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1. Shim, KH; Paek, MC; Lee, BT; Kim, C; Kang, JY
   Preferential regrowth of indium-tin oxide (ITO) films deposited on GaN (0001) by rf-magnetron sputter
   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
   
   K.H. Shim et al., "Preferential regrowth of indium-tin oxide (ITO) films deposited on GaN (0001) by rf-magnetron sputter", APPL PHYS A, 72(4), 2001, pp. 471-474
2. Kim, TS; Lee, BT; Lee, CR; Chun, BS
   Microstructure of rapidly solidified Al-20Si alloy powders
   MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
   
   T.S. Kim et al., "Microstructure of rapidly solidified Al-20Si alloy powders", MAT SCI E A, 304, 2001, pp. 617-620
3. Moon, CK; Song, HJ; Kim, JK; Park, JH; Jang, SJ; Yoo, JB; Park, HR; Lee, BT
   Chemical-vapor-deposition growth and characterization of epitaxial 3C-SiC films on SOI substrates with thin silicon top layers
   JOURNAL OF MATERIALS RESEARCH
   
   C.K. Moon et al., "Chemical-vapor-deposition growth and characterization of epitaxial 3C-SiC films on SOI substrates with thin silicon top layers", J MATER RES, 16(1), 2001, pp. 24-27
4. Kim, JK; Je, JH; Lee, JW; Park, YJ; Kim, T; Jung, IO; Lee, BT; Lee, JL
   Microstructural and electrical investigation of Ni/Au ohmic contact on p-type GaN
   JOURNAL OF ELECTRONIC MATERIALS
   
   J.K. Kim et al., "Microstructural and electrical investigation of Ni/Au ohmic contact on p-type GaN", J ELEC MAT, 30(2), 2001, pp. L8-L12
5. Lee, BT; Yoon, YJ; Lee, KH
   Microstructural characterization of electroconductive Si3N4-TiN composites
   MATERIALS LETTERS
   
   B.T. Lee et al., "Microstructural characterization of electroconductive Si3N4-TiN composites", MATER LETT, 47(1-2), 2001, pp. 71-76
6. Park, HR; Lee, SH; Lee, BT
   Characterization of the hole capacitance of hydrogenated amorphous siliconmetal-insulator-semiconductor structures
   JOURNAL OF APPLIED PHYSICS
   
   H.R. Park et al., "Characterization of the hole capacitance of hydrogenated amorphous siliconmetal-insulator-semiconductor structures", J APPL PHYS, 90(12), 2001, pp. 6226-6229
7. Jeong, WG; Dapkus, PD; Lee, UH; Yim, JS; Lee, D; Lee, BT
   Epitaxial growth and optical characterization of InAs/InGaAsP/InP self-assembled quantum dots
   APPLIED PHYSICS LETTERS
   
   W.G. Jeong et al., "Epitaxial growth and optical characterization of InAs/InGaAsP/InP self-assembled quantum dots", APPL PHYS L, 78(9), 2001, pp. 1171-1173
8. Chiba, A; Takahashi, M; Yamanashi, H; Hoko, H; Hoshino, E; Hirano, N; Lee, BT; Ogawa, T; Ito, M; Okazaki, S
   Theoretical analysis of placement error due to absorber pattern on extremeultraviolet lithography mask
   JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
   
   A. Chiba et al., "Theoretical analysis of placement error due to absorber pattern on extremeultraviolet lithography mask", JPN J A P 1, 40(6A), 2001, pp. 3947-3952
9. Lee, JL; Kim, YT; Oh, JW; Lee, BT
   AlGaAs/InGaAs pseudomorphic high electron mobility transistor using Pd/Ge ohmic contact
   JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
   
   J.L. Lee et al., "AlGaAs/InGaAs pseudomorphic high electron mobility transistor using Pd/Ge ohmic contact", JPN J A P 1, 40(3A), 2001, pp. 1188-1193
10. Lee, BT; Kwon, MS; Yoon, JB; Shin, SY
    Fabrication of polymeric large-core waveguides for optical interconnects using a rubber molding process
    IEEE PHOTONICS TECHNOLOGY LETTERS
    
    B.T. Lee et al., "Fabrication of polymeric large-core waveguides for optical interconnects using a rubber molding process", IEEE PHOTON, 12(1), 2000, pp. 62-64
11. Lee, BT; Yoo, JH; Kim, HD
    Microstructural characterization of GPSed-RBSN and GPSed-Si3N4 ceramics
    MATERIALS TRANSACTIONS JIM
    
