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La ricerca find articoli where soggetti phrase all words 'depth profiling' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 354 riferimenti
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    1. Yamazaki, H
      Improvement of detection limit for secondary-ion mass spectrometry depth profiling of argon in silicon by energy filtering

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    2. Vacik, J; Hnatowicz, V; Cervena, J; Naramoto, H; Yamamoto, S; Fink, D
      Energy loss and energy straggling of light ions in fullerite

      FULLERENE SCIENCE AND TECHNOLOGY
    3. Li, ZQ; Hong, Y; Zhang, SY; Zhang, ZN; Shui, XJ
      Depth profiling and thermal relaxation of residual stress in Al2O3f/SAE321composites observed by SEAM

      PROGRESS IN NATURAL SCIENCE
    4. Spirkova-Hradilova, J; Nekvindova, P; Vacik, J; Cervena, J; Schrofel, J
      The possibility of tailoring the n(e) vs c(Li) relationship in lithium niobate optical waveguides

      OPTICAL MATERIALS
    5. Gonon, L; Mallegol, J; Commereuc, S; Verney, V
      Step-scan FTIR and photoacoustic detection to assess depth profile of photooxidized polymer

      VIBRATIONAL SPECTROSCOPY
    6. Maravelaki-Kalaitzaki, P; Anglos, D; Kilikoglou, V; Zafiropulos, V
      Compositional characterization of encrustation on marble with laser induced breakdown spectroscopy

      SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
    7. Menyhard, M; Zsolt, G; Chen, PJ; Powell, CJ; McMichael, RD; Egelhoff, WF
      Structural effects in the growth of giant magnetoresistance (GMR) spin valves

      APPLIED SURFACE SCIENCE
    8. Scheithauer, U
      Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections

      APPLIED SURFACE SCIENCE
    9. Oswald, S; Reiche, R
      Binding state information from XPS depth profiling: capabilities and limits

      APPLIED SURFACE SCIENCE
    10. Verda, RD; Tesmer, JR; Maggiore, CJ; Nastasi, M; Bower, RW
      Geometric considerations relevant to hydrogen depth profiling by reflection elastic recoil detection analysis

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    11. Verda, RD; Maggiore, CJ; Tesmer, JR; Misra, A; Hoechbauer, T; Nastasi, M; Bower, RW
      Depth profiling of hydrogen in crystalline silicon using elastic recoil detection analysis

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    12. Neumaier, P; Dollinger, G; Bergmaier, A; Genchev, I; Gorgens, L; Fischer, R; Ronning, C; Hofsass, H
      High-resolution elastic recoil detection utilizing Bayesian probability theory

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    13. Huisman, MC; Jongerden, MR; van der Molen, SJ; Vis, RD
      Ion beam analysis of oxidation and hydrogenation of switchable mirrors

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    14. Ishida, M; Nagao, S; Yamamura, Y
      Simulation on SIMS depth profiling of delta-doped layer including relaxation caused by defects

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    15. Landry, F; Schaaf, P
      Simulation and deconvolution program WinRNRA for depth profiling of light elements via nuclear resonance reactions

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    16. Fielitz, P; Borchardt, G
      On the accurate measurement of oxygen self-diffusivities and surface exchange coefficients in oxides via SIMS depth profiling

      SOLID STATE IONICS
    17. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Marcus, RK
      Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films

      SURFACE AND INTERFACE ANALYSIS
    18. Wittmaack, K; Hammerl, E; Eisele, I; Patel, SB
      Peak or centroid - which parameter is better suited for quantifying apparent marker locations in low-energy sputter depth profiling with reactive primary ion beams?

      SURFACE AND INTERFACE ANALYSIS
    19. Alkemade, PFA; Liu, ZX
      On the anomalous SIMS transient of B in Si: the influence of surface conditions

      SURFACE AND INTERFACE ANALYSIS
    20. Bailey, P; Skeldon, P; Noakes, TCQ; Thompson, GE; Sakairi, M; Habazaki, H; Shimizu, K
      Composition and structure of enriched alloy layers in filmed Al alloys studied by medium-energy ion scattering

      SURFACE AND INTERFACE ANALYSIS
    21. Turton, TJ; White, JR
      Effect of stabilizer and pigment on photo-degradation depth profiles in polypropylene

      POLYMER DEGRADATION AND STABILITY
    22. Shyichuk, AV; Stavychna, D; White, JR
      Effect of tensile stress on chain scission and crosslinking during photo-oxidation of polypropylene

      POLYMER DEGRADATION AND STABILITY
    23. Konarski, P; Iwanejko, I; Mierzejewska, A; Diduszko, R
      Morphology of working environment microparticles

      VACUUM
    24. Konarski, P; Iwanejko, I; Mierzejewska, A; Wymyslowski, A
      Ion sputtering of microparticles in SIMS depth profile analysis

