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La ricerca find articoli where authors phrase all words 'Heiderhoff, R' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 13 riferimenti
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    1. Heiderhoff, R; Cramer, RM; Sergeev, OV; Balk, LJ
      Near-field cathodoluminescence of nanoscopic diamond properties

      DIAMOND AND RELATED MATERIALS
    2. Liu, XX; Heiderhoff, R; Abicht, HP; Balk, LJ
      Characterization of ferroelectric domains by the use of scanning near-field acoustic microscopies

      ANALYTICAL SCIENCES
    3. Gaponenko, NV; Sergeev, OV; Stepanova, EA; Parkun, VM; Mudryi, AV; Gnaser, H; Misiewicz, J; Heiderhoff, R; Balk, LJ; Thompson, GE
      Optical and structural characterization of erbium-doped TiO2 xerogel filmsprocessed on porous anodic alumina

      JOURNAL OF THE ELECTROCHEMICAL SOCIETY
    4. Heiderhoff, R; Palaniappan, M; Phang, JCH; Balk, LJ
      Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

      MICROELECTRONICS RELIABILITY
    5. Heiderhoff, R; Sergeev, OV; Liu, YY; Phang, JCH; Balk, LJ
      Comparison between standard and near-field cathodoluminescence

      JOURNAL OF CRYSTAL GROWTH
    6. Cramer, RM; Heiderhoff, R; Balk, LJ
      Nanoscopic investigations of diamond properties by scanning probe microscopy techniques

      DIAMOND AND RELATED MATERIALS
    7. Cramer, RM; Sergeev, OV; Heiderhoff, R; Balk, LJ
      Spectrally resolved cathodoluminescence analyses in the optical near-field

      JOURNAL OF MICROSCOPY-OXFORD
    8. CRAMER RM; HEIDERHOFF R; BALK LJ
      SCANNING NEAR-FIELD CATHODOLUMINESCENCE INVESTIGATIONS

      Scanning
    9. CRAMER RM; SCHADE WR; HEIDERHOFF R; BALK LJ; CHIN R
      SCANNING NEAR-FIELD OPTICAL MICROSCOPY ANALYSES OF ELECTRONIC DEVICES

      Microelectronics and reliability
    10. CRAMER RM; EBINGHAUS V; HEIDERHOFF R; BALK LJ
      NEAR-FIELD DETECTION CATHODOLUMINESCENCE INVESTIGATIONS

      Journal of physics. D, Applied physics
    11. BALK LJ; HEIDERHOFF R; KOSCHINSKI P; MAYWALD M
      NANOSCOPIC EVALUATION OF SEMICONDUCTOR PROPERTIES BY SCANNING PROBE MICROSCOPIES

      Microelectronics and reliability
    12. SPITZL R; RAIKO V; HEIDERHOFF R; GNASER H; ENGEMANN J
      MPCVD DIAMOND DEPOSITION ON BIAS PRETREATED POROUS SILICON

      DIAMOND AND RELATED MATERIALS
    13. HEIDERHOFF R; KOSCHINSKI P; MAYWALD M; BALK LJ; BACHMANN PK
      CORRELATION OF THE ELECTRICAL, THERMAL, AND OPTICAL-PROPERTIES OF CVDDIAMOND FILMS BY SCANNING MICROSCOPY TECHNIQUES

      DIAMOND AND RELATED MATERIALS


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 01/06/20 alle ore 15:25:57