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La ricerca find articoli where authors phrase all words ' Ogletree, DF' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 52 riferimenti
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    1. Inoue, T; Ogletree, DF; Salmeron, M
      Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes

      JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
    2. Ling, WL; Qiu, ZQ; Takeuchi, O; Ogletree, DF; Salmeron, M
      Effect of oxygen surfactant on the magnetic and structural properties of Co films grown on Cu(110) - art. no. 024408

      PHYSICAL REVIEW B
    3. Rose, MK; Borg, A; Mitsui, T; Ogletree, DF; Salmeron, M
      Subsurface impurities in Pd(111) studied by scanning tunneling microscopy

      JOURNAL OF CHEMICAL PHYSICS
    4. Xu, L; Ogletree, DF; Salmeron, M; Tang, H; Ma, XD; Gui, J
      Thickness and drainage of perfluoropolyethers under compression

      JOURNAL OF CHEMICAL PHYSICS
    5. van den Oetelaar, RJA; Xu, L; Ogletree, DF; Salmeron, M; Tang, H; Gui, J
      Tribocharging phenomena in hard disk amorphous carbon coatings with and without perfluoropolyether lubricants

      JOURNAL OF APPLIED PHYSICS
    6. Ling, WL; Takeuchi, O; Ogletree, DF; Qiu, ZQ; Salmeron, M
      STM studies on the growth of monolayers: Co on Cu(110) with one half monolayer of preadsorbed oxygen

      SURFACE SCIENCE
    7. Xu, L; Ogletree, DF; Salmeron, M; Tang, HA; Gui, J; Marchon, B
      De-wetting of lubricants on hard disks

      JOURNAL OF CHEMICAL PHYSICS
    8. Inoue, T; Ogletree, DF; Salmeron, M
      Field emission study of diamond-like carbon films with scanned-probe field-emission force microscopy

      APPLIED PHYSICS LETTERS
    9. Enachescu, M; van den Oetelaar, RJA; Carpick, RW; Ogletree, DF; Flipse, CFJ; Salmeron, M
      Observation of proportionality between friction and contact area at the nanometer scale

      TRIBOLOGY LETTERS
    10. Mowery, MD; Kopta, S; Ogletree, DF; Salmeron, M; Evans, CE
      Structural manipulation of the frictional properties of linear polymers insingle molecular layers

      LANGMUIR
    11. Enachescu, M; Schleef, D; Ogletree, DF; Salmeron, M
      Integration of point-contact microscopy and atomic-force microscopy: Application to characterization of graphite/Pt(111)

      PHYSICAL REVIEW B-CONDENSED MATTER
    12. Barrena, E; Kopta, S; Ogletree, DF; Charych, DH; Salmeron, M
      Relationship between friction and molecular structure: Alkylsilane lubricant films under pressure

      PHYSICAL REVIEW LETTERS
    13. Carpick, RW; Ogletree, DF; Salmeron, M
      A general equation for fitting contact area and friction vs load measurements

      JOURNAL OF COLLOID AND INTERFACE SCIENCE
    14. XU L; LIO A; HU J; OGLETREE DF; SALMERON M
      WETTING AND CAPILLARY PHENOMENA OF WATER ON MICA

      JOURNAL OF PHYSICAL CHEMISTRY B
    15. CARPICK RW; DAI Q; OGLETREE DF; SALMERON M
      FRICTION FORCE MICROSCOPY INVESTIGATIONS OF POTASSIUM HALIDE SURFACESIN ULTRAHIGH-VACUUM - STRUCTURE, FRICTION AND SURFACE MODIFICATION

      Tribology letter
    16. DUNPHY JC; ROSE M; BEHLER S; OGLETREE DF; SALMERON M; SAUTET P
      ACETYLENE STRUCTURE AND DYNAMICS ON PD(111)

      Physical review. B, Condensed matter
    17. BLUHM H; PAN SH; XU L; INOUE T; OGLETREE DF; SALMERON M
      SCANNING FORCE MICROSCOPE AND VACUUM CHAMBER FOR THE STUDY OF ICE FILMS - DESIGN AND FIRST RESULTS

      Review of scientific instruments
    18. ENACHESCU M; VANDENOETELAAR RJA; CARPICK RW; OGLETREE DF; FLIPSE CFJ; SALMERON M
      ATOMIC-FORCE MICROSCOPY STUDY OF AN IDEALLY HARD CONTACT - THE DIAMOND(111) TUNGSTEN CARBIDE INTERFACE

      Physical review letters
    19. LIO A; MORANT C; OGLETREE DF; SALMERON M
      ATOMIC-FORCE MICROSCOPY STUDY OF THE PRESSURE-DEPENDENT STRUCTURAL AND FRICTIONAL-PROPERTIES OF N-ALKANETHIOLS ON GOLD