    B.T. Lee et al., "Microstructural characterization of GPSed-RBSN and GPSed-Si3N4 ceramics", MATER T JIM, 41(2), 2000, pp. 312-316
12. Lee, BT; Shin, YS; Kim, JH
    High-temperature interfacial reaction of an Al thin film with single-crystal 6H-SiC
    JOURNAL OF MATERIALS RESEARCH
    
    B.T. Lee et al., "High-temperature interfacial reaction of an Al thin film with single-crystal 6H-SiC", J MATER RES, 15(11), 2000, pp. 2284-2287
13. Cho, NI; Kim, YM; Hong, C; Chae, HB; Kim, CK; Lee, BT
    A study of the effect of UV laser annealing on a-SiC films for structure ordering
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY
    
    N.I. Cho et al., "A study of the effect of UV laser annealing on a-SiC films for structure ordering", J KOR PHYS, 37(6), 2000, pp. 998-1002
14. Choi, JH; Kim, JH; Lee, BT; Kim, YM; Moon, JH
    Microwave dielectric properties of Ba-Nd-Ti-O system doped with metal oxides
    MATERIALS LETTERS
    
    J.H. Choi et al., "Microwave dielectric properties of Ba-Nd-Ti-O system doped with metal oxides", MATER LETT, 44(1), 2000, pp. 29-34
15. Kim, JK; Je, JH; Lee, JL; Park, YJ; Lee, BT
    Microstructural investigation of Ni/Au ohmic contact on p-type GaN
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY
    
    J.K. Kim et al., "Microstructural investigation of Ni/Au ohmic contact on p-type GaN", J ELCHEM SO, 147(12), 2000, pp. 4645-4651
16. Lee, BT; Hwang, CS
    Influences of interfacial intrinsic low-dielectric layers on the dielectric properties of sputtered (Ba,Sr)TiO3 thin films
    APPLIED PHYSICS LETTERS
    
    B.T. Lee e C.S. Hwang, "Influences of interfacial intrinsic low-dielectric layers on the dielectric properties of sputtered (Ba,Sr)TiO3 thin films", APPL PHYS L, 77(1), 2000, pp. 124-126
17. Lee, BT; Kim, DK; Moon, CK; Kim, JK; Seo, YH; Nahm, KS; Lee, HJ; Lee, KW; Yu, KS; Kim, Y; Jang, SJ
    Microstructural investigation of low temperature chemical vapor deposited 3C-SiC/Si thin films using single-source precursors
    JOURNAL OF MATERIALS RESEARCH
    
    B.T. Lee et al., "Microstructural investigation of low temperature chemical vapor deposited 3C-SiC/Si thin films using single-source precursors", J MATER RES, 14(1), 1999, pp. 24-28
18. Lee, BT; Kim, WD; Lee, KH; Lim, HJ; Kang, CS; Hideki, H; Joo, SH; Park, HB; Yoo, CY; Lee, SI; Lee, MY
    Electrical properties of sputtered (Ba,Sr)TiO3 thin films prepared by two-step deposition method
    JOURNAL OF ELECTRONIC MATERIALS
    
    B.T. Lee et al., "Electrical properties of sputtered (Ba,Sr)TiO3 thin films prepared by two-step deposition method", J ELEC MAT, 28(4), 1999, pp. L9-L12
19. Lee, BT; Park, JS; Kim, DK; Ahn, JH
    Characterization of heavy deposits on InP mesa sidewalls reactive ion etched using CH4/H-2 plasma
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    
    B.T. Lee et al., "Characterization of heavy deposits on InP mesa sidewalls reactive ion etched using CH4/H-2 plasma", SEMIC SCI T, 14(4), 1999, pp. 345-349
20. Lee, BT; Kim, HD
    In situ synthesis of TiN-reinforced Si3N4 matrix composites using Si and sponge Ti powders
    JOURNAL OF MATERIALS SCIENCE
    
    B.T. Lee e H.D. Kim, "In situ synthesis of TiN-reinforced Si3N4 matrix composites using Si and sponge Ti powders", J MATER SCI, 34(24), 1999, pp. 6169-6176
21. Hwang, CS; Lee, BT; Kang, CS; Lee, KH; Cho, HJ; Hideki, H; Kim, WD; Lee, SI; Lee, MY
    Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and (Ba, Sr)TiO3 thin films
    JOURNAL OF APPLIED PHYSICS
    
    C.S. Hwang et al., "Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and (Ba, Sr)TiO3 thin films", J APPL PHYS, 85(1), 1999, pp. 287-295
22. Park, JW; Park, KS; Lee, BT; Lee, CH; Lee, SD; Choi, JB; Yoo, KH; Kim, J; Oh, SC; Park, SI; Kim, KT; Kim, JJ
    Enhancement of Coulomb blockade and tunability by multidot coupling in a silicon-on-insulator-based single-electron transistor
    APPLIED PHYSICS LETTERS
    