      VACUUM
    25. Tonova, DA; Konova, AA
      Characterization of inhomogeneous dielectric coatings with arbitrary refractive index profiles by multiple angle of incidence ellipsometry

      THIN SOLID FILMS
    26. Montecchi, M; Montereali, RM; Nichelatti, E
      Reflectance and transmittance of a slightly inhomogeneous thin film bounded by rough, unparallel interfaces

      THIN SOLID FILMS
    27. Vazsonyi, E; Szilagyi, E; Petrik, P; Horvath, ZE; Lohner, T; Fried, M; Jalsovszky, G
      Porous silicon formation by stain etching

      THIN SOLID FILMS
    28. Sugiura, M; Mitsuoka, T; Murase, A
      Depth profiling analysis of functional groups in outdoor-exposed polyethylene using derivatization-electron probe X-ray microanalysis

      POLYMER JOURNAL
    29. Kiland, BR; Urban, MW; Ryntz, RA
      Surface depth-profiling of polymer compounds using step-scan photoacousticspectroscopy (S-2 PAS)

      POLYMER
    30. Lee, YJ; Lee, JH; Lee, YY; Kang, YH; Kim, YS; Kwon, SN; Jeong, K
      Interdiffusion in vacuum-deposited dielectric thin films

      OPTICS COMMUNICATIONS
    31. Markwitz, A; White, GV; Trompetter, WJ; Brown, IWM
      Influence of the native oxide layer on the silicon surface during initial stages of nitridation

      MIKROCHIMICA ACTA
    32. Alimov, VK; Ertl, K; Roth, J
      Deuterium retention and lattice damage in tungsten irradiated with D ions

      JOURNAL OF NUCLEAR MATERIALS
    33. Yang, H; Irudayaraj, J; Sakhamuri, S
      Characterization of edible coatings and microorganisms on food surfaces using fourier transform infrared photoacoustic spectroscopy

      APPLIED SPECTROSCOPY
    34. Ekgasit, S; Padermshoke, A
      Optical contact in ATR/FT-IR spectroscopy

      APPLIED SPECTROSCOPY
    35. Ogai, K; Ueda, K
      Nondestructive depth profiling by specimen tilting using scanning electronmicroscope-energy dispersive X-ray spectrometer

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    36. Wilkinson, DK; Loveday, DA; Prutton, M
      Nondestructive angle-resolved X-ray depth profiling: Interpretation of angle-resolved profiles using a Monte Carlo approach

      MICROSCOPY AND MICROANALYSIS
    37. Fondeur, F; Mitchell, BS
      A modified diffuse reflectance infrared Fourier transform spectroscopy cell for depth profiling of ceramic fibers

      SPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY
    38. Taglauer, E; Kohl, A; Eckstein, W; Beikler, R
      Aspects of analysing supported catalysts by low-energy ion scattering

      JOURNAL OF MOLECULAR CATALYSIS A-CHEMICAL
    39. Fink, D; Szimkowiak, P; Hu, XW; Hnatowicz, V; Vacik, J; Chadderton, LT
      Redistribution of boron in silicon after Ne+ postirradiation and thermal annealing

      RADIATION EFFECTS AND DEFECTS IN SOLIDS
    40. Bazin, N; Andrew, JE; McInnes, HA
      Formation and depth profiling analysis of multilayers derived from sol-gelprocessing using dynamic SIMS, RBS, and TEM

      JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
    41. Wang, JL; Wang, TM
      Transition metal (thin-film)/Si (substrate) contacts: buried interface study by soft X-ray emission spectroscopy

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    42. Park, IS; Ahn, EC; Yu, J; Lee, HY
      Cohesive failure of the Cu/polyimide system

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    43. Miller, EL; Yavuz, I; Nicolaides, L; Mandelis, A
      An adaptive, multiscale inverse scattering approach to photothermal depth profilometry

      CIRCUITS SYSTEMS AND SIGNAL PROCESSING
    44. Iwaki, M; Terashima, K
      Change in atomic density of glassy carbon by Na ion implantation

      SURFACE & COATINGS TECHNOLOGY
    45. Quiros, C; Prieto, P; Elizalde, E; Perez-Casero, R; Gomez, V; Herrero, P; Sanz, JM
      Determination of resputtering yields in carbon nitride films grown by dualion beam sputtering

      SURFACE & COATINGS TECHNOLOGY
    46. Fan, Y; Fitzgerald, AG; Cairns, JA; John, P; Troupe, CE; Wilson, JIB
      A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

      APPLIED SURFACE SCIENCE
    47. van der Heide, PAW
      The caesium enhancement effect observed during SIMS ultra shallow depth profile analysis of SiO2 on Si

      APPLIED SURFACE SCIENCE
    48. Shaanan, M; Kalish, R
      The simulation of SIMS measurements of light element profiles in diamond

