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La ricerca find articoli where soggetti phrase all words 'ANISOTROPY SPECTROSCOPY' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 58 riferimenti
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    1. Weightman, P; Martin, DS; Maunder, A
      RAS: a new probe of surface states

      JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
    2. Hannappel, T; Toben, L; Moller, K; Willig, F
      In-situ monitoring of InP(100) and GaP(100) interfaces and characterization with RDS at 20 K

      JOURNAL OF ELECTRONIC MATERIALS
    3. Hingerl, K; Balderas-Navarro, RE; Bonanni, A; Tichopadek, P; Schmidt, WG
      On the origin of resonance features in reflectance difference data of silicon

      APPLIED SURFACE SCIENCE
    4. Calmels, L; Inglesfield, JE; Arola, E; Crampin, S; Rasing, T
      Local-field effects on the near-surface and near-interface screened electric field in noble metals - art. no. 125416

      PHYSICAL REVIEW B
    5. Tereshchenko, OE; Daineka, DV; Paget, D
      Metallicity and disorder at the alkali-metal/GaAs(001) interface - art. no. 085310

      PHYSICAL REVIEW B
    6. Berkovits, VL; Witkowski, N; Borensztein, Y; Paget, D
      Effect of surface reconstruction on the low-temperature oxidation of InAs(100): Optical investigations - art. no. 121314

      PHYSICAL REVIEW B
    7. Pforte, F; Michalke, T; Gerlach, A; Goldmann, A; Matzdorf, R
      Strong contributions from surface electromagnetic fields to angle-resolvedphotoemission intensities of copper - art. no. 115405

      PHYSICAL REVIEW B
    8. Martin, DS; Weightman, P
      Reflection anisotropy spectroscopy: a new probe of metal surfaces

      SURFACE AND INTERFACE ANALYSIS
    9. Pemble, ME
      NESSPIOM - Network for enhanced semiconductor surface processing through in situ optical monitoring

      SURFACE AND INTERFACE ANALYSIS
    10. Bremer, J; Hunderi, O
      RAS studies of laterally nanostructured surfaces

      PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
    11. Ueng, HJ; Chen, NP; Janes, DB; Webb, KJ; McInturff, DT; Melloch, MR
      Temperature-dependent behavior of low-temperature-grown GaAs nonalloyed ohmic contacts

      JOURNAL OF APPLIED PHYSICS
    12. Balderas-Navarro, RE; Hingerl, K; Bonanni, A; Sitter, H; Stifter, D
      In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy

      APPLIED PHYSICS LETTERS
    13. Begarney, MJ; Li, CH; Law, DC; Visbeck, SB; Sun, Y; Hicks, RF
      Reflectance difference spectroscopy of mixed phases of indium phosphide (001)

      APPLIED PHYSICS LETTERS
    14. Stahrenberg, K; Hermann, T; Esser, N; Richter, W
      Surface optical properties of clean Cu(110) and Cu(110)-(2 x 1)-O

      PHYSICAL REVIEW B
    15. Morrice, DE; Farrell, T; Joyce, TB; Chalker, PR
      Investigation of electromechanical distortions in gallium nitride by reflectance anisotropy spectroscopy

      DIAMOND AND RELATED MATERIALS
    16. Haberland, K; Bhattacharya, A; Zorn, M; Weyers, M; Zettler, JT; Richter, W
      MOVPE growth of (Al,Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy

      JOURNAL OF ELECTRONIC MATERIALS
    17. Borensztein, Y
      Linear optical spectroscopies for surface studies

      SURFACE REVIEW AND LETTERS
    18. Kita, T; Tachikawa, K; Tango, H; Yamashita, K; Nishino, T
      Self-assembled growth of InAs-quantum dots and postgrowth behavior studiedby reflectance-difference spectroscopy

      APPLIED SURFACE SCIENCE
    19. Straube, P; Pforte, F; Michalke, T; Berge, K; Gerlach, A; Goldmann, A
      Photoemission study of the surface state at Y on Cu(110): Band structure, electron dynamics, and surface optical properties

      PHYSICAL REVIEW B
    20. Schwab, C; Meister, G; Goldmann, A; Bertel, E
      Second-harmonic generation from Na-covered Cu(110): intensity enhancement by inter-surface-state transitions?

