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La ricerca find articoli where soggetti phrase all words 'image simulation' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 75 riferimenti
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    1. Kaiser, U; Chuvilin, A; Kyznetsov, V; Butenko, Y
      Evidence for 9R-SiC?

      MICROSCOPY AND MICROANALYSIS
    2. Balk, TJ; Kumar, M; Hemker, KJ
      Influence of Fe substitutions on the deformation behavior and fault energies of Ni3Ge-Fe3Ge Ll(2) intermetallic alloys

      ACTA MATERIALIA
    3. Aouine, M; Geantet, C; Epicier, T
      HRTEM study of the morphology of RuS2 supported particles

      CATALYSIS TODAY
    4. Force, C; Paniego, AR; Guil, JM; Gatica, JM; Lopez-Cartes, C; Bernal, S; Sanz, J
      Metal sintering in Rh/Al2O3 catalysts followed by HREM, H-1 NMR, and H-2 chemisorption

      LANGMUIR
    5. Schultrich, H; Schultrich, B
      TEM-simulation of amorphous carbon films: influence of supercell packaging

      ULTRAMICROSCOPY
    6. Mitsuishi, K; Kawasaki, M; Takeguchi, M; Yasuda, H; Furuya, K
      High-angle annular dark-field STEM observation of Xe nanocrystals embeddedin Al

      ULTRAMICROSCOPY
    7. Ishizuka, K
      Prospects of atomic resolution imaging with an aberration-corrected STEM

      JOURNAL OF ELECTRON MICROSCOPY
    8. Arai, S; Tsukimoto, S; Muto, S; Saka, H
      Direct observation of the atomic structure in a solid-liquid interface

      MICROSCOPY AND MICROANALYSIS
    9. Hata, S; Shindo, D; Mitate, T; Kuwano, N; Matsumura, S; Oki, K
      HRTEM image contrast of short range order in Ni4Mo

      MICRON
    10. Re, M; Carlino, E; Sorba, L; Franciosi, A; Muller, BH
      High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous-crystalline interface

      MICRON
    11. Shiramatsu, N; Iwata, S; Minemoto, T
      Visibility evaluation of the inverse-phase CRT raster moire pattern

      IEICE TRANSACTIONS ON ELECTRONICS
    12. Yeung, MS; Barouch, E
      Limitation of the Kirchhoff boundary conditions for aerial image simulation in 157-nm optical lithography

      IEEE ELECTRON DEVICE LETTERS
    13. Petersson, E; Jarvi, T
      Both contest and scramble competition affect the growth performance of brown trout, Salmo trutta, parr of wild and of sea-ranched origins

      ENVIRONMENTAL BIOLOGY OF FISHES
    14. Beleggia, M; Pozzi, G
      On the calculation of the phase shift of superconducting fluxons: from theisolated to the lattice case

      ULTRAMICROSCOPY
    15. Lamy, M; Thibault, J
      HREM of CoSi2/SiC heterophase interface: facts and artifacts in the interface distance profile measurements

      ULTRAMICROSCOPY
    16. Wang, YX; Ling, H
      A frequency-aspect extrapolation algorithm for ISAR image simulation basedon two-dimensional ESPRIT

      IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING
    17. Bernal, S; Baker, RT; Burrows, A; Calvino, JJ; Kiely, CJ; Lopez-Cartes, C; Perez-Omil, JA; Rodriguez-Izquierdo, JM
      Structure of highly dispersed metals and oxides: exploring the capabilities of high-resolution electron microscopy

      SURFACE AND INTERFACE ANALYSIS
    18. Peplow, DE; Verghese, K
      Digital mammography image simulation using Monte Carlo

      MEDICAL PHYSICS
    19. Nepijko, SA; Hofmeister, H; Sack-Kongehl, H; Schlogl, R
      Multiply twinned particles beyond the icosahedron

      JOURNAL OF CRYSTAL GROWTH
    20. Zou, XD
      On the phase problem in electron microscopy: The relationship between structure factors, exit waves, and HREM images

      MICROSCOPY RESEARCH AND TECHNIQUE
    21. Bernal, S; Calvino, JJ; Lopez-Cartes, C; Pintado, JM; Perez-Omil, JA; Rodriguez-Izquierdo, JM; Hayek, K; Rupprechter, G
      Nanostructural evolution of high loading Rh/lanthana catalysts through thepreparation and reduction steps

