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La ricerca find articoli where soggetti phrase all words 'ellipsometry' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 2002 riferimenti
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    1. Bohm, S; Peter, LM; Schlichthorl, G; Greef, R
      Ellipsometric and microwave reflectivity studies of current oscillations during anodic dissolution of p-Si in fluoride solutions

      JOURNAL OF ELECTROANALYTICAL CHEMISTRY
    2. Xia, SJ; Birss, VI
      A multi-technique study of compact and hydrous Au oxide growth in 0.1 M sulfuric acid solutions

      JOURNAL OF ELECTROANALYTICAL CHEMISTRY
    3. Howse, JR; Steitz, R; Pannek, M; Simon, P; Schubert, DW; Findenegg, GH
      Adsorbed surfactant layers at polymer/liquid interfaces. A neutron reflectivity study

      PHYSICAL CHEMISTRY CHEMICAL PHYSICS
    4. Viana, AS; Abrantes, LM; Jin, G; Floate, S; Nichols, RJ; Kalaji, M
      Electrochemical, spectroscopic and SPM evidence for the controlled formation of self-assembled monolayers and organised multilayers of ferrocenyl alkyl thiols on Au(111)

      PHYSICAL CHEMISTRY CHEMICAL PHYSICS
    5. Logothetidis, S; Gioti, M; Charitidis, C; Patsalas, P
      Development of diamond and diamond-related materials with desired properties

      ADVANCED ENGINEERING MATERIALS
    6. Kergoat, H; Kergoat, MJ; Justino, L; Chertkow, H; Robillard, A; Bergman, H
      An evaluation of the retinal nerve fiber layer thickness by scanning laserpolarimetry in individuals with dementia of the Alzheimer type

      ACTA OPHTHALMOLOGICA SCANDINAVICA
    7. Diebold, AC; Canterbury, J; Chism, W; Richter, C; Nguyen, N; Ehrstein, J; Weintraub, C
      Characterization and production metrology of gate dielectric films

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    8. Papis, E; Kudla, A; Piotrowski, TT; Golaszewska, K; Kaminska, E; Piotrowska, A
      Ellipsometric investigations of (100) GaSb surface under chemical etching and sulfide treatment

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    9. Marrs, AD
      Sequential Bayesian estimation for tracking the composition of growing silicon-germanium alloys

      PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES
    10. Keddie, JL
      Structural analysis of organic interfacial layers by ellipsometry

      CURRENT OPINION IN COLLOID & INTERFACE SCIENCE
    11. Gee, ML; Goodall, DG; Stevens, GW
      Imaging of droplet profiles during drainage of a film between a droplet and an interface

      OIL & GAS SCIENCE AND TECHNOLOGY-REVUE DE L INSTITUT FRANCAIS DU PETROLE
    12. Voue, M; De Coninck, J
      Spreading on heterogeneous substrates

      OIL & GAS SCIENCE AND TECHNOLOGY-REVUE DE L INSTITUT FRANCAIS DU PETROLE
    13. Peltonen, L; Karjalainen, M; Hirvonen, J; Yliruusi, J
      Four sorbitan monoesters: XRDP and DSC studies on bulk material and ellipsometric studies on Langmuir-Blodgett monolayers

      STP PHARMA SCIENCES
    14. Cobianu, B; Modreanu, M; Danila, M; Gavrila, R; Bercu, M; Gartner, M
      Structural and morphological changes in low temperature annealed LPCVD Si layers

      JOURNAL DE PHYSIQUE IV
    15. Visnovksy, S; Postava, K; Yamaguchi, T
      Magneto-optic polar Kerr and Faraday effects in periodic multilayers

      OPTICS EXPRESS
    16. Germer, TA
      Polarized light scattering by microroughness and small defects in dielectric layers

      JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
    17. Ducros, MG; Marsack, JD; Rylander, HG; Thomsen, SL; Milner, TE
      Primate retina imaging with polarization-sensitive optical coherence tomography

      JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
    18. Hu, YZ; Tay, SP
      Characterization of high-K dielectric ZrO2 films annealed by rapid thermalprocessing

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    19. Akazawa, H
      Formation of Si-Si bonds and precipitation of Si nanocrystals in vacuum-ultraviolet-irradiated a-SiO2 films

