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La ricerca find articoli where soggetti phrase all words 'ION MASS-SPECTROMETRY' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 977 riferimenti
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    1. Scotchford, CA; Gilmore, CP; Cooper, E; Leggett, GJ; Downes, S
      Protein adsorption and human osteoblast-like cell attachment and growth onalkylthiol on gold self-assembled monolayers

      JOURNAL OF BIOMEDICAL MATERIALS RESEARCH
    2. Belhomme, C; Gourba, E; Cassir, M; Tessier, C
      Chemical and electrochemical behaviour of Ni-Ti in the cathodic conditionsused in molten carbonate fuel cells

      JOURNAL OF ELECTROANALYTICAL CHEMISTRY
    3. Wang, J; Chen, CY; Buck, SM; Chen, Z
      Molecular chemical structure on poly(methyl methacrylate) (PMMA) surface studied by sum frequency generation (SFG) vibrational spectroscopy

      JOURNAL OF PHYSICAL CHEMISTRY B
    4. Shao, JZ; Liu, JQ; Carr, CM
      Investigation into the synergistic effect between UV/ozone exposure and peroxide pad-batch bleaching on the printability of wool

      COLORATION TECHNOLOGY
    5. Janshoff, A; Ross, M; Gerke, V; Steinem, C
      Visualization of annexin I binding to calcium-induced phosphatidylserine domains

      CHEMBIOCHEM
    6. Pollak, C; Stubbings, T; Hutter, H
      Differential image distortion correction

      MICROSCOPY AND MICROANALYSIS
    7. Conty, C
      Today's and tomorrow's instruments

      MICROSCOPY AND MICROANALYSIS
    8. English, RD; Van Stipdonk, MJ; Schweikert, EA
      Secondary ion yield improvements for phosphated and sulfated molecules using substrate-enhanced time-of-flight secondary ion mass spectrometry

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    9. Belykh, SF; Kovarsky, AP; Palitsin, VV; Adriaens, A; Adams, F
      Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    10. Yamazaki, H
      Improvement of detection limit for secondary-ion mass spectrometry depth profiling of argon in silicon by energy filtering

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    11. Wirtz, T; Duez, B; Migeon, HN; Scherrer, H
      Useful yields of MCs+ and MCs2+ clusters: a comparative study between the Cameca IMS 4f and the Cation Mass Spectrometer

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    12. Gresham, GL; Groenewold, GS; Appelhans, AD; Olson, JE; Benson, MT; Jeffery, MT; Rowland, B; Weibel, MA
      Static secondary ionization mass spectrometry and mass spectrometry/mass spectrometry (MS2) characterization of the chemical warfare agent HD on soilparticle surfaces

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    13. Belov, ME; Nikolaev, EN; Harkewicz, R; Masselon, CD; Alving, K; Smith, RD
      Ion discrimination during ion accumulation in a quadrupole interface external to a Fourier transform ion cyclotron resonance mass spectrometer

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    14. Diehnelt, CW; Van Stipdonk, MJ; Schweikert, EA
      Effectiveness of atomic and polyatomic primary ions for organic secondary ion mass spectrometry

      INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
    15. Napolitani, E; Carnera, A; Privitera, V; Priolo, F
      Ultrashallow profiling of semiconductors by secondary ion mass spectrometry: methods and applications

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    16. Takatsuji, H
      Advanced time-of-flight secondary ion mass spectrometry analyses for application to TFT-LCD

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    17. Groenewold, GS; Scott, JR; Gianotto, AK; Hodges, BDM; Kessinger, GF; Benson, MT; Wright, JB
      Gas-phase condensation reactions of SixOyHz- oxyanions with H2O

      JOURNAL OF PHYSICAL CHEMISTRY A
    18. Groenewold, GS; Hodges, BDM; Scott, JR; Gianotto, AK; Appelhans, AD; Kessinger, GF; Wright, JB
      Oxygen-for-sulfur exchange in the gas phase: Reactions of Al and Si oxyanions with H2S

      JOURNAL OF PHYSICAL CHEMISTRY A
    19. Null, AP; Muddiman, DC
      Perspectives on the use of electrospray ionization Fourier transform ion cyclotron resonance mass spectrometry for short tandem repeat genotyping in the post-genome era

      JOURNAL OF MASS SPECTROMETRY
    20. Aubriet, F; Poleunis, C; Bertrand, P
      Capabilities of static TOF-SIMS in the differentiation of first-row transition metal oxides