    J.W. Park et al., "Enhancement of Coulomb blockade and tunability by multidot coupling in a silicon-on-insulator-based single-electron transistor", APPL PHYS L, 75(4), 1999, pp. 566-568
23. LEE BT; LEE KH; HIRAGA K
    STRESS-INDUCED PHASE-TRANSFORMATION OF ZRO2 IN ZRO2 (3MOL-PERCENT Y2O3)-25VOL-PERCENT-AL2O3 COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Scripta materialia
    
    B.T. Lee et al., "STRESS-INDUCED PHASE-TRANSFORMATION OF ZRO2 IN ZRO2 (3MOL-PERCENT Y2O3)-25VOL-PERCENT-AL2O3 COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Scripta materialia, 38(7), 1998, pp. 1101-1107
24. AHN JH; OH KR; PARK CY; HAN SG; KIM HG; LEE BT; KIM DK; PARK C
    FABRICATION OF A HIGH-PERFORMANCE INGAASP INP INTEGRATED LASER WITH BUTT-COUPLED PASSIVE WAVE-GUIDES UTILIZING CH4/H-2 REACTIVE ION ETCHING/
    Semiconductor science and technology (Print)
    
    J.H. Ahn et al., "FABRICATION OF A HIGH-PERFORMANCE INGAASP INP INTEGRATED LASER WITH BUTT-COUPLED PASSIVE WAVE-GUIDES UTILIZING CH4/H-2 REACTIVE ION ETCHING/", Semiconductor science and technology (Print), 13(10), 1998, pp. 1205-1208
25. Lee, BT; Park, JW; Park, KS; Lee, CH; Paik, SW; Lee, SD; Choi, JB; Min, KS; Park, JS; Hahn, SY; Park, TJ; Shin, H; Hong, SC; Lee, K; Kwon, HC; Park, SI; Kim, KT; Yoo, KH
    Fabrication of a dual-gate-controlled Coulomb blockade transistor based ona silicon-on-insulator structure
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    
    B.T. Lee et al., "Fabrication of a dual-gate-controlled Coulomb blockade transistor based ona silicon-on-insulator structure", SEMIC SCI T, 13(12), 1998, pp. 1463-1467
26. MUN JK; LEE JL; KIM H; LEE BT; LEE JJ; PYUN KE
    DEGRADATION MECHANISM OF GAAS-MESFETS
    Microelectronics and reliability
    
    J.K. Mun et al., "DEGRADATION MECHANISM OF GAAS-MESFETS", Microelectronics and reliability, 38(1), 1998, pp. 171-178
27. LEE BT
    FRACTURE CHARACTERISTIC OF A (SI-AL-O-N)-SIC COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Journal of Materials Science
    
    B.T. Lee, "FRACTURE CHARACTERISTIC OF A (SI-AL-O-N)-SIC COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Journal of Materials Science, 33(2), 1998, pp. 313-318
28. KIM YT; LEE JL; LEE BT
    MICROSTRUCTURAL AND ELECTRICAL INVESTIGATION OF PD GE/TI/AU OHMIC CONTACT TO PSEUDOMORPHIC HIGH-ELECTRON-MOBILITY TRANSISTOR WITH UNDOPED CAP LAYER/
    Journal of applied physics
    
    Y.T. Kim et al., "MICROSTRUCTURAL AND ELECTRICAL INVESTIGATION OF PD GE/TI/AU OHMIC CONTACT TO PSEUDOMORPHIC HIGH-ELECTRON-MOBILITY TRANSISTOR WITH UNDOPED CAP LAYER/", Journal of applied physics, 84(2), 1998, pp. 911-917
29. HWANG CS; LEE BT; KANG CS; KIM JW; LEE KH; CHO HJ; HORII H; KIM WD; LEE SI; ROH YB; LEE MY
    A COMPARATIVE-STUDY ON THE ELECTRICAL-CONDUCTION MECHANISMS OF (BA0.5SR0.5)TIO3 THIN-FILMS ON PT AND IRO2 ELECTRODES
    Journal of applied physics
    
    C.S. Hwang et al., "A COMPARATIVE-STUDY ON THE ELECTRICAL-CONDUCTION MECHANISMS OF (BA0.5SR0.5)TIO3 THIN-FILMS ON PT AND IRO2 ELECTRODES", Journal of applied physics, 83(7), 1998, pp. 3703-3713
30. SEO YH; KIM KC; SHIM HW; NAHM KS; SUH EK; LEE HJ; KIM DK; LEE BT
    EFFECTS OF EXPERIMENTAL PARAMETERS ON VOID FORMATION IN THE GROWTH OF3C-SIC THIN-FILM ON SI SUBSTRATE
    Journal of the Electrochemical Society
    
