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La ricerca find articoli where soggetti phrase all words 'SIMS' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 1243 riferimenti
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    1. Wang, J; Chen, CY; Buck, SM; Chen, Z
      Molecular chemical structure on poly(methyl methacrylate) (PMMA) surface studied by sum frequency generation (SFG) vibrational spectroscopy

      JOURNAL OF PHYSICAL CHEMISTRY B
    2. Dong, X; Hercules, DM
      Relative secondary ion yields of polymers

      JOURNAL OF PHYSICAL CHEMISTRY B
    3. Fuoco, ER; Gillen, G; Wijesundara, MBJ; Wallace, WE; Hanley, L
      Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles

      JOURNAL OF PHYSICAL CHEMISTRY B
    4. Shao, JZ; Liu, JQ; Carr, CM
      Investigation into the synergistic effect between UV/ozone exposure and peroxide pad-batch bleaching on the printability of wool

      COLORATION TECHNOLOGY
    5. Grutzmacher, HF; Zoric, S; Wellbrock, C
      Complexation of transition metal ions M+ (M = Fe, Co, Ni, Cu, Zn, Ag) by [2.n]paracyclophane-enes (n = 3, 4, 5, 6) in the gas phase: effect of the molecular cavity on the complexation capability

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    6. English, RD; Van Stipdonk, MJ; Schweikert, EA
      Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    7. Yamazaki, H
      Improvement of detection limit for secondary-ion mass spectrometry depth profiling of argon in silicon by energy filtering

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    8. Wirtz, T; Duez, B; Migeon, HN; Scherrer, H
      Useful yields of MCs+ and MCs2+ clusters: a comparative study between the Cameca IMS 4f and the Cation Mass Spectrometer

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    9. Gresham, GL; Groenewold, GS; Appelhans, AD; Olson, JE; Benson, MT; Jeffery, MT; Rowland, B; Weibel, MA
      Static secondary ionization mass spectrometry and mass spectrometry/mass spectrometry (MS2) characterization of the chemical warfare agent HD on soilparticle surfaces

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    10. Fahey, AJ; Messenger, S
      Isotopic ratio measurements by time-of-flight secondary ion mass spectrometry

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    11. Kilburn, MR; Hinton, RW
      Relative ion yields for SIMS analysis of trace elements in metallic Fe, Fe-Si alloy, and FeSi

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    12. Diehnelt, CW; Van Stipdonk, MJ; Schweikert, EA
      Effectiveness of atomic and polyatomic primary ions for organic secondary ion mass spectrometry

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    13. Enjalbal, C; Maux, D; Martinez, J; Combarieu, R; Aubagnac, JL
      Mass spectrometry and combinatorial chemistry: New approaches for direct support-bound compound identification

      COMBINATORIAL CHEMISTRY & HIGH THROUGHPUT SCREENING
    14. Napolitani, E; Carnera, A; Privitera, V; Priolo, F
      Ultrashallow profiling of semiconductors by secondary ion mass spectrometry: methods and applications

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    15. Oquab, D; Monceau, D
      In-situ SEM study of cavity growth during high temperature oxidation of beta-(Ni,Pd)Al

      SCRIPTA MATERIALIA
    16. Gontier-Moya, EG; Bernardini, J; Moya, F
      Silver and platinum diffusion in alumina single crystals

      ACTA MATERIALIA
    17. Gurumurthy, CK; Kramer, EJ; Hui, CY
      Hydro-thermal fatigue of polymer interfaces

      ACTA MATERIALIA
    18. Aubriet, F; Poleunis, C; Bertrand, P
      Capabilities of static TOF-SIMS in the differentiation of first-row transition metal oxides

      JOURNAL OF MASS SPECTROMETRY
    19. Todd, PJ; Schaaff, TG; Chaurand, P; Caprioli, RM
      Organic ion imaging of biological tissue with secondary ion mass spectrometry and matrix-assisted laser desorption/ionization

      JOURNAL OF MASS SPECTROMETRY
    20. Jiang, ZX; Backer, S; Lee, JJ; Wu, LY; Guenther, T; Sieloff, D; Choi, P; Foisy, M; Alkemade, PFA
      Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    21. Berenov, AV; Marriott, R; Foltyn, SR; MacManus-Driscoll, JL
      Effect of Ca-doping on grain boundaries and superconducting properties of YBa2Cu3O7-delta

      IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
    22. Maux, D; Enjalbal, C; Martinez, J; Aubagnac, JL
      Static secondary ion mass spectrometry to monitor solid-phase peptide synthesis

      JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
    23. Philipona, C; Chevolot, Y; Leonard, D; Mathieu, HJ; Sigrist, H; Marquis-Weible, F
      A scanning near-field optical microscope approach to biomolecule patterning

      BIOCONJUGATE CHEMISTRY
    24. Chen, DG; Wang, X; Deloule, E; Li, BX; Xia, QK; Cheng, H; Wu, YB
      Zircon SIMS ages and chemical compositions from Northern Dabie Terrain: Its implication for pyroxenite genesis

      CHINESE SCIENCE BULLETIN
    25. Wang, W; Huang, Q; Wang, HC; Yang, MC; Luo, JB; Wen, SZ
      Tribo-chemistry of lubricant depletion at head-disk interface

      SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
    26. Jiang, ZC; Liu, YW; Chung, WF; Cheung, CY; Yagi, I; Tian, H
      TOF-SIMS analysis: Application to ultra-thin AWA film on magnetic head

      SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
    27. Yang, MC; Luo, JB; Wen, SZ; Wang, W; Huang, Q; Hao, CW
      Failure characterization at head/disk interface of hard disk drive

      SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
    28. Chevolot, Y; Martins, J; Milosevic, N; Leonard, D; Zeng, S; Malissard, M; Berger, EG; Maier, P; Mathieu, HJ; Crout, DHG; Sigrist, H
      Immobilisation on polystyrene of diazirine derivatives of mono- and disaccharides: Biological activities of modified surfaces

      BIOORGANIC & MEDICINAL CHEMISTRY
    29. Chehimi, MM; Abel, ML; Watts, JF; Digby, RP
      Surface chemical and thermodynamic properties of gamma-glycidoxy-propyltrimethoxysilane-treated alumina: an XPS and IGC study

      JOURNAL OF MATERIALS CHEMISTRY
    30. Rho, HS; Arafat, HA; Kountz, B; Buchanan, RC; Pinto, NG; Bishop, PL
      Decomposition of hazardous organic materials in the solidification/stabilization process using catalytic-activated carbon

      WASTE MANAGEMENT
    31. English, RD; Van Stipdonk, MJ; Diehnelt, CW; Schweikert, EA
      Influence of constituent mass on secondary ion yield enhancements from polyatomic ion impacts on aminoethanethiol self-assembled monolayer surfaces

      RAPID COMMUNICATIONS IN MASS SPECTROMETRY
    32. Lenaerts, J; Verlinden, G; Ignatova, VA; Van Vaeck, L; Gijbels, R; Geuens, I
      Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS)

      FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
    33. Liu, L; Gong, H; Wang, Y; Wang, JP; Wee, ATS; Liu, R
      Annealing effects of tantalum thin films sputtered on [001] silicon substrate

      MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS
    34. Norstrom, A; Watson, H; Engstrom, B; Rosenholm, J
      Treatment of E-glass fibres with acid, base and silanes

      COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS
    35. Schropp, REI; Alkemade, PFA; Rath, JK
      Poly-silicon films with low impurity concentration made by hot wire chemical vapour deposition

      SOLAR ENERGY MATERIALS AND SOLAR CELLS
    36. Ambite, JL; Knoblock, CA; Muslea, I; Philpot, AG
      Compiling source descriptions for efficient and flexible information integration

      JOURNAL OF INTELLIGENT INFORMATION SYSTEMS
    37. Visser, MM; Weichel, S; Storas, P; de Reus, R; Hanneborg, AB
      Sodium distribution in thin-film anodic bonding

      SENSORS AND ACTUATORS A-PHYSICAL
    38. Goessl, A; Garrison, MD; Lhoest, JB; Hoffman, AS
      Plasma lithography - thin-film patterning of polymeric biomaterials by RF plasma polymerization I: Surface preparation and analysis

      JOURNAL OF BIOMATERIALS SCIENCE-POLYMER EDITION
    39. Goessl, A; Golledge, SL; Hoffman, AS
      Plasma lithography - thin-film patterning of polymers by RF plasma polymerization II: Study of differential binding using adsorption probes

