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1. Alkemade, PFA; Jiang, ZX
   Complex roughening of Si under oblique bombardment by low-energy oxygen ions
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
   
   P.F.A. Alkemade e Z.X. Jiang, "Complex roughening of Si under oblique bombardment by low-energy oxygen ions", J VAC SCI B, 19(5), 2001, pp. 1699-1705
2. Jiang, ZX; Backer, S; Lee, JJ; Wu, LY; Guenther, T; Sieloff, D; Choi, P; Foisy, M; Alkemade, PFA
   Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
   
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3. Deenapanray, PNK; Petravic, M
   Low energy O-2(+) and N-2(+) beam-induced profile broadening effects in Si
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
   
   P.N.K. Deenapanray e M. Petravic, "Low energy O-2(+) and N-2(+) beam-induced profile broadening effects in Si", J VAC SCI A, 19(3), 2001, pp. 893-898
4. Anfone, AB; Marcus, RK
   Radio frequency glow discharge optical emission spectrometry (rf-GD-OES) analysis of solid glass samples
   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
   
   A.B. Anfone e R.K. Marcus, "Radio frequency glow discharge optical emission spectrometry (rf-GD-OES) analysis of solid glass samples", J ANAL ATOM, 16(5), 2001, pp. 506-513
5. Menyhard, M; Zsolt, G; Chen, PJ; Powell, CJ; McMichael, RD; Egelhoff, WF
   Structural effects in the growth of giant magnetoresistance (GMR) spin valves
   APPLIED SURFACE SCIENCE
   
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6. Scheithauer, U
   Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections
   APPLIED SURFACE SCIENCE
   
   U. Scheithauer, "Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections", APPL SURF S, 179(1-4), 2001, pp. 20-24
7. Hodoroaba, VD; Unger, WES; Jenett, H; Hoffmann, V; Hagenhoff, B; Kayser, S; Wetzig, K
   Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS
   APPLIED SURFACE SCIENCE
   
   V.D. Hodoroaba et al., "Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS", APPL SURF S, 179(1-4), 2001, pp. 30-37
8. Willich, P; Steinberg, C
   SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components
   APPLIED SURFACE SCIENCE
   
   P. Willich e C. Steinberg, "SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components", APPL SURF S, 179(1-4), 2001, pp. 263-268
9. Bukaluk, A
   Auger electron spectroscopy investigations of the effect of degradation ofdepth resolution and its influence on the interdiffusion data in thin filmAu/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures
   APPLIED SURFACE SCIENCE
   
   A. Bukaluk, "Auger electron spectroscopy investigations of the effect of degradation ofdepth resolution and its influence on the interdiffusion data in thin filmAu/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures", APPL SURF S, 175, 2001, pp. 790-796
10. Szilagyi, E
    On the limitations introduced by energy spread in elastic recoil detectionanalysis
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    E. Szilagyi, "On the limitations introduced by energy spread in elastic recoil detectionanalysis", NUCL INST B, 183(1-2), 2001, pp. 25-33
11. Neumaier, P; Dollinger, G; Bergmaier, A; Genchev, I; Gorgens, L; Fischer, R; Ronning, C; Hofsass, H
    High-resolution elastic recoil detection utilizing Bayesian probability theory
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    P. Neumaier et al., "High-resolution elastic recoil detection utilizing Bayesian probability theory", NUCL INST B, 183(1-2), 2001, pp. 48-61
12. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Marcus, RK
    Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films
    SURFACE AND INTERFACE ANALYSIS
    
    K. Shimizu et al., "Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films", SURF INT AN, 31(9), 2001, pp. 869
13. Chen, L; Simmonds, MC; Habesch, S; Rodenburg, JM
    Crystal orientation effects on sputtering and depth resolution in GDOES
    SURFACE AND INTERFACE ANALYSIS
    
    L. Chen et al., "Crystal orientation effects on sputtering and depth resolution in GDOES", SURF INT AN, 31(3), 2001, pp. 206-211
14. Kobzev, AP; Kravtcov, EA; Romashev, LN; Semerikov, AV; Ustinov, VV
    Using of the high-grade layered structures for the demonstration of the depth resolution of the RBS method
    VACUUM
    