      JOURNAL OF MASS SPECTROMETRY
    21. Todd, PJ; Schaaff, TG; Chaurand, P; Caprioli, RM
      Organic ion imaging of biological tissue with secondary ion mass spectrometry and matrix-assisted laser desorption/ionization

      JOURNAL OF MASS SPECTROMETRY
    22. Marotta, E; Paradisi, C
      Products, rate constants and mechanisms of gas-phase reactions of CX3+, CX2+, CX+ (X = F and/or Cl) and Cl+ with 1,1,1- and 1,1,2-trichlorotrifluoroethane

      JOURNAL OF MASS SPECTROMETRY
    23. Cuyckens, F; Rozenberg, R; de Hoffmann, E; Claeys, M
      Structure characterization of flavonoid O-diglycosides by positive and negative nano-electrospray ionization ion trap mass spectrometry

      JOURNAL OF MASS SPECTROMETRY
    24. Brotin, T; Darzac, M; Forest, D; Becchi, M; Dutasta, JP
      Formation of cryptophanes from their precursors as viewed by liquid secondary ion mass spectrometry

      JOURNAL OF MASS SPECTROMETRY
    25. Kuroda, J; Fukai, T; Nomura, T
      Collision-induced dissociation of ring-opened cyclic depsipeptides with a guanidino group by electrospray ionization/ion trap mass spectrometry

      JOURNAL OF MASS SPECTROMETRY
    26. Weiskopf, AS; Vouros, P; Cunniff, J; Binderup, E; Bjorkling, F; Binderup, L; White, MC; Posner, GH
      Examination of structurally selective derivatization of vitamin D-3 analogues by electrospray mass spectrometry

      JOURNAL OF MASS SPECTROMETRY
    27. Hu, HQ; Wenthold, PG
      The structure of ionized 1,5 hexadiene in the gas phase

      JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
    28. He, MY; Xu, JX; He, XR; Chan, TWD; Lau, RLC
      Sequence analysis of peptides with biological activities using electrospray-Fourier transform ion cyclotron resonance mass spectrometry

      CHINESE SCIENCE BULLETIN
    29. Hirokawa, K; Li, Z; Tanaka, A
      Role of electronegativity in the qualitative inference of the TOF-SIMS fragment pattern of inorganic compounds

      FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
    30. Tsukui, S; Adachi, M; Oshima, R; Nakajima, H; Toujou, F; Tsukamoto, K; Tabata, T
      Oxygen tracer diffusion in the YBa(2)Cu(3)Oy superconductor

      PHYSICA C
    31. Lappas, AA; Nalbandian, L; Iatridis, DK; Voutetakis, SS; Vasalos, IA
      Effect of metals poisoning on FCC products yields: studies in an FCC shortcontact time pilot plant unit

      CATALYSIS TODAY
    32. Tanaka, A
      Surface and interface analysis of polymers

      JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS
    33. Netcheva, S; Bertrand, P
      Ion-beam-induced morphology on the surface of thin polymer films at low current density and high ion fluence

      JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
    34. Ross, M; Steinem, C; Galla, HJ; Janshoff, A
      Visualization of chemical and physical properties of calcium-induced domains in DPPC/DPPS Langmuir-Blodgett layers

      LANGMUIR
    35. Esaka, F; Watanabe, K; Magara, M; Hanzawa, Y; Usuda, S
      Screening of uranium particles by total-reflection X-ray fluorescence spectrometry for safeguards environmental sample analysis

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    36. Thellier, M; Chevallier, A; His, I; Jarvis, MC; Lovell, MA; Ripoll, C; Robertson, D; Sauerwein, W; Verdus, MC
      Methodological developments for application to the study of physiological boron and to boron neutron capture therapy

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    37. Thellier, M; Derue, C; Tafforeau, M; Le Sceller, L; Verdus, MC; Massiot, P; Ripoll, C
      Physical methods for in vitro analytical imaging in the microscopic range in biology, using radioactive or stable isotopes (review article)

      JOURNAL OF TRACE AND MICROPROBE TECHNIQUES
    38. Carini, M; Aldini, G; Furlanetto, S; Stefani, R; Facino, RM
      LC coupled to ion-trap MS for the rapid screening and detection of polyphenol antioxidants from Helichrysum stoechas

      JOURNAL OF PHARMACEUTICAL AND BIOMEDICAL ANALYSIS
    39. Pajo, L; Tamborini, G; Rasmussen, G; Mayer, K; Koch, L
      A novel isotope analysis of oxygen in uranium oxides: comparison of secondary ion mass spectrometry, glow discharge mass spectrometry and thermal ionization mass spectrometry

      SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
    40. Coumbaros, J; Kirkbride, KP; Klass, G; Skinner, W
      Characterisation of 0.22 caliber rimfire gunshot residues by time-of-flight secondary ion mass spectrometry (TOF-SIMS): a preliminary study

      FORENSIC SCIENCE INTERNATIONAL
    41. Kim, H; Falth, FJ; Andersson, TG
      Unintentional incorporation of B, As, and O impurities in GaN grown by molecular beam epitaxy

      JOURNAL OF ELECTRONIC MATERIALS
    42. Stander, MA; Nieuwoudt, TW; Steyn, PS; Shephard, GS; Creppy, EE; Sewram, V
      Toxicokinetics of ochratoxin A in vervet monkeys (Cercopithecus aethiops)

      ARCHIVES OF TOXICOLOGY
    43. Rainville, S; Bradley, MP; Porto, JV; Thompson, JK; Pritchard, DE
      Precise measurements of the masses of Cs, Rb and Na - A new route to the fine structure constant

      HYPERFINE INTERACTIONS
    44. Nicholls, CR; Allchin, CR; Law, RJ
      Levels of short and medium chain length polychlorinated n-alkanes in environmental samples from selected industrial areas in England and Wales

      ENVIRONMENTAL POLLUTION
    45. Boulyga, SF; Testa, C; Desideri, D; Becker, JS
      Optimisation and application of ICP-MS and alpha-spectrometry for determination of isotopic ratios of depleted uranium and plutonium in samples collected in Kosovo

      JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
    46. Chang, SG; Lee, HJ; Kang, H; Park, SM
      Characterization of surface films formed prior to bulk reduction of lithium in rigorously dried propylene carbonate solutions

      BULLETIN OF THE KOREAN CHEMICAL SOCIETY
    47. Gay, I; Lorey, DR; Schinazi, RF; Morrison, GH; Chandra, S
      Dynamic SIMS ion microscopy imaging of intracellular boron accumulation from carboranyl nucleosides in glioma cells

      ANTICANCER RESEARCH
    48. Brauer, D
      Rapid inhibition of root growth in wheat associated with aluminum uptake as followed by changes in morin fluorescence

      JOURNAL OF PLANT NUTRITION
    49. Houssiau, L; Bertrand, P
      TOF-SIMS study of alkanethiol adsorption and ordering on gold

      APPLIED SURFACE SCIENCE
    50. Stapel, D; Benninghoven, A
      Application of atomic and molecular primary ions for TOF-SIMS analysis of additive containing polymer surfaces

      APPLIED SURFACE SCIENCE
    51. Karolewski, MA; Cavell, RG
      Characterisation of adsorbed intermediates in the CH3OH/O/Cu(100) system by secondary ion mass spectrometry

      APPLIED SURFACE SCIENCE
    52. Oya, Y; Suzuki, T; Iinuma, K; Morita, K; Horikawa, T; Abe, K
      An isotope effect in electrolytic hydrogen absorption of some transition metals studied by ERDA and SIMS techniques

      APPLIED SURFACE SCIENCE
    53. Krantzman, KD; Postawa, Z; Garrison, BJ; Winograd, N; Stuart, SJ; Harrison, JA
      Understanding collision cascades in molecular solids

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    54. Jones, FH
      Teeth and bones: applications of surface science to dental materials and related biomaterials

      SURFACE SCIENCE REPORTS
    55. Seubert, A
      On-line coupling of ion chromatography with ICP-AES and ICP-MS

      TRAC-TRENDS IN ANALYTICAL CHEMISTRY
    56. Slingsby, R; Kiser, R
      Sample treatment techniques and methodologies for ion chromatography

      TRAC-TRENDS IN ANALYTICAL CHEMISTRY
    57. Bertrand, I; Grignon, N; Hinsinger, P; Souche, G; Jaillard, B
      The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus

      SCANNING
    58. Chehade, F; De Labriolle-Vaylet, C; Michelot, J; Moins, N; Moreau, MF; Hindie, E; Papon, J; Escaig, F; Galle, P; Veyre, A
      Distribution of I-BZA (N-2-diethylaminoethyl-4-iodobenzamide) in grafted melanoma and normal skin: A study by secondary ion mass spectroscopy

      CELLULAR AND MOLECULAR BIOLOGY
    59. Eccles, AJ; Steele, TA
      Routine problem solving with the SIMS chemical microscope

      INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES
    60. Mathieu, HJ
      Bioengineered material surfaces for medical applications

