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La ricerca find articoli where soggetti phrase all words 'high-resolution transmission electron microscopy' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 148 riferimenti
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    1. Kaiser, U; Chuvilin, A; Kyznetsov, V; Butenko, Y
      Evidence for 9R-SiC?

      MICROSCOPY AND MICROANALYSIS
    2. Yaguchi, T; Matsumoto, H; Kamino, T; Ishitani, T; Urao, R
      Method for cross-sectional thin specimen preparation from a specific site using a combination of a focused ion beam system and intermediate voltage electron microscope and its application to the characterization of a precipitate in a steel

      MICROSCOPY AND MICROANALYSIS
    3. Golberg, D; Bando, Y; Kurashima, K; Sato, T
      Synthesis and characterization of ropes made of BN multiwalled nanotubes

      SCRIPTA MATERIALIA
    4. Jia, CL; Siegert, M; Urban, K
      The structure of the interface between BaTiO3 thin films and MgO substrates

      ACTA MATERIALIA
    5. Xie, GQ; Ohashi, O; Yoshioka, T; Song, MH; Mitsuishi, K; Yasuda, H; Furuya, K; Noda, T
      Effect of interface behavior between particles on properties of pure Al powder compacts by spark plasma sintering

      MATERIALS TRANSACTIONS
    6. Lai, PF; Prawer, S; Bursill, LA
      Recovery of diamond after irradiation at high energy and annealing

      DIAMOND AND RELATED MATERIALS
    7. Jiang, M; Zhang, XG; Liu, Y; Hao, GM; Lin, H
      Ferromagnetic carbon-coated iron and its compounds nanocrystallite synthesized at high metal to carbon rate and high yield by a modified AC arc method

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    8. Tanaka, N; Kawahara, M
      Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    9. Hata, S; Mitate, T; Kuwano, N; Matsumura, S; Shindo, D; Oki, K
      Short range order structures in fcc-based Ni-Mo studied by high resolutiontransmission electron microscopy with image processing

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    10. Yonenaga, I; Lim, SH; Lee, CW; Shindo, D
      Atomic arrangement of dislocation defects in GaAs by HREM

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    11. Fujimoto, M; Suzuki, T
      High-resolution transmission electron microscopy and computer simulation of defect structures in electronic perovskite ceramics

      JOURNAL OF THE CERAMIC SOCIETY OF JAPAN
    12. Kang, S; Doolittle, WA; Lee, KK; Dai, ZR; Wang, ZL; Stock, SR; Brown, AS
      Characterization of AlGaN/GaN structures on various substrates grown by radio frequency-plasma assisted molecular beam epitaxy

      JOURNAL OF ELECTRONIC MATERIALS
    13. Allen, LJ; Faulkner, HML; Oxley, M; Paganin, D
      Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy

      ULTRAMICROSCOPY
    14. Bokel, RMJ; Jansen, J; Zandbergen, HW
      Determination of the orientation in small areas of the exit wave

      ULTRAMICROSCOPY
    15. Yoo, DC; Lee, JY
      Superlattice formation of (Ba,Sr)TiO3 prepared by metal-organic chemical vapor deposition

      MATERIALS LETTERS
    16. De Hosson, JTM; Kooi, BJ
      Metal/ceramic interfaces: a microscopic analysis

      SURFACE AND INTERFACE ANALYSIS
    17. Choi, JH; Lee, JY; Kim, JH
      Phase evolution in aluminum nitride thin films on Si(100) prepared by radio frequency magnetron sputtering

      THIN SOLID FILMS
    18. Yaguchi, T; Sato, T; Kamino, T; Taniguchi, Y; Motomiya, K; Tohji, K; Kasuya, A
      A method for characterizing carbon nanotubes

      JOURNAL OF ELECTRON MICROSCOPY
    19. Dal Santo, V; Sordelli, L; Dossi, C; Recchia, S; Fonda, E; Vlaic, G; Psaro, R
      Characterization of Pd/MgO catalysts: Role of organometallic precursor-surface interactions