    A.P. Kobzev et al., "Using of the high-grade layered structures for the demonstration of the depth resolution of the RBS method", VACUUM, 63(4), 2001, pp. 501-505
15. Bukaluk, A
    Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures
    VACUUM
    
    A. Bukaluk, "Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures", VACUUM, 63(1-2), 2001, pp. 119-126
16. Zalar, A; Jagielski, J; Mozetic, M; Pracek, B; Panjan, P
    Ion beam mixing of Ni/Al multilayer structure at different temperatures
    VACUUM
    
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17. Barradas, NP
    Rutherford backscattering analysis of thin films and superlattices with roughness
    JOURNAL OF PHYSICS D-APPLIED PHYSICS
    
    N.P. Barradas, "Rutherford backscattering analysis of thin films and superlattices with roughness", J PHYS D, 34(14), 2001, pp. 2109-2116
18. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Wood, GC
    Migration of oxalate ions in anodic alumina
    ELECTROCHIMICA ACTA
    
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19. Wittmaack, K; Griesche, J; Osten, HJ; Patel, SB
    In search of optimum conditions for the growth of sharp and shallow B-delta markers in Si by molecular beam epitaxy
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    
    K. Wittmaack et al., "In search of optimum conditions for the growth of sharp and shallow B-delta markers in Si by molecular beam epitaxy", J VAC SCI B, 18(1), 2000, pp. 524-528
20. Wei, P; Cardoso, S; de Jesus, CM; Soares, JC; Freitas, PP; da Silva, MF
    RBS study of the interdiffusion effect between CoFe/MnIr layers in tunnel junctions
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    P. Wei et al., "RBS study of the interdiffusion effect between CoFe/MnIr layers in tunnel junctions", NUCL INST B, 170(1-2), 2000, pp. 205-210
21. Szilagyi, E
    Energy spread in ion beam analysis
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    E. Szilagyi, "Energy spread in ion beam analysis", NUCL INST B, 161, 2000, pp. 37-47
22. Simon, A; Csik, A; Paszti, F; Kiss, AZ; Beke, DL; Daroczi, L; Erdelyi, Z; Langer, GA
    Study of interdiffusion in amorphous Si/Ge multilayers by Rutherford backscattering spectrometry
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    A. Simon et al., "Study of interdiffusion in amorphous Si/Ge multilayers by Rutherford backscattering spectrometry", NUCL INST B, 161, 2000, pp. 471-475
23. Hofmann, S
    Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS
    SURFACE AND INTERFACE ANALYSIS
    
    S. Hofmann, "Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS", SURF INT AN, 30(1), 2000, pp. 228-236
24. Zalar, A; Pracek, B; Panjan, P
    Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers
    SURFACE AND INTERFACE ANALYSIS
    
    A. Zalar et al., "Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers", SURF INT AN, 30(1), 2000, pp. 247-250
25. Richter, S; Lesch, N; Karduck, P
    Characterization of a heat-insulating coating on floatglass by sputter-assisted EPMA
    SURFACE AND INTERFACE ANALYSIS
    
    S. Richter et al., "Characterization of a heat-insulating coating on floatglass by sputter-assisted EPMA", SURF INT AN, 30(1), 2000, pp. 260-263
26. Bukaluk, A
    Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers
    SURFACE AND INTERFACE ANALYSIS
    
    A. Bukaluk, "Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers", SURF INT AN, 30(1), 2000, pp. 597-602
27. Moon, DW; Won, JY; Kim, KJ; Kim, HJ; Kang, HJ; Petravic, M
    GaAs delta-doped layers in Si for evaluation of SIMS depth resolution
    SURFACE AND INTERFACE ANALYSIS
    
