Catalogo Articoli (Spogli Riviste)

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La ricerca find articoli where soggetti phrase all words 'X-RAY REFLECTOMETRY' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 39 riferimenti
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    1. Durand, O; Berger, V; Bisaro, R; Bouchier, A; De Rossi, A; Marcadet, X; Prevot, I
      Determination of thicknesses and interface roughnesses of GaAs-based and InAs/AlSb-based heterostructures by X-ray reflectometry

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    2. Muenier, C; Tomasella, E; Vives, S; Mikhailov, S
      X-ray reflectometry study of diamond-like carbon films obtained by plasma-enchanced chemical vapor deposition

      DIAMOND AND RELATED MATERIALS
    3. Zymierska, D; Auleytner, J; Godwod, K; Domagala, J; Datsenko, L; Choinski, J
      X-ray study of silicon crystal structure changes due to implantation with fast nitrogen ions

      JOURNAL OF ALLOYS AND COMPOUNDS
    4. Arnault, JC; Knoll, A; Smigiel, E; Cornet, A
      Roughness fractal approach of oxidised surfaces by AFM and diffuse X-ray reflectometry measurements

      APPLIED SURFACE SCIENCE
    5. van der Lee, A
      Grazing incidence specular reflectivity: theory, experiment, and applications

      SOLID STATE SCIENCES
    6. Sato, S; Imanaga, T; Matsubara, E; Saito, M; Waseda, Y
      Application of energy dispersive grazing incidence X-ray reflectometry method to structural analysis of liquid/liquid and liquid/solid interfaces

      MATERIALS TRANSACTIONS JIM
    7. Quade, A; Wulff, H; Steffen, H; Tun, TM; Hippler, R
      Investigation of the aluminium oxidation in an oxygen plasma excited by microwaves

      THIN SOLID FILMS
    8. Aktosun, T; Sacks, PE
      Inversion of reflectivity data for nondecaying potentials

      SIAM JOURNAL ON APPLIED MATHEMATICS
    9. Neissendorfer, F; Pietsch, U; Brezesinski, G; Mohwald, H
      The energy-dispersive reflectometer diffractometer at BESSY-I

      MEASUREMENT SCIENCE & TECHNOLOGY
    10. Pelka, JB; Auleytner, J; Domagala, J; Werner, Z; Janik-Czachor, M
      Study of near-surface layers modified by ion implantation in Si wafers by grazing incidence X-ray reflectometry

      JOURNAL OF ALLOYS AND COMPOUNDS
    11. Saito, M; Waseda, Y
      New anomalous grazing X-ray reflection method for determining the atomic number density in multi-layered thin film

      MATERIALS TRANSACTIONS JIM
    12. Matz, W; Schell, N; Bernhard, G; Prokert, F; Reich, T; Claussner, J; Oehme, W; Schlenk, R; Dienel, S; Funke, H; Eichhorn, F; Betzl, M; Prohl, D; Strauch, U; Huttig, G; Krug, H; Neumann, W; Brendler, V; Reichel, P; Denecke, MA; Nitsche, H
      ROBL - a CRG beamline for radiochemistry and materials research at the ESRF

      JOURNAL OF SYNCHROTRON RADIATION
    13. Langer, J; Krausslich, J; Mattheis, R; Senz, S; Hesse, D
      Characterisation of interfacial properties in sputtered Co Cu multilayers:X-ray reflectometry compared with TEM and AFM

      JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
    14. Schug, C; Schempp, S; Lamparter, P; Steeb, S
      Surface roughness of sputter-deposited gold films: a combined X-ray technique and AFM study

      SURFACE AND INTERFACE ANALYSIS
    15. Wulff, H; Quaas, M; Steffen, H
      Investigation of plasma-deposited ITO films by GIXR and GIXRD

      THIN SOLID FILMS
    16. IJDIYAOU Y; HAFIDI K; AZIZAN M; AMEZIANE EL; OUTZOURHIT A; DREESEN L; BENAI K
      GRAZING-INCIDENCE X-RAY REFLECTOMETRY STUDIES OF CDTE(111) SURFACES AND A-SI THIN-FILMS

      Solar energy materials and solar cells
    17. MIKULIK P; BAUMBACH T
      X-RAY REFLECTION BY MULTILAYER SURFACE GRATINGS

      Physica. B, Condensed matter
    18. LOGOTHETIDIS S; STERGIOUDIS G; VOUROUTZIS N
      STUDIES WITH NONDESTRUCTIVE TECHNIQUES OF THE COMPOSITION, INITIAL-STAGES OF GROWTH AND SURFACE-TOPOGRAPHY OF THIN AMORPHOUS-CARBON FILMS

      Surface & coatings technology
    19. DIETSCH R; HOLZ T; MAI H; MEYER CF; SCHOLZ R; WEHNER B
      HIGH-PRECISION LARGE-AREA PLD OF X-RAY OPTICAL MULTILAYERS

      Applied surface science
    20. SPEAKMAN J; GACEM V; GIBAUD A; RICHARDSON T; COWLAM N
      STRUCTURES AND DEFECTS IN LANGMUIR-BLODGETT-FILMS

      Thin solid films
    21. ARYS X; JONAS AM; LAGUITTON B; LASCHEWSKY A; LEGRAS R; WISCHERHOFF E
      ULTRATHIN MULTILAYERS MADE BY ALTERNATE DEPOSITION OF IONENES AND POLYVINYLSULFATE - FROM UNSTABLE TO STABLE GROWTH