      JOURNAL OF CATALYSIS
    20. Shirahata, N; Kijima, K; Ma, XL; Ikuhara, Y
      Thermal change of unstable stacking faults in beta-SiC

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    21. Shirahata, N; Kijima, K; Ma, XL; Ikuhara, Y
      A new type of stacking fault in beta-SiC

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    22. Kizuka, T; Kawasaki, M
      A single vacancy chain and its bundle in magnesium oxide as line-type lattice defects

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    23. Kizuka, T; Umehara, S; Fujisawa, S
      Metal-insulator transition in stable one-dimensional arrangements of single gold atoms

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    24. Huang, JY; Zhu, YT
      Advances in the synthesis and characterization of boron nitride

      DEFECTS AND DIFFUSION IN CERAMICS
    25. Dokou, E; Stangland, EE; Andres, RP; Delgass, WN; Barteau, MA
      Comparison of AFM and HRTEM to determine the metal particle morphology andloading of an Au/TiO2 catalyst

      CATALYSIS LETTERS
    26. Hata, S; Shindo, D; Mitate, T; Kuwano, N; Matsumura, S; Oki, K
      HRTEM image contrast of short range order in Ni4Mo

      MICRON
    27. Onozuka, T; Sato, H; Nagakura, S
      Domain configurations of the "incommensurate" structures of 2H-TaSe2 and Bi2Sr2(Ca(1-x)Ln(x))Cu2O8+delta studied by HRTEM

      MICRON
    28. Beeli, C
      High-resolution electron microscopy of quasicrystals

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    29. Pailloux, F; Gaboriaud, RJ; Champeaux, C; Catherinot, A
      Epitaxial stress study by large angle convergent beam electron diffractionand high-resolution transmission electron microscopy Moire fringe pattern

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    30. Kaneko, K; Honda, SW; Nagano, T; Saitoh, T
      Analytical investigation of grain boundaries of compressive deformed Al-doped sintered beta-SiC

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    31. Yakushiji, K; Mitani, S; Takanashi, K; Ha, JG; Fujimori, H
      Composition dependence of particle size distribution and giant magnetoresistance in Co-Al-O granular films

      JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
    32. Wei, BQ; Kohler-Redlich, P; Bader, U; Heiland, B; Spolenak, R; Arzt, E; Ruhle, M
      Selective specimen preparation for TEM observation of the cross-section ofindividual carbon nanotube/metal junctions

      ULTRAMICROSCOPY
    33. Knowles, KM; Turan, S
      The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic-ceramic composites

      ULTRAMICROSCOPY
    34. Tillmann, K; Lentzen, M; Rosenfeld, R
      Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures

      ULTRAMICROSCOPY
    35. Zakharov, ND; Werner, P; Zibrov, IP; Filonenko, VP; Sundberg, M
      Structural studies of calcium tungsten bronzes, CaxWO3, formed at high pressure

      CRYSTAL RESEARCH AND TECHNOLOGY
    36. Nepijko, SA; Klimenkov, M; Kuhlenbeck, H; Freund, HJ
      Local melting of the NiAl substrate under deposited Pd clusters during irradiation in a transmission electron microscope

      CRYSTAL RESEARCH AND TECHNOLOGY
    37. Hasse, A; Volz, K; Schaper, AK; Koch, J; Hohnsdorf, F; Stolz, W
      TEM investigations of (GaIn)(NAs)/GaAs multi-quantum wells grown by MOVPE

      CRYSTAL RESEARCH AND TECHNOLOGY
    38. Akatsu, T; Scheu, C; Wagner, T; Gemming, T; Hosoda, N; Suga, T; Ruhle, M
      Morphology and microstructure of the Ar+-ion sputtered (0001) alpha-Al2O3 surface

