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1. Barranco, A; Holgado, JP; Yubero, F; Espinos, JP; Martin, A; Gonzalez-Elipe, AR
   Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N-2(+) bombardment
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
   
   A. Barranco et al., "Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N-2(+) bombardment", J VAC SCI A, 19(3), 2001, pp. 1024-1026
2. Barranco, A; Mejias, JA; Espinos, JP; Caballero, A; Gonzalez-Elipe, AR; Yubero, F
   Chemical stability of Sin+ species in SiOx (x < 2) thin films
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
   
   A. Barranco et al., "Chemical stability of Sin+ species in SiOx (x < 2) thin films", J VAC SCI A, 19(1), 2001, pp. 136-144
3. Barranco, A; Yubero, F; Espinos, JP; Benitez, J; Gonzalez-Elipe, AR; Cotrino, J; Allain, J; Girardeau, T; Riviere, JP
   Room temperature synthesis of SiO2 thin films by ion beam induced and plasma enhanced CVD
   SURFACE & COATINGS TECHNOLOGY
   
   A. Barranco et al., "Room temperature synthesis of SiO2 thin films by ion beam induced and plasma enhanced CVD", SURF COAT, 142, 2001, pp. 856-860
4. Gervasoni, JL; Yubero, F
   Bulk and surface plasmon excitation induced by charged particles moving near a solid surface
   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
   
   J.L. Gervasoni e F. Yubero, "Bulk and surface plasmon excitation induced by charged particles moving near a solid surface", NUCL INST B, 182, 2001, pp. 96-101
5. Barranco, A; Yubero, F; Espinos, JP; Gonzalez-Eipe, AR
   The chemical state vector: a new concept for the characterization of oxideinterfaces
   SURFACE AND INTERFACE ANALYSIS
   
   A. Barranco et al., "The chemical state vector: a new concept for the characterization of oxideinterfaces", SURF INT AN, 31(8), 2001, pp. 761-767
6. Barranco, A; Yubero, F; Cotrino, J; Espinos, JP; Benitez, J; Rojas, TC; Allain, J; Girardeau, T; Reviere, JP; Gonzalez-Elipe, AR
   Low temperature synthesis of dense SiO2 thin films by ion beam induced chemical vapor deposition
   THIN SOLID FILMS
   
   A. Barranco et al., "Low temperature synthesis of dense SiO2 thin films by ion beam induced chemical vapor deposition", THIN SOL FI, 396(1-2), 2001, pp. 9-15
7. Holgado, JP; Espinos, JP; Yubero, F; Justo, A; Ocana, M; Benitez, J; Gonzalez-Elipe, AR
   Ar stabilisation of the cubic/tetragonal phases of ZrO2 in thin films prepared by ion beam induced chemical vapour deposition
   THIN SOLID FILMS
   
   J.P. Holgado et al., "Ar stabilisation of the cubic/tetragonal phases of ZrO2 in thin films prepared by ion beam induced chemical vapour deposition", THIN SOL FI, 389(1-2), 2001, pp. 34-42
8. Holgado, JP; Barranco, A; Yubero, F; Espinos, JP; Gonzalez-Elipe, AR
   Surface microstructure of MgO deposited on SiO2 by analysis of plasmon excitations in photoemission experiments
   SURFACE SCIENCE
   
   J.P. Holgado et al., "Surface microstructure of MgO deposited on SiO2 by analysis of plasmon excitations in photoemission experiments", SURF SCI, 482, 2001, pp. 1325-1330
9. Barranco, A; Yubero, F; Mejias, JA; Espinos, JP; Gonzalez-Elipe, AR
   Electronic interactions at SiO2/M ' O-x (M ': Al, Ti) oxide interfaces
   SURFACE SCIENCE
   
   A. Barranco et al., "Electronic interactions at SiO2/M ' O-x (M ': Al, Ti) oxide interfaces", SURF SCI, 482, 2001, pp. 680-686
10. Yubero, F; Ocana, M; Caballero, A; Gonzalez-Elipe, AR
    Structural modifications produced by the incorporation of Ar within the lattice of Fe2O3 thin films prepared by ion beam induced chemical vapour deposition
    ACTA MATERIALIA
    
    F. Yubero et al., "Structural modifications produced by the incorporation of Ar within the lattice of Fe2O3 thin films prepared by ion beam induced chemical vapour deposition", ACT MATER, 48(18-19), 2000, pp. 4555-4561
11. Yubero, F; Ocana, M; Justo, A; Contreras, L; Gonzalez-Elipe, AR
    Iron oxide thin films prepared by ion beam induced chemical vapor deposition: Structural characterization by infrared spectroscopy
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
    