      JOURNAL OF PHYSICAL CHEMISTRY B
    20. BEHLER S; ROSE MK; DUNPHY JC; OGLETREE DF; SALMERON M; CHAPELIER C
      SCANNING TUNNELING MICROSCOPE WITH CONTINUOUS-FLOW CRYOSTAT SAMPLE COOLING

      Review of scientific instruments
    21. BEHLER S; ROSE MK; OGLETREE DF; SALMERON M
      METHOD TO CHARACTERIZE THE VIBRATIONAL RESPONSE OF A BEETLE TYPE SCANNING TUNNELING MICROSCOPE

      Review of scientific instruments
    22. ENDERLE T; HA T; OGLETREE DF; CHEMLA DS; MAGOWAN C; WEISS S
      MEMBRANE SPECIFIC MAPPING AND COLOCALIZATION OF MALARIAL AND HOST SKELETAL PROTEINS IN THE PLASMODIUM-FALCIPARUM-INFECTED ERYTHROCYTE BY DUAL-COLOR NEAR-FIELD SCANNING OPTICAL MICROSCOPY

      Proceedings of the National Academy of Sciences of the United Statesof America
    23. CARPICK RW; OGLETREE DF; SALMERON M
      LATERAL STIFFNESS - A NEW NANOMECHANICAL MEASUREMENT FOR THE DETERMINATION OF SHEAR STRENGTHS WITH FRICTION FORCE MICROSCOPY

      Applied physics letters
    24. CARPICK RW; AGRAIT N; OGLETREE DF; SALMERON M
      MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (VOL 14, PG 1289, 1996)

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    25. CARPICK RW; AGRAIT N; OGLETREE DF; SALMERON M
      MEASUREMENT OF INTERFACIAL SHEAR (FRICTION) WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    26. HU J; WANG M; WEIER HUG; FRANTZ P; KOLBE W; OGLETREE DF; SALMERON M
      IMAGING OF SINGLE EXTENDED DNA-MOLECULES ON FLAT (AMINOPROPYL)TRIETHOXYSILANE-MICA BY ATOMIC-FORCE MICROSCOPY

      Langmuir
    27. CARPICK RW; AGRAIT N; OGLETREE DF; SALMERON M
      VARIATION OF THE INTERFACIAL SHEAR-STRENGTH AND ADHESION OF A NANOMETER-SIZED CONTACT

      Langmuir
    28. HU J; XIAO XD; OGLETREE DF; SALMERON M
      THE STRUCTURE OF MOLECULARLY THIN-FILMS OF WATER ON MICA IN HUMID ENVIRONMENTS (VOL 344, PG 221, 1995)

      Surface science
    29. OGLETREE DF; CARPICK RW; SALMERON M
      CALIBRATION OF FRICTIONAL FORCES IN ATOMIC-FORCE MICROSCOPY

      Review of scientific instruments
    30. HA T; ENDERLE T; OGLETREE DF; CHEMLA DS; SELVIN PR; WEISS S
      PROBING THE INTERACTION BETWEEN 2 SINGLE MOLECULES - FLUORESCENCE RESONANCE ENERGY-TRANSFER BETWEEN A SINGLE-DONOR AND A SINGLE ACCEPTOR

      Proceedings of the National Academy of Sciences of the United Statesof America
    31. SELVIN PR; HA T; ENDERLE T; OGLETREE DF; CHEMLA DS; WEISS S
      FLUORESCENCE RESONANCE ENERGY-TRANSFER BETWEEN A SINGLE-DONOR AND A SINGLE ACCEPTOR MOLECULE

      Biophysical journal
    32. BOTKIN D; GLASS J; CHEMLA DS; OGLETREE DF; SALMERON M; WEISS S
      ADVANCES IN ULTRAFAST SCANNING-TUNNELING-MICROSCOPY

      Applied physics letters
    33. WEISS S; BOTKIN D; OGLETREE DF; SALMERON M; CHEMLA DS
      THE ULTRAFAST RESPONSE OF A SCANNING TUNNELING MICROSCOPE

      Physica status solidi. b, Basic research
    34. DUNPHY JC; SAUTET P; OGLETREE DF; SALMERON M
      APPROACH TO SURFACE-STRUCTURE DETERMINATION WITH THE SCANNING TUNNELING MICROSCOPE - MULTIPLE-GAP IMAGING AND ELECTRON-SCATTERING QUANTUM-CHEMISTRY THEORY

      Physical review. B, Condensed matter
    35. HU J; XIAO XD; OGLETREE DF; SALMERON M
      THE STRUCTURE OF MOLECULARLY THIN-FILMS OF WATER ON MICA IN HUMID ENVIRONMENTS