    D.W. Moon et al., "GaAs delta-doped layers in Si for evaluation of SIMS depth resolution", SURF INT AN, 29(6), 2000, pp. 362-368
28. Kudriavtsev, Y; Villegas, A; Godines, A; Ecker, P; Asomoza, R; Nikishin, S; Jin, C; Faleev, N; Temkin, H
    SIMS study of GaAsN/GaAs multiple quantum wells
    SURFACE AND INTERFACE ANALYSIS
    
    Y. Kudriavtsev et al., "SIMS study of GaAsN/GaAs multiple quantum wells", SURF INT AN, 29(6), 2000, pp. 399-402
29. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Wood, GC
    Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films
    SURFACE AND INTERFACE ANALYSIS
    
    K. Shimizu et al., "Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films", SURF INT AN, 29(2), 2000, pp. 155-159
30. Deenapanray, PNK; Petravic, M
    On the segregation of Ca at SiO2/Si interface during oxygen ion bombardment
    SURFACE AND INTERFACE ANALYSIS
    
    P.N.K. Deenapanray e M. Petravic, "On the segregation of Ca at SiO2/Si interface during oxygen ion bombardment", SURF INT AN, 29(2), 2000, pp. 160-167
31. Seah, MP; Spencer, SJ; Cumpson, PJ; Johnstone, JE
    Sputter-induced cone and filament formation on InP and AFM tip shape determination
    SURFACE AND INTERFACE ANALYSIS
    
    M.P. Seah et al., "Sputter-induced cone and filament formation on InP and AFM tip shape determination", SURF INT AN, 29(11), 2000, pp. 782-790
32. Seah, MP; Spencer, SJ; Gilmore, IS; Johnstone, JE
    Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS
    SURFACE AND INTERFACE ANALYSIS
    
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33. Kolar, M; Dobcnik, D; Radic, N
    Potentiometric flow-injection determination of vitamin C and glutathione with a chemically prepared tubular silver electrode
    PHARMAZIE
    
    M. Kolar et al., "Potentiometric flow-injection determination of vitamin C and glutathione with a chemically prepared tubular silver electrode", PHARMAZIE, 55(12), 2000, pp. 913-916
34. Gerardi, C; Tagliente, MA; Del Vecchio, A; Tapfer, L; Coccorese, C; Attanasio, C; Mercaldo, LV; Maritato, L; Slaughter, JM; Falco, CM
    Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers
    JOURNAL OF APPLIED PHYSICS
    
    C. Gerardi et al., "Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers", J APPL PHYS, 87(2), 2000, pp. 717-723
35. Everall, NJ
    Confocal Raman microscopy: Why the depth resolution and spatial accuracy can be much worse than you think
    APPLIED SPECTROSCOPY
    
    N.J. Everall, "Confocal Raman microscopy: Why the depth resolution and spatial accuracy can be much worse than you think", APPL SPECTR, 54(10), 2000, pp. 1515-1520
36. Puga-Lambers, M; Lambers, ES; Holloway, PH
    Electron beam oxidation of shallow implants
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    
    M. Puga-Lambers et al., "Electron beam oxidation of shallow implants", MAT SC S PR, 2(3), 1999, pp. 209-217
37. Dupuy, JC
    SIMS analysis in thin semiconductor films
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS
    
    J.C. Dupuy, "SIMS analysis in thin semiconductor films", VIDE, 54(292), 1999, pp. 160
38. Hong, W; Hayakawa, S; Maeda, K; Fukuda, S; Gohshi, Y
    Light element analysis in steel by high-energy heavy-ion time of flight elastic recoil detection analysis
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
    
    W. Hong et al., "Light element analysis in steel by high-energy heavy-ion time of flight elastic recoil detection analysis", SPECT ACT B, 54(1), 1999, pp. 151-157
39. Asam, T
    Glow discharge optical spectroscopy depth profile analysis of conductive and nonconductive samples in a commercial service laboratory
    SURFACE & COATINGS TECHNOLOGY
    
