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La ricerca find articoli where authors phrase all words ' Novikov, YA' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 38 riferimenti
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    1. Volk, CP; Novikov, YA; Ozerin, YV; Rakov, AV
      Accuracy of measurement of microrelief dimensions from a scanning electronmicroscope image of a cleavage

      MEASUREMENT TECHNIQUES
    2. Gornev, ES; Novikov, YA; Plotnikov, YI; Rakov, AV
      Scanning force microscope measurement of the parameters of the profiles ofsubmillimeter VLSI components

      MEASUREMENT TECHNIQUES
    3. Shantarovich, VP; Novikov, YA; Suptel, ZK; Kevdina, IB; Masuda, T; Khotimskii, VS; Yampolskii, YP
      Influence of deformation and chemical structure on elementary free volumesin glassy polymers

      RADIATION PHYSICS AND CHEMISTRY
    4. Volk, CP; Novikov, YA; Rakov, AV
      SEM calibration in the micrometer and submicrometer ranges by means of a periodic linear measure

      MEASUREMENT TECHNIQUES
    5. Shantarovich, VP; Novikov, YA; Suptel, ZK; Oleinik, EF; Boyce, MC
      The influence of deformation and chemical composition on elementary free volumes in glassy polymers

      ACTA PHYSICA POLONICA A
    6. Novikov, YA; Rakov, AV
      Metrology of VLSI critical element sizes

      MEASUREMENT TECHNIQUES
    7. Shantarovich, VP; Novikov, YA; Oleinik, EF; Arzhakov, MS; Suptel', ZK; Salamatina, OB; Kevdina, IB
      Positron annihilation studies of the effect of composition and external actions on free volume in glassy polymers

      VYSOKOMOLEKULYARNYE SOEDINENIYA SERIYA A & SERIYA B
    8. Kirkinskii, VA; Novikov, YA
      A new approach to theoretical modelling of nuclear fusion in palladium deuteride

      EUROPHYSICS LETTERS
    9. GRAFUTIN VI; GRISHKIN VL; MYASISHCHEVA GG; FUNTIKOV YV; NOVIKOV YA
      POSITRON-ANNIHILATION IN POLYCRYSTALLINE METALS

      Physics of the solid state
    10. SHANTAROVICH VP; AZAMATOVA ZK; NOVIKOV YA
      POSITRON INVESTIGATIONS OF FREE-VOLUME ELEMENTS IN POLYMER GAS-SEPARATION MEMBRANES

      Physics of the solid state
    11. SHANTAROVICH VP; NOVIKOV YA; AZAMATOVA ZK; YAMPOLSKII YP
      POSITRON STUDIES OF POLYMERIC GAS-SEPARATION MEMBRANES

      Vysokomolekularnye soedinenia. Seria A
    12. NOVIKOV YA; RAKOV AV; FILIPPOV MN
      LINEAR MEASUREMENTS ON SEM OF ELEMENTS WI TH TRAPEZOID STRUCTURE WITHDIFFERENT ENERGIES OF ELECTRONS OF A PROBE

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    13. SHANTAROVICH VP; AZAMATOVA ZK; NOVIKOV YA; YAMPOLSKII YP
      FREE-VOLUME DISTRIBUTION OF HIGH PERMEABILITY MEMBRANE MATERIALS PROBED BY POSITRON-ANNIHILATION

      Macromolecules
    14. NOVIKOV YA; RAKOV AV
      RAPID MEASUREMENT OF THE DIAMETER OF THE ELECTRON-PROBE OF A SCANNINGELECTRON-MICROSCOPE

      Measurement techniques
    15. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      MEASUREMENT OF THE DIVERGENCE ANGLE OF THE ELECTRON-MICROPROBE OF A SCANNING ELECTRON-MICROSCOPE

      Measurement techniques
    16. NOVIKOV YA; RAKOV AV; STRIZHKOV IB; SEDOV SV
      LINEAR MEASUREMENTS IN SUBMICRON RANGE ON SEM

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    17. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      CALIBRATION OF THE SCANNING ELECTRON-MICR OSCOPES

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    18. SHANTAROVICH VP; KEVDINA IB; NOVIKOV YA; DZHEIN VK; GUPTA A
      STUDY OF POROUS SILICON LAYERS BY THE POS ITRON-ANNIHILATION TECHNIQUE

      Fizika tverdogo tela
    19. GOLDBERG EI; NOVIKOV YA
      ENSURING THE COMPLETE TESTABILITY OF PROGRAMMABLE LOGIC MATRICES

