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La ricerca find articoli where soggetti phrase all words 'SAMPLE ROTATION' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 53 riferimenti
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    1. Esturau, N; Sanchez-Ferrando, F; Gavin, JA; Roumestand, C; Delsuc, MA; Parella, T
      The use of sample rotation for minimizing convection effects in self-diffusion NMR measurements

      JOURNAL OF MAGNETIC RESONANCE
    2. Alkemade, PFA; Jiang, ZX
      Complex roughening of Si under oblique bombardment by low-energy oxygen ions

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    3. Yamada, I; Matsuo, J; Toyoda, N; Kirkpatrick, A
      Materials processing by gas cluster ion beams

      MATERIALS SCIENCE & ENGINEERING R-REPORTS
    4. Goryachko, A; Kruger, D; Kurps, R; Weidner, G; Pomplun, K
      Improved Auger electron spectroscopy sputter depth profiling of W/WNx and WSix layers on Si substrates

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    5. Versmold, H; Bongers, U; Musa, S
      Scattering experiments on the structure of concentrated dispersions

      COLLOID AND POLYMER SCIENCE
    6. Chini, TK; Datta, D; Bhattacharyya, SR; Sanyal, MK
      Nanostructuring with a high current isotope separator and ion implanter

      APPLIED SURFACE SCIENCE
    7. Pidun, M; Karduck, P; Mayer, J; Heime, K; Schineller, B; Walther, T
      Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contactson Si-doped GaN

      APPLIED SURFACE SCIENCE
    8. Konarski, P; Iwanejko, I; Mierzejewska, A; Wymyslowski, A
      Ion sputtering of microparticles in SIMS depth profile analysis

      VACUUM
    9. Ramanath, G; Greene, JE; Petrov, I; Baker, JE; Allen, LH; Gillen, G
      Channeling-induced asymmetric distortion of depth profiles from polycrystalline-TiN/Ti/TiN(001) trilayers during secondary ion mass spectrometry

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    10. Zalar, A; Pracek, B; Panjan, P
      Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers

      SURFACE AND INTERFACE ANALYSIS
    11. Seah, MP; Spencer, SJ; Cumpson, PJ; Johnstone, JE
      Sputter-induced cone and filament formation on InP and AFM tip shape determination

      SURFACE AND INTERFACE ANALYSIS
    12. Gerardi, C; Tagliente, MA; Del Vecchio, A; Tapfer, L; Coccorese, C; Attanasio, C; Mercaldo, LV; Maritato, L; Slaughter, JM; Falco, CM
      Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers

      JOURNAL OF APPLIED PHYSICS
    13. Menyhard, M
      High-depth-resolution Auger depth profiling atomic mixing

      MICRON
    14. Malherbe, JB; Odendaal, RQ
      Ton sputtering, surface topography, SPM and surface analysis of electronicmaterials

      APPLIED SURFACE SCIENCE
    15. Rudy, AS; Smirnov, VK
      Hydrodynamic model of wave-ordered structures formed by ion bombardment ofsolids

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    16. Carter, G
      The effects of surface ripples on sputtering erosion rates and secondary ion emission yields

      JOURNAL OF APPLIED PHYSICS
    17. HOFMANN S
      SPUTTER DEPTH PROFILING OF THIN-FILMS

      High-temperature materials and processes
    18. KIM KJ; JUNG KH
      MECHANISM OF FACET FORMATION ON NI SURFACES BY SPUTTERING WITH OXYGEN-ION BEAMS

      Surface and interface analysis
    19. PAN JS; TAY ST; HUAN CHA; WEE ATS
      ATOMIC-FORCE MICROSCOPY INVESTIGATION OF THE O-2(-INDUCED SURFACE-TOPOGRAPHY OF INP())

      Surface and interface analysis
    20. WOHNER T; ECKE G; ROSSLER H; HOFMANN S
      SPUTTERING-INDUCED SURFACE-ROUGHNESS OF POLYCRYSTALLINE AL FILMS AND ITS INFLUENCE ON AES DEPTH PROFILES

