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1. Bianco, A; Viticoli, M; Gusmano, G; Paci, M; Padeletti, G; Scardi, P
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   A. Bianco et al., "Zirconium tin titanate thin films via aqueous polymeric precursor route", MAT SCI E C, 15(1-2), 2001, pp. 211-213
2. Caminiti, R; Capobianchi, A; Marovino, P; Paoletti, AM; Padeletti, G; Pennesi, G; Rossi, G
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   R. Caminiti et al., "Structural and morphological characterisation of ruthenium phthalocyanine films by energy dispersive X-ray diffraction and atomic force microscopy", THIN SOL FI, 382(1-2), 2001, pp. 74-80
3. Fabbri, F; Padeletti, G; Petrisor, T; Celentano, G; Boffa, V
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   F. Fabbri et al., "Surface morphology of pulsed laser deposited YBa2Cu3O7-delta and NdBa2Cu3O7-delta thin films on SrTiO3 substrates", SUPERCOND S, 13(10), 2000, pp. 1492-1498
4. Padeletti, G; Pergolini, S; Montesperelli, G; D'Alessandro, A; Campoli, F; Maltese, P
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   G. Padeletti et al., "Evaluation of structural and adhesive properties of nylon 6 and PTFE alignment films by means of atomic force microscopy", APPL PHYS A, 71(5), 2000, pp. 571-576
5. Beccaria, AM; Padeletti, G; Montesperelli, G; Chiaruttini, L
   The effect of pretreatments with siloxanes on the corrosion resistance of aluminium in NaCl solution
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   A.M. Beccaria et al., "The effect of pretreatments with siloxanes on the corrosion resistance of aluminium in NaCl solution", SURF COAT, 111(2-3), 1999, pp. 240-246
6. PADELETTI G; LARCIPRETE R
   ATOMIC-FORCE MICROSCOPY STUDY OF THE MORPHOLOGICAL MODIFICATIONS INDUCED BY LASER PROCESSING OF SI(1-X)GEX SI SAMPLES/
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   G. Padeletti e R. Larciprete, "ATOMIC-FORCE MICROSCOPY STUDY OF THE MORPHOLOGICAL MODIFICATIONS INDUCED BY LASER PROCESSING OF SI(1-X)GEX SI SAMPLES/", Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1762-1766
7. LARCIPRETE R; COZZI S; PIERETTI S; PADELETTI G; MASETTI E; MONTECCHI M
   THERMAL AND EXCIMER-LASER ASSISTED GROWTH OF SI(1-X)GEX ALLOYS FROM SI2H6 AND GEH4 MONITORED BY ON LINE SINGLE-WAVELENGTH ELLIPSOMETRY AND EX-SITU ATOMIC-FORCE MICROSCOPY
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   R. Larciprete et al., "THERMAL AND EXCIMER-LASER ASSISTED GROWTH OF SI(1-X)GEX ALLOYS FROM SI2H6 AND GEH4 MONITORED BY ON LINE SINGLE-WAVELENGTH ELLIPSOMETRY AND EX-SITU ATOMIC-FORCE MICROSCOPY", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 644-652
8. LARCIPRETE R; COZZI S; MASETTI E; MONTECCHI M; PADELETTI G
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   R. Larciprete et al., "GROWTH OF GE LAYERS ON SI(100) MONITORED BY IN-SITU ELLIPSOMETRY", Thin solid films, 315(1-2), 1998, pp. 49-56
9. CAMPOLI F; BECCHERELLI R; DALESSANDRO A; FERRARA V; GALLOPPA A; PADELETTI G; PETROCCO S; MALTESE P
   USE OF PTFE ALIGNMENT LAYERS IN PASSIVE ADDRESSED SSFLC DISPLAYS
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   F. Campoli et al., "USE OF PTFE ALIGNMENT LAYERS IN PASSIVE ADDRESSED SSFLC DISPLAYS", Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 304, 1997, pp. 357
10. INGO GM; PADELETTI G; CHIOZZINI G; BULTRINI G
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12. INGO GM; MAZZONI S; BULTRINI G; FONTANA S; PADELETTI G; CHIOZZINI G; SCOPPIO L
    SMALL-AREA XPS AND XAES STUDY OF THE IRON-ORE SMELTING PROCESS
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    G.M. Ingo et al., "SMALL-AREA XPS AND XAES STUDY OF THE IRON-ORE SMELTING PROCESS", Surface and interface analysis, 22(1-12), 1994, pp. 614-619
13. INGO GM; PADELETTI G
    SEGREGATION ASPECTS AT THE FRACTURE SURFACES OF 8 WT-PERCENT YTTRIA-ZIRCONIA THERMAL BARRIER COATINGS
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    G.M. Ingo e G. Padeletti, "SEGREGATION ASPECTS AT THE FRACTURE SURFACES OF 8 WT-PERCENT YTTRIA-ZIRCONIA THERMAL BARRIER COATINGS", Surface and interface analysis, 21(6-7), 1994, pp. 450
14. NGUYENVANDAU F; MATHET V; GALTIER P; PADELETTI G; OLIVIER J; CRETE DG; COLLOT P
    A STUDY OF PBSE HETEROEPITAXY ON SI(111) FOR IR OPTOELECTRONIC APPLICATIONS
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    F. Nguyenvandau et al., "A STUDY OF PBSE HETEROEPITAXY ON SI(111) FOR IR OPTOELECTRONIC APPLICATIONS", Materials science & engineering. B, Solid-state materials for advanced technology, 21(2-3), 1993, pp. 317-320
15. OLIVIER J; PADELETTI G; INGO GM; MATTOGNO G; BOSACCHI A; FRANCHI S
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16. INGO GM; PADELETTI G
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17. MATHET V; GALTIER P; NGUYENVANDAU F; PADELETTI G; OLIVIER J
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    V. Mathet et al., "A MICROSTRUCTURAL STUDY OF CRYSTALLINE DEFECTS IN PBSE BAF2/CAF2 ON (111)SI GROWN BY MOLECULAR-BEAM EPITAXY/", Journal of crystal growth, 132(1-2), 1993, pp. 241-249