      SURFACE SCIENCE
    21. Schwab, C; Meister, G; Woll, J; Gerlach, A; Goldmann, A
      Experimental intensity analysis of second harmonic generation at the Cu(110) surface

      SURFACE SCIENCE
    22. Steimetz, E; Wehnert, T; Kirmse, H; Poser, F; Zettler, JT; Neumann, W; Richter, W
      Optimizing the growth procedure for InAs quantum dot stacks by optical in situ techniques

      JOURNAL OF CRYSTAL GROWTH
    23. Chen, NP; Ueng, HJ; Janes, DB; Woodall, JM; Melloch, MR
      A quantitative conduction model for a low-resistance nonalloyed ohmic contact structure utilizing low-temperature-grown GaAs

      JOURNAL OF APPLIED PHYSICS
    24. Haberland, K; Kurpas, P; Pristovsek, M; Zettler, JT; Veyers, M; Richter, W
      Spectroscopic process sensors in MOVPE device production

      APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
    25. Westwood, DI; Sobiesierski, Z; Matthai, CC
      The dynamics of quantum dot formation in the InAs on GaAs(001) system: growth rate effects

      APPLIED SURFACE SCIENCE
    26. Apostolopoulos, G; Herfort, J; Ulrici, W; Daweritz, L; Ploog, KH
      In situ reflectance-difference spectroscopy of GaAs grown at low temperatures

      PHYSICAL REVIEW B-CONDENSED MATTER
    27. Zorn, M; Kurpas, P; Shkrebtii, AI; Junno, B; Bhattacharya, A; Knorr, K; Weyers, M; Samuelson, L; Zettler, JT; Richter, W
      Correlation of InGaP(001) surface structure during growth and bulk ordering

      PHYSICAL REVIEW B-CONDENSED MATTER
    28. Lastras-Martinez, A; Balderas-Navarro, RE; Lastras-Martinez, LF; Vidal, MA
      Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around E-1 and E-1+Delta(1)

      PHYSICAL REVIEW B-CONDENSED MATTER
    29. Chalker, PR; Joyce, TB; Farrell, T; Johnston, C; Crossley, A; Eccles, J
      Raman and reflection anisotropy spectroscopic studies of GaN and AlN growth on GaAs(100)

      THIN SOLID FILMS
    30. Gerlach, A; Meister, G; Matzdorf, R; Goldmann, A
      High-resolution photoemission study of the (Y)over-bar surface state on Ag(110)

      SURFACE SCIENCE
    31. Power, JR; Weightman, P; Bose, S; Shkrebtii, AI; Del Sole, R
      The initial stages of Ge growth on vicinal Si(001) studied by reflectance anisotropy spectroscopy

      SURFACE SCIENCE
    32. Perry, CC; Frederick, BG; Power, JR; Cole, RJ; Haq, S; Chen, Q; Richardson, NV; Weightman, P
      Complementary vibrational and reflectance anisotropy spectroscopic determination of molecular azimuthal orientation

      SURFACE SCIENCE
    33. Shchukin, VA; Bimberg, D
      Spontaneous ordering of nanostructures on crystal surfaces

      REVIEWS OF MODERN PHYSICS
    34. Pristovsek, M; Menhal, H; Schmidtling, T; Esser, N; Richter, W
      Comparative study of the GaAs (113), (115), (001), ((1)over-bar(1)over-bar(5)over-bar), ((1)over-bar(1)over-bar(3)over-bar), and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy

      MICROELECTRONICS JOURNAL
    35. Leonardi, K; Hommel, D; Meyne, C; Zettler, JT; Richter, W
      Growth of self-assembled (Zn)CdSe nanostructures on ZnSe by migration enhanced epitaxy

      JOURNAL OF CRYSTAL GROWTH
    36. SOBIESIERSKI Z; WESTWOOD DI
      REFLECTANCE ANISOTROPY SPECTROSCOPY AND THE GROWTH OF LOW-DIMENSIONALMATERIALS

      Thin solid films
    37. ZETTLER JT; PRISTOVSEK M; TREPK T; SHKREBTII A; STEIMETZ E; ZORN M; RICHTER W
      RESPONSE OF THE SURFACE DIELECTRIC FUNCTION TO DYNAMIC SURFACE MODIFICATIONS - APPLICATION OF REFLECTANCE ANISOTROPY SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY

      Thin solid films
    38. HABERLAND K; HUNDERI O; PRISTOVSEK M; ZETTLER JT; RICHTER W
      ELLIPSOMETRIC AND REFLECTANCE-ANISOTROPY MEASUREMENTS ON ROTATING SAMPLES

      Thin solid films
    39. MEYNE C; POHL UW; ZETTLER JT; RICHTER W
      OBSERVATION OF DIFFERENT GROWTH MODES IN THE MOVPE OF CDS ZNS AND CDSE/ZNSE BY IN-SITU REFLECTANCE ANISOTROPY SPECTROSCOPY/

      Journal of crystal growth
    40. Zettler, JT; Haberland, K; Zorn, M; Pristovsek, M; Richter, W; Kurpas, P; Weyers, M
      Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques

      JOURNAL OF CRYSTAL GROWTH
    41. Hardtdegen, H; Pristovsek, M; Menhal, H; Zettler, JT; Richter, W; Schmitz, D
      In situ characterization of GaAs growth in nitrogen atmosphere during MOVPE: a comparison to hydrogen atmosphere