      Thin solid films
    22. VIGNAUD G; GIBAUD A; PARIS F; AUSSERRE D; GRUBEL G
      ANALYSIS OF X-RAY REFLECTIVITY CURVES OF NON-GAUSSIAN SURFACES

      Thin solid films
    23. LANGER J; MATTHEIS R; KRAUSSLICH J; SENZ S; HESSE D; SCHUHRKE T; ZWECK J
      DETERMINATION OF INTERFACIAL ROUGHNESS AND ITS CORRELATION IN SPUTTERED COZR CU MULTILAYERS/

      Thin solid films
    24. ELAZHARI MY; AZIZAN M; BENNOUNA A; OUTZOURHIT A; AMEZIANE EL; BRUNEL M
      OPTICAL-PROPERTIES OF OXYGENATED AMORPHOUS CADMIUM TELLURIDE THIN-FILMS

      Solar energy materials and solar cells
    25. VIERHELLER TR; FOSTER MD; SCHMIDT A; MATHAUER K; KNOLL W; WEGNER G; STATIJA S; MAJKRZAK CF
      STRUCTURE AND STABILITY OF 2-COMPONENT LANGMUIR-BLODGETT MULTILAYERS CONTAINING CADMIUM ARACHIDATE AND POLYGLUTAMATE DETERMINED BY REFLECTIVITY

      Langmuir
    26. WIEGAND G; JAWOREK T; WEGNER G; SACKMANN E
      HETEROGENEOUS SURFACES OF STRUCTURED HAIRY-ROD POLYMER-FILMS - PREPARATION AND METHODS OF FUNCTIONALIZATION

      Langmuir
    27. SELLA C; MAAZA M; PARDO B; DUNSTETER F; MARTIN JC; SAINTECATHERINE MC; KABA A
      STRUCTURAL INVESTIGATION OF PT-AL2O3 CO-SPUTTERED NANO-CERMET FILMS STUDIED BY SMALL-ANGLE X-RAY-SCATTERING, GRAZING ANGLE X-RAY REFLECTOMETRY, TEM AND AFM

      Surface & coatings technology
    28. UMBACH CC; BLAKELY JM
      SPECULAR AND DIFFUSE-SCATTERING OF X-RAYS FROM A FUSION-DRAWN GLASS-SURFACE

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    29. CHAUVINEAU JP; BRIDOU F
      ANGULAR ANALYSIS OF IRON FLUORESCENCE IN AN FE-C PERIODIC MULTILAYER

      Journal de physique. IV
    30. SAITO M; MATSUBARA E; WASEDA Y
      ANOMALOUS GRAZING X-RAY REFLECTOMETRY FOR DETERMINING THE NUMBER DENSITY OF ATOMS IN THE NEAR-SURFACE REGION

      Materials transactions, JIM
    31. SOHN D; YU H; NAKAMATSU J; RUSSO PS; DALY WH
      MONOLAYER PROPERTIES OF A FUZZY ROD POLYMER - POLY(GAMMA-STEARYL-ALPHA, L-GLUTAMATE)

      Journal of polymer science. Part B, Polymer physics
    32. PIETSCH U; BARBERKA TA; ENGLISCH U; STOMMER R
      THE DOMAIN-STRUCTURE OF LB MULTILAYERS PREPARED FROM FATTY-ACID SALTS

      Thin solid films
    33. DAVIS F; GERBER M; COWLAM N; STIRLING CJM
      MORPHOLOGY AND BINDING OF SPONTANEOUSLY ASSEMBLED MULTILAYERS OF CALIX-4-RESORCINARENES

      Thin solid films
    34. KONOVALOV OV; FEIGIN LA; SHCHEDRIN BM
      ALLOWANCE FOR APPARATUS DISTORTIONS IN MO DELING THE STRUCTURE OF LANGMUIR-BLODGETT-FILMS FROM REFLECTIVITY DATA

      Kristallografia
    35. BARIBEAU JM; LOCKWOOD DJ; HEADRICK RL
      NATURE AND EVOLUTION OF INTERFACES IN SI SI1-XGEX SUPERLATTICES/

      Journal of electronic materials
    36. KATSURAGAWA T; CHIBA E; OKADA K; TANI K; TOMONO H
      SURFACE-STRUCTURE ANALYSIS OF POLYACRYLATE THIN-FILMS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    37. HORIKAWA Y; NAGAI K; IKETAKI Y
      SOFT-X-RAY REFLECTOMETRY WITH A LASER-PRODUCED PLASMA SOURCE

      Optical engineering
    38. VELASQUEZ ELZ; FANTINI MCA; CARRENO MNP; PEREYRA I; TAKAHASHI H; LANDERS R
      EFFECT OF PLASMA-ETCHING, CARBON CONCENTRATION, AND BUFFER LAYER ON THE PROPERTIES OF A-SI-H A-SI1-XCX-H MULTILAYERS/

      Journal of applied physics
    39. XU ZL; TANG ZZ; KEVAN SD; NOVET T; JOHNSON DC
      EFFECT OF STRUCTURAL INCOHERENCE ON THE LOW-ANGLE DIFFRACTION PATTERNOF SYNTHETIC MULTILAYER MATERIALS

      Journal of applied physics


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 03/08/20 alle ore 13:50:28