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    20. Tinani, M; Mueller, A; Gao, Y; Irene, EA; Hu, YZ; Tay, SP
      In situ real-time studies of nickel silicide phase formation

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    21. Flynn, MG; Smith, R; Abraham, P; DenBaars, S
      Control of a III-V MOCVD process using ultraviolet absorption and ultrasonic concentration monitoring

      IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY
    22. Rosen, IG; Parent, T; Cooper, C; Chen, P; Madhukar, A
      A neural-network-based approach to determining a robust process recipe forthe plasma-enhanced deposition of silicon nitride thin films

      IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY
    23. Olson, DA; Pankratz, S; Johnson, PM; Cady, A; Nguyen, HT; Huang, CC
      Optical studies of the smectic-C-alpha* phase layer structure in free-standing films - art. no. 061711

      PHYSICAL REVIEW E
    24. Iester, M; Mermoud, A
      Retinal nerve fiber layer and physiological central corneal thickness

      JOURNAL OF GLAUCOMA
    25. Ma, XD; Tang, H; Gui, J
      Temperature effect on spreading of perfluoropolyethers on amorphous carbonfilms

      TRIBOLOGY LETTERS
    26. Karis, TE
      Tribochemistry in contact recording

      TRIBOLOGY LETTERS
    27. Huang, ZM; Zang, ZH; Jiang, CP; Chu, JH
      Refractive index enhancement effect in Hg1-xCdxTe near the fundamental gap

      JOURNAL OF INFRARED AND MILLIMETER WAVES
    28. Goring, GLG; Brown, RS; Horton, JH
      The adsorption of benzo[k]fluoranthene on self assembled films of octadecyltrichlorosilane

      JOURNAL OF MATERIALS CHEMISTRY
    29. Siegel, G; Malmsten, M; Klussendorf, D; Michel, F
      A receptor-based biosensor for lipoprotein docking at the endothelial surface and vascular matrix

      BIOSENSORS & BIOELECTRONICS
    30. Shirshov, YM; Snopok, BA; Samoylov, AV; Kiyanovskij, AP; Venger, EF; Nabok, AV; Ray, AK
      Analysis of the response of planar polarization interferometer to molecular layer formation: fibrinogen adsorption on silicon nitride surface

      BIOSENSORS & BIOELECTRONICS
    31. Bahng, JH; Kim, KJ; Ihm, SH; Kim, JY; Park, HL
      Evolution of optical constants and electronic structure of disordered Si1-xGex alloys

      JOURNAL OF PHYSICS-CONDENSED MATTER
    32. Yamamoto, S; Oda, S
      Atomic layer-by-layer MOCVD of complex metal oxides and in situ process monitoring

      CHEMICAL VAPOR DEPOSITION
    33. Djurisic, AB; Li, EH
      Modeling the optical constants of CuGaSe2 and CuInSe2

      APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
    34. Meichsner, J; Li, K
      In situ characterisation of thin-film formation in molecular low-temperature plasmas

      APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
    35. Plass, MF; Popov, C; Ivanov, B; Mandl, S; Jelinek, H; Zambov, LM; Kulisch, W
      Correlation between photoluminescence, optical and structural properties of amorphous nitrogen-rich carbon nitride films

      APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
    36. Hodgkinson, I; Wu, QH
      Inorganic chiral optical materials

      ADVANCED MATERIALS
    37. Dragan, S; Schwarz, S; Eichhorn, KJ; Lunkwitz, M
      Electrostatic self-assembled nano architectures between polycations of integral type and azo dyes

      COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
    38. Wen, XY; Franses, EI
      Adsorption of bovine serum albumin at the air/water interface and its effect on the formation of DPPC surface film

      COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
    39. Abraham, T; Giasson, S
      Interactions of partially screened polyelectrolyte layers with oppositely charged surfactant in confined environment

      COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
    40. Hermann, AM; Gonzalez, C; Ramakrishnan, PA; Balzar, D; Popa, N; Rice, P; Marshall, CH; Hilfiker, JN; Tiwald, T; Sebastian, PJ; Calixto, ME; Bhattacharya, RN
      Fundamental studies on large area Cu(In,Ga)Se-2 films for high efficiency solar cells

      SOLAR ENERGY MATERIALS AND SOLAR CELLS
    41. Hamma, S; Cabarrocas, PRI
      Low-temperature growth of thick intrinsic and ultrathin phosphorous or boron-doped microcrystalline silicon films: Optimum crystalline fractions for solar cell applications