    Y.H. Seo et al., "EFFECTS OF EXPERIMENTAL PARAMETERS ON VOID FORMATION IN THE GROWTH OF3C-SIC THIN-FILM ON SI SUBSTRATE", Journal of the Electrochemical Society, 145(1), 1998, pp. 292-299
31. LEE BT; HIGASHI K; HIRAGA K
    INTERFACIAL STRUCTURE OF SI3N4 WHISKER-REINFORCED 7064-ALUMINUM COMPOSITE
    Journal of materials science letters
    
    B.T. Lee et al., "INTERFACIAL STRUCTURE OF SI3N4 WHISKER-REINFORCED 7064-ALUMINUM COMPOSITE", Journal of materials science letters, 16(3), 1997, pp. 206-208
32. LEE JL; MUN JK; LEE BT
    THERMAL-DEGRADATION MECHANISM OF TI PT/AU SCHOTTKY CONTACT TO N-TYPE GAAS/
    Journal of applied physics
    
    J.L. Lee et al., "THERMAL-DEGRADATION MECHANISM OF TI PT/AU SCHOTTKY CONTACT TO N-TYPE GAAS/", Journal of applied physics, 82(10), 1997, pp. 5011-5016
33. HWANG CS; LEE BT; CHO HJ; LEE KH; KANG CS; HIDEKI H; LEE SI; LEE MY
    A POSITIVE TEMPERATURE-COEFFICIENT OF RESISTIVITY EFFECT FROM A PARAELECTRIC PT (BA-0.5,SR-0.5)TIO3/IRO2 THIN-FILM CAPACITOR/
    Applied physics letters
    
    C.S. Hwang et al., "A POSITIVE TEMPERATURE-COEFFICIENT OF RESISTIVITY EFFECT FROM A PARAELECTRIC PT (BA-0.5,SR-0.5)TIO3/IRO2 THIN-FILM CAPACITOR/", Applied physics letters, 71(3), 1997, pp. 371-373
34. CHO HJ; OH SJ; KANG CS; HWANG CS; LEE BT; LEE KH; HORII H; LEE SI; LEE MY
    IMPROVEMENT OF LEAKAGE CURRENT CHARACTERISTICS OF BA0.5SR0.5TIO3 FILMS BY N2O PLASMA SURFACE-TREATMENT
    Applied physics letters
    
    H.J. Cho et al., "IMPROVEMENT OF LEAKAGE CURRENT CHARACTERISTICS OF BA0.5SR0.5TIO3 FILMS BY N2O PLASMA SURFACE-TREATMENT", Applied physics letters, 71(22), 1997, pp. 3221-3223
35. LEE KH; HWANG CS; LEE BT; KIM WD; HORII H; KANG CS; CHO HJ; LEE SI; LEE MY
    VARIATION OF ELECTRICAL-CONDUCTION PHENOMENA OF PT (BA, SR)TIO3/PT CAPACITORS BY DIFFERENT TOP ELECTRODE FORMATION PROCESSES/
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    K.H. Lee et al., "VARIATION OF ELECTRICAL-CONDUCTION PHENOMENA OF PT (BA, SR)TIO3/PT CAPACITORS BY DIFFERENT TOP ELECTRODE FORMATION PROCESSES/", JPN J A P 1, 36(9B), 1997, pp. 5860-5865
36. CHO HJ; HORII H; HWANG CS; KIM JW; KANG CS; LEE BT; LEE SI; KOH YB; LEE MY
    PREPARATION AND CHARACTERIZATION OF IRIDIUM OXIDE THIN-FILMS GROWN BYDC REACTIVE SPUTTERING
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    H.J. Cho et al., "PREPARATION AND CHARACTERIZATION OF IRIDIUM OXIDE THIN-FILMS GROWN BYDC REACTIVE SPUTTERING", JPN J A P 1, 36(3B), 1997, pp. 1722-1727
37. KANG CS; CHO HJ; HWANG CS; LEE BT; LEE KH; HORII H; KIM WD; LEE SI; LEE MY
    DEPOSITION CHARACTERISTICS OF (BA, SR)TIO3 THIN-FILMS BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION AT LOW SUBSTRATE TEMPERATURES
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    C.S. Kang et al., "DEPOSITION CHARACTERISTICS OF (BA, SR)TIO3 THIN-FILMS BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION AT LOW SUBSTRATE TEMPERATURES", JPN J A P 1, 36(11), 1997, pp. 6946-6952
38. CHO HJ; KANG CS; HWANG CS; KIM JW; HORII H; LEE BT; LEE SI; LEE MY
    STRUCTURAL AND ELECTRICAL-PROPERTIES OF BA0.5SR0.5TIO3 FILMS ON IR AND IRO2 ELECTRODES
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    
    H.J. Cho et al., "STRUCTURAL AND ELECTRICAL-PROPERTIES OF BA0.5SR0.5TIO3 FILMS ON IR AND IRO2 ELECTRODES", JPN J A P 2, 36(7A), 1997, pp. 874-876
39. HWANG CS; LEE BT; PARK SO; KIM JW; CHO HJ; KANG CS; HORII H; LEE SI; LEE MY
    INTERFACE POTENTIAL BARRIER HEIGHT AND LEAKAGE CURRENT BEHAVIOR OF PT(BA,SR)TIO3/PT CAPACITORS FABRICATED BY SPUTTERING PROCESS/
    Integrated ferroelectrics
    
