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La ricerca find articoli where soggetti phrase all words 'DIFFRACTOMETER' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 359 riferimenti
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    1. Uragami, T; Acosta, AS; Fujioka, H; Mano, T; Ohta, J; Ofuchi, H; Oshima, M; Takagi, Y; Kimura, M; Suzuki, T
      Characterization of strain distribution in quantum dots by X-ray diffraction

      JOURNAL OF CRYSTAL GROWTH
    2. Walton, RI; Smith, RI; O'Hare, D
      Following the hydrothermal crystallisation of zeolites using time-resolvedin situ powder neutron diffraction

      MICROPOROUS AND MESOPOROUS MATERIALS
    3. Schelev, MY
      Pico-femtosecond image-tube photography in quantum electronics

      QUANTUM ELECTRONICS
    4. Chantler, CT; Tran, CQ; Barnea, Z; Paterson, D; Cookson, DJ; Balaic, DX
      Measurement of the x-ray mass attenuation coefficient of copper using 8.85-20 keV synchrotron radiation - art. no. 062506

      PHYSICAL REVIEW A
    5. Bian, XF; Wang, WM; Qin, JY
      Liquid structure of Al-12.5% Si alloy modified by antimony

      MATERIALS CHARACTERIZATION
    6. Zheng, XH; Qu, B; Wang, YT; Dai, ZZ; Yang, H; Liang, JW
      Microtwins and twin inclusions in the 3C-SiC epilayers grown on Si(001) byAPCVD

      SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY
    7. Ohsato, H
      Science of tungstenbronze-type like Ba6-3xR8+2xTi18O54 (R = rare earth) microwave dielectric solid solutions

      JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
    8. Nakamura, Y; Oikawa, K; Kamiyama, T; Akiba, E
      Crystal structure of two hydrides formed from a Ti-V-MnBCC solid solution alloy studied by time-of-flight neutron powder diffraction - a NaCl structure and a CaF2 structure

      JOURNAL OF ALLOYS AND COMPOUNDS
    9. Jiang, M; Zhang, XG; Liu, Y; Hao, GM; Lin, H
      Ferromagnetic carbon-coated iron and its compounds nanocrystallite synthesized at high metal to carbon rate and high yield by a modified AC arc method

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    10. Shin, YS; Lee, HJ; So, HM; Kim, JJ; Kim, N; Yoo, KH
      Observation of conductance oscillations in a superconducting Andreev diffractometer

      PHYSICA C
    11. Toraya, H
      Crystal structure analysis using high-resolution synchrotron radiation powder diffraction data

      JOURNAL OF THE CERAMIC SOCIETY OF JAPAN
    12. Tanigaki, N; Yoshida, Y; Kaito, A; Yase, K
      Total-reflection X-ray diffraction study of friction-tranferred poly(tetrafluoroethylene) film

      JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
    13. Nakamura, H; Yamazaki, S; Ohnishi, T; Ida, T; Toraya, H
      The Monte Carlo method for finding missing atoms in solving crystal structures from powder diffraction data without applying a rigid-body approximation

      POWDER DIFFRACTION
    14. Yamazaki, S; Toraya, H
      X-ray powder data for MgMnSiO4 and Mg0.6Mn1.4SiO4

      POWDER DIFFRACTION
    15. Tang, CC; MacLean, EJ; Roberts, MA; Clarke, DT; Pantos, E; Prag, AJN
      The study of Attic black gloss sherds using synchrotron x-ray diffraction

      JOURNAL OF ARCHAEOLOGICAL SCIENCE
    16. Yan, PX; Zhang, XM; Xu, JW; Wu, ZG; Song, QM
      High-temperature behavior of the boride layer of 45# carbon steel

      MATERIALS CHEMISTRY AND PHYSICS
    17. Rajnikant; Gupta, VK; Shafi, S; Khan, EH; Firoz, J; Shafiullah; Gupta, R
      3 beta-acetoxy-5 alpha-cholestan-6-one: A steroid

      CRYSTAL RESEARCH AND TECHNOLOGY
    18. Rajnikant; Gupta, VK; Rangari, VD; Bapat, SR; Agarwal, RB; Gupta, R
      Crystallographic analysis of acetyl beta-boswellic acid

      CRYSTAL RESEARCH AND TECHNOLOGY
    19. Rutt, U; Beno, MA; Strempfer, J; Jennings, G; Kurtz, C; Montano, PA
      Diffractometer for high energy X-rays at the APS