    T. Asam, "Glow discharge optical spectroscopy depth profile analysis of conductive and nonconductive samples in a commercial service laboratory", SURF COAT, 119, 1999, pp. 310-312
40. Rar, A; Hofmann, S; Yoshihara, K; Kajiwara, K
    Optimization of depth resolution parameters in AES sputter profiling of GaAs AlAs multilayer structures
    APPLIED SURFACE SCIENCE
    
    A. Rar et al., "Optimization of depth resolution parameters in AES sputter profiling of GaAs AlAs multilayer structures", APPL SURF S, 145, 1999, pp. 310-314
41. Kornich, GV; Betz, G; Bazhin, AI
    Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    
    G.V. Kornich et al., "Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment", NUCL INST B, 152(4), 1999, pp. 437-448
42. Linnarsson, MK; Svensson, BG
    Cascade mixing in AlxGa1-xAs/GaAs during sputter profiling by noble-gas ions
    PHYSICAL REVIEW B-CONDENSED MATTER
    
    M.K. Linnarsson e B.G. Svensson, "Cascade mixing in AlxGa1-xAs/GaAs during sputter profiling by noble-gas ions", PHYS REV B, 60(20), 1999, pp. 14302-14310
43. Schlichting, F; Berger, D; Niedrig, H
    Thickness determination of ultra-thin films using backscattered electron spectra of a new toroidal electrostatic spectrometer
    SCANNING
    
    F. Schlichting et al., "Thickness determination of ultra-thin films using backscattered electron spectra of a new toroidal electrostatic spectrometer", SCANNING, 21(3), 1999, pp. 197-203
44. Sykes, DE
    SIMS with sample rotation: an experimental novelty or a practical necessity?
    SURFACE AND INTERFACE ANALYSIS
    
    D.E. Sykes, "SIMS with sample rotation: an experimental novelty or a practical necessity?", SURF INT AN, 28(1), 1999, pp. 49-55
45. Goschnick, J; Natzeck, C; Sommer, M
    Discrete shape analysis of the energy distribution to discriminate non-atomic signal contributions in depth profiling with SNMS
    SURFACE AND INTERFACE ANALYSIS
    
    J. Goschnick et al., "Discrete shape analysis of the energy distribution to discriminate non-atomic signal contributions in depth profiling with SNMS", SURF INT AN, 28(1), 1999, pp. 56-60
46. Hofmann, S
    From depth resolution to depth resolution function: Refinement of the concept for delta layers, single layers and multilayers
    SURFACE AND INTERFACE ANALYSIS
    
    S. Hofmann, "From depth resolution to depth resolution function: Refinement of the concept for delta layers, single layers and multilayers", SURF INT AN, 27(9), 1999, pp. 825-834
47. Jiang, ZX; Alkemade, PFA
    The surface transient in Si for SIMS with oblique low-energy O-2(+) beams
    SURFACE AND INTERFACE ANALYSIS
    
    Z.X. Jiang e P.F.A. Alkemade, "The surface transient in Si for SIMS with oblique low-energy O-2(+) beams", SURF INT AN, 27(3), 1999, pp. 125-131
48. Shimizu, K; Brown, GM; Habazaki, H; Kobayashi, K; Skeldon, P; Thompson, GE; Wood, GC
    Influence of surface roughness on the depth resolution of GDOES depth profiling analysis
    SURFACE AND INTERFACE ANALYSIS
    
    K. Shimizu et al., "Influence of surface roughness on the depth resolution of GDOES depth profiling analysis", SURF INT AN, 27(3), 1999, pp. 153-156
49. Deenapanray, PNK; Petravic, M
    Angular and energy dependence of the ion beam oxidation of Si using oxygenions from a duoplasmatron source
    SURFACE AND INTERFACE ANALYSIS
    
    P.N.K. Deenapanray e M. Petravic, "Angular and energy dependence of the ion beam oxidation of Si using oxygenions from a duoplasmatron source", SURF INT AN, 27(2), 1999, pp. 92-97
50. Carter, G
    The effects of surface ripples on sputtering erosion rates and secondary ion emission yields
    JOURNAL OF APPLIED PHYSICS
    