    C.S. Hwang et al., "INTERFACE POTENTIAL BARRIER HEIGHT AND LEAKAGE CURRENT BEHAVIOR OF PT(BA,SR)TIO3/PT CAPACITORS FABRICATED BY SPUTTERING PROCESS/", Integrated ferroelectrics, 13(1-3), 1996, pp. 449-469
40. HWANG CS; KANG CS; CHO HJ; PARK SO; LEE BT; KIM JW; HORII H; LEE SI; LEE MY
    EFFECTS OF OXIDANTS ON THE DEPOSITION AND DIELECTRIC-PROPERTIES OF THE SRTIO3 THIN-FILMS PREPARED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD)
    Integrated ferroelectrics
    
    C.S. Hwang et al., "EFFECTS OF OXIDANTS ON THE DEPOSITION AND DIELECTRIC-PROPERTIES OF THE SRTIO3 THIN-FILMS PREPARED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD)", Integrated ferroelectrics, 12(2-4), 1996, pp. 199-213
41. LEE BT; KIM HD
    NITRIDATION MECHANISM OF SI COMPACTS STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Materials transactions, JIM
    
    B.T. Lee e H.D. Kim, "NITRIDATION MECHANISM OF SI COMPACTS STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Materials transactions, JIM, 37(10), 1996, pp. 1547-1553
42. LEE BT; KIM DK; AHN JH
    OBSERVATION OF OXIDE-FILMS ON CH4 H-2 REACTIVE ION ETCH PROCESSED INPMESA SIDEWALLS AND SURFACES/
    Semiconductor science and technology
    
    B.T. Lee et al., "OBSERVATION OF OXIDE-FILMS ON CH4 H-2 REACTIVE ION ETCH PROCESSED INPMESA SIDEWALLS AND SURFACES/", Semiconductor science and technology, 11(10), 1996, pp. 1456-1459
43. ISAWA T; LEE BT; HIRAGA K
    HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TECHNEGAS AND PERTECHNEGAS - REPLY
    Nuclear medicine communications
    
    T. Isawa et al., "HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TECHNEGAS AND PERTECHNEGAS - REPLY", Nuclear medicine communications, 17(9), 1996, pp. 823-823
44. ISAWA T; LEE BT; HIRAGA K
    HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TECHNEGAS AND PERTECHNEGAS
    Nuclear medicine communications
    
    T. Isawa et al., "HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TECHNEGAS AND PERTECHNEGAS", Nuclear medicine communications, 17(2), 1996, pp. 147-152
45. SIMS CD; BUTLER PEM; CASANOVA R; LEE BT; RANDOLPH MA; LEE WPA; VACANTI CA; YAREMCHUK MJ
    INJECTABLE CARTILAGE USING POLYETHYLENE OXIDE POLYMER SUBSTRATES
    Plastic and reconstructive surgery
    