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    20. Gaponov, YA; Dementyev, EA; Kochubei, DI; Tolochko, BP
      Portable high precision small/wide angle X-ray scattering diffractometer

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    21. Isshiki, M; Ohishi, Y; Goto, S; Takeshita, K; Ishikawa, T
      High-energy X-ray diffraction beamline: BL04B2 at SPring-8

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    22. Yabashi, M; Mochizuki, T; Yamazaki, H; Goto, S; Ohashi, H; Takeshita, K; Ohata, T; Matsushita, T; Tamasaku, K; Tanaka, Y; Ishikawa, T
      Design of a beamline for the SPring-8 long undulator source 1

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    23. Gau, TS; Jean, YC; Liu, KY; Chung, CH; Chen, CK; Lai, SC; Shu, CH; Huang, YS; Chao, CH; Lee, YR; Chen, CT; Chang, SL
      Soft X-ray diffractometer for synchrotron radiation

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    24. Fujimori, H; Yashima, M; Sasaki, S; Kakihana, M; Mori, T; Tanaka, M; Yoshimura, M
      Internal distortion in ceria-doped hafnia solid solutions: High-resolutionx-ray diffraction and Raman scattering - art. no. 134104

      PHYSICAL REVIEW B
    25. Meyerheim, HL; Sander, D; Popescu, R; Kirschner, J; Steadman, P; Ferrer, S
      Surface structure and stress in Fe monolayers on W(110) - art. no. 045414

      PHYSICAL REVIEW B
    26. Reedijk, MF; Arsic, J; de Theije, FK; McBride, MT; Peters, KF; Vlieg, E
      Structure of liquid Sn on Ge(111) - art. no. 033403

      PHYSICAL REVIEW B
    27. Ohhara, T; Uekusa, H; Ohashi, Y; Tanaka, I; Kumazawa, S; Niimura, N
      Direct observation of deuterium migration in crystalline-state reaction bysingle-crystal neutron diffraction. III. Photoracemization of 1-cyanoethylcobaloxime complexes

      ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
    28. Tanahashi, Y; Nakamura, H; Yamazaki, S; Kojima, Y; Saito, H; Ida, T; Toraya, H
      Ab initio structure determination of monoclinic 2,2-dihydroxymethylbutanoic acid from synchrotron radiation powder diffraction data: combined use of direct methods and the Monte Carlo method

      ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
    29. Roberts, MA; Fitch, AN
      Na4Ge7O16 center dot 6 H2O and Na2.6Rb0.8H0.6Ge7O16 center dot 6 H2O refined from powder synchrotron X-ray diffraction data

      ZEITSCHRIFT FUR KRISTALLOGRAPHIE
    30. Meyerheim, HL; Sander, D; Popescu, R; Steadman, P; Ferrer, S; Kirschner, J
      Interlayer relaxation of W(110) studied by surface X-ray diffraction

      SURFACE SCIENCE
    31. Wagh, AG; Rakhecha, VC; Treimer, W
      Bonse-Hart angular profiles realized for multiply Bragg reflected neutrons- art. no. 125504

      PHYSICAL REVIEW LETTERS
    32. Howard, CJ; Withers, RL; Kennedy, BJ
      Space group and structure for the perovskite Ca0.5Sr0.5TiO3

      JOURNAL OF SOLID STATE CHEMISTRY
    33. Leineweber, A; Jacobs, H; Fischer, P; Bottger, G
      Uniaxial orientational order-disorder transitions in diammine magnesium halides, Mg(ND3)(2)Cl-2 and Mg(ND3)(2)Br-2, investigated by neutron diffraction

      JOURNAL OF SOLID STATE CHEMISTRY
    34. Gartstein, E; Mandelbrot, M; Mogilyanski, D
      Instrumental origin effects in triple-axis diffraction

      JOURNAL OF PHYSICS D-APPLIED PHYSICS
    35. Wasik, D; Baj, M; Siwiec-Matuszyk, J; Gronkowski, J; Jasinski, J; Karczewski, G
      Effect of hydrostatic pressure on degradation of CdTe/CdMgTe heterostructures grown by molecular beam epitaxy on GaAs substrates

      JOURNAL OF APPLIED PHYSICS
    36. Ballirano, P; Caminiti, R
      Rietveld refinements on laboratory energy dispersive X-ray diffraction (EDXD) data

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    37. Toraya, H
      Estimation of errors in the measurement of unit-cell parameters. I. Statistical uncertainties of peak positions of powder diffraction lines determined by individual profile fitting

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    38. Flores-Llamas, H
      Asymmetries of the Voigt line shape

