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La ricerca find articoli where authors phrase all words 'Urban, FK' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 30 riferimenti
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    1. Zhang, P; Zuo, F; Urban, FK; Khabari, A; Griffiths, P; Hosseini-Tehrani, A
      Irreversible magnetization in nickel nanoparticles

      JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
    2. Hosseini-Tehrani, A; Urban, FK
      Modeling of large cluster synthesis

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    3. Urban, FK; Khabari, A; Hosseini-Tehrani, A; Griffiths, P; Fernandez, G
      Nanophase copper thin films deposited from a beam source

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    4. Urban, FK; Hosseini-Tehrani, A; Khabari, A; Griffiths, P; Fernandez, G
      Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beam

      THIN SOLID FILMS
    5. URBAN FK; BARTON D; BOUDANI NI
      EXTREMELY FAST ELLIPSOMETRY SOLUTIONS USING CASCADED NEURAL NETWORKS ALONE

      Thin solid films
    6. URBAN FK; BARTON D
      TOWARD A-PRIORI SELECTION OF ELLIPSOMETRY ANGLES AND WAVELENGTHS USING A HIGH-PERFORMANCE SEMANTIC DATABASE

      Thin solid films
    7. TABET MF; URBAN FK
      DECONVOLUTION OF TIP AFFECTED ATOMIC-FORCE MICROSCOPE IMAGES AND COMPARISON TO RUTHERFORD BACKSCATTERING SPECTROMETRY

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    8. ATHEY PR; TABET MF; URBAN FK
      DETERMINING THE OPTICAL-PROPERTIES OF A MIXED-METAL OXIDE FILM, CO3-X-YCRXFEYO4, WITH SPECTROSCOPIC ELLIPSOMETRY AND ATOMIC-FORCE MICROSCOPY

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    9. URBAN FK; BARTON D
      SENSITIVITY OF VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY TO ISOTROPICTHIN-FILM PROPERTIES

      Thin solid films
    10. ATHEY PR; URBAN FK; HOLLOWAY PH
      USE OF MULTIPLE ANALYTICAL TECHNIQUES TO CONFIRM IMPROVED OPTICAL MODELING OF SNO2-F FILMS BY ATOMIC-FORCE MICROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    11. URBAN FK; COMFORT JC
      NUMERICAL ELLIPSOMETRY - APPLICATIONS OF A NEW ALGORITHM FOR REAL-TIME, IN-SITU FILM GROWTH MONITORING

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    12. LINDQUIST CS; URBAN FK
      ANALYSIS OF SURFACE VOID FRACTION USING ATOMIC-FORCE MICROSCOPY

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    13. ATHEY PR; URBAN FK; TABET MF; MCGAHAN WA
      OPTICAL-PROPERTIES OF COBALT OXIDE-FILMS DEPOSITED BY SPRAY-PYROLYSIS

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    14. BARTON D; COMFORT JC; URBAN FK
      NUMERICAL ELLIPSOMETRY - REAL-TIME SOLUTIONS USING MAPPING ONTO THE COMPLEX INDEX PLANE

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    15. COMFORT JC; URBAN FK; BARTON D
      AN ALGORITHM FOR ANALYZING ELLIPSOMETRIC DATA TAKEN WITH MULTIPLE ANGLES OF INCIDENCE

      Thin solid films
    16. TABET MF; URBAN FK
      COMPARISON OF ATOMIC-FORCE MICROSCOPE AND RUTHERFORD BACKSCATTERING SPECTROMETRY DATA OF NANOMETER-SIZE ZINC ISLANDS

      Thin solid films
    17. COMFORT JC; URBAN FK
      NUMERICAL TECHNIQUES USEFUL IN THE PRACTICE OF ELLIPSOMETRY

      Thin solid films
    18. LINDQUIST CS; URBAN FK
      SURFACE-ANALYSIS ALGORITHMS FOR SCANNING PROBE MICROSCOPY

      Thin solid films
    19. COX AJ; NAINAPARAMPIL JJ; TABET MF; HOSSEINITEHRANI A; URBAN FK
      RECENT DEVELOPMENTS IN IONIZED CLUSTER BEAM THIN-FILM DEPOSITION

      Thin solid films
    20. TABET MF; FENG SW; COX AJ; URBAN FK
      INVESTIGATION OF SILVER IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE

      Journal of physics. D, Applied physics
    21. URBAN FK; TABET MF
      DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR IN-SITU ELLIPSOMETRY OFFILMS GROWING ON UNKNOWN SUBSTRATES

      Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    22. URBAN FK; COMFORT JC
      NUMERICAL ELLIPSOMETRY - ENHANCEMENT OF NEW ALGORITHMS FOR REAL-TIME,IN-SITU FILM GROWTH MONITORING

      Thin solid films
    23. URBAN FK; ROMINE P; ISLAM MS
      ADVANCED IMAGE-PROCESSING IN SCANNING PROBE MICROSCOPY

      Thin solid films
    24. URBAN FK; ATHEY PR; ISLAM MS
      MODELING OF SURFACE-ROUGHNESS IN VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY, USING NUMERICAL PROCESSING OF ATOMIC-FORCE MICROSCOPY IMAGES

      Thin solid films
    25. FENG SW; NAINAPARAMPIL JJ; TABET MF; URBAN FK
      GOLD AND ZINC THIN-FILMS DEPOSITED BY THE IONIZED CLUSTER BEAM TECHNIQUE

      Thin solid films
    26. URBAN FK; TABET MF
      REAL-TIME, IN-SITU ELLIPSOMETRY SOLUTIONS USING ARTIFICIAL NEURAL-NETWORK PREPROCESSING

      Thin solid films
    27. URBAN FK; FENG SW; NAINAPARAMPIL JJ
      STUDY OF ZINC THIN-FILMS FORMED USING LARGE CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    28. URBAN FK; FENG SW; NAINAPARAMPIL JJ
      DETERMINATION OF ZINC CLUSTER-SIZE IN IONIZED CLUSTER BEAM FILM DEPOSITION

      Journal of applied physics
    29. URBAN FK; HOSSEINITEHRANI A; FENG SW; NAINAPARAMPIL JJ
      SELECTIVE-AREA DEPOSITION OF METAL-FILMS BY THE IONIZED CLUSTER BEAM METHOD

      Applied physics letters
    30. URBAN FK
      ELLIPSOMETRY ALGORITHM FOR ABSORBING FILMS

      Applied optics


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 23/10/20 alle ore 14:13:12