    C.D. Sims et al., "INJECTABLE CARTILAGE USING POLYETHYLENE OXIDE POLYMER SUBSTRATES", Plastic and reconstructive surgery, 98(5), 1996, pp. 843-850
46. KANG CS; HWANG CS; CHO HJ; LEE BT; PARK SO; KIM JW; HORII H; LEE SI; KOH YB; LEE MY
    PREPARATION AND ELECTRICAL-PROPERTIES OF SRTIO3 THIN-FILMS DEPOSITED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD)
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    C.S. Kang et al., "PREPARATION AND ELECTRICAL-PROPERTIES OF SRTIO3 THIN-FILMS DEPOSITED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD)", JPN J A P 1, 35(9B), 1996, pp. 4890-4895
47. LEE BT; KIM HC
    PREDICTION OF ELECTROMAGNETIC PROPERTIES OF MNZN FERRITE-SILICONE RUBBER COMPOSITES IN WIDE FREQUENCY-RANGE
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    B.T. Lee e H.C. Kim, "PREDICTION OF ELECTROMAGNETIC PROPERTIES OF MNZN FERRITE-SILICONE RUBBER COMPOSITES IN WIDE FREQUENCY-RANGE", JPN J A P 1, 35(6A), 1996, pp. 3401-3406
48. SHINDO D; YOSHIDA M; LEE BT; TAKASUGI T; HIRAGA K
    HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS IN A B2-TYPE INTERMETALLIC COMPOUND COTI
    Intermetallics
    
    D. Shindo et al., "HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DISLOCATIONS IN A B2-TYPE INTERMETALLIC COMPOUND COTI", Intermetallics, 3(2), 1995, pp. 167-171
49. LEE BT; KOYAMA T; NISHIYAMA A; HIRAGA K
    MICROSTRUCTURE AND FRACTURE CHARACTERISTIC OF SI3N4-ZRO2(MGO) CERAMICCOMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Scripta metallurgica et materialia
    
    B.T. Lee et al., "MICROSTRUCTURE AND FRACTURE CHARACTERISTIC OF SI3N4-ZRO2(MGO) CERAMICCOMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Scripta metallurgica et materialia, 32(7), 1995, pp. 1073-1077
50. LEE BT; LEE JW; EOM HJ; SHIN SY
    FOURIER-TRANSFORM ANALYSIS FOR RECTANGULAR GROOVE GUIDE
    IEEE transactions on microwave theory and techniques
    
    B.T. Lee et al., "FOURIER-TRANSFORM ANALYSIS FOR RECTANGULAR GROOVE GUIDE", IEEE transactions on microwave theory and techniques, 43(9), 1995, pp. 2162-2165
51. IM BM; KOMORI M; LEE BT; AOYAGI E; AKIYAMA E; HABAZAKI H; KAWASHIMA A; ASAMI K; HIRAGA K; HASHIMOTO K
    THE EFFECT OF MICROCRYSTALLITES IN THE AMORPHOUS MATRIX ON THE CORROSION BEHAVIOR OF AMORPHOUS FE-8CR-P ALLOYS
    Corrosion science
    
    B.M. Im et al., "THE EFFECT OF MICROCRYSTALLITES IN THE AMORPHOUS MATRIX ON THE CORROSION BEHAVIOR OF AMORPHOUS FE-8CR-P ALLOYS", Corrosion science, 37(9), 1995, pp. 1411-1422
52. KIM DK; AHN JH; LEE BT; LEE HJ; CHA SS; LIM KY; KIM JB; LEE JL; JANG SJ; PARK IS
    LIQUID-PHASE EPITAXIAL-GROWTH OF HIGH-QUALITY GAAS ON INP USING SE-DOPED GAAS BUFFER LAYER AND GRATING-PATTERNED SUBSTRATES
    Applied physics letters
    
    D.K. Kim et al., "LIQUID-PHASE EPITAXIAL-GROWTH OF HIGH-QUALITY GAAS ON INP USING SE-DOPED GAAS BUFFER LAYER AND GRATING-PATTERNED SUBSTRATES", Applied physics letters, 66(19), 1995, pp. 2531-2533
53. LEE BT; PEZZOTTI G; HIRAGA K
    MICROSTRUCTURE AND FRACTURE-BEHAVIOR OF SIC-PLATELET-REINFORCED SI3N4MATRIX COMPOSITES
    Materials science & engineering. A, Structural materials: properties, microstructure and processing
    
    B.T. Lee et al., "MICROSTRUCTURE AND FRACTURE-BEHAVIOR OF SIC-PLATELET-REINFORCED SI3N4MATRIX COMPOSITES", Materials science & engineering. A, Structural materials: properties, microstructure and processing, 177(1-2), 1994, pp. 151-160
54. LEE BT; HIRAGA K
    CRACK-PROPAGATION AND DEFORMATION-BEHAVIOR OF AL2O3-24 VOL-PERCENT ZRO2 COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Journal of materials research
    