      Surface and interface analysis
    21. HOFMANN S
      SPUTTER DEPTH PROFILE ANALYSIS OF INTERFACES

      Reports on progress in physics
    22. HOFMANN S; RAR A
      ULTRAHIGH-RESOLUTION IN SPUTTER DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY USING IONIZED SF6 MOLECULES AS PRIMARY IONS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    23. FARVER TB; HOLT D; LEHENBAUER T; GREENLEY WM
      APPLICATION OF COMPOSITE ESTIMATION IN STUDIES OF ANIMAL POPULATION PRODUCTION WITH 2-STAGE REPEATED SAMPLE DESIGNS

      Preventive veterinary medicine
    24. ROLAND U; SALZER R
      INTERPRETATION OF SPINNING-SAMPLE BANDS IN THE FT RAMAN-SPECTRA OF ROTATING SAMPLES

      Mikrochimica acta
    25. KOPONEN I; SIEVANEN OP; HAUTALA M; HAKOVIRTA M
      SIMULATIONS OF SPUTTERING INDUCED ROUGHENING AND FORMATION OF SURFACE-TOPOGRAPHY IN DEPOSITION OF AMORPHOUS DIAMOND FILMS WITH MASS SEPARATED KILOELECTRONVOLT ION-BEAMS

      Journal of applied physics
    26. SALZER R; ROLAND U; BORN R; SAWATZKI J
      NEW TECHNIQUE ALLOWING FT-RAMAN MEASUREMENTS OF ROTATING SAMPLES

      Applied spectroscopy
    27. BRADLEY RM
      DYNAMIC SCALING OF ION-SPUTTERED ROTATING SURFACES

      Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
    28. VAJO JJ; DOTY RE; CIRLIN EH
      INFLUENCE OF O-2(-INDUCED RIPPLE TOPOGRAPHY ON SILICON() ENERGY, FLUX, AND FLUENCE ON THE FORMATION AND GROWTH OF SPUTTERING)

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    29. MOON DW; KIM KJ
      SURFACE-TOPOGRAPHY DEVELOPMENT ON ION-BEAM-SPUTTERED SURFACES - ROLE OF SURFACE INHOMOGENEITY INDUCED BY ION-BEAM BOMBARDMENT

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    30. KOZHUKHOV AV; KONARSKI P; HERMAN MA
      ION ETCHING EFFECTS OCCURRING IN SECONDARY-ION MASS-SPECTROMETRY DEPTH PROFILING OF INGAAS INP AND INGAAS/ALAS/INP MBE GROWN HETEROSTRUCTURES/

      Acta Physica Polonica. A
    31. ZALAR A; SEIBT EW; PANJAN P
      OXIDE THIN-FILMS FORMED DURING ROTATIONAL AES SPUTTER DEPTH PROFILINGOF NI CR MULTILAYERS USING OXYGEN IONS/

      Applied surface science
    32. CRITCHLOW GW
      INSTRUMENTAL TECHNIQUES FOR THE SURFACE-ANALYSIS OF MATERIALS

      Transactions of the Institute of Metal Finishing
    33. AJOY G; RAMAKRISHNA J
      ANALYTICAL EXPRESSION FOR THE MAGIC-ANGLE-SPINNING NUCLEAR-MAGNETIC-RESONANCE LINE-SHAPE IN THE PRESENCE OF THE 2ND-ORDER QUADRUPOLE INTERACTION FOR THE NONZERO ASYMMETRY PARAMETER AND LARGE-SAMPLE ROTATION FREQUENCY

      Solid state nuclear magnetic resonance
    34. KAJIWARA K; SHIMIZU R
      RESOLUTION IN SPUTTER DEPTH PROFILING ASSESSED BY ALAS GAAS SUPERLATTICES/