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    39. Fujimori, H; Yashima, M; Sasaki, S; Kakihana, M; Mori, T; Tanaka, M; Yoshimura, M
      Cubic-tetragonal phase change of yttria-doped hafnia solid solution: high-resolution X-ray diffraction and Raman scattering

      CHEMICAL PHYSICS LETTERS
    40. Thompson, SP; Tang, CC
      Laboratory investigation of crystallisation in annealed amorphous MgSiO3

      ASTRONOMY AND ASTROPHYSICS
    41. Yamazaki, S; Toraya, H
      Determination of positions of zeolitic calcium atoms and water molecules in hydrothermally formed aluminum-substituted tobermorite-1.1nm using synchrotron radiation powder diffraction data

      JOURNAL OF THE AMERICAN CERAMIC SOCIETY
    42. Noguchi, Y; Shimizu, H; Miyayama, M; Oikawa, K; Kamiyama, T
      Ferroelectric properties and structure distortion in A-site-modified SrBi2Ta2O9

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    43. Peterson, RC; Yang, HX
      High-temperature devices and environmental cells designed for X-ray and neutron diffraction experiments

      HIGH-TEMPERATURE AND HIGH-PRESSURE CRYSTAL CHEMISTRY
    44. Strempfer, J; Bruckel, T; Caliebe, W; Vernes, A; Ebert, H; Prandl, W; Schneider, JR
      Form-factor measurements on chromium with high-energy synchrotron radiation

      EUROPEAN PHYSICAL JOURNAL B
    45. Ramakrishnan, S; Degenhardt, R; Vietzke, K
      Erythrocyte deformability in Waldenstrom's macroglobulinemia

      CLINICAL HEMORHEOLOGY AND MICROCIRCULATION
    46. Shimakawa, Y; Kubo, Y; Nakagawa, Y; Goto, S; Kamiyama, T; Asano, H; Izumi, F
      Crystal structure and ferroelectric properties of ABi(2)Ta(2)O(9) (A = Ca,Sr, and Ba)

      PHYSICAL REVIEW B
    47. Lomov, AA; Bushuev, VA; Karavanskii, VA
      Study of surface and interface roughnesses in porous silicon by high-resolution X-ray methods

      CRYSTALLOGRAPHY REPORTS
    48. Chen, N
      Point defects in III-V compound semiconductors

      DEFECTS AND DIFFUSION IN SEMICONDUCTORS
    49. Shu, KY; Yang, XG; Zhang, SK; Lu, GL; Lei, YQ; Wang, QD
      Effect of Cr and Co additives on microstructure and electrochemical performance of Zr(NiVMn)(2)M-0.1 alloys

      JOURNAL OF ALLOYS AND COMPOUNDS
    50. Gorid'ko, NY; Sushko, VG; Teselko, PA
      Anisotropy of fields of stress in Si monocrystals with ordered dislocationstructure

      MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
    51. Izumi, F; Yamamoto, A; Khasanova, NR; Kumazawa, S; Hu, WZ; Kamiyama, T
      Novel techniques of neutron powder diffraction and their applications to superconducting oxides

      PHYSICA C
    52. Stierle, A; Formoso, V; Comin, F; Schmitz, G; Franchy, R
      Oxidation of NiAl(100) studied with surface sensitive X-ray diffraction

      PHYSICA B
    53. Wechsler, D; Zsigmond, G; Streffer, F; Stride, JA; Mezei, F
      Monte-Carlo simulations for instrumentation at pulsed and continuous sources

      PHYSICA B
    54. Bellmann, D; Staron, P; Becker, P
      Performance of a double crystal diffractometer with different channel-cut perfect Si crystals

      PHYSICA B
    55. Fischer, P; Frey, G; Koch, M; Konnecke, M; Pomjakushin, V; Schefer, J; Thut, R; Schlumpf, N; Burge, R; Greuter, U; Bondt, S; Berruyer, E
      High-resolution powder diffractometer HRPT for thermal neutrons at SINQ

      PHYSICA B
    56. Ohms, C; Youtsos, AG; Bontenbal, A; Mulder, FM
      Neutron diffraction facilities at the high flux reactor, Petten

      PHYSICA B
    57. Bleif, HJ; Wechsler, D; Mezei, F
      TOF powder diffractometer on a reactor source

      PHYSICA B
    58. Popa, NC; Ionita, I
      The instrumental profile for a neutron powder diffractometer in focusing geometry