    B.T. Lee e K. Hiraga, "CRACK-PROPAGATION AND DEFORMATION-BEHAVIOR OF AL2O3-24 VOL-PERCENT ZRO2 COMPOSITE STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Journal of materials research, 9(5), 1994, pp. 1199-1207
55. LEE BT; CHUN BS; HIRAGA K
    MICROSTRUCTURE OF GAS-ATOMIZED AL-20 WT-PERCENT SI-1 WT-PERCENT NI POWDERS STUDIED BY ELECTRON-MICROSCOPY
    Journal of materials research
    
    B.T. Lee et al., "MICROSTRUCTURE OF GAS-ATOMIZED AL-20 WT-PERCENT SI-1 WT-PERCENT NI POWDERS STUDIED BY ELECTRON-MICROSCOPY", Journal of materials research, 9(10), 1994, pp. 2519-2523
56. KIM DK; LEE BT
    PREVENTION OF SUBSTRATE MELT-BACK BY SE ADDITION DURING LIQUID-PHASE EPITAXIAL-GROWTH OF GAAS ON GAAS-COATED SI
    Materials letters
    
    D.K. Kim e B.T. Lee, "PREVENTION OF SUBSTRATE MELT-BACK BY SE ADDITION DURING LIQUID-PHASE EPITAXIAL-GROWTH OF GAAS ON GAAS-COATED SI", Materials letters, 20(5-6), 1994, pp. 335-338
57. PEZZOTTI G; LEE BT; HIRAGA K; NISHIDA T
    MICROSCOPY INVESTIGATION ON FRACTURE MECHANISMS IN HOT-ISOSTATICALLY PRESSED SI3N4 SIC-PLATELET COMPOSITES/
    Journal of Materials Science
    
    G. Pezzotti et al., "MICROSCOPY INVESTIGATION ON FRACTURE MECHANISMS IN HOT-ISOSTATICALLY PRESSED SI3N4 SIC-PLATELET COMPOSITES/", Journal of Materials Science, 29(7), 1994, pp. 1786-1794
58. LEE BT; HIRAGA K; SHINDO D; NISHIYAMA A
    MICROSTRUCTURE OF PRESSURELESS-SINTERED AL2O3-24 VOL-PERCENT ZRO2 COMPOSITE STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    Journal of Materials Science
    
    B.T. Lee et al., "MICROSTRUCTURE OF PRESSURELESS-SINTERED AL2O3-24 VOL-PERCENT ZRO2 COMPOSITE STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY", Journal of Materials Science, 29(4), 1994, pp. 959-964
59. KIM HC; LEE BT; TAKAHASHI K; FRIEDRICH K
    DYNAMIC-MECHANICAL PROPERTIES OF UNFILLED AND GLASS-FIBER FILLED LIQUID-CRYSTAL POLYESTER
    Journal of macromolecular science. Physics
    
    H.C. Kim et al., "DYNAMIC-MECHANICAL PROPERTIES OF UNFILLED AND GLASS-FIBER FILLED LIQUID-CRYSTAL POLYESTER", Journal of macromolecular science. Physics, B33(1), 1994, pp. 11-20
60. LEE BT; LOGAN RA
    GROWTH OF INP ON ETCHED GROOVES USING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY
    Journal of crystal growth
    
    B.T. Lee e R.A. Logan, "GROWTH OF INP ON ETCHED GROOVES USING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY", Journal of crystal growth, 140(1-2), 1994, pp. 1-8
61. TUNCER E; LEE BT; ISLAM MS; NEIKIRK DP
    QUASI-STATIC CONDUCTOR LOSS CALCULATIONS IN TRANSMISSION-LINES USING A NEW CONFORMAL MAPPING TECHNIQUE
    IEEE transactions on microwave theory and techniques
    
    E. Tuncer et al., "QUASI-STATIC CONDUCTOR LOSS CALCULATIONS IN TRANSMISSION-LINES USING A NEW CONFORMAL MAPPING TECHNIQUE", IEEE transactions on microwave theory and techniques, 42(9), 1994, pp. 1807-1815
62. KIM DK; LEE BT
    HETEROEPITAXIAL GROWTH OF GAAS ON (100)GAAS AND INP BY SELECTIVE LIQUID-PHASE EPITAXY
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    
    D.K. Kim e B.T. Lee, "HETEROEPITAXIAL GROWTH OF GAAS ON (100)GAAS AND INP BY SELECTIVE LIQUID-PHASE EPITAXY", JPN J A P 1, 33(10), 1994, pp. 5870-5874
63. LEE BT; NISHIYAMA A; HIRAGA K
    MICRO-INDENTATION FRACTURE-BEHAVIOR OF AL2O3-24 VOL-PERCENT-ZRO2(Y2O3) COMPOSITES STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY
    Materials transactions, JIM
    