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    35. HSU CM; MCPHAIL DS
      A NEWLY DEVELOPED CHEMICAL BEVELLING TECHNIQUE USED FOR DEPTH INDEPENDENT HIGH DEPTH RESOLUTION SIMS ANALYSIS

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    36. KONARSKI P; HERMAN MA; KOZHUKHOV AV; OBODNIKOV VI
      MORPHOLOGY OF THE INALAS INP INTERFACE IN THE MBE-GROWN HETEROSTRUCTURES ANALYZED BY SIMS DEPTH PROFILING/

      Thin solid films
    37. ZALM PC
      ULTRA-SHALLOW DOPING PROFILING WITH SIMS

      Reports on progress in physics
    38. INOUE K; TOKORO M; SUZUKI N; MATSUBARA R; NAKANO K
      SIDEWALL-LESS DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    39. CIRLIN EH; VAJO JJ; HASENBERG TC
      LIMITING FACTORS FOR SECONDARY-ION MASS-SPECTROMETRY PROFILING

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    40. ENGLE PD; GELLER JD
      COMPUTER-CENTRIC ROTATIONAL DEPTH PROFILING

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    41. KACIULIS S; MATTOGNO G; TREIDERIS G; VITICOLI S
      XPS STUDY OF THE INXGA1-XAS GAAS SUPERLATTICE

      Journal of electron spectroscopy and related phenomena
    42. KAJIWARA K
      CRYSTALLINE EFFECTS IN-DEPTH RESOLUTION IN AES DEPTH PROFILING

      Surface and interface analysis
    43. DELAET J; DEBOECIK K; TERRYN H; VEREECKEN J
      DETERMINATION OF THE DEPTH RESOLUTION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF ANODIC BARRIER OXIDE-FILMS ON DIFFERENTLY PRETREATEDALUMINUM SUBSTRATES

      Surface and interface analysis
    44. HOFMANN S
      ATOMIC MIXING, SURFACE-ROUGHNESS AND INFORMATION DEPTH IN HIGH-RESOLUTION AES DEPTH PROFILING OF A GAAS ALAS SUPERLATTICE STRUCTURE/

      Surface and interface analysis
    45. CARTER G; NOBES MJ; CAVE C; ALQADI N
      RIPPLE PRODUCTION INDUCED BY OBLIQUE-INCIDENCE ION-BOMBARDMENT OF SI

      Vacuum
    46. ZALAR A; SEIBT EW; PANJAN P
      AUGER-ELECTRON SPECTROSCOPY ROTATIONAL DEPTH PROFILING OF NI CR MULTILAYERS USING O2+ AND AR+ IONS

      Thin solid films
    47. BARNA A; MENYHARD M
      AUGER DEPTH PROFILE ANALYSIS OF DEEPLY BURIED INTERFACES

      Physica status solidi. a, Applied research
    48. HOFMANN S
      RECENT PROGRESS IN QUANTITATIVE AND HIGH-SPATIAL-RESOLUTION AES

      Mikrochimica acta
    49. HIDIROGLOU MA; SRINATH KP
      PROBLEMS ASSOCIATED WITH DESIGNING SUBANNUAL BUSINESS SURVEYS

      Journal of business & economic statistics
    50. HOFMANN S
      APPROACHING THE LIMITS OF HIGH-RESOLUTION DEPTH PROFILING

      Applied surface science
    51. ZALAR A; HOFMANN S
      COMPARISON OF ROTATIONAL DEPTH PROFILING WITH AES AND XPS

      Applied surface science
    52. HOSLER W; PAMLER W
      EFFECTS OF CRYSTALLINITY ON DEPTH RESOLUTION IN SPUTTER DEPTH PROFILES

      Surface and interface analysis
    53. HENNEBERG MM
      INFLUENCE OF CRYSTALLINE-STRUCTURE AND AMORPHOUS MATERIAL IN THE DEPTH RESOLUTION OF SPUTTER ETCHING

      Surface and interface analysis


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Documento generato il 29/10/20 alle ore 07:07:01