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    49. Cao, ZX; Oechsner, H
      On the formation of concentration profiles by low-energy ion bombardment and sputter depth profiling

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    50. Fink, D; Muller, M
      Capillaric penetration of etchant solution into swift heavy ion-irradiatedsilicone rubber

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    51. Radovic, IB; Steinbauer, E; Benka, O
      Elastic recoil detection analysis for large recoil angles (LA-ERDA)

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    52. Cao, ZX; Oechsner, H
      Concentration microprofiles in iron silicides induced by low energy Ar+ ion bombardment

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    53. Stanchev, A; Ignatova, V; Ghelev, C
      A novel approach to angular-resolved X-ray photoelectron spectroscopy depth-profiling

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    54. Galdikas, A; Pranevicius, L
      Surface composition changes of ternary alloys in the non-steady state regime of preferential sputtering

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    55. Markwitz, A
      Depth profiling: RBS versus energy-dispersive X-ray imaging using scanningtransmission electron microscopy

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    56. Landry, F; Lieb, KP; Schaaf, P
      Investigation of laser nitriding of iron using ion beam analysis

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    57. Link, F; Baumann, H; Bethge, K
      Determination of the carbon depth profiles of (Si1CxCy)-C-12-C-13 layers using RBS and NRRA

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    58. Ingo, GM; Bultrini, G; de Caro, T; Del Vais, C
      Microchemical study of the black gloss on red- and black-figured Attic vases

      SURFACE AND INTERFACE ANALYSIS
    59. Basile, F; Bergner, J; Bombart, C; Rondot, B; Le Guevel, P; Lorang, G
      Electrochemical and analytical (XPS and AES) study of passive layers formed on Fe-Ni alloys in borate solutions

      SURFACE AND INTERFACE ANALYSIS
    60. Kovac, J; Bogataj, T; Zalar, A
      Optimized linear decomposition of data obtained during AES depth profiling

      SURFACE AND INTERFACE ANALYSIS
    61. Hofmann, S
      Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS

      SURFACE AND INTERFACE ANALYSIS
    62. Licciardello, A; Renna, L; Pignataro, S
      Interfacial phenomena during depth profiling with gallium ions: a ToF-SIMSapproach

      SURFACE AND INTERFACE ANALYSIS
    63. Zalar, A; Pracek, B; Panjan, P
      Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers

      SURFACE AND INTERFACE ANALYSIS
    64. Vanzetti, L; Bersani, M; Sbetti, M; Anderle, M
      XPS and SIMS depth profiling of oxynitrides

      SURFACE AND INTERFACE ANALYSIS
    65. Richter, S; Lesch, N; Karduck, P
      Characterization of a heat-insulating coating on floatglass by sputter-assisted EPMA

      SURFACE AND INTERFACE ANALYSIS
    66. Kaciulis, S; Mattogno, G
      Characterization of thin-film devices for gas sensing

      SURFACE AND INTERFACE ANALYSIS
    67. Ayouchi, R; Martin, F; Ramos-Barrado, JR; Leinen, D
      Compositional, structural and electrical characterization of barium titanate thin films prepared on fused silica and Si(111) by spray pyrolysis

      SURFACE AND INTERFACE ANALYSIS
    68. Bukaluk, A
      Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers

      SURFACE AND INTERFACE ANALYSIS
    69. Leinen, D; Rodriguez-Castellon, E; Sirera, R; Calzada, L
      Silicate formation at the interface of a calcium-modified lead titanate thin film deposited on Si(100)

      SURFACE AND INTERFACE ANALYSIS
    70. Lamaze, GP; Chen-Mayer, HH; Gerouki, A; Goldner, RB
      Analysis of lithium transport in electrochromic multilayer films by neutron depth profiling

      SURFACE AND INTERFACE ANALYSIS
    71. Kudriavtsev, Y; Villegas, A; Godines, A; Ecker, P; Asomoza, R; Nikishin, S; Jin, C; Faleev, N; Temkin, H
      SIMS study of GaAsN/GaAs multiple quantum wells

      SURFACE AND INTERFACE ANALYSIS
    72. Oswald, S; Schmidt, B; Heinig, KH
      XPS investigation with factor analysis for the study of Ge clustering in SiO2

      SURFACE AND INTERFACE ANALYSIS
    73. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Wood, GC
      GDOES depth profiling analysis of amorphous Ni-P-plated aluminium hard disks

      SURFACE AND INTERFACE ANALYSIS
    74. Seah, MP; Spencer, SJ; Gilmore, IS; Johnstone, JE
      Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS

      SURFACE AND INTERFACE ANALYSIS
    75. Adamsons, K
      Chemical surface characterization and depth profiling of automotive coating systems

      PROGRESS IN POLYMER SCIENCE
    76. Menyhard, M; Sulyok, A; Pentek, K; Zeltser, AM
      Demixing in spin valve structures: an Auger depth profiling study