    G. Carter, "The effects of surface ripples on sputtering erosion rates and secondary ion emission yields", J APPL PHYS, 85(1), 1999, pp. 455-459
51. Lieb, KP
    Thin film analysis with nuclear methods
    CONTEMPORARY PHYSICS
    
    K.P. Lieb, "Thin film analysis with nuclear methods", CONT PHYS, 40(6), 1999, pp. 385-413
52. Dobcnik, D; Gros, I; Kolar, M
    A silver/silver sulphide selective electrode prepared by means of chemicaltreatment of silver wire
    ACTA CHIMICA SLOVENICA
    
    D. Dobcnik et al., "A silver/silver sulphide selective electrode prepared by means of chemicaltreatment of silver wire", ACTA CHIM S, 45(3), 1998, pp. 209-216
53. ROMERO D; LASERNA JJ
    SURFACE AND TOMOGRAPHIC DISTRIBUTION OF CARBON IMPURITIES IN PHOTONIC-GRADE SILICON USING LASER-INDUCED BREAKDOWN SPECTROMETRY
    Journal of analytical atomic spectrometry (Print)
    
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54. Gibeau, TE; Marcus, RK
    Influence of discharge parameters on the resultant sputtered crater shapesfor a radio frequency glow discharge mass spectrometry source
    JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
    
    T.E. Gibeau e R.K. Marcus, "Influence of discharge parameters on the resultant sputtered crater shapesfor a radio frequency glow discharge mass spectrometry source", J ANAL ATOM, 13(12), 1998, pp. 1303-1311
55. DANG TA; FRISK TA
    DEPTH RESOLUTION ADVANTAGES OF PLASMA SPUTTERING IN-DEPTH PROFILING OF CONDUCTIVE AND NONCONDUCTIVE MATERIALS
    Surface & coatings technology
    
    T.A. Dang e T.A. Frisk, "DEPTH RESOLUTION ADVANTAGES OF PLASMA SPUTTERING IN-DEPTH PROFILING OF CONDUCTIVE AND NONCONDUCTIVE MATERIALS", Surface & coatings technology, 106(1), 1998, pp. 60-65
56. BRACCONI P; NYBORG L
    QUANTITATIVE PHASE-ANALYSIS AND THICKNESS MEASUREMENT OF SURFACE-OXIDE LAYERS IN METAL AND ALLOY POWDERS BY THE CHEMICAL-GRANULAR METHOD
    Applied surface science
    
    P. Bracconi e L. Nyborg, "QUANTITATIVE PHASE-ANALYSIS AND THICKNESS MEASUREMENT OF SURFACE-OXIDE LAYERS IN METAL AND ALLOY POWDERS BY THE CHEMICAL-GRANULAR METHOD", Applied surface science, 133(1-2), 1998, pp. 129-147
57. ASOMOZA R; MERKULOVA O; MERKULOV A; VIDAL MA; SALAZAR B
    INFLUENCE OF ION SPUTTERING ON THE SURFACE-TOPOGRAPHY OF GAAS
    Applied surface science
    