    F. Yubero et al., "Iron oxide thin films prepared by ion beam induced chemical vapor deposition: Structural characterization by infrared spectroscopy", J VAC SCI A, 18(5), 2000, pp. 2244-2248
12. Gonzalez-Elipe, AR; Yubero, F; Espinos, JP; Caballero, A; Ocana, M; Holgado, JP; Morales, J
    Amorphisation and related structural effects in thin films prepared by ionbeam assisted methods
    SURFACE & COATINGS TECHNOLOGY
    
    A.R. Gonzalez-Elipe et al., "Amorphisation and related structural effects in thin films prepared by ionbeam assisted methods", SURF COAT, 125(1-3), 2000, pp. 116-123
13. Sanchez-Agudo, M; Yubero, F; Fuentes, GG; Gutierrez, A; Sacchi, M; Soriano, L; Sanz, JM
    Study of the growth of ultrathin films of NiO on Cu(111)
    SURFACE AND INTERFACE ANALYSIS
    
    M. Sanchez-Agudo et al., "Study of the growth of ultrathin films of NiO on Cu(111)", SURF INT AN, 30(1), 2000, pp. 396-400
14. Yubero, F; Barranco, A; Mejias, JA; Espinos, JP; Gonzalez-Elipe, AR
    Spectroscopic characterisation and chemical reactivity of silicon monoxidelayers deposited on Cu(100)
    SURFACE SCIENCE
    
    F. Yubero et al., "Spectroscopic characterisation and chemical reactivity of silicon monoxidelayers deposited on Cu(100)", SURF SCI, 458(1-3), 2000, pp. 229-238
15. Yubero, F; Gonzalez-Elipe, AR; Tougaard, S
    Determination of growth mechanisms by X-ray photoemission acid ion scattering spectroscopies: application to thin iron oxide films deposited on SiO2
    SURFACE SCIENCE
    
    F. Yubero et al., "Determination of growth mechanisms by X-ray photoemission acid ion scattering spectroscopies: application to thin iron oxide films deposited on SiO2", SURF SCI, 457(1-2), 2000, pp. 24-36
16. Reiche, R; Yubero, F; Espinos, JP; Gonzalez-Elipe, AR
    Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies
    SURFACE SCIENCE
    
    R. Reiche et al., "Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies", SURF SCI, 457(1-2), 2000, pp. 199-210
17. Gonzalez-Elipe, AR; Espinos, JP; Barranco, A; Yubero, F; Caballero, A
    CVD induced by ion beams for the preparation of oxide and nitride thin films
    JOURNAL DE PHYSIQUE IV
    
    A.R. Gonzalez-Elipe et al., "CVD induced by ion beams for the preparation of oxide and nitride thin films", J PHYS IV, 9(P8), 1999, pp. 699-708
18. Jimenez, VM; Espinos, JP; Gonzalez-Elipe, AR; Caballero, A; Yubero, F
    SnO2 thin films prepared by ion beam induced CVD. Preparation and characterization
    JOURNAL DE PHYSIQUE IV
    
    V.M. Jimenez et al., "SnO2 thin films prepared by ion beam induced CVD. Preparation and characterization", J PHYS IV, 9(P8), 1999, pp. 749-755
19. Jimenez, VM; Lassaletta, G; Fernandez, A; Espinos, JP; Yubero, F; Gonzalez-Elipe, AR; Soriano, L; Sanz, JM; Papaconstantopoulos, DA
    Resonant photoemission characterization of SnO
    PHYSICAL REVIEW B-CONDENSED MATTER
    
    V.M. Jimenez et al., "Resonant photoemission characterization of SnO", PHYS REV B, 60(15), 1999, pp. 11171-11179
20. Simonsen, AC; Yubero, F; Tougaard, S
    Analysis of angle-resolved electron energy loss in XPS spectra of Ag, Au, Co, Cu, Fe and Si
    SURFACE SCIENCE
    
    A.C. Simonsen et al., "Analysis of angle-resolved electron energy loss in XPS spectra of Ag, Au, Co, Cu, Fe and Si", SURF SCI, 436(1-3), 1999, pp. 149-159
21. Yubero, F; Barranco, A; Espinos, JP; Gonzalez-Elipe, AR
    Anomalous behaviour in resonant Auger emission of SiOx thin films
    SURFACE SCIENCE
    