      APPLIED SURFACE SCIENCE
    39. Quintana, C; Lancin, M; Marhic, C; Perez, M; Martin-Benito, J; Avila, J; Carrascosa, JL
      Initial studies with high resolution TEM and electron energy loss spectroscopy studies of ferritin cores extracted from brains of patients with progressive supranuclear palsy and Alzheimer disease

      CELLULAR AND MOLECULAR BIOLOGY
    40. Onozuka, T; Niizeki, K
      Symmetrical staircase in the profile of lattice-modulation period versus Pr-concentration and domain configurations in Bi2Sr2(Ca1-xPrx)Cu2O8+delta

      JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
    41. Graat, PCJ; Zandbergen, HW; Somers, MAJ; Mittemeijer, EJ
      Constitution and crystallography of thin thermal-oxide layers on epsilon-Fe2Ni1-x: A HREM investigation

      OXIDATION OF METALS
    42. Hu, JJ; Tanaka, N
      Beam alignment and related problems of spherical aberration corrected high-resolution TEM Images

      JOURNAL OF ELECTRON MICROSCOPY
    43. Tillmann, K; Jager, W
      Quantitative HRTEM analysis of semiconductor quantum dots

      JOURNAL OF ELECTRON MICROSCOPY
    44. Heinke, H; Passow, T; Stockmann, A; Selke, H; Leonardi, K; Hommel, D
      Analysis of cadmium diffusion in ZnSe by X-ray diffraction and transmission electron microscopy

      JOURNAL OF CRYSTAL GROWTH
    45. You, LP; Heng, CL; Ma, SY; Ma, ZC; Zong, WH; Wu, ZL; Win, GG
      Precipitation and crystallization of nanometer Si clusters in annealed Si-rich SiO2 films

      JOURNAL OF CRYSTAL GROWTH
    46. Vorob'ev, AB; Gutakovsky, AK; Prinz, VY
      Cleavage of thin films for X-HREM study of interface quality in heterostructures

      JOURNAL OF CRYSTAL GROWTH
    47. Li, D; Xu, HF; Guthrie, GD
      Zeolite-supported Ni and Mo catalysts for hydrotreatments II. HRTEM observations

      JOURNAL OF CATALYSIS
    48. Nitta, N; Taniwaki, M; Suzuki, T; Hayashi, Y; Satoh, Y; Yoshiie, T
      Anomalous defect structure formed on GaSb surface by low temperature Sn ion-implantation and its formation mechanism

      JOURNAL OF THE JAPAN INSTITUTE OF METALS
    49. Gillot, F; Righi, D; Elsass, F
      Pedogenic smectites in podzols from central Finland: An analytical electron microscopy study

      CLAYS AND CLAY MINERALS
    50. Janney, DE; Cowley, JM; Buseck, PR
      Transmission electron microscopy of synthetic 2-and 6-line ferrihydrite

      CLAYS AND CLAY MINERALS
    51. Kaiser, U; Chuvilin, A; Brown, PD; Richter, W
      Origin of threefold periodicity in high-resolution transmission electron microscopy images of thin film cubic SiC

      MICROSCOPY AND MICROANALYSIS
    52. Levay, A; Mobus, G; Vitek, V; Ruhle, M; Tichy, G
      Structure of misfit dislocations in niobium-sapphire interfaces and strength of interfacial bonding: An atomistic study

      ACTA MATERIALIA
    53. Kizuka, T
      Structures of Ag/ZnO, Ag/WO3 and Ag/Al-oxide nanocrystalline composites prepared by gas evaporation and in-situ compaction

      MATERIALS TRANSACTIONS JIM
    54. Fujita, M; Ihn, KJ; Tsuji, M; Kohjiya, S
      Morphology of polymer crystals grown from solutions epitaxially on alkali halides

      KOBUNSHI RONBUNSHU
    55. Bokel, RMJ; Jansen, J; van Dyck, D; Zandbergen, HW
      The effect of mechanical vibration and drift on the reconstruction of exitwaves from a through focus series of HREM images

