Catalogo Articoli (Spogli Riviste)

HELP
ATTENZIONE: attualmente gli articoli Current Contents (fonte ISI) a partire dall'anno 2002 sono consultabili sulla Risorsa On-Line

Le informazioni sugli articoli di fonte ISI sono coperte da copyright

La ricerca find articoli where soggetti phrase all words 'DEPTH-RESOLUTION' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 151 riferimenti
Si mostrano 100 riferimenti a partire da 1
Selezionare un intervallo

Per ulteriori informazioni selezionare i riferimenti di interesse.

    1. Alkemade, PFA; Jiang, ZX
      Complex roughening of Si under oblique bombardment by low-energy oxygen ions

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    2. Jiang, ZX; Backer, S; Lee, JJ; Wu, LY; Guenther, T; Sieloff, D; Choi, P; Foisy, M; Alkemade, PFA
      Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    3. Deenapanray, PNK; Petravic, M
      Low energy O-2(+) and N-2(+) beam-induced profile broadening effects in Si

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    4. Anfone, AB; Marcus, RK
      Radio frequency glow discharge optical emission spectrometry (rf-GD-OES) analysis of solid glass samples

      JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
    5. Menyhard, M; Zsolt, G; Chen, PJ; Powell, CJ; McMichael, RD; Egelhoff, WF
      Structural effects in the growth of giant magnetoresistance (GMR) spin valves

      APPLIED SURFACE SCIENCE
    6. Scheithauer, U
      Improved sputter depth resolution in Auger thin film analysis using in situ low angle cross-sections

      APPLIED SURFACE SCIENCE
    7. Hodoroaba, VD; Unger, WES; Jenett, H; Hoffmann, V; Hagenhoff, B; Kayser, S; Wetzig, K
      Depth profiling of electrically non-conductive layered samples by RF-GDOESand HFM plasma SNMS

      APPLIED SURFACE SCIENCE
    8. Willich, P; Steinberg, C
      SIMS depth profile analysis of wear resistant coatings on cutting tools and technical components

      APPLIED SURFACE SCIENCE
    9. Bukaluk, A
      Auger electron spectroscopy investigations of the effect of degradation ofdepth resolution and its influence on the interdiffusion data in thin filmAu/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures

      APPLIED SURFACE SCIENCE
    10. Szilagyi, E
      On the limitations introduced by energy spread in elastic recoil detectionanalysis

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    11. Neumaier, P; Dollinger, G; Bergmaier, A; Genchev, I; Gorgens, L; Fischer, R; Ronning, C; Hofsass, H
      High-resolution elastic recoil detection utilizing Bayesian probability theory

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    12. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Marcus, RK
      Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films

      SURFACE AND INTERFACE ANALYSIS
    13. Chen, L; Simmonds, MC; Habesch, S; Rodenburg, JM
      Crystal orientation effects on sputtering and depth resolution in GDOES

      SURFACE AND INTERFACE ANALYSIS
    14. Kobzev, AP; Kravtcov, EA; Romashev, LN; Semerikov, AV; Ustinov, VV
      Using of the high-grade layered structures for the demonstration of the depth resolution of the RBS method

      VACUUM
    15. Bukaluk, A
      Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures

      VACUUM
    16. Zalar, A; Jagielski, J; Mozetic, M; Pracek, B; Panjan, P
      Ion beam mixing of Ni/Al multilayer structure at different temperatures

      VACUUM
    17. Barradas, NP
      Rutherford backscattering analysis of thin films and superlattices with roughness

      JOURNAL OF PHYSICS D-APPLIED PHYSICS
    18. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Wood, GC
      Migration of oxalate ions in anodic alumina

      ELECTROCHIMICA ACTA
    19. Wittmaack, K; Griesche, J; Osten, HJ; Patel, SB
      In search of optimum conditions for the growth of sharp and shallow B-delta markers in Si by molecular beam epitaxy

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    20. Wei, P; Cardoso, S; de Jesus, CM; Soares, JC; Freitas, PP; da Silva, MF
      RBS study of the interdiffusion effect between CoFe/MnIr layers in tunnel junctions

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    21. Szilagyi, E
      Energy spread in ion beam analysis

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    22. Simon, A; Csik, A; Paszti, F; Kiss, AZ; Beke, DL; Daroczi, L; Erdelyi, Z; Langer, GA
      Study of interdiffusion in amorphous Si/Ge multilayers by Rutherford backscattering spectrometry