      SOLAR ENERGY MATERIALS AND SOLAR CELLS
    42. Fujiwara, H; Toyoshima, Y; Kondo, M; Matsuda, A
      Application of real-time in situ spectroscopic ellipsometry and infrared spectroscopy for characterizing interface structure of a-Si : H layer

      SOLAR ENERGY MATERIALS AND SOLAR CELLS
    43. Matsuura, D; Kamiya, T; Fortmann, CM; Simizu, I
      Microstructure control of very thin polycrystalline silicon layers on glass substrate by plasma enhanced CVD

      SOLAR ENERGY MATERIALS AND SOLAR CELLS
    44. Muhl, S; Camps, E; Escobar-Alarcon, L; Olea, O; Miki, M; Morrison, NA
      DLC films prepared by electron evaporation of graphite in an ECR plasma

      DIAMOND AND RELATED MATERIALS
    45. Patsalas, P; Handrea, M; Logothetidis, S; Gioti, M; Kennou, S; Kautek, W
      A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques

      DIAMOND AND RELATED MATERIALS
    46. Canillas, A; Polo, MC; Andujar, JL; Sancho, J; Bosch, S; Robertson, J; Milne, WI
      Spectroscopic ellipsometric study of tetrahedral amorphous carbon films: optical properties and modelling

      DIAMOND AND RELATED MATERIALS
    47. Laskarakis, A; Logothetidis, S; Charitidis, C; Gioti, M; Panayiotatos, Y; Handrea, M; Kautek, W
      A study on the bonding structure and mechanical properties of magnetron sputtered CNx thin films

      DIAMOND AND RELATED MATERIALS
    48. Zapien, JA; Messier, R; Collins, RW
      Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: phase identification in boron nitride thin films

      DIAMOND AND RELATED MATERIALS
    49. Logothetidis, S; Gioti, M; Patsalas, P
      Real-time monitoring, growth kinetics and properties of carbon based materials deposited by sputtering

      DIAMOND AND RELATED MATERIALS
    50. Gupta, S; Weiner, BR; Morell, G
      Spectroscopic ellipsometry studies of nanocrystalline carbon thin films deposited by HFCVD

      DIAMOND AND RELATED MATERIALS
    51. Polgar, O; Fried, M; Lohner, T; Barsony, I
      A combined topographical search strategy with ellipsometric application

      JOURNAL OF GLOBAL OPTIMIZATION
    52. Duteil, F; Du, CX; Jarrendahl, K; Ni, WX; Hansson, GV
      Er/O doped Si1-xGex alloy layers grown by MBE

      OPTICAL MATERIALS
    53. Modreanu, M; Gartner, M; Tomozeiu, N; Seekamp, J; Cosmin, P
      Investigation on optical and microstructural properties of photoluminescent LPCVD SiOxNy thin films

      OPTICAL MATERIALS
    54. Migas, DB; Henrion, W; Rebien, M; Shaposhnikov, VL; Borisenko, VE; Miglio, L
      Optical properties of isostructural beta-FeSi2, OsSi2, Fe0.5Os0.5Si2 and Os0.5Fe0.5Si2

      OPTICAL MATERIALS
    55. Shaposhnikov, VL; Ivanenko, LI; Migas, DB; Lenssen, D; Carius, R; Mantl, S; Borisenko, VE
      Optical properties of semiconducting RU2Si3

      OPTICAL MATERIALS
    56. Arwin, H
      Is ellipsometry suitable for sensor applications?

      SENSORS AND ACTUATORS A-PHYSICAL
    57. Dmitruk, NL; Mayeva, OI; Mamykin, SV; Yastrubchak, OB; Klopfleisch, M
      Characterization and application of multilayer diffraction gratings as optochemical sensors

      SENSORS AND ACTUATORS A-PHYSICAL
    58. Sakaino, K; Adachi, S
      Study of Si(100) surfaces etched in TMAH solution

      SENSORS AND ACTUATORS A-PHYSICAL
    59. Kasic, A; Schubert, M; Rheinlander, B; Riede, V; Einfeldt, S; Hommel, D; Kuhn, B; Off, J; Scholz, F
      Effective carrier mass and mobility versus carrier concentration in p- andn-type alpha-GaN determined by infrared ellipsometry and Hall resistivity measurements