      ULTRAMICROSCOPY
    56. Rosenauer, A; Gerthsen, D
      Composition evaluation by the lattice fringe analysis method using defocusseries

      ULTRAMICROSCOPY
    57. Narayanan, V; Sukidi, N; Bachmann, KJ; Mahajan, S
      Origins of defects in self assembled GaP islands grown on Si(001) and Si(111)

      THIN SOLID FILMS
    58. Gribelyuk, MA; Wilk, GD
      Growth and microstructure of Si/CaF2/Si(111) heterostructures

      THIN SOLID FILMS
    59. Anstis, GR
      The influence of atomic vibrations on the imaging properties of atomic focusers

      JOURNAL OF MICROSCOPY-OXFORD
    60. Kirmse, H; Schneider, R; Scheerschmidt, K; Conrad, D; Neumann, W
      TEM characterization of self-organized CdSe/ZnSe quantum dots

      JOURNAL OF MICROSCOPY-OXFORD
    61. Muto, SE; Horiuchi, S; Tanabe, T
      Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy

      JOURNAL OF ELECTRON MICROSCOPY
    62. Yang, GY; Bando, Y; Onoda, M; Saeki, M
      High-resolution transmission electron microscopy of the composite crystal Sr1.145TiS3

      JOURNAL OF ELECTRON MICROSCOPY
    63. Clark, TE; Mancoff, FB; Wang, SX; Clemens, BM; Sinclair, R
      Study of DC plasma oxidized Al2O3 barriers in spin dependent tunneling junctions using high resolution transmission electron microscopy

      IEEE TRANSACTIONS ON MAGNETICS
    64. Kizuka, T; Yanaka, T
      Atomic-scale electron beam processing

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    65. ZHU YM
      WHY THE LARGE-ANGLE TWIST-BOUNDARIES IN BI2SR2CACU2O8-CURRENT(DELTA CAN CARRY SUPER)

      MATERIALS RESEARCH INNOVATIONS
    66. KIZUKA T; TANAKA N; DEGUCHI S; NARUSE M
      TIME-RESOLVED HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY USING A PIEZO-DRIVING SPECIMEN HOLDER FOR ATOMIC-SCALE MECHANICAL INTERACTION

      MICROSCOPY AND MICROANALYSIS
    67. HOWE JM; MURRAY TM; MOORE KT; CSONTOS AA; TSAI MM; GARG A; BENSON WE
      UNDERSTANDING INTERPHASE BOUNDARY DYNAMICS BY IN-SITU HIGH-RESOLUTIONAND ENERGY-FILTERING TRANSMISSION ELECTRON-MICROSCOPY AND REAL-TIME IMAGE SIMULATION

      MICROSCOPY AND MICROANALYSIS
    68. BENAISSA M; DIAZ G
      CONTRIBUTION OF HRTEM TO THE CHARACTERIZATION OF SILICA-INCORPORATED COPPER-OXIDE CATALYSTS PREPARED BY THE SOL-GEL TECHNIQUE

      Microscopy research and technique
    69. HORNYAK GL; PESCHEL S; SAWITOWSKI T; SCHMID G
      TEM, STM AND AFM AS TOOLS TO STUDY CLUSTERS AND COLLOIDS

      Micron
    70. CSONTOS AA; TSAI MM; HOWE JM
      IN-SITU HIGH-RESOLUTION ELECTRON SPECTROSCOPIC IMAGING OF PRECIPITATEGROWTH IN AN AL-AG ALLOY

      Micron
    71. GRAFF A; SENZ S; ZAKHAROV ND; HESSE D
      STRUCTURE OF THE TOPOTAXIAL MG2SNO4 MGO SOLID REACTION FRONT/

      Zeitschrift für physikalische Chemie
    72. YONENAGA I; BROWN PD; HUMPHREYS CJ
      CLIMB OF DISLOCATIONS IN GAAS BY IRRADIATION