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    23. Hofmann, S
      Ultimate depth resolution and profile reconstruction in sputter profiling with AES and SIMS

      SURFACE AND INTERFACE ANALYSIS
    24. Zalar, A; Pracek, B; Panjan, P
      Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers

      SURFACE AND INTERFACE ANALYSIS
    25. Richter, S; Lesch, N; Karduck, P
      Characterization of a heat-insulating coating on floatglass by sputter-assisted EPMA

      SURFACE AND INTERFACE ANALYSIS
    26. Bukaluk, A
      Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers

      SURFACE AND INTERFACE ANALYSIS
    27. Moon, DW; Won, JY; Kim, KJ; Kim, HJ; Kang, HJ; Petravic, M
      GaAs delta-doped layers in Si for evaluation of SIMS depth resolution

      SURFACE AND INTERFACE ANALYSIS
    28. Kudriavtsev, Y; Villegas, A; Godines, A; Ecker, P; Asomoza, R; Nikishin, S; Jin, C; Faleev, N; Temkin, H
      SIMS study of GaAsN/GaAs multiple quantum wells

      SURFACE AND INTERFACE ANALYSIS
    29. Shimizu, K; Habazaki, H; Skeldon, P; Thompson, GE; Wood, GC
      Influence of argon pressure on the depth resolution during GDOES depth profiling analysis of thin films

      SURFACE AND INTERFACE ANALYSIS
    30. Deenapanray, PNK; Petravic, M
      On the segregation of Ca at SiO2/Si interface during oxygen ion bombardment

      SURFACE AND INTERFACE ANALYSIS
    31. Seah, MP; Spencer, SJ; Cumpson, PJ; Johnstone, JE
      Sputter-induced cone and filament formation on InP and AFM tip shape determination

      SURFACE AND INTERFACE ANALYSIS
    32. Seah, MP; Spencer, SJ; Gilmore, IS; Johnstone, JE
      Depth resolution in sputter depth profiling-characterization of a third batch of tantalum pentoxide on tantalum certified reference material by AES and SIMS

      SURFACE AND INTERFACE ANALYSIS
    33. Kolar, M; Dobcnik, D; Radic, N
      Potentiometric flow-injection determination of vitamin C and glutathione with a chemically prepared tubular silver electrode

      PHARMAZIE
    34. Gerardi, C; Tagliente, MA; Del Vecchio, A; Tapfer, L; Coccorese, C; Attanasio, C; Mercaldo, LV; Maritato, L; Slaughter, JM; Falco, CM
      Secondary ion mass spectrometry and x-ray analysis of superconducting Nb/Pd multilayers

      JOURNAL OF APPLIED PHYSICS
    35. Everall, NJ
      Confocal Raman microscopy: Why the depth resolution and spatial accuracy can be much worse than you think

      APPLIED SPECTROSCOPY
    36. Puga-Lambers, M; Lambers, ES; Holloway, PH
      Electron beam oxidation of shallow implants

      MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
    37. Dupuy, JC
      SIMS analysis in thin semiconductor films

      VIDE-SCIENCE TECHNIQUE ET APPLICATIONS
    38. Hong, W; Hayakawa, S; Maeda, K; Fukuda, S; Gohshi, Y
      Light element analysis in steel by high-energy heavy-ion time of flight elastic recoil detection analysis

      SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
    39. Asam, T
      Glow discharge optical spectroscopy depth profile analysis of conductive and nonconductive samples in a commercial service laboratory

      SURFACE & COATINGS TECHNOLOGY
    40. Rar, A; Hofmann, S; Yoshihara, K; Kajiwara, K
      Optimization of depth resolution parameters in AES sputter profiling of GaAs AlAs multilayer structures

      APPLIED SURFACE SCIENCE
    41. Kornich, GV; Betz, G; Bazhin, AI
      Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment

      NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
    42. Linnarsson, MK; Svensson, BG
      Cascade mixing in AlxGa1-xAs/GaAs during sputter profiling by noble-gas ions

      PHYSICAL REVIEW B-CONDENSED MATTER
    43. Schlichting, F; Berger, D; Niedrig, H
      Thickness determination of ultra-thin films using backscattered electron spectra of a new toroidal electrostatic spectrometer

      SCANNING
    44. Sykes, DE
      SIMS with sample rotation: an experimental novelty or a practical necessity?