    R. Asomoza et al., "INFLUENCE OF ION SPUTTERING ON THE SURFACE-TOPOGRAPHY OF GAAS", Applied surface science, 126(3-4), 1998, pp. 205-212
58. BARRADAS NP; JEYNES C; MIRONOV OA; PHILLIPS PJ; PARKER EHC
    HIGH DEPTH RESOLUTION RUTHERFORD BACKSCATTERING ANALYSIS OF SI-SI0.78GE0.22 (001)SI SUPERLATTICES/
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    N.P. Barradas et al., "HIGH DEPTH RESOLUTION RUTHERFORD BACKSCATTERING ANALYSIS OF SI-SI0.78GE0.22 (001)SI SUPERLATTICES/", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 239-243
59. ZIEGLER JF
    RBS ERD SIMULATION PROBLEMS - STOPPING POWERS, NUCLEAR-REACTIONS AND DETECTOR RESOLUTION/
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    J.F. Ziegler, "RBS ERD SIMULATION PROBLEMS - STOPPING POWERS, NUCLEAR-REACTIONS AND DETECTOR RESOLUTION/", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 141-146
60. TAVARES CJ; REBOUTA L; ALVES EJ; ALMEIDA B; SOUSA JBE; DASILVA MF; SOARES JC
    INTERFACIAL ROUGHNESS OF MULTILAYERED TIN ZRN COATINGS/
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    C.J. Tavares et al., "INTERFACIAL ROUGHNESS OF MULTILAYERED TIN ZRN COATINGS/", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 278-282
61. DOLLINGER G; FREY CM; BERGMAIER A; FAESTERMANN T
    ELASTIC RECOIL DETECTION WITH SINGLE ATOMIC LAYER DEPTH RESOLUTION
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    G. Dollinger et al., "ELASTIC RECOIL DETECTION WITH SINGLE ATOMIC LAYER DEPTH RESOLUTION", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 603-610
62. YESIL IM; ASSMANN W; HUBER H; LOBNER KEG
    SIMULATION OF SURFACE-ROUGHNESS EFFECTS IN ERDA
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    I.M. Yesil et al., "SIMULATION OF SURFACE-ROUGHNESS EFFECTS IN ERDA", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 623-627
63. ELLIMAN RG; TIMMERS H; PALMER GR; OPHEL TR
    LIMITATIONS TO DEPTH RESOLUTION IN HIGH-ENERGY, HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    R.G. Elliman et al., "LIMITATIONS TO DEPTH RESOLUTION IN HIGH-ENERGY, HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 649-653
64. STEINBAUER E; BENKA O; STEINBATZ M
    A NEW SETUP FOR ELASTIC RECOIL ANALYSIS USING ION-INDUCED ELECTRON-EMISSION FOR PARTICLE IDENTIFICATION
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    E. Steinbauer et al., "A NEW SETUP FOR ELASTIC RECOIL ANALYSIS USING ION-INDUCED ELECTRON-EMISSION FOR PARTICLE IDENTIFICATION", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 695-700
65. SZILAGYI E; WIELUNSKI LS; PASZTI F
    THEORETICAL APPROXIMATION OF ENERGY-DISTRIBUTION OF ELASTICALLY RECOILED HYDROGEN-ATOMS
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    E. Szilagyi et al., "THEORETICAL APPROXIMATION OF ENERGY-DISTRIBUTION OF ELASTICALLY RECOILED HYDROGEN-ATOMS", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 701-706
66. WIELUNSKI LS; SZILAGYI E; HARDING GL
    MULTIPLE-SCATTERING EFFECTS IN-DEPTH RESOLUTION OF ELASTIC RECOIL DETECTION
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    L.S. Wielunski et al., "MULTIPLE-SCATTERING EFFECTS IN-DEPTH RESOLUTION OF ELASTIC RECOIL DETECTION", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 713-718
67. HIGASHI Y; MARUO T; HOMMA Y
    DEPTH PROFILING OF AN IN0.53GA0.47AS INP MULTILAYER SAMPLE USING GRAZING-INCIDENCE SPUTTERED NEUTRAL MASS-SPECTROMETRY WITH LASER POST-IONIZATION/
    Surface and interface analysis
    
    Y. Higashi et al., "DEPTH PROFILING OF AN IN0.53GA0.47AS INP MULTILAYER SAMPLE USING GRAZING-INCIDENCE SPUTTERED NEUTRAL MASS-SPECTROMETRY WITH LASER POST-IONIZATION/", Surface and interface analysis, 26(3), 1998, pp. 220-223
68. KIM KJ; JUNG KH
    MECHANISM OF FACET FORMATION ON NI SURFACES BY SPUTTERING WITH OXYGEN-ION BEAMS
    Surface and interface analysis
    
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69. PAN JS; TAY ST; HUAN CHA; WEE ATS
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70. PUGALAMBERS M; HOLLOWAY PH
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71. Gautier, B; Prudon, G; Dupuy, JC
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72. Menyhard, M
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73. PARK JW; ROULEAU CM; LOWNDES DH
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    Journal of crystal growth
    
