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La ricerca find articoli where authors phrase all words ' Mourgues, K' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 11 riferimenti
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    1. Pichon, L; Mourgues, K; Raoult, F; Mohammed-Brahim, T; Kis-Sion, K; Briand, D; Bonnaud, O
      Thin film transistors fabricated by in situ doped unhydrogenated polysilicon films obtained by solid phase crystallization

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    2. Helen, Y; Dassow, R; Nerding, M; Mourgues, K; Raoult, F; Kohler, JR; Mohammed-Brahim, T; Rogel, R; Bonnaud, O; Werner, JH; Strunk, HP
      High mobility thin film transistors by Nd : YVO4-laser crystallization

      THIN SOLID FILMS
    3. Toutah, H; Tala-Ighil, B; Llibre, JF; Rahal, A; Mourgues, K; Helen, Y; Brahim, TM; Dassow, R; Kohler, JR
      Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material

      THIN SOLID FILMS
    4. Mercha, A; Pichon, L; Carin, R; Mourgues, K; Bonnaud, O
      Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise

      THIN SOLID FILMS
    5. Dassow, R; Kohler, JR; Helen, Y; Mourgues, K; Bonnaud, O; Mohammed-Brahim, T; Werner, JH
      Laser crystallization of silicon for high-performance thin-film transistors

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    6. Toutah, H; Llibre, JF; Tala-Ighil, B; Mohammed-Brahim, T; Mourgues, K; Helen, Y; Raoult, F; Bonnaud, O
      Stability of polysilicon thin film transistors under switch operating

      MICROELECTRONICS RELIABILITY
    7. Mourgues, K; Rahal, A; Mohammed-Brahim, T; Sarret, M; Kleider, JP; Longeaud, C; Bachrouri, A; Romano-Rodriguez, A
      Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

      JOURNAL OF NON-CRYSTALLINE SOLIDS
    8. Tala-Ighil, B; Rahal, A; Mourgues, K; Toutah, A; Pichon, L; Mohammed-Brahim, T; Raoult, F; Bonnaud, O
      State creation induced by gate bias stress in unhydrogenated polysilicon TFTs

      THIN SOLID FILMS
    9. Helen, Y; Mourgues, K; Raoult, F; Mohammed-Brahim, T; Bonnaud, O; Rogel, R; Prochasson, S; Boher, P; Zahorski, D
      Single shot excimer laser crystallization and LPCVD silicon TFTs

      THIN SOLID FILMS
    10. TALAIGHIL B; TOUTAH H; RAHAL A; MOURGUES K; PICHON L; RAOULT F; BONNAUD O; MOHAMMEDBRAHIM T
      GATE BIAS STRESS IN HYDROGENATED AND UNHYDROGENATED POLYSILICON THIN-FILM TRANSISTORS

      Microelectronics and reliability
    11. PICHON L; RAOULT F; MOURGUES K; KISSION K; MOHAMMEDBRAHIM T; BONNAUD O
      LOW-TEMPERATURE (LESS-THAN-OR-EQUAL-TO-600 DEGREES-C) UNHYDROGENATED IN-SITU DOPED POLYSILICON THIN-FILM TRANSISTORS - TOWARDS A TECHNOLOGYFOR FLAT-PANEL DISPLAYS

      Thin solid films


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 24/01/21 alle ore 08:38:57