      SURFACE AND INTERFACE ANALYSIS
    45. Goschnick, J; Natzeck, C; Sommer, M
      Discrete shape analysis of the energy distribution to discriminate non-atomic signal contributions in depth profiling with SNMS

      SURFACE AND INTERFACE ANALYSIS
    46. Hofmann, S
      From depth resolution to depth resolution function: Refinement of the concept for delta layers, single layers and multilayers

      SURFACE AND INTERFACE ANALYSIS
    47. Jiang, ZX; Alkemade, PFA
      The surface transient in Si for SIMS with oblique low-energy O-2(+) beams

      SURFACE AND INTERFACE ANALYSIS
    48. Shimizu, K; Brown, GM; Habazaki, H; Kobayashi, K; Skeldon, P; Thompson, GE; Wood, GC
      Influence of surface roughness on the depth resolution of GDOES depth profiling analysis

      SURFACE AND INTERFACE ANALYSIS
    49. Deenapanray, PNK; Petravic, M
      Angular and energy dependence of the ion beam oxidation of Si using oxygenions from a duoplasmatron source

      SURFACE AND INTERFACE ANALYSIS
    50. Carter, G
      The effects of surface ripples on sputtering erosion rates and secondary ion emission yields

      JOURNAL OF APPLIED PHYSICS
    51. Lieb, KP
      Thin film analysis with nuclear methods

      CONTEMPORARY PHYSICS
    52. Dobcnik, D; Gros, I; Kolar, M
      A silver/silver sulphide selective electrode prepared by means of chemicaltreatment of silver wire

      ACTA CHIMICA SLOVENICA
    53. ROMERO D; LASERNA JJ
      SURFACE AND TOMOGRAPHIC DISTRIBUTION OF CARBON IMPURITIES IN PHOTONIC-GRADE SILICON USING LASER-INDUCED BREAKDOWN SPECTROMETRY

      Journal of analytical atomic spectrometry (Print)
    54. Gibeau, TE; Marcus, RK
      Influence of discharge parameters on the resultant sputtered crater shapesfor a radio frequency glow discharge mass spectrometry source

      JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
    55. DANG TA; FRISK TA
      DEPTH RESOLUTION ADVANTAGES OF PLASMA SPUTTERING IN-DEPTH PROFILING OF CONDUCTIVE AND NONCONDUCTIVE MATERIALS

      Surface & coatings technology
    56. BRACCONI P; NYBORG L
      QUANTITATIVE PHASE-ANALYSIS AND THICKNESS MEASUREMENT OF SURFACE-OXIDE LAYERS IN METAL AND ALLOY POWDERS BY THE CHEMICAL-GRANULAR METHOD

      Applied surface science
    57. ASOMOZA R; MERKULOVA O; MERKULOV A; VIDAL MA; SALAZAR B
      INFLUENCE OF ION SPUTTERING ON THE SURFACE-TOPOGRAPHY OF GAAS

      Applied surface science
    58. BARRADAS NP; JEYNES C; MIRONOV OA; PHILLIPS PJ; PARKER EHC
      HIGH DEPTH RESOLUTION RUTHERFORD BACKSCATTERING ANALYSIS OF SI-SI0.78GE0.22 (001)SI SUPERLATTICES/

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    59. ZIEGLER JF
      RBS ERD SIMULATION PROBLEMS - STOPPING POWERS, NUCLEAR-REACTIONS AND DETECTOR RESOLUTION/

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    60. TAVARES CJ; REBOUTA L; ALVES EJ; ALMEIDA B; SOUSA JBE; DASILVA MF; SOARES JC
      INTERFACIAL ROUGHNESS OF MULTILAYERED TIN ZRN COATINGS/

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    61. DOLLINGER G; FREY CM; BERGMAIER A; FAESTERMANN T
      ELASTIC RECOIL DETECTION WITH SINGLE ATOMIC LAYER DEPTH RESOLUTION

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    62. YESIL IM; ASSMANN W; HUBER H; LOBNER KEG
      SIMULATION OF SURFACE-ROUGHNESS EFFECTS IN ERDA

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    63. ELLIMAN RG; TIMMERS H; PALMER GR; OPHEL TR
      LIMITATIONS TO DEPTH RESOLUTION IN HIGH-ENERGY, HEAVY-ION ELASTIC RECOIL DETECTION ANALYSIS

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    64. STEINBAUER E; BENKA O; STEINBATZ M
      A NEW SETUP FOR ELASTIC RECOIL ANALYSIS USING ION-INDUCED ELECTRON-EMISSION FOR PARTICLE IDENTIFICATION