      CATALYSIS TODAY
    22. Oku, T; Sun, Q; Wang, DS; Wang, Q; Kawazoe, Y; Schmid, G; Suganuma, K
      Atomic structure of Pd-intercalated graphite by high-resolution electron microscopy and first principles calculations

      MATERIALS TRANSACTIONS JIM
    23. Blanco, G; Calvino, JJ; Cauqui, MA; Corchado, P; Lopez-Cartes, C; Colliex, C; Perez-Omil, JA; Stephan, O
      Nanostructural evolution under reducing conditions of a Pt/CeTbOx catalyst: A new alternative system as a TWC component

      CHEMISTRY OF MATERIALS
    24. Lopez-Cartes, C; Perez-Omil, JA; Pintado, JM; Calvino, JJ; Kang, ZC; Eyring, L
      Rare-earth oxides with fluorite-related structures: their systematic investigation using HREM images, image simulations and electron diffraction pattern simulations

      ULTRAMICROSCOPY
    25. Nellist, PD; Pennycook, SJ
      Incoherent imaging using dynamically scattered coherent electrons

      ULTRAMICROSCOPY
    26. Plamann, T; Hytch, MJ
      Tests on the validity of the atomic column approximation for STEM probe propagation

      ULTRAMICROSCOPY
    27. Patti, R; Pozzi, G
      On the interpretation of Lorentz and holographic interference images of superconducting fluxons: the influence of the specimen thickness

      ULTRAMICROSCOPY
    28. Kaiser, U; Chuvilin, A; Richter, W
      On the peculiarities of bright/dark contrast in HRTEM images of SiC polytypes

      ULTRAMICROSCOPY
    29. Foeth, M; Stadelmann, P; Buffat, PA
      Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

      ULTRAMICROSCOPY
    30. Suvorova, EI; Buffat, PA
      Electron diffraction from micro- and nanoparticles of hydroxyapatite

      JOURNAL OF MICROSCOPY-OXFORD
    31. Kirmse, H; Schneider, R; Scheerschmidt, K; Conrad, D; Neumann, W
      TEM characterization of self-organized CdSe/ZnSe quantum dots

      JOURNAL OF MICROSCOPY-OXFORD
    32. Foeth, M; Sfera, A; Stadelmann, P; Buffat, PA
      A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls

      JOURNAL OF ELECTRON MICROSCOPY
    33. Muto, SE; Horiuchi, S; Tanabe, T
      Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy

      JOURNAL OF ELECTRON MICROSCOPY
    34. Zhang, YG; Ichinose, H; Nakanose, M; Ito, K; Ishida, Y
      Structure modelling of Sigma 3 and Sigma 9 coincident boundaries in CVD diamond thin films

      JOURNAL OF ELECTRON MICROSCOPY
    35. ZHU YM
      WHY THE LARGE-ANGLE TWIST-BOUNDARIES IN BI2SR2CACU2O8-CURRENT(DELTA CAN CARRY SUPER)

      MATERIALS RESEARCH INNOVATIONS
    36. HOWE JM; MURRAY TM; MOORE KT; CSONTOS AA; TSAI MM; GARG A; BENSON WE
      UNDERSTANDING INTERPHASE BOUNDARY DYNAMICS BY IN-SITU HIGH-RESOLUTIONAND ENERGY-FILTERING TRANSMISSION ELECTRON-MICROSCOPY AND REAL-TIME IMAGE SIMULATION

      MICROSCOPY AND MICROANALYSIS
    37. KUI D; WANG YM; WANG ZM
      A PRACTICAL PROCEDURE FOR THE CALCULATION OF DIFFRACTED ELECTRON AMPLITUDES AND PHASES IN THE REAL-SPACE MULTISLICE METHOD

      Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties
    38. TANAKA N; KIMATA H; TAKASHIMA T; KIZUKA T
      ULTIMATE OBSERVATION OF TUNGSTEN ATOMS AND CLUSTERS ADSORBED ON SINGLE-CRYSTALLINE MGO FILMS

      Microscopy research and technique
    39. HIROTSU Y; OHKUBO T; MATSUSHITA M
      STUDY OF AMORPHOUS ALLOY STRUCTURES WITH MEDIUM-RANGE ATOMIC ORDERING

