTEM study of the morphology of RuS2 supported particles
CATALYSIS TODAY
Metal sintering in Rh/Al2O3 catalysts followed by HREM, H-1 NMR, and H-2 chemisorption
LANGMUIR
TEM-simulation of amorphous carbon films: influence of supercell packaging
ULTRAMICROSCOPY
High-angle annular dark-field STEM observation of Xe nanocrystals embeddedin Al
ULTRAMICROSCOPY
Prospects of atomic resolution imaging with an aberration-corrected STEM
JOURNAL OF ELECTRON MICROSCOPY
Direct observation of the atomic structure in a solid-liquid interface
MICROSCOPY AND MICROANALYSIS
HRTEM image contrast of short range order in Ni4Mo
MICRON
High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous-crystalline interface
MICRON
Visibility evaluation of the inverse-phase CRT raster moire pattern
IEICE TRANSACTIONS ON ELECTRONICS
Limitation of the Kirchhoff boundary conditions for aerial image simulation in 157-nm optical lithography
IEEE ELECTRON DEVICE LETTERS
Both contest and scramble competition affect the growth performance of brown trout, Salmo trutta, parr of wild and of sea-ranched origins
ENVIRONMENTAL BIOLOGY OF FISHES
On the calculation of the phase shift of superconducting fluxons: from theisolated to the lattice case
ULTRAMICROSCOPY
HREM of CoSi2/SiC heterophase interface: facts and artifacts in the interface distance profile measurements
ULTRAMICROSCOPY
A frequency-aspect extrapolation algorithm for ISAR image simulation basedon two-dimensional ESPRIT
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
Structure of highly dispersed metals and oxides: exploring the capabilities of high-resolution electron microscopy
SURFACE AND INTERFACE ANALYSIS
Digital mammography image simulation using Monte Carlo
MEDICAL PHYSICS
Multiply twinned particles beyond the icosahedron
JOURNAL OF CRYSTAL GROWTH
On the phase problem in electron microscopy: The relationship between structure factors, exit waves, and HREM images
MICROSCOPY RESEARCH AND TECHNIQUE
Nanostructural evolution of high loading Rh/lanthana catalysts through thepreparation and reduction steps
CATALYSIS TODAY
Atomic structure of Pd-intercalated graphite by high-resolution electron microscopy and first principles calculations
MATERIALS TRANSACTIONS JIM
Nanostructural evolution under reducing conditions of a Pt/CeTbOx catalyst: A new alternative system as a TWC component
CHEMISTRY OF MATERIALS
Rare-earth oxides with fluorite-related structures: their systematic investigation using HREM images, image simulations and electron diffraction pattern simulations
ULTRAMICROSCOPY
Incoherent imaging using dynamically scattered coherent electrons
ULTRAMICROSCOPY
Tests on the validity of the atomic column approximation for STEM probe propagation
ULTRAMICROSCOPY
On the interpretation of Lorentz and holographic interference images of superconducting fluxons: the influence of the specimen thickness
ULTRAMICROSCOPY
On the peculiarities of bright/dark contrast in HRTEM images of SiC polytypes
ULTRAMICROSCOPY
Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
ULTRAMICROSCOPY
Electron diffraction from micro- and nanoparticles of hydroxyapatite
JOURNAL OF MICROSCOPY-OXFORD
TEM characterization of self-organized CdSe/ZnSe quantum dots
JOURNAL OF MICROSCOPY-OXFORD
A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
JOURNAL OF ELECTRON MICROSCOPY
Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
JOURNAL OF ELECTRON MICROSCOPY
Structure modelling of Sigma 3 and Sigma 9 coincident boundaries in CVD diamond thin films
JOURNAL OF ELECTRON MICROSCOPY
WHY THE LARGE-ANGLE TWIST-BOUNDARIES IN BI2SR2CACU2O8-CURRENT(DELTA CAN CARRY SUPER)
MATERIALS RESEARCH INNOVATIONS
UNDERSTANDING INTERPHASE BOUNDARY DYNAMICS BY IN-SITU HIGH-RESOLUTIONAND ENERGY-FILTERING TRANSMISSION ELECTRON-MICROSCOPY AND REAL-TIME IMAGE SIMULATION
MICROSCOPY AND MICROANALYSIS
A PRACTICAL PROCEDURE FOR THE CALCULATION OF DIFFRACTED ELECTRON AMPLITUDES AND PHASES IN THE REAL-SPACE MULTISLICE METHOD
Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties
ULTIMATE OBSERVATION OF TUNGSTEN ATOMS AND CLUSTERS ADSORBED ON SINGLE-CRYSTALLINE MGO FILMS
Microscopy research and technique
STUDY OF AMORPHOUS ALLOY STRUCTURES WITH MEDIUM-RANGE ATOMIC ORDERING