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    65. SZILAGYI E; WIELUNSKI LS; PASZTI F
      THEORETICAL APPROXIMATION OF ENERGY-DISTRIBUTION OF ELASTICALLY RECOILED HYDROGEN-ATOMS

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    66. WIELUNSKI LS; SZILAGYI E; HARDING GL
      MULTIPLE-SCATTERING EFFECTS IN-DEPTH RESOLUTION OF ELASTIC RECOIL DETECTION

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    67. HIGASHI Y; MARUO T; HOMMA Y
      DEPTH PROFILING OF AN IN0.53GA0.47AS INP MULTILAYER SAMPLE USING GRAZING-INCIDENCE SPUTTERED NEUTRAL MASS-SPECTROMETRY WITH LASER POST-IONIZATION/

      Surface and interface analysis
    68. KIM KJ; JUNG KH
      MECHANISM OF FACET FORMATION ON NI SURFACES BY SPUTTERING WITH OXYGEN-ION BEAMS

      Surface and interface analysis
    69. PAN JS; TAY ST; HUAN CHA; WEE ATS
      ATOMIC-FORCE MICROSCOPY INVESTIGATION OF THE O-2(-INDUCED SURFACE-TOPOGRAPHY OF INP())

      Surface and interface analysis
    70. PUGALAMBERS M; HOLLOWAY PH
      CHARACTERIZATION OF SHALLOW IMPLANTS WITH SIMS USING ELECTRON-BEAM-ASSISTED OXYGEN BOMBARDMENT WITH OXYGEN BACKFILL

      Surface and interface analysis
    71. Gautier, B; Prudon, G; Dupuy, JC
      Toward a better reliability in the deconvolution of SIMS depth profiles

      SURFACE AND INTERFACE ANALYSIS
    72. Menyhard, M
      On the performance of the TRIM simulation for the evaluation of Auger depth profiles

      SURFACE AND INTERFACE ANALYSIS
    73. PARK JW; ROULEAU CM; LOWNDES DH
      HETEROEPITAXIAL GROWTH OF N-TYPE CDSE ON GAAS(001) BY PULSED-LASER DEPOSITION - STUDIES OF FILM-SUBSTRATE INTERDIFFUSION AND INDIUM DIFFUSION

      Journal of crystal growth
    74. Cardenas, J; Svensson, BG; Petravic, M
      Evidence for the influence of thermal spikes on ion induced mixing in Si at energies between 3 and 300 keV

      JOURNAL OF APPLIED PHYSICS
    75. HOFMANN S; RAR A
      ULTRAHIGH-RESOLUTION IN SPUTTER DEPTH PROFILING WITH AUGER-ELECTRON SPECTROSCOPY USING IONIZED SF6 MOLECULES AS PRIMARY IONS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    76. OECHSNER H
      CHEMICAL SURFACE AND THIN-FILM ANALYSIS IN GLASS COATING

      Glass science and technology
    77. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
      DEVELOPMENT OF A HIGH MASS-RESOLUTION TOF-ERDA SYSTEM FOR A WIDE MASSRANGE FROM HYDROGEN TO MIDDLE HEAVY-ELEMENTS

      Analytical sciences
    78. DOYLE BP; MACLEAR RD; CONNELL SH; FORMENTI P; MACHI IZ; BUTLER JE; SCHAAFF P; SELLSCHOP JPF; SIDERASHADDAD E; BHARUTHRAM K
      3-D-MICRO-ERDA MICROSCOPY OF TRACE HYDROGEN DISTRIBUTIONS IN DIAMOND USING A 2-D-PSD WITH EVENT RECONSTRUCTION

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    79. PLAMANN K; BEHRISCH R
      ELASTIC RECOIL DETECTION ANALYSIS (ERDA) OF THICK-FILMS

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    80. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
      DEVELOPMENT OF A HIGH MASS-RESOLUTION TOF-ERDA SYSTEM FOR A WIDE MASSRANGE

      Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    81. ELST K; ADRIAENS A; ADAMS F
      THE STUDY OF RIPPLE FORMATION AND DEGRADATION OF DEPTH RESOLUTION IN GAAS AND ALXGA1-XAS STRUCTURES

      International journal of mass spectrometry and ion processes
    82. CHU DP; DOWSETT MG
      DOPANT SPATIAL DISTRIBUTIONS - SAMPLE-INDEPENDENT RESPONSE FUNCTION AND MAXIMUM-ENTROPY RECONSTRUCTION

      Physical review. B, Condensed matter
    83. GERARDI C
      SIMS ANALYSES OF III-V SEMICONDUCTOR QUANTUM-WELL AND SUPERLATTICE HETEROSTRUCTURES