    F. Yubero et al., "Anomalous behaviour in resonant Auger emission of SiOx thin films", SURF SCI, 436(1-3), 1999, pp. 202-212
22. Fuentes, GG; Mancheno, IG; Balbas, F; Quiros, C; Trigo, JF; Yubero, F; Elizalde, E; Sanz, JM
    Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
    
    G.G. Fuentes et al., "Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry", PHYS ST S-A, 175(1), 1999, pp. 429-436
23. YUBERO F; STABEL A; GONZALEZELIPE AR
    OPTICAL-PROPERTIES AND ELECTRON-SPECTROSCOPY CHARACTERIZATION OF ALXTIYOZ THIN-FILMS
    Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    
    F. Yubero et al., "OPTICAL-PROPERTIES AND ELECTRON-SPECTROSCOPY CHARACTERIZATION OF ALXTIYOZ THIN-FILMS", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3477-3482
24. YUBERO F; ESPINOS JP; GONZALEZELIPE AR
    OPTICAL-PROPERTIES OF ZIRCONIA-YTTRIA SINGLE-CRYSTAL COMPOUNDS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
    Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    
    F. Yubero et al., "OPTICAL-PROPERTIES OF ZIRCONIA-YTTRIA SINGLE-CRYSTAL COMPOUNDS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2287-2291
25. STABEL A; CABALLERO A; ESPINOS JP; YUBERO F; JUSTO A; GONZALEZELIPE AR
    PREPARATION AND CHARACTERIZATION OF AL-TI MIXED-OXIDE THIN-FILMS
    Surface & coatings technology
    
    A. Stabel et al., "PREPARATION AND CHARACTERIZATION OF AL-TI MIXED-OXIDE THIN-FILMS", Surface & coatings technology, 101(1-3), 1998, pp. 142-145
26. LOPEZCARRENO LD; BENITEZ G; VISCIDO L; HERAS JM; YUBERO F; ESPINOS JP; GONZALEZELIPE AR
    OXIDATION OF MOLYBDENUM SURFACES BY REACTIVE OXYGEN PLASMA AND O-2(- AN AUGER AND XPS STUDY() BOMBARDMENT )
    Surface and interface analysis
    
    L.D. Lopezcarreno et al., "OXIDATION OF MOLYBDENUM SURFACES BY REACTIVE OXYGEN PLASMA AND O-2(- AN AUGER AND XPS STUDY() BOMBARDMENT )", Surface and interface analysis, 26(4), 1998, pp. 235-241
27. FINAZZIA; BENCOK P; HRICOVINI K; YUBERO F; CHEVRIER F; KOLB E; KRILL G; VESELY M; CHAPPERT C; RENARD JP
    X-RAY MAGNETIC CIRCULAR-DICHROISM STUDY OF VANADIUM IN THIN-FILMS (V AG(100) AND V/FE(100)) AND ALLOYS (FE0.82V0.18/AU(111))/
    Thin solid films
    
    FINAZZIA et al., "X-RAY MAGNETIC CIRCULAR-DICHROISM STUDY OF VANADIUM IN THIN-FILMS (V AG(100) AND V/FE(100)) AND ALLOYS (FE0.82V0.18/AU(111))/", Thin solid films, 317(1-2), 1998, pp. 314-317
28. LOPEZCARRENO LD; BENITEZ G; VISCIDO L; HERAS JM; YUBERO F; ESPINOS JP; GONZALEZELIPE AR
    DIFFERENT OXIDATION-STATES OF POLYCRYSTALLINE MOLYBDENUM TREATED BY O-2-PLASMA OR O-2-ION BOMBARDMENT
    Surface science
    
    L.D. Lopezcarreno et al., "DIFFERENT OXIDATION-STATES OF POLYCRYSTALLINE MOLYBDENUM TREATED BY O-2-PLASMA OR O-2-ION BOMBARDMENT", Surface science, 404(1-3), 1998, pp. 174-177
29. YUBERO F; JIMENEZ VM; GONZALEZELIPE AR
    OPTICAL-PROPERTIES AND ELECTRONIC-TRANSITIONS OF SNO2 THIN-FILMS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
    Surface science
    