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    60. Schubert, M; Kasic, A; Sik, J; Einfeldt, S; Hommel, D; Harle, V; Off, J; Scholz, F
      Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by infrared ellipsometry and Raman spectroscopy

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    61. Katiyar, M; Abelson, JR
      Investigation of hydrogen induced phase transition from a-Si : H to mu c-Si : H using real time infrared spectroscopy

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    62. Richter, P; Kress, M; Mohler, E; Roskos, HG; Jakob, G; Adrian, H
      Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements

      PHYSICA C
    63. Belyaeva, AI; Galuza, AA
      Optical constants of surface layer on gadolinium gallium garnet determinedby ellipsometry

      PHYSICA B
    64. Benesch, J; Svedhem, S; Svensson, SCT; Valiokas, R; Liedberg, B; Tengvall, P
      Protein adsorption to oligo(ethylene glycol) self-assembled monolayers: Experiments with fibrinogen, heparinized plasma, and serum

      JOURNAL OF BIOMATERIALS SCIENCE-POLYMER EDITION
    65. Berg, ICH; Kalfas, S; Malmsten, M; Arnebrant, T
      Proteolytic degradation of oral biofilms in vitro and in vivo: potential of proteases originating from Euphausia superba for plaque control

      EUROPEAN JOURNAL OF ORAL SCIENCES
    66. Steen, ML; Flory, WC; Capps, NE; Fisher, ER
      Plasma modification of porous structures for formation of composite materials

      CHEMISTRY OF MATERIALS
    67. Park, HM; Grimard, DS; Grizzle, JW; Terry, FL
      Etch profile control of high-aspect ratio deep submicrometer alpha-Si gateetch

      IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
    68. Niu, XH; Jakatdar, N; Bao, JW; Spanos, CJ
      Specular spectroscopic scatterometry

      IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
    69. Mahltig, B; Gohy, JF; Jerome, R; Stamm, M
      Diblock polyampholytes at the silicon-water interface: Adsorption as a function of block ratio and molecular weight

      JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
    70. Forrest, JA; Dalnoki-Veress, K
      Sub-glass-transition temperature interface formation between an immiscibleglass rubber pair

      JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
    71. Zangooie, S; Schubert, M; Tiwald, TE; Woollam, JA
      Infrared optical properties of aged porous GaAs

      JOURNAL OF MATERIALS RESEARCH
    72. Gonzalez, JA; Figueroa, OL; Weiner, BR; Morell, G
      Study of the effects of low-energy electron bombardment during the chemical vapor deposition of diamond

      JOURNAL OF MATERIALS RESEARCH
    73. Puff, N; Marchal, R; Aguie-Beghin, A; Douillard, R
      Is grape invertase a major component of the adsorption layer formed at theair/champagne wine interface?

      LANGMUIR
    74. Eskilsson, K; Leal, C; Lindman, B; Miguel, M; Nylander, T
      DNA-surfactant complexes at solid surfaces

      LANGMUIR
    75. Mann, EK
      Evaluating optical techniques for determining film structure: Optical invariants for anisotropic dielectric thin films

      LANGMUIR
    76. Goodall, DG; Gee, ML; Stevens, GW
      Effect of surfactant on the drainage of an aqueous film between an oil droplet approaching a hydrophobic solid surface

      LANGMUIR
    77. Lu, JR; Murphy, EF; Su, TJ; Lewis, AL; Stratford, PW; Satija, SK
      Reduced protein adsorption on the surface of a chemically grafted phospholipid monolayer

      LANGMUIR
    78. Joseph, EA; Gross, C; Liu, HY; Laaksonen, RT; Celii, FG
      Characterization of silicon-rich nitride and oxynitride films for polysilicon gate patterning. I. Physical, characterization

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    79. Fukarek, W
      In situ characterization of thin film growth: Boron nitride on silicon

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    80. Yan, L; Gao, X; Bungay, C; Woollam, JA
      Study of surface chemical changes and erosion rates for CV-1144-0 siliconeunder electron cyclotron resonance oxygen plasma exposure

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    81. Poinoosawmy, D; Tan, JCH; Bunce, C; Hitchings, RA
      The ability of the GDx Nerve Fibre Analyser neural network to diagnose glaucoma