      JOURNAL OF CRYSTAL GROWTH
    42. Zorn, M; Trepk, T; Kurpas, P; Weyers, M; Zettler, JT; Richter, W
      In situ monitoring and control of InGaP growth on GaAs in MOVPE

      JOURNAL OF CRYSTAL GROWTH
    43. Steimetz, E; Wehnert, T; Haberland, K; Zettler, JT; Richter, W
      GaAs cap layer growth and In-segregation effects on self-assembled InAs quantum dots monitored by optical techniques

      JOURNAL OF CRYSTAL GROWTH
    44. STEIMETZ E; RICHTER W; SCHIENLE F; FISCHER D; KLEIN M; ZETTLER JT
      THE EFFECT OF DIFFERENT GROUP-V PRECURSORS ON THE EVOLUTION OF QUANTUM DOTS MONITORED BY OPTICAL IN-SITU MEASUREMENTS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    45. KURPAS P; SATO M; KNAUER A; WEYERS M
      ONLINE GROWTH MONITORING OF INP-BASED DEVICE STRUCTURES BY REFLECTANCE ANISOTROPY SPECTROSCOPY

      Journal of electronic materials
    46. KURPAS P; OSTER A; WEYERS M; RUMBERG A; KNORR K; RICHTER W
      FORMATION OF GAASP INTERFACE LAYERS MONITORED BY REFLECTANCE ANISOTROPY SPECTROSCOPY

      Journal of electronic materials
    47. PAHLKE D; KINSKY J; SCHULTZ C; PRISTOVSEK M; ZORN M; ESSER N; RICHTER W
      STRUCTURE OF INP(001) SURFACES PREPARED BY DECAPPING AND BY ION-BOMBARDMENT AND ANNEALING

      Physical review. B, Condensed matter
    48. DAWERITZ L; STAHRENBERG K; SCHUTZENDUBE P; ZETTLER JT; RICHTER W; PLOOG KH
      EVOLUTION OF SHORT-RANGE AND LONG-RANGE ORDER DURING SI INCORPORATIONON GAAS(001) OBSERVED BY RAS AND RHEED DURING MBE

      Journal of crystal growth
    49. KOBAYASHI N; KOBAYASHI Y; UWAI K
      ORIGIN OF SURFACE REFLECTANCE SPECTRUM DURING EPITAXY

      Journal of crystal growth
    50. BASS JM; MORRIS SJ; MATTHAI CC
      THEORETICAL REFLECTANCE ANISOTROPY SPECTROSCOPY AND SCANNING-TUNNELING-MICROSCOPY STUDY OF THE GAAS(001)(2X4) SURFACE

      Materials science & engineering. B, Solid-state materials for advanced technology
    51. RICHTER W; ZETTLER JT
      REAL-TIME ANALYSIS OF III-V-SEMICONDUCTOR EPITAXIAL-GROWTH

      Applied surface science
    52. SCHOLZ SM; JACOBI K; ZETTLER JT; RICHTER W
      REFLECTANCE ANISOTROPY SPECTROSCOPY ON THE GE(113) SURFACE

      Surface science
    53. PAHLKE D; ARENS M; ESSER N; WANG DT; RICHTER W
      HYDROGEN-INDUCED STRUCTURE CHANGES OF GAAS(100) C(4X4), (2X4) AND (4X2) SURFACES

      Surface science
    54. RILEY J; WOLFFRAMM D; WESTWOOD D; EVANS A
      STUDIES IN THE GROWTH OF ZNSE ON GAAS(001)

      Journal of crystal growth
    55. ESSER N; SANTOS PV; KUBALL M; CARDONA M; ARENS M; PAHLKE D; RICHTER W; STIETZ F; SCHAEFER JA; FIMLAND BO
      HYDROGEN-INDUCED MODIFICATION OF THE OPTICAL-PROPERTIES OF THE GAAS(100) SURFACE

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    56. ASPNES DE
      OBSERVATION AND ANALYSIS OF EPITAXIAL-GROWTH WITH REFLECTANCE-DIFFERENCE SPECTROSCOPY

      Materials science & engineering. B, Solid-state materials for advanced technology
    57. ARENS M; KUBALL M; ESSER N; RICHTER W; CARDONA M; FIMLAND BO
      INFLUENCE OF HYDROGEN ADSORPTION ON THE OPTICAL-PROPERTIES OF THE GAAS(100)-C(4X4) SURFACE

      Physical review. B, Condensed matter
    58. LINDNER E; KEMMLER M; MAYER HA
      SUPPORTED ORGANOMETALLIC COMPLEXES .6. CH ARACTERIZATION AND REACTIVITY OF POLYSILOXANE-BOUND (ETHER-PHOSPHANE)RUTHENIUM(II) COMPLEXES

      Zeitschrift fur anorganische und allgemeine Chemie


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/06/20 alle ore 21:10:13