    F. Yubero et al., "OPTICAL-PROPERTIES AND ELECTRONIC-TRANSITIONS OF SNO2 THIN-FILMS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY", Surface science, 400(1-3), 1998, pp. 116-126
30. FINAZZI M; YUBERO F; BENCOK P; CHEVRIER F; HRICOVINI K; CICCACCI F; KRILL G
    X-RAY MAGNETIC CIRCULAR-DICHROISM OF VANADIUM THIN-FILMS GROWN ON AG(100) AND FE(100)
    Journal of magnetism and magnetic materials
    
    M. Finazzi et al., "X-RAY MAGNETIC CIRCULAR-DICHROISM OF VANADIUM THIN-FILMS GROWN ON AG(100) AND FE(100)", Journal of magnetism and magnetic materials, 165(1-3), 1997, pp. 78-81
31. ANDRIEU S; FINAZZI M; YUBERO F; FISCHER H; ARCADE P; CHEVRIER F; HRICOVINI K; KRILL G; PIECUCH M
    1 ML MN FE(001) - IS MN COUPLING WITH FE ANTIFERROMAGNETIC OR FERROMAGNETIC/
    Journal of magnetism and magnetic materials
    
    S. Andrieu et al., "1 ML MN FE(001) - IS MN COUPLING WITH FE ANTIFERROMAGNETIC OR FERROMAGNETIC/", Journal of magnetism and magnetic materials, 165(1-3), 1997, pp. 191-194
32. ANDRIEU S; FINAZZI M; YUBERO F; FISCHER HM; ARCADE P; CHEVRIER F; HENNET L; HRICOVINI K; KRILL G; PIECUCH M
    MAGNETISM OF MN ULTRA-THIN FILMS GROWN ON (001) BCC FE STUDIED BY X-RAY MAGNETIC CIRCULAR-DICHROISM
    Europhysics letters
    
    S. Andrieu et al., "MAGNETISM OF MN ULTRA-THIN FILMS GROWN ON (001) BCC FE STUDIED BY X-RAY MAGNETIC CIRCULAR-DICHROISM", Europhysics letters, 38(6), 1997, pp. 459-464
33. SIMONSEN AC; YUBERO F; TOUGAARD S
    QUANTITATIVE MODEL OF ELECTRON-ENERGY-LOSS IN XPS
    Physical review. B, Condensed matter
    
    A.C. Simonsen et al., "QUANTITATIVE MODEL OF ELECTRON-ENERGY-LOSS IN XPS", Physical review. B, Condensed matter, 56(3), 1997, pp. 1612-1619
34. ANDRIEU S; FINAZZI M; YUBERO F; ARCADE P; CHEVRIER F; FISCHER H; HRICOVINI K; KRILL G; PIECUCH M
    MAGNETISM OF ULTRATHIN EPITAXIAL MN FILMS ON FE(001) STUDIED IN CIRCULAR MAGNETIC DICHROISM
    Journal de physique. IV
    
    S. Andrieu et al., "MAGNETISM OF ULTRATHIN EPITAXIAL MN FILMS ON FE(001) STUDIED IN CIRCULAR MAGNETIC DICHROISM", Journal de physique. IV, 6(C7), 1996, pp. 117-121
35. PRIETO P; YUBERO F; ELIZALDE E; SANZ JM
    DIELECTRIC-PROPERTIES OF ZR, ZRN, ZR3N4, AND ZRO2 DETERMINED BY QUANTITATIVE-ANALYSIS OF ELECTRON-ENERGY-LOSS SPECTRA
    Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    
    P. Prieto et al., "DIELECTRIC-PROPERTIES OF ZR, ZRN, ZR3N4, AND ZRO2 DETERMINED BY QUANTITATIVE-ANALYSIS OF ELECTRON-ENERGY-LOSS SPECTRA", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(6), 1996, pp. 3181-3188
36. YUBERO F; SANZ JM; RAMSKOV B; TOUGAARD S
    MODEL FOR QUANTITATIVE-ANALYSIS OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA - ANGULAR-DEPENDENCE
    Physical review. B, Condensed matter
    
    F. Yubero et al., "MODEL FOR QUANTITATIVE-ANALYSIS OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA - ANGULAR-DEPENDENCE", Physical review. B, Condensed matter, 53(15), 1996, pp. 9719-9727
37. YUBERO F; FUJITA D; RAMSKOV B; TOUGAARD S
    EXPERIMENTAL TEST OF MODEL FOR ANGULAR AND ENERGY-DEPENDENCE OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA
    Physical review. B, Condensed matter
    