      Surface and interface analysis
    84. BENNETT J
      PROFILING SHALLOW AS IMPLANTS WITH LOW-ENERGY CS BOMBARDMENT ON A MODIFIED CAMECA IMS-4F

      Surface and interface analysis
    85. GAUTIER B; DUPUY JC; PROST R; PRUDON G
      EFFECTIVENESS AND LIMITS OF THE DECONVOLUTION OF SIMS DEPTH PROFILES OF BORON IN SILICON

      Surface and interface analysis
    86. JIANG ZX; ALKEMADE PFA; ALGRA E; RADELAAR S
      HIGH DEPTH RESOLUTION SIMS ANALYSIS WITH LOW-ENERGY GRAZING O-2(+) BEAMS

      Surface and interface analysis
    87. TAKAKUWAHONGO C; TOMITA M
      HIGH-SENSITIVITY SIMS ANALYSIS OF CARBON IN GAN FILMS BY MOLECULAR ION DETECTION

      Surface and interface analysis
    88. JIANG ZX; ALKEMADE PFA
      A NOVEL-APPROACH FOR THE DETERMINATION OF THE ACTUAL INCIDENCE ANGLE IN A MAGNETIC-SECTOR SIMS INSTRUMENT

      Surface and interface analysis
    89. ZALAR A; HOFMANN S; PANJAN P
      CHARACTERIZATION OF CHEMICAL INTERDIFFUSIVITIES AT SILICON METAL INTERFACES IN INITIAL REACTION STAGES/

      Vacuum
    90. MIRONOV OA; PHILLIPS PJ; PARKER EHC; DOWSETT MG; BARRADAS NP; JEYNES C; MIRONOV M; GNEZDILOV VP; USHAKOV V; EREMENKO VV
      STRUCTURAL AND OPTICAL CHARACTERIZATION OF UNDOPED SI-SI0.78GE0.22 SI(001) SUPERLATTICES GROWN BY MBE/

      Thin solid films
    91. ECKE G; ROSSLER H; CIMALLA V; PEZOLDT J
      INTERPRETATION OF AUGER DEPTH PROFILES OF THIN SIC LAYERS ON SI

      Mikrochimica acta
    92. FITTING HJ; KUHR JC; GOLDBERG M; BECHER B; BARFELS T
      EDX DEPTHS ANALYSIS OF MIS-STRUCTURES

      Mikrochimica acta
    93. DEGRAUW CJ; SIJTSEMA NM; OTTO C; GREVE J
      AXIAL RESOLUTION OF CONFOCAL RAMAN MICROSCOPES - GAUSSIAN-BEAM THEORYAND PRACTICE

      Journal of Microscopy
    94. NURMELA A; RAUHALA E; RAISANEN J
      ELASTIC-SCATTERING CROSS-SECTIONS FOR THE P-24 MEV( HE SYSTEM IN THE ENERGY REGION OF 1.4)

      Journal of applied physics
    95. BEENEN A; SPANNER G; NIESSNER R
      PHOTOACOUSTIC DEPTH-RESOLVED ANALYSIS OF TISSUE MODELS

      Applied spectroscopy
    96. HONG W; HAYAKAWA S; MAEDA K; FUKUDA S; YANOKURA M; ARATANI M; KIMURA K; GOHSHI Y; TANIHATA I
      DETERMINATION OF THE MASS RESOLUTION AND THE DEPTH RESOLUTION OF TIME-OF-FLIGHT ELASTIC RECOIL DETECTION ANALYSIS USING HEAVY-ION BEAMS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    97. MATHIEU HJ
      AES AND XPS DEPTH PROFILE ANALYSIS - A CRITICAL-REVIEW

      Le Vide
    98. BRADLEY RM
      DYNAMIC SCALING OF ION-SPUTTERED ROTATING SURFACES

      Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
    99. DOBCNIK D; STERGULEC J; GOMISCEK S
      PREPARATION OF AN IODIDE ION-SELECTIVE ELECTRODE BY CHEMICAL TREATMENT OF A SILVER WIRE

      Fresenius' journal of analytical chemistry
    100. VAJO JJ; DOTY RE; CIRLIN EH
      INFLUENCE OF O-2(-INDUCED RIPPLE TOPOGRAPHY ON SILICON() ENERGY, FLUX, AND FLUENCE ON THE FORMATION AND GROWTH OF SPUTTERING)

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 16/01/21 alle ore 13:09:21