      Materials science & engineering. A, Structural materials: properties, microstructure and processing
    73. RYEN L; OLSSON E; EDVARDSSON CNL; HELMERSSON U
      DISLOCATIONS, STRAIN, AND DEFECTS IN HETEROEPITAXIAL YBA2CU3O7-X SRTIO3 MULTILAYERS/

      Physica. C, Superconductivity
    74. PHILLIPP F
      ADVANCES IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

      Materials transactions, JIM
    75. HATA S; SHINDO D; KUWANO N; MATSUMURA S; OKI K
      INTERPRETATION OF HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE IMAGES OF SHORT-RANGE ORDERED NI4MO

      Materials transactions, JIM
    76. HOWE JM
      ATOMIC-STRUCTURE, COMPOSITION, MECHANISMS AND DYNAMICS OF TRANSFORMATION INTERFACES IN DIFFUSIONAL PHASE-TRANSFORMATIONS

      Materials transactions, JIM
    77. INOUE M; SUZUKI K; AMASUGA H; NAKAMURA M; MERA Y; TAKEUCHI S; MAEDA K
      RELIABLE IMAGE-PROCESSING THAT CAN EXTRACT AN ATOMICALLY-RESOLVED LINE-SHAPE OF PARTIAL DISLOCATIONS IN SEMICONDUCTORS FROM PLAN-VIEW HIGH-RESOLUTION ELECTRON-MICROSCOPIC IMAGES

      Ultramicroscopy
    78. WANG ZL
      AN OPTICAL-POTENTIAL APPROACH TO INCOHERENT MULTIPLE THERMAL DIFFUSE-SCATTERING IN QUANTITATIVE HRTEM

      Ultramicroscopy
    79. SANCHEZ M; COWLEY JM
      THE IMAGING PROPERTIES OF ATOMIC FOCUSERS

      Ultramicroscopy
    80. ROMEO M; UHLAQBOUILLET C; DEVILLE JP; WERCKMANN J; EHRET G; CHELLY R; DENTEL D; ANGOT T; BISCHOFF JL
      HRTEM STUDY OF STRAINED SI GE MULTILAYERS

      Thin solid films
    81. MARET M; ULHAQBOUILLET C; STAIGER W; CADEVILLE MC; LEFEBVRE S; BESSIERE M
      INVESTIGATION OF CHEMICAL ORDERING IN MBE-GROWN COXPT1-X FILMS BY X-RAY-DIFFRACTION AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

      Thin solid films
    82. CZIRAKI A; PIERRONBOHNES V; ULHAQBOUILLET C; TOTHKADAR E; BAKONYI I
      A CROSS-SECTIONAL HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF ELECTRODEPOSITED NI-CU CU MULTILAYERS/

      Thin solid films
    83. WU XL; MENG DW; PAN ZL; YANG GM; LI DX
      TRANSMISSION ELECTRON-MICROSCOPIC STUDY OF NEW, REGULAR, MIXED-LAYER STRUCTURES IN CALCIUM-RARE-EARTH FLUOROCARBONATE MINERALS

      Mineralogical Magazine
    84. BURDEN AP; BAIGRIE S; HUTCHISON JL
      AN INVESTIGATION OF THE ELECTRON-IRRADIATION OF CARBON-BLACKS IN VARIOUS GAS ATMOSPHERES USING A MODIFIED ELECTRON-MICROSCOPE

      Journal of Microscopy
    85. STEINECKER A; MADER W
      EXIT WAVE RECONSTRUCTION USING A CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPE

      Journal of Microscopy
    86. MATSUDA K; KAWABATA T; NAOI T; UETANI Y; RENGAKUJI S; SATO T; KAMIO A; IKENO S
      PRECIPITATION BEHAVIOR OF A 2-STEP AGED AL-MG-SI ALLOY WITH EXCESS SILICON

