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La ricerca find articoli where authors phrase all words ' TOZER RC' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 21 riferimenti
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    1. Tan, CH; David, JPR; Rees, GJ; Tozer, RC; Herbert, DC
      Treatment of soft threshold in impact ionization

      JOURNAL OF APPLIED PHYSICS
    2. Tan, CH; David, JPR; Plimmer, SA; Rees, GJ; Tozer, RC; Grey, R
      Low multiplication noise thin Al0.6Ga0.4As avalanche photodiodes

      IEEE TRANSACTIONS ON ELECTRON DEVICES
    3. Ng, BK; David, JPR; Plimmer, SA; Rees, GJ; Tozer, RC; Hopkinson, M; Hill, G
      Avalanche multiplication characteristics of Al0.8Ga0.2As diodes

      IEEE TRANSACTIONS ON ELECTRON DEVICES
    4. Devonshire, R; Healey, TJ; Stone, DA; Tozer, RC
      Relative enhancement of near-UV emission from a low-pressure mercury-rare-gas discharge lamp, for an LCD backlighting application

      MEASUREMENT SCIENCE & TECHNOLOGY
    5. Li, KF; Ong, DS; David, JPR; Tozer, RC; Rees, GJ; Plimmer, SA; Chang, KY; Roberts, JS
      Avalanche noise characteristics of thin GaAs structures with distributed carrier generation

      IEEE TRANSACTIONS ON ELECTRON DEVICES
    6. Ng, BK; David, JPR; Plimmer, SA; Hopkinson, M; Tozer, RC; Rees, GJ
      Impact ionization coefficients of Al0.8Ga0.2As

      APPLIED PHYSICS LETTERS
    7. Tan, CH; Clark, JC; David, JPR; Rees, GJ; Plimmer, SA; Tozer, RC; Herbert, DC; Robbins, DJ; Leong, WY; Newey, J
      Avalanche noise measurement in thin Si p(+)-i-n(+) diodes

      APPLIED PHYSICS LETTERS
    8. Li, KF; Ong, DS; David, JPR; Tozer, RC; Rees, GJ; Robson, PN; Grey, R
      Low noise GaAs and Al0.3Ga0.7As avalanche photodetectors

      IEE PROCEEDINGS-OPTOELECTRONICS
    9. Li, KF; Plimmer, SA; David, JPR; Tozer, RC; Rees, GJ; Robson, PN; Button, CC; Clark, JC
      Low avalanche noise characteristics in thin InP p(+)-i-n(+) diodes with electron initiated multiplication

      IEEE PHOTONICS TECHNOLOGY LETTERS
    10. HOSSEINISIANAKI A; BULLOUGH WA; WHITTLE M; TOZER RC; MAKIN J
      STEADY-STATE AND TRANSIENT MODELS FOR THE ELECTRICAL RESPONSE OF AN ELECTRORHEOLOGICAL CATCH SYSTEM

      IEE proceedings. Science, measurement and technology
    11. LI KF; ONG DS; DAVID JPR; REES GJ; TOZER RC; ROBSON PN; GREY R
      AVALANCHE MULTIPLICATION NOISE CHARACTERISTICS IN THIN GAAS P(-I-N(+)DIODES())

      I.E.E.E. transactions on electron devices
    12. LI KF; ONG DS; DAVID JPR; TOZER RC; REES GJ; ROBSON PN; GREY R
      LOW EXCESS NOISE CHARACTERISTICS IN THIN AVALANCHE REGION GAAS DIODES

      Electronics Letters
    13. DJAMDJI F; GORVIN AC; FREESTON IL; TOZER RC; MAYES IC; BLIGHT SR
      ELECTRICAL-IMPEDANCE TOMOGRAPHY APPLIED TO SEMICONDUCTOR WAFER CHARACTERIZATION

      Measurement science & technology
    14. ANDERSON DK; TOZER RC; FREESTON IL
      ANALYTIC SOLUTION OF THE FORWARD PROBLEM FOR INDUCED CURRENT ELECTRICAL-IMPEDANCE TOMOGRAPHY SYSTEMS

      IEE proceedings. Science, measurement and technology
    15. FREESTON IL; TOZER RC
      IMPEDANCE IMAGING USING INDUCED CURRENTS

      Physiological measurement
    16. HOSSEINISIANAKI A; BULLOUGH WA; TOZER RC; WHITTLE M; MAKIN J
      EXPERIMENTAL INVESTIGATION INTO THE ELECTRICAL MODELING OF ELECTRORHEOLOGICAL FLUIDS IN THE SHEAR MADE

      IEE proceedings. Science, measurement and technology
    17. SCAIFE JM; TOZER RC; FREESTON IL
      CONDUCTIVITY AND PERMITTIVITY IMAGES FROM AN INDUCED CURRENT ELECTRICAL-IMPEDANCE TOMOGRAPHY SYSTEM

      IEE proceedings. Science, measurement and technology
    18. TOZER RC; ORRELL CT; BULLOUGH WA
      ON-OFF EXCITATION SWITCH FOR ER DEVICES

      International journal of modern physics b
    19. TOZER RC; ORRELL CT; BULLOUGH WA
      ON-OFF EXCITATION SWITCH FOR ER DEVICES

      International journal of modern physics b
    20. SCAIFE JM; TOZER RC; FREESTON IL
      UNREFERENCED IMAGING USING AN INDUCED CURRENT ELECTRICAL-IMPEDANCE IMAGING-SYSTEM

      Electronics Letters
    21. PURVIS WR; TOZER RC; ANDERSON DK; FREESTON IL
      INDUCED CURRENT IMPEDANCE IMAGING

      IEE proceedings. A, Science, measurement and technology


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 11/08/20 alle ore 18:45:58