    F. Yubero et al., "EXPERIMENTAL TEST OF MODEL FOR ANGULAR AND ENERGY-DEPENDENCE OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA", Physical review. B, Condensed matter, 53(15), 1996, pp. 9728-9732
38. DUFOUR G; PONCEY C; ROCHET F; ROULET H; IACOBUCCI S; SACCHI M; YUBERO F; MOTTA N; PIANCASTELLI MN; SGARLATA A; DECRESCENZI M
    METAL PHTHALOCYANINES (MPC, M=NI, CU) ON CU(001) AND SI(001) SURFACESSTUDIED BY XPS, XAS AND STM
    Journal of electron spectroscopy and related phenomena
    
    G. Dufour et al., "METAL PHTHALOCYANINES (MPC, M=NI, CU) ON CU(001) AND SI(001) SURFACESSTUDIED BY XPS, XAS AND STM", Journal of electron spectroscopy and related phenomena, 76, 1995, pp. 219-224
39. VICENTIN FC; TURCHINI S; YUBERO F; VOGEL J; SACCHI M
    ABSORPTION CROSS-SECTIONS AT THE M(4,5) EDGES OF RARE-EARTHS - A SOFT-X-RAY TRANSMISSION EXPERIMENT
    Journal of electron spectroscopy and related phenomena
    
    F.C. Vicentin et al., "ABSORPTION CROSS-SECTIONS AT THE M(4,5) EDGES OF RARE-EARTHS - A SOFT-X-RAY TRANSMISSION EXPERIMENT", Journal of electron spectroscopy and related phenomena, 74(3), 1995, pp. 187-194
40. CASTRUCCI P; YUBERO F; VICENTIN FC; VOGEL J; SACCHI M
    SURFACE CRYSTAL-FIELD AT THE ER SI(111) INTERFACE STUDIED BY SOFT-X-RAY LINEAR DICHROISM/
    Physical review. B, Condensed matter
    
    P. Castrucci et al., "SURFACE CRYSTAL-FIELD AT THE ER SI(111) INTERFACE STUDIED BY SOFT-X-RAY LINEAR DICHROISM/", Physical review. B, Condensed matter, 52(19), 1995, pp. 14035-14039
41. PRIETO P; FERNANDEZ A; SORIANO L; YUBERO F; ELIZALDE E; GONZALEZELIPE AR; SANZ JM
    ELECTRONIC-STRUCTURE OF INSULATING ZR3N4 STUDIED BY RESONANT PHOTOEMISSION
    Physical review. B, Condensed matter
    
    P. Prieto et al., "ELECTRONIC-STRUCTURE OF INSULATING ZR3N4 STUDIED BY RESONANT PHOTOEMISSION", Physical review. B, Condensed matter, 51(24), 1995, pp. 17984-17987
42. YUBERO F; JANSSON C; BATCHELOR DR; TOUGAARD S
    VALIDITY OF THE METHOD FOR QUANTITATIVE XPS OF SURFACE NANOSTRUCTURES- APPLICATION TO CU AU/CU/
    Surface science
    
    F. Yubero et al., "VALIDITY OF THE METHOD FOR QUANTITATIVE XPS OF SURFACE NANOSTRUCTURES- APPLICATION TO CU AU/CU/", Surface science, 333, 1995, pp. 753-758
43. YUBERO F; TURCHINI S; VICENTIN FC; VOGEL J; SACCHI M
    MAGNETIC CIRCULAR-DICHROISM IN TRANSMISSION MODE AT THE NI 2P EDGES
    Solid state communications
    
    F. Yubero et al., "MAGNETIC CIRCULAR-DICHROISM IN TRANSMISSION MODE AT THE NI 2P EDGES", Solid state communications, 93(1), 1995, pp. 25-28
44. YUBERO F; SANZ JM; TRIGO JF; ELIZALDE E; TOUGAARD S
    QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS
    Surface and interface analysis
    
    F. Yubero et al., "QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS", Surface and interface analysis, 22(1-12), 1994, pp. 124-128
45. YUBERO F; TOUGAARD S; ELIZALDE E; SANZ JM
    DIELECTRIC LOSS FUNCTION OF SI AND SIO2 FROM QUANTITATIVE-ANALYSIS OFREELS SPECTRA
    Surface and interface analysis
    
    F. Yubero et al., "DIELECTRIC LOSS FUNCTION OF SI AND SIO2 FROM QUANTITATIVE-ANALYSIS OFREELS SPECTRA", Surface and interface analysis, 20(8), 1993, pp. 719-726