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1. Fond, C
   Cavitation criterion for rubber materials: A review of void-growth models
   JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
   
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   A stochastic covariate failure model for assessing system reliability
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   Improvement of threshold voltage deviation in damascene metal gate transistors
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4. Kawahara, J; Matsuki, T; Hayashi, Y
   Analysis of processing damage on a ferroelectric SrBi2Ta2O9 capacitor for ferroelectric random access memory device fabrication
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   On the action of gamma radiation on solid C-60 and C-70 fullerenes: A comparison with graphite irradiation
   FULLERENE SCIENCE AND TECHNOLOGY
   
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6. Simon, P; Luchies, JM; Maly, W
   Identification of plasma-induced damage conditions in VLSI designs
   IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
   
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7. Muto, S; Tanabe, T
   Temperature effect of electron-irradiation-induced structural modificationin graphite
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8. Yagishita, A; Saito, T; Nakajima, K; Inumiya, S; Akasaka, Y; Ozawa, Y; Hieda, K; Tsunashima, Y; Suguro, K; Arikado, T; Okumura, K
   High performance damascene metal gate MOSFET's for 0.1 mu m regime
   IEEE TRANSACTIONS ON ELECTRON DEVICES
   
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9. Igarashi, Y; Tani, K; Kasai, M; Ashikaga, K; Ito, T
   Submicron ferroelectric capacitors fabricated by chemical mechanical polishing process for high-density ferroelectric memories
   JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
   
   Y. Igarashi et al., "Submicron ferroelectric capacitors fabricated by chemical mechanical polishing process for high-density ferroelectric memories", JPN J A P 1, 39(4B), 2000, pp. 2083-2086
10. Takeuchi, M; Muto, S; Tanabe, T; Kurata, H; Hojou, K
    Structural change in graphite under electron irradiation at low temperatures
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11. Muto, S; Tanabe, T; Takeuchi, M; Kobayashi, Y; Furuno, S; Hojou, K
    TEM analyses of surface ridge network in an ion-irradiated graphite thin film
    JOURNAL OF NUCLEAR MATERIALS
    
    S. Muto et al., "TEM analyses of surface ridge network in an ion-irradiated graphite thin film", J NUCL MAT, 272, 1999, pp. 285-289
12. Muto, SE; Horiuchi, S; Tanabe, T
    Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
    JOURNAL OF ELECTRON MICROSCOPY
    
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13. Muto, S; Tanabe, T
    Fragmentation of graphite crystals by electron irradiation at elevated temperatures
    JOURNAL OF ELECTRON MICROSCOPY
    
    S. Muto e T. Tanabe, "Fragmentation of graphite crystals by electron irradiation at elevated temperatures", J ELEC MICR, 48(5), 1999, pp. 519-523
14. Saito, T; Yagishita, A; Inumiya, S; Nakajima, K; Akasaka, Y; Ozawa, Y; Yano, H; Hieda, K; Suguro, K; Arikado, T; Okumura, K
    Plasma-damage-free gate process using chemical mechanical polishing for 0.1 mu m MOSFETs
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    T. Saito et al., "Plasma-damage-free gate process using chemical mechanical polishing for 0.1 mu m MOSFETs", JPN J A P 1, 38(4B), 1999, pp. 2227-2231
15. Muto, S; Takeuchi, M; Tanabe, T; Kurata, H; Hojou, K
    Change in chemical bonding states in electron-irradiated graphite
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    S. Muto et al., "Change in chemical bonding states in electron-irradiated graphite", JPN J A P 1, 38(3A), 1999, pp. 1514-1515
16. RAMULU M
    MACHINING AND SURFACE INTEGRITY OF FIBER-REINFORCED PLASTIC COMPOSITES
    Sadhana
    
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17. WALTER ME; RAVICHANDRAN G
    EXPERIMENTAL SIMULATION OF MATRIX CRACKING AND DEBONDING IN A MODEL BRITTLE-MATRIX COMPOSITE
    Experimental mechanics
    
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18. KOYAMA M; CHEONG CW; YOKOYAMA K; OHDOMARI I
    INFLUENCE OF NEAR-SURFACE DEFECTS IN SI INDUCED BY REACTIVE ION ETCHING ON THE ELECTRICAL-PROPERTIES OF THE PT N-SI INTERFACE/
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    M. Koyama et al., "INFLUENCE OF NEAR-SURFACE DEFECTS IN SI INDUCED BY REACTIVE ION ETCHING ON THE ELECTRICAL-PROPERTIES OF THE PT N-SI INTERFACE/", JPN J A P 1, 36(11), 1997, pp. 6682-6686
19. FENG W; ADACHI K; KOWADA M
    AN OPTIMAL STATE-AGE DEPENDENT REPLACEMENT FOR A NETWORK SYSTEM
    European journal of operational research
    
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