      THIN SOLID FILMS
    77. Fried, M; Redei, L
      Non-destructive optical depth profiling and real-time evaluation of spectroscopic data

      THIN SOLID FILMS
    78. Gritsch, M; Hutter, H; Holzer, L; Tasch, S
      Local ions distribution inhomogeneities in polymer based light emitting cells

      MIKROCHIMICA ACTA
    79. Dietrich, D; Willich, P; Stockel, S; Weise, K; Marx, G
      SIMS profiling and TEM of CVD films on multi-filament samples

      MIKROCHIMICA ACTA
    80. Baunack, S
      Data preprocessing in peak shape analysis of Auger electron spectra

      MIKROCHIMICA ACTA
    81. Prutton, M; Wilkinson, DK; Loveday, DA
      Quantitative AES-mapping and depth profiling

      MIKROCHIMICA ACTA
    82. Baunack, S; Schreiber, G; Oettel, H; Blawert, C; Mordike, BL
      Distribution of ion-implanted nitrogen in iron alloys investigated by AES

      MIKROCHIMICA ACTA
    83. Zalm, PC
      Dynamic SIMS: Quantification at all depths?

      MIKROCHIMICA ACTA
    84. Tretyakov, VV; Rukolaine, SA; Usikov, AS; Makarov, SV
      Investigation of inhomogeneites in epitaxial AlxGa1-xN layers grown on sapphire

      MIKROCHIMICA ACTA
    85. Lesch, N; Aretz, A; Pidun, M; Richter, S; Karduck, P
      Application of sputter-assisted EPMA to depth profile analysis

      MIKROCHIMICA ACTA
    86. Willich, P; Wischmann, U
      EPMA and quantitative MCs+-SIMS of metal-DLC coating materials

      MIKROCHIMICA ACTA
    87. Sivakesava, S; Irudayaraj, J
      Analysis of potato chips using FTIR photoacoustic spectroscopy

      JOURNAL OF THE SCIENCE OF FOOD AND AGRICULTURE
    88. Stoessel, M; Wittmann, G; Staudigel, J; Steuber, F; Blassing, J; Roth, W; Klausmann, H; Rogler, W; Simmerer, J; Winnacker, A; Inbasekaran, M; Woo, EP
      Cathode-induced luminescence quenching in polyfluorenes

      JOURNAL OF APPLIED PHYSICS
    89. Everall, NJ
      Modeling and measuring the effect of refraction on the depth resolution ofconfocal Raman microscopy

      APPLIED SPECTROSCOPY
    90. Irudayaraj, J; Yang, H
      Analysis of cheese using step-scan Fourier transform infrared photoacoustic spectroscopy

      APPLIED SPECTROSCOPY
    91. Wahls, MWC; Kentta, E; Leyte, JC
      Depth profiles in coated paper: Experimental and simulated FT-IR photoacoustic difference magnitude spectra

      APPLIED SPECTROSCOPY
    92. Everall, NJ
      Confocal Raman microscopy: Why the depth resolution and spatial accuracy can be much worse than you think

      APPLIED SPECTROSCOPY
    93. Power, JF; Fu, SW; Schweitzer, MA
      Depth profiling of optical absorption in thin films via the mirage effect and a new inverse scattering theory. Part I: Principles and methodology

      APPLIED SPECTROSCOPY
    94. Fu, SW; Power, JF
      Depth profiling of optical absorption in thin films via the mirage effect and a new inverse scattering theory. Part II: Experimental reconstructions on well-characterized materials

      APPLIED SPECTROSCOPY
    95. Yang, H; Irudayaraj, J
      Depth profiling Fourier transform analysis of cheese package using generalized two-dimensional photoacoustic correlation spectroscopy

      TRANSACTIONS OF THE ASAE
    96. Dupuy, JC
      SIMS analysis in thin semiconductor films

      VIDE-SCIENCE TECHNIQUE ET APPLICATIONS
    97. Veser, G; Wright, A; Caretta, R
      On the oxidation-reduction kinetics of palladium

      CATALYSIS LETTERS
    98. Ghosh, S; Klett, R; Fink, D; Dwivedi, KK; Vacik, J; Hnatowicz, V; Cervena, J
      On the penetration of aqueous solutions into pristine and radiation damaged polyimide

      RADIATION PHYSICS AND CHEMISTRY
    99. Menyhard, M
      High-depth-resolution Auger depth profiling atomic mixing

      MICRON
    100. Fink, D; Lippold, G; Yakushev, MV; Tomlinson, RD; Pilkington, RD
      On the redistribution of 20 keV lithium in CuInSe2

      SOLAR ENERGY MATERIALS AND SOLAR CELLS


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Documento generato il 30/10/20 alle ore 07:09:42