      PHYSICA B
    59. Kandyel, E; Kamiyama, T; Oikawa, K; Torii, S; Mori, K; Asano, H; Sekkina, MA
      Oxygen configuration in the superconductor (Hg0.7Mo0.3)Sr-2(Ca1-xRx)Cu2Oz (R = Nd and Pr)

      JOURNAL OF SUPERCONDUCTIVITY
    60. Njeh, A; Wieder, T; Fuess, H
      Grazing excidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films

      POWDER DIFFRACTION
    61. Subramanian, N; Shekar, NVC; Sahu, PC; Yousuf, M; Rajan, KG
      Powder X-ray diffraction data of BaFI

      POWDER DIFFRACTION
    62. Sawada, H
      Estimation and correction of effects of simultaneous reflections on intensity data collected with the four-circle diffractometer

      CRYSTAL RESEARCH AND TECHNOLOGY
    63. Leiss, B; Ullemeyer, K; Weber, K; Brokmeier, HG; Bunge, HJ; Drury, M; Faul, U; Fueten, F; Frischbutter, A; Klein, H; Kuhs, W; Launeau, P; Lloyd, GE; Prior, DJ; Scheffzuk, C; Weiss, T; Walther, K; Wenk, HR
      Recent developments and goals in texture research of geological materials - Preface

      JOURNAL OF STRUCTURAL GEOLOGY
    64. Ullemeyer, K; Braun, G; Dahms, M; Kruhl, JH; Olesen, NO; Siegesmund, S
      Texture analysis of a muscovite-bearing quartzite: a comparison of some currently used techniques

      JOURNAL OF STRUCTURAL GEOLOGY
    65. Mocuta, C; Barbier, A; Renaud, G
      CoO(111) surface study by surface X-ray diffraction

      APPLIED SURFACE SCIENCE
    66. Saxena, AM
      Characteristics of thin-film multilayer monochromator systems from ray-tracing calculations

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    67. Wong, J; Waide, PA; Elmer, JW; Thompson, AC
      Spatially resolved diffraction using a Seller Collimator-Imaging plate assembly

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
    68. Sakata, O; Lyman, PF; Tinkham, BP; Walko, DA; Marasco, DL; Lee, TL; Bedzyk, MJ
      X-ray scattering study of the Ge(001): Te(1X1) surface structure

      PHYSICAL REVIEW B
    69. Herbstein, FH
      How precise are measurements of unit-cell dimensions from single crystals?

      ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
    70. Ohhara, T; Harada, J; Ohashi, Y; Tanaka, I; Kumazawa, S; Niimura, N
      Direct observation of deuterium migration in crystalline-state reaction bysingle-crystal neutron diffraction. II. 3-1 Photoisomerization of a cobaloxime complex

      ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE
    71. Nesterets, YI; Punegov, VI
      The statistical kinematical theory of X-ray diffraction as applied to reciprocal-space mapping

      ACTA CRYSTALLOGRAPHICA SECTION A
    72. Stierle, A; Formoso, V; Comin, F; Franchy, R
      Surface X-ray diffraction study ion the initial oxidation of NiAl(100)

      SURFACE SCIENCE
    73. Hong, H; Wu, Z; Chiang, TC; Zschack, P; Jemian, P; Chen, H; Aburano, RD
      Reflection surface x-ray diffraction patterns: k-space images

      REVIEW OF SCIENTIFIC INSTRUMENTS
    74. Geselbracht, MJ; Walton, RI; Cowell, ES; Millange, F; O'Hare, D
      A furnace for the in situ study of the formation of inorganic solids at high temperature using time-resolved energy-dispersive x-ray diffraction

      REVIEW OF SCIENTIFIC INSTRUMENTS
    75. Kobayashi, Y; Mitsunaga, T; Fujinawa, G; Arii, T; Suetake, M; Asai, K; Harada, J
      Structural phase transition from rhombohedral to cubic in LaCoO3

      JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN
    76. Madsen, LD; Charavel, R; Birch, J; Svedberg, EB
      Assessment of MgO(100) and (111) substrate quality by X-ray diffraction

      JOURNAL OF CRYSTAL GROWTH
    77. Saroun, J
      Evaluation of double-crystal SANS data influenced by multiple scattering

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    78. Jedrecy, N
      Coupling between spatial and angular variables in surface X-ray diffraction: effects on the line shapes and integrated intensities

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    79. Cheary, RW; Dooryhee, E; Lynch, P; Armstrong, N; Dligatch, S
      X-ray diffraction line broadening from thermally deposited gold films