      JOURNAL OF BIOMATERIALS SCIENCE-POLYMER EDITION
    40. Shichi, Y
      Recent developments in techniques of surface analysis

      JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS
    41. Tanaka, A
      Surface and interface analysis of polymers

      JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS
    42. Haneda, H; Miyazawa, Y; Sakaguchi, I; Nozawa, H; Yanagitani, T; Melendo, MJ
      Diffusion of scandium, gallium and ytterbium ions into single- and poly-crystalline yttrium aluminum garnets

      JOURNAL OF THE CERAMIC SOCIETY OF JAPAN
    43. Itoh, J; Yashima, I; Ohashi, N; Sakaguchi, I; Haneda, H; Tanaka, J
      Ni ion diffusion in barium titanate perovskite

      JOURNAL OF THE CERAMIC SOCIETY OF JAPAN
    44. Yamazaki, H
      Quantitative depth profiling of argon in tungsten films by secondary ion mass spectrometry

      ANALYTICAL SCIENCES
    45. Netcheva, S; Bertrand, P
      Ion-beam-induced morphology on the surface of thin polymer films at low current density and high ion fluence

      JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
    46. Jbir, N; Chaibi, W; Ammar, S; Jemmali, A; Ayadi, A
      Root growth and lignification of two wheat species differing in their sensitivity to NaCl, in response to salt stress

      COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE III-SCIENCES DE LA VIE-LIFE SCIENCES
    47. Lenaerts, J; Verlinden, G; Van Vaeck, L; Gijbels, R; Geuens, I; Callant, P
      Exchange of fluorinated cyanine dyes between different types of silver halide microcrystals studied by imaging time-of-flight secondary ion mass spectrometry

      LANGMUIR
    48. Wagner, MS; Castner, DG
      Characterization of adsorbed protein films by time-of-flight secondary ionmass spectrometry with principal component analysis

      LANGMUIR
    49. Artyushkova, K; Wall, B; Koenig, J; Fulghum, JE
      Direct correlation of x-ray photoelectron spectroscopy and Fourier transform infrared spectra and images from poly(vinyl chloride)/poly(methyl methacrylate) polymer blends

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    50. Esaka, F; Watanabe, K; Magara, M; Hanzawa, Y; Usuda, S
      Screening of uranium particles by total-reflection X-ray fluorescence spectrometry for safeguards environmental sample analysis

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    51. Thellier, M; Chevallier, A; His, I; Jarvis, MC; Lovell, MA; Ripoll, C; Robertson, D; Sauerwein, W; Verdus, MC
      Methodological developments for application to the study of physiological boron and to boron neutron capture therapy

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    52. Jbir, N; Ammar, S; Chaibi, W; Ayadi, A
      PAL activity and ionic contents of two wheat species differing in their sensitivity to NaCl, in response to salt stress (Case report)

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    53. Thellier, M; Derue, C; Tafforeau, M; Le Sceller, L; Verdus, MC; Massiot, P; Ripoll, C
      Physical methods for in vitro analytical imaging in the microscopic range in biology, using radioactive or stable isotopes (review article)

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    54. Pajo, L; Tamborini, G; Rasmussen, G; Mayer, K; Koch, L
      A novel isotope analysis of oxygen in uranium oxides: comparison of secondary ion mass spectrometry, glow discharge mass spectrometry and thermal ionization mass spectrometry

      SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
    55. Coumbaros, J; Kirkbride, KP; Klass, G; Skinner, W
      Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

      FORENSIC SCIENCE INTERNATIONAL
    56. Peled, E; Tow, DB; Merson, A; Gladkich, A; Burstein, L; Golodnitsky, D
      Composition, depth profiles and lateral distribution of materials in the SEI built on HOPG-TOF SIMS and XPS studies

      JOURNAL OF POWER SOURCES
    57. Artyushkova, K; Fulghum, JE
      Identification of chemical components in XPS spectra and images using multivariate statistical analysis methods

      JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
    58. Watts, JF; Abel, ML; Perruchot, C; Lowe, C; Maxted, JT; White, RG
      Segregation and crosslinking in urea formaldehyde/epoxy resins: a study byhigh-resolution XPS

      JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
    59. Brookes, PN; Fraser, S; Short, RD; Hanley, L; Fuoco, E; Roberts, A; Hutton, S
      The effect of ion energy on the chemistry of air-aged polymer films grown from the hyperthermal polyatomic ion Si2OMe5+

      JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
    60. White, J; Pal, R; Dell, JM; Musca, CA; Antoszewski, J; Faraone, L; Burke, P
      p-to-n type-conversion mechanisms for HgCdTe exposed to H-2/CH4 plasmas

      JOURNAL OF ELECTRONIC MATERIALS
    61. Qi, YD; Musante, C; Lau, KM; Smith, L; Odedra, R; Kanjolia, R
      OMVPE growth of P-type GaN using solution Cp2Mg

      JOURNAL OF ELECTRONIC MATERIALS
    62. Szymczak, W; Wolf, M; Wittmaack, K
      Characterisation of fulvic acids and glycyrrhizic acid by time-of-flight secondary ion mass spectrometry

      ACTA HYDROCHIMICA ET HYDROBIOLOGICA
    63. Stevenson, CM; Abdelrehim, IM; Novak, SW
      Infra-red photoacoustic and secondary ion mass spectrometry measurements of obsidian hydration rims

      JOURNAL OF ARCHAEOLOGICAL SCIENCE
    64. Ohchi, Y; Tojyou, F
      The characterization of lubricant on ME tape by TOF-SIMS analysis

      JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
    65. Nagaraj, DR; Brinen, JS
      SIMS study of adsorption of collectors on pyrite

      INTERNATIONAL JOURNAL OF MINERAL PROCESSING
    66. O'Dea, AR; Prince, KE; Smart, RSC; Gerson, AR
      Secondary ion mass spectrometry investigation of the interaction of xanthate with galena

      INTERNATIONAL JOURNAL OF MINERAL PROCESSING
    67. Plotnikov, A; Vogt, C; Hoffmann, V; Taschner, C; Wetzig, K
      Application of laser ablation inductively coupled plasma quadrupole mass spectrometry (LA-ICP-QMS) for depth profile analysis

      JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
    68. Ke, JA; Wang, I
      Elucidation of the role of potassium fluoride in the chemical and physicalnature of ZSM-5 zeolite

      MATERIALS CHEMISTRY AND PHYSICS
    69. Park, CJ; Cha, MJ; Lee, DS
      Determination of copper in uniformly-doped silicon thin films by isotope-dilution inductively coupled plasma mass spectrometry

      BULLETIN OF THE KOREAN CHEMICAL SOCIETY
    70. Shi, L; Liu, SY; Liu, ZQ; Song, FR
      New typical ionic cluster K+(KNO3)(n) and NO3-(KNO3)(m)

      CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
    71. Hodoroaba, VD; Unger, WES; Jenett, H; Hoffmann, V; Hagenhoff, B; Kayser, S; Wetzig, K
      Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS

      APPLIED SURFACE SCIENCE
    72. Pollak, C; Reichmann, K; Hutter, H
      SIMS investigation of chemical solution-deposited SrTiO3/LaNiO3

      APPLIED SURFACE SCIENCE
    73. Hutter, H; Nowikow, K; Gammer, K
      Visualization of 3D-SIMS measurements

      APPLIED SURFACE SCIENCE
    74. Windeln, J; Bram, C; Eckes, HL; Hammel, D; Huth, J; Marien, J; Rohl, H; Schug, C; Wahl, M; Wienss, A
      Applied surface analysis in magnetic storage technology

      APPLIED SURFACE SCIENCE
    75. Gammer, K; Musser, S; Hutter, H
      Characterization of the 3D-distribution of the components in Al-alloyed high speed steels with SIMS

      APPLIED SURFACE SCIENCE
    76. Willich, P; Steinberg, C
      SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components

      APPLIED SURFACE SCIENCE
    77. Heinisch, C; Piplits, K; Kubel, F; Schintlmeister, A; Pfluger, E; Hutter, H
      SIMS investigation of MoS2 based sputtercoatings

      APPLIED SURFACE SCIENCE
    78. Mayerhofer, KE; Neubauer, E; Eisenmenger-Sittner, C; Hutter, H
      Characterisation of Cr intermediate layers in Cu-C-system with SIMS method