      Microscopy research and technique
    40. REYESGASGA J; TEHUACANERO S; YACAMAN MJ
      MOIRE PATTERNS IN HIGH-RESOLUTION ELECTRON-MICROSCOPY IMAGES OF MOS2

      Microscopy research and technique
    41. HIGASHIDA K; OKAZAKI S; MORIKAWA T; ONODERA R
      BURGERS VECTOR OF CRACK-TIP DISLOCATIONS IN MAGNESIUM-OXIDE CRYSTALS

      Materials transactions, JIM
    42. CHUNG WF; ALTMAN MS
      STEP CONTRAST IN LOW-ENERGY-ELECTRON MICROSCOPY

      Ultramicroscopy
    43. BERNAL S; BOTANA FJ; CALVINO JJ; LOPEZCARTES C; PEREZOMIL JA; RODRIGUEZIZQUIERDO JM
      THE INTERPRETATION OF HREM IMAGES OF SUPPORTED METAL-CATALYSTS USING IMAGE SIMULATION - PROFILE VIEW IMAGES

      Ultramicroscopy
    44. JANSEN J; TANG D; ZANDBERGEN HW; SCHENK H
      MSLS, A LEAST-SQUARES PROCEDURE FOR ACCURATE CRYSTAL-STRUCTURE REFINEMENT FROM DYNAMICAL ELECTRON-DIFFRACTION PATTERNS

      Acta crystallographica. Section A, Foundations of crystallography
    45. JUNG D; SEO DK; REN J; WHANGBO MH
      SIMULATION OF THE SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPY IMAGES OF A XANTHINE MONOLAYER ON GRAPHITE

      Surface science
    46. SAXTON WO
      QUANTITATIVE COMPARISON OF IMAGES AND TRANSFORMS

      Journal of Microscopy
    47. MULLER H; ROSE H; SCHORSCH P
      A COHERENCE FUNCTION-APPROACH TO IMAGE SIMULATION

      Journal of Microscopy
    48. GEMMING T; MOBUS G; EXNER M; ERNST F; RUHLE M
      AB-INITIO HRTEM SIMULATIONS OF IONIC-CRYSTALS - A CASE-STUDY OF SAPPHIRE

      Journal of Microscopy
    49. BOOTHROYD CB
      WHY DONT HIGH-RESOLUTION SIMULATIONS AND IMAGES MATCH

      Journal of Microscopy
    50. MOBUS G; SCHWEINFEST R; GEMMING T; WAGNER T; RUHLE M
      ITERATIVE STRUCTURE RETRIEVAL TECHNIQUES IN HREM - A COMPARATIVE-STUDY AND A MODULAR PROGRAM PACKAGE

      Journal of Microscopy
    51. MIYANO T
      A HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION AND COMPUTER IMAGESIMULATION OF INCOMMENSURATE STRUCTURES IN THE TA2O5-WO3 SYSTEM

      Journal of Electron Microscopy
    52. Yi, M; Seo, E; Seo, Y; Lee, K; Kim, O
      Characterization of proximity correction in 100-nm-regime X-ray lithography

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    53. BELL JM; LINNETT LM
      SIMULATION AND ANALYSIS OF SYNTHETIC SIDESCAN SONAR IMAGES

      IEE proceedings. Radar, sonar and navigation
    54. ONISHI K; ISHIMOTO J; INOUE T; INOUE S; KUMANO M; TAKANO H
      TRICK PLAY METHOD FOR DIGITAL VCRS

      Electronics and communications in Japan. Part 3, Fundamental electronic science
    55. SHIRAMATSU N; IWATA S
      AN EVALUATION METHOD FOR CRT MOIRE PATTERNS BY VISIBILITY ESTIMATION AND IMAGE SIMULATION

      IEICE transactions on electronics
    56. PLUMMER CJG; GENSLER R; KAUSCH HH
      LATTICE IMAGING IN MELT CRYSTALLIZED POLYPROPYLENE THIN-FILMS

      Colloid and polymer science
    57. HOVINGTON P; DROUIN D; GAUVIN R
      CASINO - A NEW MONTE-CARLO CODE IN C-LANGUAGE FOR ELECTRON-BEAM INTERACTION .1. DESCRIPTION OF THE PROGRAM

      Scanning
    58. KOSUGI H; SHINDO D; HIRAGA K; KUDOH J
      QUANTITATIVE-ANALYSIS OF A HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGE OF WO3 BLOCK STRUCTURE WITH A RESIDUAL INDEX