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    80. Ahmed, FU; Tanaka, I; Niimura, N
      Performance of a multi-wavelength monochromator system for neutron single-crystal and powder diffraction

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    81. Vlieg, E
      ROD: A program for surface X-ray crystallography

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    82. Toraya, H
      Crystal structure refinement of alpha-Si3N4 using synchrotron radiation powder diffraction data: unbiased refinement strategy

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    83. Stoica, AD; Popovici, M; Yelon, WB; Berliner, R
      Position-sensitive analysis in curved-crystal three-axis neutron spectrometry (quasielastic scattering case)

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    84. Lippmann, T; Schneider, LR
      Accurate structure-factor measurements using high-energy synchrotron radiation: a test on cuprite, Cu2O

      JOURNAL OF APPLIED CRYSTALLOGRAPHY
    85. Uragami, T; Fujioka, H; Waki, I; Mano, T; Ono, K; Oshima, M; Takagi, Y; Kimura, M; Suzuki, T
      Generalized grazing incidence-angle X-ray diffraction studies on InAs quantum dots on Si (100) substrates

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    86. Kasahara, Y; Nishikawa, K
      Construction of small-angle X-ray scattering diffractometer using asymmetric channel-cut monochromator

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    87. Tsusaka, Y; Yokoyama, K; Takeda, S; Urakawa, M; Kagoshima, Y; Matsui, J; Kimura, S; Kimura, H; Kobayashi, K; Izumi, K
      Formation of parallel X-ray microbeam and its application

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    88. Hagdorn, K; Hohlwein, D; Ihringer, J; Knorr, K; Prandl, W; Ritter, H; Schmid, H; Zeiske, T
      Canted antiferromagnetism and magnetoelastic coupling in metallic Ho0.1Ca0.9MnO3

      EUROPEAN PHYSICAL JOURNAL B
    89. Volz, HM; Matyi, RJ
      High-resolution X-ray diffraction analyses of protein crystals

      PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES
    90. Guinebretiere, R; Dauger, A; Masson, O; Soulestin, B
      Sol-gel fabrication of heteroepitaxial zirconia films on MgO(001) substrates

      PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS ANDMECHANICAL PROPERTIES
    91. Kumar, A; Shamsuzzoha, M
      Effects of pre-treated substrates on the growth morphology of diamond films prepared by the hot filament chemical vapor deposition method

      NEW DIAMOND AND FRONTIER CARBON TECHNOLOGY
    92. Bell, AMT; Smith, JNB; Attfield, JP; Rawson, JM; Shankland, F; David, WIF
      A synchrotron X-ray powder diffraction study of 4-(2,3,4-trifluorophenyl)-1,2,3,5-dithiadiazolyl. Crystal structure determination using a global optimisation method

      NEW JOURNAL OF CHEMISTRY
    93. Lomov, AA; Bushuev, VA; Imamov, RM; Bocchi, C; Franzosi, P
      Asymptotic diffuse X-ray scattering by silicon-doped GaAs single crystals

      CRYSTALLOGRAPHY REPORTS
    94. Lin, WJ; Hatton, PD; Baudenbacher, F; Santiso, J
      Synchrotron X-ray studies of ultra-high-quality crystalline YBa2Cu3O7-delta in submicron thick films

      IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
    95. Niimura, N
      Neutrons expand the field of structural biology

      CURRENT OPINION IN STRUCTURAL BIOLOGY
    96. Fewster, PF
      Absolute lattice parameter measurement

      JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
    97. Amenitsch, H; Rauch, H; Seidl, E
      Ultra small angle neutron scattering from superconducting filament structures

      KERNTECHNIK
    98. Fourme, R; Shepard, W; Schiltz, M; Prange, T; Ramin, M; Kahn, R; de la Fortelle, E; Bricogne, G
      Better structures from better data through better methods: a review of developments in de novo macromolecular phasing techniques and associated instrumentation at LURE

      JOURNAL OF SYNCHROTRON RADIATION
    99. Yamamoto, A; Khasanova, NR; Izumi, F; Wu, XJ; Kamiyama, T; Torii, S; Tajima, S
      Crystal structure and its role in electrical properties of the perovskite CaPbO3 synthesized at high pressure

      CHEMISTRY OF MATERIALS
    100. Zhang, XG; Li, P; Parent, DW; Zhao, G; Ayers, JE; Jain, FC
      Comparison of X-ray diffraction methods for determination of the critical layer thickness for dislocation multiplication

      JOURNAL OF ELECTRONIC MATERIALS


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Documento generato il 22/10/20 alle ore 12:02:39