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1. Tanaka, N; Kawahara, M
   Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films
   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
   
   N. Tanaka e M. Kawahara, "Time-resolved high-resolution transmission electron microscopy and high-angle annular dark field scanning transmission electron microscopy of metal-mediated crystallization of amorphous germanium films", MAT SCI E A, 312(1-2), 2001, pp. 25-30
2. AFONSO CN; SOLIS J; VEGA F; SIEGEL J; SZYSZKO W
   SOLIDIFICATION PHENOMENA IN GE FILMS UPON NANO-SECOND AND PICO-SECONDLASER-PULSE MELTING
   Applied surface science
   
   C.N. Afonso et al., "SOLIDIFICATION PHENOMENA IN GE FILMS UPON NANO-SECOND AND PICO-SECONDLASER-PULSE MELTING", Applied surface science, 110, 1997, pp. 20-24
3. PETFORDLONG AK; DOOLE RC; AFONSO CN
   KINETICS OF GRAIN-BOUNDARY REACTIONS AT SEMIMETAL-SEMICONDUCTOR INTERFACES OBSERVED DURING IN-SITU TRANSMISSION ELECTRON-MICROSCOPE ANNEALING
   Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties
   
   A.K. Petfordlong et al., "KINETICS OF GRAIN-BOUNDARY REACTIONS AT SEMIMETAL-SEMICONDUCTOR INTERFACES OBSERVED DURING IN-SITU TRANSMISSION ELECTRON-MICROSCOPE ANNEALING", Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 74(4), 1996, pp. 907-918
4. EMELYANOV VI; SOUMBATOV AA
   PERIODIC PHASE-STRUCTURE FORMATION IN PULSE INDUCED CRYSTALLIZATION OF FILMS
   Physica status solidi. a, Applied research
   
   V.I. Emelyanov e A.A. Soumbatov, "PERIODIC PHASE-STRUCTURE FORMATION IN PULSE INDUCED CRYSTALLIZATION OF FILMS", Physica status solidi. a, Applied research, 158(2), 1996, pp. 493-504
5. HIRSCH P; REIMER L
   INFLUENCE OF ZERO-LOSS FILTERING ON ELECTRON-OPTICAL PHASE-CONTRAST
   Journal of Microscopy
   
   P. Hirsch e L. Reimer, "INFLUENCE OF ZERO-LOSS FILTERING ON ELECTRON-OPTICAL PHASE-CONTRAST", Journal of Microscopy, 174, 1994, pp. 143-148