      Nippon Kinzoku Gakkaishi
    87. MATSUDA K; YOSHIDA T; WADA T; YOSHIDA M; UETANI Y; SATO T; KAMIO A; IKENO S
      PRECIPITATION SEQUENCE IN AL-MG-SI ALLOYS WITH EXCESS MAGNESIUM

      Nippon Kinzoku Gakkaishi
    88. MATSUDA K; YOSHIDA T; GAMADA H; FUJII K; UETANI Y; SATO T; KAMIO A; IKENO S
      HIGH-RESOLUTION TRANSMISSION ELECTRON-MIC ROSCOPY OF PRECIPITATE MICROSTRUCTURES OF 2-STEP AGED AL-1.6-PERCENT-MG2SI ALLOY

      Nippon Kinzoku Gakkaishi
    89. WIERZCHOS J; ASCASO C
      MINERALOGICAL TRANSFORMATION OF BIOWEATHERED GRANITIC BIOTITE, STUDIED BY HRTEM - EVIDENCE FOR A NEW PATHWAY IN LICHEN ACTIVITY

      Clays and clay minerals
    90. HIROYAMA Y; TAMURA M
      EFFECT OF VERY THIN SIC LAYER ON HETEROEPITAXIAL GROWTH OF CUBIC GAN ON SI(001)

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    91. CAMPBELL GH; KING WE; COHEN D
      ANALYSIS OF EXPERIMENTAL ERROR IN HIGH-RESOLUTION ELECTRON-MICROGRAPHS

      MICROSCOPY AND MICROANALYSIS
    92. BARONNET A
      SILICATE MICROSTRUCTURES AT THE SUB-ATOMIC SCALE

      Comptes rendus de l'Academie des sciences. Serie II. Sciences de la terre et des planetes
    93. EIJSBOUTS S
      ON THE FLEXIBILITY OF THE ACTIVE PHASE IN HYDROTREATING CATALYSTS

      Applied catalysis. A, General
    94. INUI H; MORIWAKI M; ANDO S; YAMAGUCHI M
      PLASTIC-DEFORMATION OF SINGLE-CRYSTALS OF CRSI2 WITH THE C40 STRUCTURE

      Materials science & engineering. A, Structural materials: properties, microstructure and processing
    95. MORIWAKI M; ITO K; INUI H; YAMAGUCHI M
      PLASTIC-DEFORMATION OF SINGLE-CRYSTALS OF NBSI2 WITH THE C40 STRUCTURE

      Materials science & engineering. A, Structural materials: properties, microstructure and processing
    96. HUANG JY; TANIGUCHI T; HORIUCHI S
      FACILITATED SYNTHESIS OF SUPERHARD MATERIALS BY HEXAGONAL-CUBIC TRANSITION

      Diamond films and technology
    97. TSUREKAWA S; MORITA K; NAKASHIMA H; YOSHINAGA H
      GEOMETRIC STRUCTURES OF GRAIN-BOUNDARIES EXPECTED FROM THE O-LATTICE THEORY COMPARED WITH HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE IMAGES

      Materials transactions, JIM
    98. EDGAR JH; YU ZJ; SMITH DJ; CHAUDHURI J; CHENG X
      X-RAY-DIFFRACTION AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF 3C-SIC ALN/6H-SIC(0001)/

      Journal of electronic materials
    99. ICHISE N; BABA N; NAGASHIMA H
      THE PHASE SPECTRUM-BASED MEASUREMENT OF THE TEM PARAMETERS

      Ultramicroscopy
    100. COWLEY JM; SPENCE JCH; SMIRNOV VV
      THE ENHANCEMENT OF ELECTRON-MICROSCOPE RESOLUTION BY USE OF ATOMIC FOCUSERS

      Ultramicroscopy


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Documento generato il 27/01/21 alle ore 09:31:29