      Surface science
    36. HU J; XIAO XD; OGLETREE DF; SALMERON M
      ATOMIC-SCALE FRICTION AND WEAR OF MICA

      Surface science
    37. HU J; XIAO XD; OGLETREE DF; SALMERON M
      IMAGING THE CONDENSATION AND EVAPORATION OF MOLECULARLY THIN-FILMS OFWATER WITH NANOMETER RESOLUTION

      Science
    38. BOTKIN D; WEISS S; OGLETREE DF; BEEMAN J; SALMERON M; CHEMLA DS
      DESIGN CONSIDERATION IN AN ULTRAFAST SCANNING TUNNELING MICROSCOPE

      Review of scientific instruments
    39. DAI Q; VOLLMER R; CARPICK RW; OGLETREE DF; SALMERON M
      VARIABLE-TEMPERATURE ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE

      Review of scientific instruments
    40. DUNPHY JC; CHAPELIER C; OGLETREE DF; SALMERON MB
      DEPOSITION OF AU ON A SULFUR COVERED MO(100) SURFACE - ADSORBATE ADSORBATE INTERACTION AND GROWTH

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    41. ZHENG JF; OGLETREE DF; WALKER J; SALMERON M; WEBER ER
      CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY OF SEMICONDUCTOR VERTICAL-CAVITY SURFACE-EMITTING LASER STRUCTURE

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    42. ZHENG JF; LIU X; WEBER ER; OGLETREE DF; SALMERON
      SI DONORS (SI(GA)) IN GAAS OBSERVED BY SCANNING-TUNNELING-MICROSCOPY

      Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
    43. SAUTET P; DUNPHY JC; OGLETREE DF; JOACHIM C; SALMERON M
      IMAGING A P(2X2) LAYER OF SULFUR ON RE(0001) WITH THE SCANNING TUNNELING MICROSCOPE - AN EXPERIMENTAL AND THEORETICAL-STUDY OF THE EFFECT OF ADSORPTION SITE AND TIP STRUCTURE

      Surface science
    44. BARBIERI A; JENTZ D; MATERER N; HELD G; DUNPHY J; OGLETREE DF; SAUTET P; SALMERON M; VANHOVE MA; SOMORJAI GA
      SURFACE CRYSTALLOGRAPHY OF RE(0001)-(2X2)-S AND RE(0001)-(2-ROOT-3X2-ROOT) R30-DEGREES-6S - A COMBINED LEED AND STM STUDY

      Surface science
    45. ZHENG JF; LIU X; NEWMAN N; WEBER ER; OGLETREE DF; SALMERON M
      SCANNING-TUNNELING-MICROSCOPY STUDIES OF SI DONORS (SI-GA) IN GAAS

      Physical review letters
    46. LIU GY; FENTER P; CHIDSEY CED; OGLETREE DF; EISENBERGER P; SALMERON M
      AN UNEXPECTED PACKING OF FLUORINATED N-ALKANE THIOLS ON AU(111) - A COMBINED ATOMIC-FORCE MICROSCOPY AND X-RAY-DIFFRACTION STUDY

      The Journal of chemical physics
    47. DUNPHY JC; MCINTYRE BJ; GOMEZ J; OGLETREE DF; SOMORJAI GA; SALMERON MB
      COADSORBATE INDUCED COMPRESSION OF SULFUR OVERLAYERS ON RE(0001) AND PT(111) BY CO

      The Journal of chemical physics
    48. SALMERON M; NEUBAUER G; FOLCH A; TOMITORI M; OGLETREE DF; SAUTET P
      VISCOELASTIC AND ELECTRICAL-PROPERTIES OF SELF-ASSEMBLED MONOLAYERS ON AU(111) FILMS

      Langmuir
    49. SAUTET P; DUNPHY J; OGLETREE DF; SALMERON M
      THE ROLE OF ELECTRONIC INTERFERENCES IN DETERMINING THE APPEARANCE OFSTM IMAGES - APPLICATION TO THE S(2X2) RE(0001) SYSTEM/

      Surface science
    50. CHEN SJ; SANZ F; OGLETREE DF; HALLMARK VM; DEVINE TM; SALMERON M
      SELECTIVE DISSOLUTION OF COPPER FROM AU-RICH CU-AU ALLOYS - AN ELECTROCHEMICAL STM STUDY

      Surface science
    51. MURRAY MN; HANSMA HG; BEZANILLA M; SANO T; OGLETREE DF; KOLBE W; SMITH CL; CANTOR CR; SPENGLER S; HANSMA PK; SALMERON M
      ATOMIC FORCE MICROSCOPY OF BIOCHEMICALLY TAGGED DNA

      Proceedings of the National Academy of Sciences of the United Statesof America
    52. WEISS S; OGLETREE DF; BOTKIN D; SALMERON M; CHEMLA DS
      ULTRAFAST SCANNING PROBE MICROSCOPY

      Applied physics letters


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 13/08/20 alle ore 05:07:41