      Automation and remote control
    20. DANILOV VA; NOVIKOV YA; RAKOV AV; STEKOLIN IY
      SEM MEASUREMENT OF THE LINEAR DIMENSIONS OF RELIEF SUBMICRON STRUCTURES BY THE METHOD OF INVARIANT POINTS

      Measurement techniques
    21. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      SCANNING ELECTRON-MICROSCOPE CALIBRATION WITH INPUT DATA CHECKING

      Measurement techniques
    22. NOVIKOV YA; STEKOLIN IY
      ACCURACY IN CALIBRATING ELECTRON-MICROSCOPES WITH SILICON SLOT STRUCTURES

      Measurement techniques
    23. DANILOV VA; NOVIKOV YA; RAKOV AV; STEKOLIN IY
      MEASUREMENT OF LINEAR DIMENSIONS OF SUBMICRON STRUCTURES WITH A SCANNING ELECTRON-MICROSCOPE

      Measurement techniques
    24. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      CALIBRATION OF REM WITH ELIMINATION OF SYSTEMATIC LINEAR-GAUGE ERROR

      Measurement techniques
    25. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      CALIBRATION OF SCANNING ELECTRON-MICROSCOPES BY MEANS OF PITCH STRUCTURES

      Measurement techniques
    26. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      MEASURING THE DIAMETER OF AN ELECTRON-PROBE WITH A SCANNING ELECTRON-MICROSCOPE

      Measurement techniques
    27. GOLDBERG EI; NOVIKOV YA
      CONSTRUCTION OF SHORT COMPLETE TEST SETS FOR PROGRAMMABLE LOGIC-ARRAYS

      Automation and remote control
    28. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      CALIBRATING A SCANNING ELECTRON-MICROSCOPE BY MEANS OF A LINEAR MEASURE HAVING ONE CERTIFIED DIMENSION

      Measurement techniques
    29. NOVIKOV YA; RAKOV AV; STEKOLIN IY
      SCANNING ELECTRON-MICROSCOPE CALIBRATION WITH SIMULTANEOUS ELECTRON-PROBE DIAMETER DETERMINATION

      Measurement techniques
    30. GRAFUTIN VI; KOMLEV VP; NOVIKOV YA; RAKOV AV; FILIMONOV MK; FUNTIKOV YV; SHANTAROVICH VP
      POSITRON-ANNIHILATION STUDY OF THE LAMINA R STRUCTURES

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    31. NOVIKOV YA; RAKOV AV; SHANTAROVICH VP
      ON POSITRON-ANNIHILATION IN POLYCRYSTALLI NE METALS

      Fizika tverdogo tela
    32. NOVIKOV YA; PESHEKHONOV SV; RAKOV AV; SIMONOV AN; STEKOLIN IY; STRIZHKOV IB; TSYBULSKII VV
      CALIBRATION OF SCANNING ELECTRON-MICROSCOPES FOR MEASURING THE DIMENSIONS OF SUBMICRON RELIEF ELEMENTS

      Measurement techniques
    33. NOVIKOV YA; RAKOV AV; STEKOLIN IY; STRIZHKOV IB
      DETERMINATION OF THE DIAMETER OF THE ELECTRON-PROBE OF A SCANNING ELECTRON-MICROSCOPE

      Measurement techniques
    34. NOVIKOV YA; RAKOV AV; SIMONOV AN; STECOLIN IY; STRIZHKOV IB
      INTERACTION OF SECONDARY EMISSIVE ELECTRO NS WITH RELIEF SURFACE

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    35. NOVIKOV YA; RAKOV AV; STECOLIN IY; STRIZHKOV IB; TSYBULSKY VV
      MECHANISMS OF VIDEO PROFILE FORMATION IN SEM

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    36. NOVIKOV YA; RAKOV AV; STECOLIN IY
      THE OPTICAL DIFFRACTION GRATING AS A REFE RENCE GAUGE STRUCTURE FOR SCANNING ELECTRON-MICROSCOPE

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    37. NOVIKOV YA; PESHEKHONOV SV; RAKOV AV; SEDOV SV; SIMONOV AN; STECOLIN IY; STRIZHKOV IB
      THE DETERMINATION OF MAIN SEM PARAMETERS USING OF SLIT-LIKE SILICON SUBMICRON STRUCTURES

      Izvestia Akademii nauk SSSR. Seria fiziceskaa
    38. GOLDBERG EI; NOVIKOV YA
      A TESTABLE COMBINATIONAL-AUTOMATA IMPLEMENTATION BASED ON PROGRAMMABLE LOGIC-ARRAYS

      Automation and remote control


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 01/06/20 alle ore 11:54:45