      SURFACE AND INTERFACE ANALYSIS
    61. Gui, D; Cha, LZ; Liu, R; Wee, ATS
      SIMS quantification of Si1-xGex alloys using polyatomic secondary ions

      SURFACE AND INTERFACE ANALYSIS
    62. Liu, SY; Weng, LT; Chan, CM; Li, L; Ho, NK; Jiang, M
      Quantitative surface characterization of poly(styrene)/poly(4-vinyl phenol) random and block copolymers by ToF-SIMS and XPS

      SURFACE AND INTERFACE ANALYSIS
    63. Alkemade, PFA; Liu, ZX
      On the anomalous SIMS transient of B in Si: the influence of surface conditions

      SURFACE AND INTERFACE ANALYSIS
    64. Zeng, XM; Weng, LT; Li, L; Chan, CM; Liu, SY; Jiang, M
      ToF-SIMS study of the surface morphology of blends of polystyrene and poly(N-vinyl-2-pyrrolidone) compatibilized by poly(styrene-co-4-vinylphenol)

      SURFACE AND INTERFACE ANALYSIS
    65. Galuska, AA
      Quantitative ToF-SIMS analysis of monomers, oxidation and trace elements in EPDM gels

      SURFACE AND INTERFACE ANALYSIS
    66. Murase, A; Ohmori, T
      ToF-SIMS analysis of model compounds of friction modifier adsorbed onto friction surfaces of ferrous materials

      SURFACE AND INTERFACE ANALYSIS
    67. Murase, A; Ohmori, T
      ToF-SIMS analysis of friction surfaces tested with mixtures of a phosphiteand a friction modifier

      SURFACE AND INTERFACE ANALYSIS
    68. Murase, A; Ohmori, T
      ToF-SIMS analysis of phosphate-type lubricant additives adsorbed on friction surfaces of ferrous materials

      SURFACE AND INTERFACE ANALYSIS
    69. Medard, N; Aouinti, M; Poncin-Epaillard, F; Bertrand, P
      ToF-SIMS ability to quantify surface chemical groups: Correlation with XPSanalysis and spectrochemical titration

      SURFACE AND INTERFACE ANALYSIS
    70. Quirk, RA; Briggs, D; Davies, MC; Tendler, SJB; Shakesheff, KM
      Characterization of the spatial distributions of entrapped polymers following the surface engineering of poly(lactic acid)

      SURFACE AND INTERFACE ANALYSIS
    71. Gerlock, JL; Kucherov, AV; Smith, CA
      Determination of active HALS in automotive paint systems II: HALS distribution in weathered clearcoat/basecoat paint systems

      POLYMER DEGRADATION AND STABILITY
    72. Foti, C; Bonamonte, D; Mascolo, G; Tiravanti, G; Rigano, L; Angelini, G
      Aminoethylethanolamine: a new allergen in cosmetics?

      CONTACT DERMATITIS
    73. Carlsson, P; Bexell, U; Olsson, M
      Tribological performance of thin organic permanent coatings deposited on 55%Al-Zn coated steel - influence of coating composition and thickness on friction and wear

      WEAR
    74. Riedel, M; Dusterhoft, H; Nagel, F
      Investigation of tungsten cathodes activated with Ba2CaWO6

      VACUUM
    75. Ogura, A; Hiroi, M
      Depth profiles of As and B implanted into Si-on-insulator substrates

      THIN SOLID FILMS
    76. Wang, CY; Zheng, JZ; Shen, ZX; Lin, Y; Wee, ATS
      Elimination Of O-2 plasma damage of low-k methyl silsesquioxane film by Asimplantation

      THIN SOLID FILMS
    77. Kiss, G; Krafcsik, OH; Kovacs, K; Josepovits, VK; Fleischer, M; Meixner, H; Deak, P; Reti, F
      Impedance spectroscopic and secondary ion mass spectrometric studies of beta-Ga2O3/O-2 interaction

      THIN SOLID FILMS
    78. Bernheim, M
      Energy threshold and ion yield for H- ions ejected from Si(111): H(1 x 1) during low energy electron collisions: study of ESD process in relation with atom manipulation in STM

      SURFACE SCIENCE
    79. Belykh, SF; Wojciechowski, IA; Palitsin, VV; Zinoviev, AV; Adriaens, A; Adams, F
      Effect of the electronic subsystem excitation on the ionisation probability of atoms sputtered from metals by atomic and molecular projectiles

      SURFACE SCIENCE
    80. Karolewski, MA; Cavell, RG
      Sputtering and secondary ion emission from Cu/Ni(100)

      SURFACE SCIENCE
    81. Wallenius, M; Tamborini, G; Koch, L
      The "age" of plutonium particles