      GRAEFES ARCHIVE FOR CLINICAL AND EXPERIMENTAL OPHTHALMOLOGY
    82. Lei, JL; Li, LJ; Zhang, ST; Cai, SM; Li, D; Yang, MZ
      Studies on corrosion behavior of copper electrode in weak alkaline solution

      ACTA CHIMICA SINICA
    83. Cristofolini, L; Arisi, S; Fontana, MP
      Surface anchoring and optically induced molecular motion in thin azobenzene polymeric films

      SYNTHETIC METALS
    84. Damman, P; Vallee, R; Dosiere, M; Toussaere, E; Zyss, J
      Oriented crystallization of NLO organic materials

      SYNTHETIC METALS
    85. Kavc, T; Langer, G; Kern, W; Kranzelbinder, G; Toussaere, E; Voss, S
      Formation of relief gratings in photoreactive polymers via gas phase modification

      SYNTHETIC METALS
    86. Spearman, P; Kouki, F; Lang, P; Valat, P; Horowitz, G; Garnier, F
      Directional dispersion of exciton levels in alpha-oligothiophenes

      SYNTHETIC METALS
    87. Kong, F; Kostecki, R; Nadeau, G; Song, X; Zaghib, K; Kinoshita, K; McLarnon, F
      In situ studies of SEI formation

      JOURNAL OF POWER SOURCES
    88. Varela, H; Malta, M; Torresi, RM
      Microgravimetric study of the influence of the solvent on the redox properties of polypyrrol modified electrodes

      JOURNAL OF POWER SOURCES
    89. Bang, CY; Lee, MS; Kim, TJ; Kim, YD; Aspnes, DE; Yu, YM; O, BS; Choi, YD
      Above bandgap optical properties of ZnS and ZnS1-xTex alloys grown by using hot-wall epitaxy

      JOURNAL OF THE KOREAN PHYSICAL SOCIETY
    90. Gallardo, J; Galliano, P; Duran, A
      Structure and porosity of hybrid SiO2 coatings

      BOLETIN DE LA SOCIEDAD ESPANOLA DE CERAMICA Y VIDRIO
    91. Daraselia, M; Garland, JW; Johs, B; Nathan, V; Sivananthan, S
      Improvement of the accuracy of the in-situ ellipsometric measurements of temperature and alloy composition for MBE grown HgCdTe LWIR/MWIR structures

      JOURNAL OF ELECTRONIC MATERIALS
    92. Edwall, D; Phillips, J; Lee, D; Arias, J
      Composition control of long wavelength MBE HgCdTe using in-situ spectroscopic ellipsometry

      JOURNAL OF ELECTRONIC MATERIALS
    93. Cui, R; Bhat, I; O'Quinn, B; Venkatasubramanian, R
      In-situ monitoring of the growth of Bi2Te3 and Sb2Te3 films and Bi2Te3-Sb2Te3 superlattice using spectroscopic ellipsometry

      JOURNAL OF ELECTRONIC MATERIALS
    94. Taniyasu, Y; Yoshikawa, A
      In-situ monitoring of surface stoichiometry and growth kinetics study of GaN (0001) in MOVPE by spectroscopic ellipsometry

      JOURNAL OF ELECTRONIC MATERIALS
    95. Hannappel, T; Toben, L; Moller, K; Willig, F
      In-situ monitoring of InP(100) and GaP(100) interfaces and characterization with RDS at 20 K

      JOURNAL OF ELECTRONIC MATERIALS
    96. Ye, C; Raty, J; Nyblom, I; Hyvarinen, HK; Moss, P
      Estimation of lignin content in single, intact pulp fibers by UV photometry and VIS Mueller matrix polarimetry

      NORDIC PULP & PAPER RESEARCH JOURNAL
    97. Munoz, M; Pollak, FH; Holden, T
      Comment on 'modelling the optical constants of GaAs: excitonic effects at E-1, E-1+Delta(1) critical points'

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    98. Djurisic, AB; Li, EH
      Response to the comment on 'Modelling the optical constants of GaAs: excitonic effects at E1, E1+Delta(1) critical points'

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    99. Thomas, PJS; Hosea, TJC; Lancefield, D; Meidia, H
      Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    100. Djurisic, AB; Chan, Y; Li, EH
      The model dielectric function: application to GaSb and InP

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY


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Documento generato il 09/08/20 alle ore 02:24:37