      Journal of Electron Microscopy
    59. NAKAMURA K; KAKIBAYASHI H; KANEHORI K; TANAKA N
      POSITION DEPENDENCE OF THE VISIBILITY OF A SINGLE GOLD ATOM IN SILICON-CRYSTALS IN HAADF-STEM IMAGE SIMULATION

      Journal of Electron Microscopy
    60. YAMADA S; TANAKA M
      STRUCTURE OF A STACKING-FAULT IN THE ((1)OVER-BAR-01) PLANE OF TIO2

      Journal of Electron Microscopy
    61. HASHIMOTO K; AKIYOSHI M; WISNIEWSKI A; JENKINS ML; TODA Y; YANO T
      A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF STRUCTURAL DEFECTS IN YBA2CU4O8 SUPERCONDUCTOR

      Physica. C, Superconductivity
    62. ROBERT M; REANEY I; STADELMANN P
      CRITICAL INTERFACE IN 2-DIMENSIONS

      Physica. A
    63. SAUNDERS M; BIRD DM; HOLBROOK OF; MIDGLEY PA; VINCENT R
      THE USE OF BETHE POTENTIALS IN ZONE-AXIS CBED PATTERN-MATCHING

      Ultramicroscopy
    64. NAKAE A; KAMON K; HANAWA T; MORIIZUMI K; NAKAO S
      PRECISION IMPROVEMENT IN OPTICAL PROXIMITY CORRECTION BY OPTIMIZING 2ND ILLUMINATION SOURCE SHAPE

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    65. YAMANASHI H; ITO M
      IMAGE SIMULATION OF EXTREME-ULTRAVIOLET LITHOGRAPHY OPTICS - EFFECT OF MULTILAYER COATINGS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    66. JOY DC
      SEMLP - A MONTE-CARLO SIMULATION PROGRAM FOR SEM IMAGING

      Microbeam analysis
    67. RADZIMSKI ZJ; RUSS JC
      IMAGE SIMULATION USING MONTE-CARLO METHODS - ELECTRON-BEAM AND DETECTOR CHARACTERISTICS

      Scanning
    68. TANG D; DORIGNAC D
      USE OF THE QUASI-CLASSICAL APPROXIMATION FOR PROJECTED POTENTIAL CALCULATION IN HREM IMAGE SIMULATION

      Journal of Microscopy
    69. RASMUSSEN DR; SUMMERFELT SR; MCKERNAN S; CARTER CB
      IMAGING SMALL SPINEL PARTICLES IN AN NIO MATRIX

      Journal of Microscopy
    70. FERROW EA
      COMPUTER-SIMULATED HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY (HRTEM) IN TOURMALINE

      Journal of Microscopy
    71. SHIBAHARA H; NUMAGUCHI K; KAWASAKI M; TAKIZAWA H; OIKAWA T; TAGUCHI H
      QUANTIFICATION OF OXYGEN VACANCIES IN PEROVSKITE USING A 300 KV HREM WITH AN IMAGING PLATE

      Journal of Electron Microscopy
    72. TAHARA Y; FUJIYOSHI Y
      A NEW METHOD TO MEASURE BILAYER THICKNESS - CRYOELECTRON MICROSCOPY OF FROZEN-HYDRATED LIPOSOMES AND IMAGE SIMULATION

      Micron
    73. DEHAAS F; VANBRUGGEN EFJ
      THE INTERHEXAMERIC CONTACTS IN THE 4-HEXAMERIC HEMOCYANIN FROM THE TARANTULA EURYPELMA-CALIFORNICUM - A TENTATIVE MECHANISM FOR COOPERATIVEBEHAVIOR

      Journal of Molecular Biology
    74. SHIBAHARA H; TOHDA H; YANAGIZAWA T
      HIGH-RESOLUTION ELECTRON-MICROSCOPIC OBSERVATION OF HYDROXYAPATITE INTOOTH CRYSTALS

      Journal of Electron Microscopy
    75. KOTERA M; YAMAGUCHI S; UMEGAKI S; SUGA H
      SIMULATION OF SCANNING ELECTRON-MICROSCOPE IMAGE FOR TRENCH STRUCTURES

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS


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Documento generato il 27/01/21 alle ore 08:18:58