    B.T. Lee et al., "MICRO-INDENTATION FRACTURE-BEHAVIOR OF AL2O3-24 VOL-PERCENT-ZRO2(Y2O3) COMPOSITES STUDIED BY TRANSMISSION ELECTRON-MICROSCOPY", Materials transactions, JIM, 34(8), 1993, pp. 682-688
64. LEE BT; HAYASHI S; HIRAI T; HIRAGA K
    CRACK-PROPAGATION BEHAVIOR OF CVD SI3N4-TIN COMPOSITE EXAMINED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    Materials transactions, JIM
    
    B.T. Lee et al., "CRACK-PROPAGATION BEHAVIOR OF CVD SI3N4-TIN COMPOSITE EXAMINED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY", Materials transactions, JIM, 34(7), 1993, pp. 573-579
65. SHINDO D; LEE BT; WASEDA Y; MURAMATSU A; SUGIMOTO T
    CRYSTALLOGRAPHY OF PLATELET-TYPE HEMATITE PARTICLES BY ELECTRON-MICROSCOPY
    Materials transactions, JIM
    
    D. Shindo et al., "CRYSTALLOGRAPHY OF PLATELET-TYPE HEMATITE PARTICLES BY ELECTRON-MICROSCOPY", Materials transactions, JIM, 34(7), 1993, pp. 580-585
66. LEE BT; HIRAGA K
    MICROSTRUCTURE AND MICRO-INDENTATION FRACTURE OF SIC-WHISKER-REINFORCED SI3N4 COMPOSITE STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
    Materials transactions, JIM
    
    B.T. Lee e K. Hiraga, "MICROSTRUCTURE AND MICRO-INDENTATION FRACTURE OF SIC-WHISKER-REINFORCED SI3N4 COMPOSITE STUDIED BY HIGH-RESOLUTION ELECTRON-MICROSCOPY", Materials transactions, JIM, 34(10), 1993, pp. 930-936
67. PEZZOTTI G; LEE BT; HIRAGA K; NISHIDA T
    A QUANTITATIVE-EVALUATION OF MICROSTRUCTURE IN SI3N4 SIC PLATELET ANDPARTICULATE COMPOSITES/
    Journal of Materials Science
    
    G. Pezzotti et al., "A QUANTITATIVE-EVALUATION OF MICROSTRUCTURE IN SI3N4 SIC PLATELET ANDPARTICULATE COMPOSITES/", Journal of Materials Science, 28(17), 1993, pp. 4787-4798
68. LEE BT; LOGAN RA; CHU SNG
    OBSERVATION OF GROWTH-PATTERNS DURING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY REGROWTH OF INP AROUND ETCHED MESAS
    Journal of crystal growth
    
    B.T. Lee et al., "OBSERVATION OF GROWTH-PATTERNS DURING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY REGROWTH OF INP AROUND ETCHED MESAS", Journal of crystal growth, 130(1-2), 1993, pp. 287-294
69. MORTON PA; LOGAN RA; TANBUNEK T; SCIORTINO PF; SERGENT AM; MONTGOMERY RK; LEE BT
    25 GHZ BANDWIDTH 1.55-MU-M GAINASP P-DOPED STRAINED MULTI-QUANTUM-WELL LASERS (VOL 28, PG 2156, 1992)
    Electronics Letters
    
    P.A. Morton et al., "25 GHZ BANDWIDTH 1.55-MU-M GAINASP P-DOPED STRAINED MULTI-QUANTUM-WELL LASERS (VOL 28, PG 2156, 1992)", Electronics Letters, 29(1), 1993, pp. 136-136
70. LEE BT; HAYES TR; THOMAS PM; PAWELEK R; SCIORTINO PF
    SIO2 MASK EROSION AND SIDEWALL COMPOSITION DURING CH4 H-2 REACTIVE ION ETCHING OF INGAASP/INP/
    Applied physics letters
    
    B.T. Lee et al., "SIO2 MASK EROSION AND SIDEWALL COMPOSITION DURING CH4 H-2 REACTIVE ION ETCHING OF INGAASP/INP/", Applied physics letters, 63(23), 1993, pp. 3170-3172
71. LEE BT; LOGAN RA; KARLICEK RF
    PLANAR REGROWTH OF INP AND INGAAS AROUND REACTIVE ION ETCHED MESAS USING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY
    Applied physics letters
    
    B.T. Lee et al., "PLANAR REGROWTH OF INP AND INGAAS AROUND REACTIVE ION ETCHED MESAS USING ATMOSPHERIC-PRESSURE METALORGANIC VAPOR-PHASE EPITAXY", Applied physics letters, 63(2), 1993, pp. 234-236