Microscopy research and technique
MOIRE PATTERNS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES OF MOS2
Microscopy research and technique
BURGERS VECTOR OF CRACK-TIP DISLOCATIONS IN MAGNESIUM-OXIDE CRYSTALS
Materials transactions, JIM
STEP CONTRAST IN LOW-ENERGY-ELECTRON MICROSCOPY
Ultramicroscopy
THE INTERPRETATION OF HREM IMAGES OF SUPPORTED METAL-CATALYSTS USING IMAGE SIMULATION - PROFILE VIEW IMAGES
Ultramicroscopy
MSLS, A LEAST-SQUARES PROCEDURE FOR ACCURATE CRYSTAL-STRUCTURE REFINEMENT FROM DYNAMICAL ELECTRON-DIFFRACTION PATTERNS
Acta crystallographica. Section A, Foundations of crystallography
SIMULATION OF THE SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY IMAGES OF A XANTHINE MONOLAYER ON GRAPHITE
Surface science
QUANTITATIVE COMPARISON OF IMAGES AND TRANSFORMS
Journal of Microscopy
A COHERENCE FUNCTION-APPROACH TO IMAGE SIMULATION
Journal of Microscopy
AB-INITIO HRTEM SIMULATIONS OF IONIC-CRYSTALS - A CASE-STUDY OF SAPPHIRE
Journal of Microscopy
WHY DONT HIGH-RESOLUTION SIMULATIONS AND IMAGES MATCH
Journal of Microscopy
ITERATIVE STRUCTURE RETRIEVAL TECHNIQUES IN HREM - A COMPARATIVE-STUDY AND A MODULAR PROGRAM PACKAGE
Journal of Microscopy
A HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION AND COMPUTER IMAGESIMULATION OF INCOMMENSURATE STRUCTURES IN THE TA2O5-WO3 SYSTEM
Journal of Electron Microscopy
Characterization of proximity correction in 100-nm-regime X-ray lithography
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
SIMULATION AND ANALYSIS OF SYNTHETIC SIDESCAN SONAR IMAGES
IEE proceedings. Radar, sonar and navigation
TRICK PLAY METHOD FOR DIGITAL VCRS
Electronics and communications in Japan. Part 3, Fundamental electronic science
AN EVALUATION METHOD FOR CRT MOIRE PATTERNS BY VISIBILITY ESTIMATION AND IMAGE SIMULATION
IEICE transactions on electronics
LATTICE IMAGING IN MELT CRYSTALLIZED POLYPROPYLENE THIN-FILMS
Colloid and polymer science
CASINO - A NEW MONTE-CARLO CODE IN C-LANGUAGE FOR ELECTRON-BEAM INTERACTION .1. DESCRIPTION OF THE PROGRAM
Scanning
QUANTITATIVE-ANALYSIS OF A HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGE OF WO3 BLOCK STRUCTURE WITH A RESIDUAL INDEX
Journal of Electron Microscopy
POSITION DEPENDENCE OF THE VISIBILITY OF A SINGLE GOLD ATOM IN SILICON-CRYSTALS IN HAADF-STEM IMAGE SIMULATION
Journal of Electron Microscopy
STRUCTURE OF A STACKING-FAULT IN THE ((1)OVER-BAR-01) PLANE OF TIO2
Journal of Electron Microscopy
A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF STRUCTURAL DEFECTS IN YBA2CU4O8 SUPERCONDUCTOR
Physica. C, Superconductivity
CRITICAL INTERFACE IN 2-DIMENSIONS
Physica. A
THE USE OF BETHE POTENTIALS IN ZONE-AXIS CBED PATTERN-MATCHING
Ultramicroscopy
PRECISION IMPROVEMENT IN OPTICAL PROXIMITY CORRECTION BY OPTIMIZING 2ND ILLUMINATION SOURCE SHAPE
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
IMAGE SIMULATION OF EXTREME-ULTRAVIOLET LITHOGRAPHY OPTICS - EFFECT OF MULTILAYER COATINGS
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
SEMLP - A MONTE-CARLO SIMULATION PROGRAM FOR SEM IMAGING
Microbeam analysis
IMAGE SIMULATION USING MONTE-CARLO METHODS - ELECTRON-BEAM AND DETECTOR CHARACTERISTICS
Scanning
USE OF THE QUASI-CLASSICAL APPROXIMATION FOR PROJECTED POTENTIAL CALCULATION IN HREM IMAGE SIMULATION
Journal of Microscopy
IMAGING SMALL SPINEL PARTICLES IN AN NIO MATRIX
Journal of Microscopy
COMPUTER-SIMULATED HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY (HRTEM) IN TOURMALINE
Journal of Microscopy
QUANTIFICATION OF OXYGEN VACANCIES IN PEROVSKITE USING A 300 KV HREM WITH AN IMAGING PLATE
Journal of Electron Microscopy
A NEW METHOD TO MEASURE BILAYER THICKNESS - CRYOELECTRON MICROSCOPY OF FROZEN-HYDRATED LIPOSOMES AND IMAGE SIMULATION
Micron
THE INTERHEXAMERIC CONTACTS IN THE 4-HEXAMERIC HEMOCYANIN FROM THE TARANTULA EURYPELMA-CALIFORNICUM - A TENTATIVE MECHANISM FOR COOPERATIVEBEHAVIOR
Journal of Molecular Biology
HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION OF HYDROXYAPATITE INTOOTH CRYSTALS
Journal of Electron Microscopy
SIMULATION OF SCANNING ELECTRON-MICROSCOPE IMAGE FOR TRENCH STRUCTURES
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS