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    A. Plotnikov et al., "Application of laser ablation inductively coupled plasma quadrupole mass spectrometry (LA-ICP-QMS) for depth profile analysis", J ANAL ATOM, 16(11), 2001, pp. 1290-1295
68. Ke, JA; Wang, I
    Elucidation of the role of potassium fluoride in the chemical and physicalnature of ZSM-5 zeolite
    MATERIALS CHEMISTRY AND PHYSICS
    
    J.A. Ke e I. Wang, "Elucidation of the role of potassium fluoride in the chemical and physicalnature of ZSM-5 zeolite", MATER CH PH, 68(1-3), 2001, pp. 157-165
69. Park, CJ; Cha, MJ; Lee, DS
    Determination of copper in uniformly-doped silicon thin films by isotope-dilution inductively coupled plasma mass spectrometry
    BULLETIN OF THE KOREAN CHEMICAL SOCIETY
    
    C.J. Park et al., "Determination of copper in uniformly-doped silicon thin films by isotope-dilution inductively coupled plasma mass spectrometry", B KOR CHEM, 22(2), 2001, pp. 205-209
70. Shi, L; Liu, SY; Liu, ZQ; Song, FR
    New typical ionic cluster K+(KNO3)(n) and NO3-(KNO3)(m)
    CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
    
    L. Shi et al., "New typical ionic cluster K+(KNO3)(n) and NO3-(KNO3)(m)", CHEM J CH U, 22(6), 2001, pp. 916-918
71. Hodoroaba, VD; Unger, WES; Jenett, H; Hoffmann, V; Hagenhoff, B; Kayser, S; Wetzig, K
    Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS
    APPLIED SURFACE SCIENCE
    
    V.D. Hodoroaba et al., "Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS", APPL SURF S, 179(1-4), 2001, pp. 30-37
72. Pollak, C; Reichmann, K; Hutter, H
    SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3
    APPLIED SURFACE SCIENCE
    
    C. Pollak et al., "SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3", APPL SURF S, 179(1-4), 2001, pp. 133-137
73. Hutter, H; Nowikow, K; Gammer, K
    Visualization of 3D-SIMS measurements
    APPLIED SURFACE SCIENCE
    
    H. Hutter et al., "Visualization of 3D-SIMS measurements", APPL SURF S, 179(1-4), 2001, pp. 161-166
74. Windeln, J; Bram, C; Eckes, HL; Hammel, D; Huth, J; Marien, J; Rohl, H; Schug, C; Wahl, M; Wienss, A
    Applied surface analysis in magnetic storage technology
    APPLIED SURFACE SCIENCE
    
    J. Windeln et al., "Applied surface analysis in magnetic storage technology", APPL SURF S, 179(1-4), 2001, pp. 167-180
75. Gammer, K; Musser, S; Hutter, H
    Characterization of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS
    APPLIED SURFACE SCIENCE
    
    K. Gammer et al., "Characterization of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS", APPL SURF S, 179(1-4), 2001, pp. 240-244
76. Willich, P; Steinberg, C
    SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components
    APPLIED SURFACE SCIENCE
    
    P. Willich e C. Steinberg, "SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components", APPL SURF S, 179(1-4), 2001, pp. 263-268
77. Heinisch, C; Piplits, K; Kubel, F; Schintlmeister, A; Pfluger, E; Hutter, H
    SIMS investigation of MoS2 based sputtercoatings
    APPLIED SURFACE SCIENCE
    
    C. Heinisch et al., "SIMS investigation of MoS2 based sputtercoatings", APPL SURF S, 179(1-4), 2001, pp. 269-274
78. Mayerhofer, KE; Neubauer, E; Eisenmenger-Sittner, C; Hutter, H
    Characterisation of Cr intermediate layers in Cu-C-system with SIMS method
    APPLIED SURFACE SCIENCE
    
    K.E. Mayerhofer et al., "Characterisation of Cr intermediate layers in Cu-C-system with SIMS method", APPL SURF S, 179(1-4), 2001, pp. 275-280
79. Kendall, M; Hutton, BM; Tetley, TD; Nieuwenhuijsen, MJ; Wigzell, E; Jones, FH
    Investigation of fine atmospheric particle surfaces and lung lining fluid interactions using XPS
    APPLIED SURFACE SCIENCE
    
    M. Kendall et al., "Investigation of fine atmospheric particle surfaces and lung lining fluid interactions using XPS", APPL SURF S, 178(1-4), 2001, pp. 27-36
80. Raghavan, G; Rao, GV; Amarendra, G; Tyagi, AK; Viswanathan, B
    Study of inter-diffusion and defect evolution in thin film Al/Ge bilayers using SIMS and positron beam
    APPLIED SURFACE SCIENCE
    
    G. Raghavan et al., "Study of inter-diffusion and defect evolution in thin film Al/Ge bilayers using SIMS and positron beam", APPL SURF S, 178(1-4), 2001, pp. 75-82
81. Srnanek, R; Kinder, R; Sciana, B; Radziewicz, D; McPhail, DS; Littlewood, SD; Novotny, I
    Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy
    APPLIED SURFACE SCIENCE
    
    R. Srnanek et al., "Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy", APPL SURF S, 177(1-2), 2001, pp. 139-145
82. Houssiau, L; Bertrand, P
    ToF-SIMS study of organosilane self-assembly on aluminum surfaces
    APPLIED SURFACE SCIENCE
    
    L. Houssiau e P. Bertrand, "ToF-SIMS study of organosilane self-assembly on aluminum surfaces", APPL SURF S, 175, 2001, pp. 351-356
83. Houssiau, L; Bertrand, P
    TOF-SIMS study of alkanethiol adsorption and ordering on gold
    APPLIED SURFACE SCIENCE
    
    L. Houssiau e P. Bertrand, "TOF-SIMS study of alkanethiol adsorption and ordering on gold", APPL SURF S, 175, 2001, pp. 399-406
84. Novak, SW; Bekos, EJ; Marino, JW
    Approaching the limit for quantitative SIMS measurement of ultra-thin nitrided SiO2 films
    APPLIED SURFACE SCIENCE
    
    S.W. Novak et al., "Approaching the limit for quantitative SIMS measurement of ultra-thin nitrided SiO2 films", APPL SURF S, 175, 2001, pp. 678-684
85. Stapel, D; Benninghoven, A
    Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces
    APPLIED SURFACE SCIENCE
    
    D. Stapel e A. Benninghoven, "Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces", APPL SURF S, 174(3-4), 2001, pp. 261-270
86. Karolewski, MA; Cavell, RG
    Characterisation of adsorbed intermediates in the CH3OH/O/Cu(100) system by secondary ion mass spectrometry
    APPLIED SURFACE SCIENCE
    
    M.A. Karolewski e R.G. Cavell, "Characterisation of adsorbed intermediates in the CH3OH/O/Cu(100) system by secondary ion mass spectrometry", APPL SURF S, 173(1-2), 2001, pp. 151-163
87. Dabala, M; Armelao, L; Buchberger, A; Calliari, I
    Cerium-based conversion layers on aluminum alloys
    APPLIED SURFACE SCIENCE
    
    M. Dabala et al., "Cerium-based conversion layers on aluminum alloys", APPL SURF S, 172(3-4), 2001, pp. 312-322
88. Tanaka, K; Yanashima, H; Yako, T; Kamio, K; Sugai, K; Kishida, S
    Aluminum chemical vapor deposition reaction of dimethylaluminum hydride onTiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
    APPLIED SURFACE SCIENCE
    
    K. Tanaka et al., "Aluminum chemical vapor deposition reaction of dimethylaluminum hydride onTiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry", APPL SURF S, 171(1-2), 2001, pp. 71-81
89. Kim, RH; Park, HH; Joo, GT
    Cation diffusion characteristics in MgO-doped LiNbO3 during Ti diffusion
    APPLIED SURFACE SCIENCE
    
    R.H. Kim et al., "Cation diffusion characteristics in MgO-doped LiNbO3 during Ti diffusion", APPL SURF S, 169, 2001, pp. 570-574
90. Lee, Y; Han, S; Lim, H; Jung, H; Cho, J; Kim, Y
    Surface characterization of polymers modified by keV and MeV ion beams
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    
    Y. Lee et al., "Surface characterization of polymers modified by keV and MeV ion beams", J ADHES SCI, 15(9), 2001, pp. 1079-1089
91. Watson, H; Norstrom, AEE; Matisons, JG; Root, A; Rosenholm, JB
    Deposition of amine functional silanes onto E-glass fibres, an NMR study
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    
    H. Watson et al., "Deposition of amine functional silanes onto E-glass fibres, an NMR study", J ADHES SCI, 15(9), 2001, pp. 1103-1117
92. Kang, JH; Cho, K; Park, CE
    Adhesion strength and mechanism of poly(imide-siloxane) to Alloy 42 leadframe
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    
    J.H. Kang et al., "Adhesion strength and mechanism of poly(imide-siloxane) to Alloy 42 leadframe", J ADHES SCI, 15(8), 2001, pp. 913-928
93. Norstrom, AEE; Fagerholm, HM; Rosenholm, JB
    Surface characterization of silane-treated industrial glass fibers
    JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    
    A.E.E. Norstrom et al., "Surface characterization of silane-treated industrial glass fibers", J ADHES SCI, 15(6), 2001, pp. 665-679
94. Kunihiro, T; Nagashima, K; Takayanagi, I; Nakamura, J; Kosaka, K; Yurimoto, H
    Noise characteristics of stacked CMOS active pixel sensor for charged particles
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    
    T. Kunihiro et al., "Noise characteristics of stacked CMOS active pixel sensor for charged particles", NUCL INST A, 470(3), 2001, pp. 512-519
95. Barton, J; Randles, T; Hearne, S; Barrett, J; Kelly, PV; Crean, GM; Siffert, P; Koebel, JM
    Scanning Acoustic Microscopy and SIMS investigation of CdTe detectors
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    
    J. Barton et al., "Scanning Acoustic Microscopy and SIMS investigation of CdTe detectors", NUCL INST A, 458(1-2), 2001, pp. 431-436
96. Kuri, G; Materlik, G
    Measured transverse straggling of MeV Sn and Sb ions implanted in SiO2 targets
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    G. Kuri e G. Materlik, "Measured transverse straggling of MeV Sn and Sb ions implanted in SiO2 targets", NUCL INST B, 183(3-4), 2001, pp. 189-195
97. Deng, ZW; Souda, R
    A SIMS study on positive and negative ions sputtered from graphite by mass-separated low energy Ne+, N-2(+) and N+ ions
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    Z.W. Deng e R. Souda, "A SIMS study on positive and negative ions sputtered from graphite by mass-separated low energy Ne+, N-2(+) and N+ ions", NUCL INST B, 183(3-4), 2001, pp. 260-270
98. Krantzman, KD; Postawa, Z; Garrison, BJ; Winograd, N; Stuart, SJ; Harrison, JA
    Understanding collision cascades in molecular solids
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    K.D. Krantzman et al., "Understanding collision cascades in molecular solids", NUCL INST B, 180, 2001, pp. 159-163
99. Ishida, M; Nagao, S; Yamamura, Y
    Simulation on SIMS depth profiling of delta-doped layer including relaxation caused by defects
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    M. Ishida et al., "Simulation on SIMS depth profiling of delta-doped layer including relaxation caused by defects", NUCL INST B, 180, 2001, pp. 230-237
100. Aoki, T; Chiba, S; Matsuo, J; Yamada, I; Biersack, JP
     Molecular dynamics and Monte-Carlo simulation of sputtering and mixing by ion irradiation
     NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
     
     T. Aoki et al., "Molecular dynamics and Monte-Carlo simulation of sputtering and mixing by ion irradiation", NUCL INST B, 180, 2001, pp. 312-316