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74. Cardenas, J; Svensson, BG; Petravic, M
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    JOURNAL OF APPLIED PHYSICS
    
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75. HOFMANN S; RAR A
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    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    
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76. OECHSNER H
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    Glass science and technology
    
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77. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
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    Analytical sciences
    
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78. DOYLE BP; MACLEAR RD; CONNELL SH; FORMENTI P; MACHI IZ; BUTLER JE; SCHAAFF P; SELLSCHOP JPF; SIDERASHADDAD E; BHARUTHRAM K
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    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
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79. PLAMANN K; BEHRISCH R
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    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
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80. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
    DEVELOPMENT OF A HIGH MASS-RESOLUTION TOF-ERDA SYSTEM FOR A WIDE MASSRANGE
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
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81. ELST K; ADRIAENS A; ADAMS F
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    International journal of mass spectrometry and ion processes
    
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82. CHU DP; DOWSETT MG
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    Physical review. B, Condensed matter
    
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84. BENNETT J
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85. GAUTIER B; DUPUY JC; PROST R; PRUDON G
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86. JIANG ZX; ALKEMADE PFA; ALGRA E; RADELAAR S
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87. TAKAKUWAHONGO C; TOMITA M
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88. JIANG ZX; ALKEMADE PFA
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89. ZALAR A; HOFMANN S; PANJAN P
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    Vacuum
    
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90. MIRONOV OA; PHILLIPS PJ; PARKER EHC; DOWSETT MG; BARRADAS NP; JEYNES C; MIRONOV M; GNEZDILOV VP; USHAKOV V; EREMENKO VV
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91. ECKE G; ROSSLER H; CIMALLA V; PEZOLDT J
    INTERPRETATION OF AUGER DEPTH PROFILES OF THIN SIC LAYERS ON SI
    Mikrochimica acta
    
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92. FITTING HJ; KUHR JC; GOLDBERG M; BECHER B; BARFELS T
    EDX DEPTHS ANALYSIS OF MIS-STRUCTURES
    Mikrochimica acta
    
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93. DEGRAUW CJ; SIJTSEMA NM; OTTO C; GREVE J
    AXIAL RESOLUTION OF CONFOCAL RAMAN MICROSCOPES - GAUSSIAN-BEAM THEORYAND PRACTICE
    Journal of Microscopy
    
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94. NURMELA A; RAUHALA E; RAISANEN J
    ELASTIC-SCATTERING CROSS-SECTIONS FOR THE P-24 MEV( HE SYSTEM IN THE ENERGY REGION OF 1.4)
    Journal of applied physics
    
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95. BEENEN A; SPANNER G; NIESSNER R
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    Applied spectroscopy
    
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96. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
    DETERMINATION OF THE MASS RESOLUTION AND THE DEPTH RESOLUTION OF TIME-OF-FLIGHT ELASTIC RECOIL DETECTION ANALYSIS USING HEAVY-ION BEAMS
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
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97. MATHIEU HJ
    AES AND XPS DEPTH PROFILE ANALYSIS - A CRITICAL-REVIEW
    Le Vide
    
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98. BRADLEY RM
    DYNAMIC SCALING OF ION-SPUTTERED ROTATING SURFACES
    Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
    
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99. DOBCNIK D; STERGULEC J; GOMISCEK S
    PREPARATION OF AN IODIDE ION-SELECTIVE ELECTRODE BY CHEMICAL TREATMENT OF A SILVER WIRE
    Fresenius' journal of analytical chemistry
    
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100. VAJO JJ; DOTY RE; CIRLIN EH
     INFLUENCE OF O-2(-INDUCED RIPPLE TOPOGRAPHY ON SILICON() ENERGY, FLUX, AND FLUENCE ON THE FORMATION AND GROWTH OF SPUTTERING)
     Journal of vacuum science & technology. A. Vacuum, surfaces, and films
     
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