      APPLIED SURFACE SCIENCE
    79. Kendall, M; Hutton, BM; Tetley, TD; Nieuwenhuijsen, MJ; Wigzell, E; Jones, FH
      Investigation of fine atmospheric particle surfaces and lung lining fluid interactions using XPS

      APPLIED SURFACE SCIENCE
    80. Raghavan, G; Rao, GV; Amarendra, G; Tyagi, AK; Viswanathan, B
      Study of inter-diffusion and defect evolution in thin film Al/Ge bilayers using SIMS and positron beam

      APPLIED SURFACE SCIENCE
    81. Srnanek, R; Kinder, R; Sciana, B; Radziewicz, D; McPhail, DS; Littlewood, SD; Novotny, I
      Determination of doping profiles on bevelled GaAs structures by Raman spectroscopy

      APPLIED SURFACE SCIENCE
    82. Houssiau, L; Bertrand, P
      ToF-SIMS study of organosilane self-assembly on aluminum surfaces

      APPLIED SURFACE SCIENCE
    83. Houssiau, L; Bertrand, P
      TOF-SIMS study of alkanethiol adsorption and ordering on gold

      APPLIED SURFACE SCIENCE
    84. Novak, SW; Bekos, EJ; Marino, JW
      Approaching the limit for quantitative SIMS measurement of ultra-thin nitrided SiO2 films

      APPLIED SURFACE SCIENCE
    85. Stapel, D; Benninghoven, A
      Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

      APPLIED SURFACE SCIENCE
    86. Karolewski, MA; Cavell, RG
      Characterisation of adsorbed intermediates in the CH3OH/O/Cu(100) system by secondary ion mass spectrometry

      APPLIED SURFACE SCIENCE
    87. Dabala, M; Armelao, L; Buchberger, A; Calliari, I
      Cerium-based conversion layers on aluminum alloys

      APPLIED SURFACE SCIENCE
    88. Tanaka, K; Yanashima, H; Yako, T; Kamio, K; Sugai, K; Kishida, S
      Aluminum chemical vapor deposition reaction of dimethylaluminum hydride onTiN studied by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

      APPLIED SURFACE SCIENCE
    89. Kim, RH; Park, HH; Joo, GT
      Cation diffusion characteristics in MgO-doped LiNbO3 during Ti diffusion

      APPLIED SURFACE SCIENCE
    90. Lee, Y; Han, S; Lim, H; Jung, H; Cho, J; Kim, Y
      Surface characterization of polymers modified by keV and MeV ion beams

      JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    91. Watson, H; Norstrom, AEE; Matisons, JG; Root, A; Rosenholm, JB
      Deposition of amine functional silanes onto E-glass fibres, an NMR study

      JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    92. Kang, JH; Cho, K; Park, CE
      Adhesion strength and mechanism of poly(imide-siloxane) to Alloy 42 leadframe

      JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    93. Norstrom, AEE; Fagerholm, HM; Rosenholm, JB
      Surface characterization of silane-treated industrial glass fibers

      JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
    94. Kunihiro, T; Nagashima, K; Takayanagi, I; Nakamura, J; Kosaka, K; Yurimoto, H
      Noise characteristics of stacked CMOS active pixel sensor for charged particles

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    95. Barton, J; Randles, T; Hearne, S; Barrett, J; Kelly, PV; Crean, GM; Siffert, P; Koebel, JM
      Scanning Acoustic Microscopy and SIMS investigation of CdTe detectors

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    96. Kuri, G; Materlik, G
      Measured transverse straggling of MeV Sn and Sb ions implanted in SiO2 targets

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    97. Deng, ZW; Souda, R
      A SIMS study on positive and negative ions sputtered from graphite by mass-separated low energy Ne+, N-2(+) and N+ ions

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    98. Krantzman, KD; Postawa, Z; Garrison, BJ; Winograd, N; Stuart, SJ; Harrison, JA
      Understanding collision cascades in molecular solids

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    99. Ishida, M; Nagao, S; Yamamura, Y
      Simulation on SIMS depth profiling of delta-doped layer including relaxation caused by defects

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    100. Aoki, T; Chiba, S; Matsuo, J; Yamada, I; Biersack, JP
      Molecular dynamics and Monte-Carlo simulation of sputtering and mixing by ion irradiation

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS


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Documento generato il 16/01/21 alle ore 12:47:06