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La ricerca find articoli where soggetti phrase all words 'ELECTRONIC SPUTTERING' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 12 riferimenti
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    1. Ghosh, S; Ingale, A; Som, T; Kabiraj, D; Tripathi, A; Mishra, S; Zhang, S; Hong, X; Avasthi, DK
      Structural effect on electronic sputtering of hydrogenated amorphous carbon films

      SOLID STATE COMMUNICATIONS
    2. Chadderton, LT; Fink, D
      Fullerene genesis by ion beams III. On the absence of latent tracks in GeVion irradiated graphite

      RADIATION EFFECTS AND DEFECTS IN SOLIDS
    3. Imanishi, N; Ohta, H; Ninomiya, S; Itoh, A
      Emission energy distribution of secondary ions produced through the electronic sputtering process under heavy ion bombardment

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    4. Schenkel, T; Newman, MW; Niedermayr, TR; Machicoane, GA; McDonald, JW; Barnes, AV; Hamza, AV; Banks, JC; Doyle, BL; Wu, KJ
      Electronic sputtering of solids by slow, highly charged ions: Fundamentalsand applications

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    5. Wunsch, R; Neugebauer, R; Jalowy, T; Hofmann, D; Rothard, H; Groeneveld, KO
      Velocity effect in secondary electron emission below and above the electronic stopping power maximum

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    6. ERIKSSON J; ROTTLER J; REIMANN CT
      FAST-ION-INDUCED SURFACE TRACKS IN BIOORGANIC FILMS

      International journal of mass spectrometry and ion processes
    7. NSOULI B; DOLE P; ALLALI H; DEBRE O; COLOMBINI D; THOMAS JP
      MEV ION SPUTTERING OF POLYMERS - OBSERVATION OF A SECONDARY-ION EMISSION DEPENDENCE ON THE CRYSTALLINITY OF PEEK AND PET FILMS

      International journal of mass spectrometry and ion processes
    8. PAPALEO RM; DEMIREV PA; ERIKSSON J; HAKANSSON P; SUNDQVIST BUR
      MEV ATOMIC ION SPUTTERING OF FULLERENES - A RADIAL-VELOCITY DISTRIBUTION STUDY

      International journal of mass spectrometry and ion processes
    9. KOPNICZKY J; HALLEN A; KESKITALO N; REIMANN CT; SUNDQVIST BUR
      MEV-ION-INDUCED DEFECTS IN ORGANIC-CRYSTALS

      Radiation measurements
    10. REIMANN CT; KOPNICZKY J; WISTUS E; ERIKSSON J; HAKANSSON P; SUNDQVIST BUR
      MEV-ATOMIC-ION-INDUCED SURFACE TRACKS IN LANGMUIR-BLODGETT-FILMS AND L-VALINE CRYSTALS STUDIED BY SCANNING FORCE MICROSCOPY

      International journal of mass spectrometry and ion processes
    11. BITENSKY I; BRINKMALM G; DEMIREV P; ERIKSSON J; HAKANSSON P; PAPALEO R; SUNDQVIST BUR; ZUBAREV R
      PLASMA DESORPTION MASS-SPECTROMETRY IN STUDIES OF FORMATION AND SPUTTERING OF FULLERENES BY MEV ATOMIC IONS

      International journal of mass spectrometry and ion processes
    12. ALLALI H; NSOULI B; THOMAS JP
      SECONDARY-EMISSION OF NEGATIVE-IONS AND ELECTRONS RESULTING FROM ELECTRONIC SPUTTERING OF CESIUM SALTS - DIFFERENCES BETWEEN HALIDES AND OXYGENATED SALTS

      International journal of mass spectrometry and ion processes


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/10/20 alle ore 11:56:34