      RADIOCHIMICA ACTA
    82. Li, L; Chan, CM; Ng, KM; Lei, YG; Weng, LT
      A time-of-flight secondary ion mass spectrometry study of sequential polymers with a well-defined segmental length

      POLYMER
    83. Stephan, T
      TOF-SIMS in cosmochemistry

      PLANETARY AND SPACE SCIENCE
    84. Song, K; Cha, H; Lee, J; Park, H; Lee, SC
      Analysis of rare-earth elements in soil sample by using laser-ablation iontrap mass spectrometry

      MICROCHEMICAL JOURNAL
    85. Lammertink, RGH; Hempenius, MA; Vancso, GJ; Shin, K; Rafailovich, MH; Sokolov, J
      Morphology and surface relief structures of asymmetric poly(styrene-block-ferrocenylsilane) thin films

      MACROMOLECULES
    86. Shin, K; Hu, X; Zheng, X; Rafailovich, MH; Sokolov, J; Zaitsev, V; Schwarz, SA
      Silicon oxide surface as a substrate of polymer thin films

      MACROMOLECULES
    87. Lee, JW; Gardella, JA
      In vitro hydrolytic surface degradation of poly(glycolic acid): Role of the surface segregated amorphous region in the induction period of bulk erosion

      MACROMOLECULES
    88. Paquin, J; Altherr, R
      New constraints on the P-T evolution of the Alpe Arami garnet peridotite body (Central Alps, Switzerland)

      JOURNAL OF PETROLOGY
    89. Oba, K; Gong, HQ; Amemiya, T; Baba, K; Takaya, K
      Applying secondary ion mass spectrometry to the analysis of elements in globlet cells of conjunctiva

      JOURNAL OF ELECTRON MICROSCOPY
    90. Gopinath, CS; Zaera, F
      NO+CO+O-2 reaction kinetics on Rh(111): A molecular beam study

      JOURNAL OF CATALYSIS
    91. Green, ML; Gusev, EP; Degraeve, R; Garfunkel, EL
      Ultrathin (< 4 nm) SiO2 and Si-O-N gate dielectric layers for silicon microelectronics: Understanding the processing, structure, and physical and electrical limits

      JOURNAL OF APPLIED PHYSICS
    92. Nobili, D; Solmi, S; Shao, J
      Clustering equilibrium and deactivation kinetics in arsenic doped silicon

      JOURNAL OF APPLIED PHYSICS
    93. Zhu, L; Liew, T
      Mobility of Z-dol lubricant thin film on carbon overcoat surface

      IEEE TRANSACTIONS ON MAGNETICS
    94. Williams, LB; Hervig, RL; Holloway, JR; Hutcheon, I
      Boron isotope geochemistry during diagenesis. Part I. Experimental determination of fractionation during illitization of smectite

      GEOCHIMICA ET COSMOCHIMICA ACTA
    95. Osanai, T; Chai, WG; Tajima, Y; Shimoda, Y; Sanai, Y; Yuen, CT
      Expression of glycoconjugates bearing the Lewis X epitope during neural differentiation of P19 EC cells

      FEBS LETTERS
    96. Gong, HQ; Amemiya, T; Takaya, K
      Retinal changes in magnesium-deficient rats

      EXPERIMENTAL EYE RESEARCH
    97. Gaponenko, NV; Sergeev, OV; Stepanova, EA; Parkun, VM; Mudryi, AV; Gnaser, H; Misiewicz, J; Heiderhoff, R; Balk, LJ; Thompson, GE
      Optical and structural characterization of erbium-doped TiO2 xerogel filmsprocessed on porous anodic alumina

      JOURNAL OF THE ELECTROCHEMICAL SOCIETY
    98. Wojciechowski, I; Delcorte, A; Gonze, X; Bertrand, P
      Mechanism of metal cationization in organic SIMS

      CHEMICAL PHYSICS LETTERS
    99. Girard, JP; Munz, IA; Johansen, H; Hill, S; Canham, A
      Conditions and timing of quartz cementation in Brent reservoirs, Hild Field, North Sea: constraints from fluid inclusions and SIMS oxygen isotope microanalysis

      CHEMICAL GEOLOGY
    100. Hawthorne, FC; Oberti, R; Cannillo, E; Ottolini, L; Roelofsen, JN; Martin, RF
      Li-bearing arfvedsonitic amphiboles from the Strange Lake peralkaline granite, Quebec

      CANADIAN MINERALOGIST


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Documento generato il 11/08/20 alle ore 12:58:54