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La ricerca find articoli where authors phrase all words ' KRAUSSLICH J' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 26 riferimenti
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    1. Bauer, A; Reischauer, P; Krausslich, J; Schell, N; Matz, W; Goetz, K
      Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters

      ACTA CRYSTALLOGRAPHICA SECTION A
    2. Lebedev, V; Jinschek, J; Krausslich, J; Kaiser, U; Schroter, B; Richter, W
      Hexagonal AlN films grown on nominal and off-axis Si(001) substrates

      JOURNAL OF CRYSTAL GROWTH
    3. Langer, J; Mattheis, R; Ocker, B; Maass, W; Senz, S; Hesse, D; Krausslich, J
      Microstructure and magnetic properties of sputtered spin valve systems

      JOURNAL OF APPLIED PHYSICS
    4. Hess, G; Bauer, A; Krausslich, J; Fissel, A; Schroter, B; Richter, W; Schell, N; Matz, W; Goetz, K
      Si/Ge-nanocrystals on SiC(0001)

      THIN SOLID FILMS
    5. Fissel, A; Kaiser, U; Schroter, B; Krausslich, J; Richter, W
      MBE-growth of heteropolytypic low-dimensional structures of SiC

      THIN SOLID FILMS
    6. Lebedev, V; Jinschek, J; Kaiser, U; Schroter, B; Richter, W; Krausslich, J
      Epitaxial relationship in the AlN/Si(001) heterosystem

      APPLIED PHYSICS LETTERS
    7. Kipshidze, DG; Schenk, HP; Fissel, A; Kaiser, U; Schulze, J; Richter, W; Weihnacht, M; Kunze, R; Krausslich, J
      Molecular-beam epitaxy of a strongly lattice-mismatched heterosystem AlN/Si(111) for application in SAW devices

      SEMICONDUCTORS
    8. Fissel, A; Kaiser, U; Krausslich, J; Pfennighaus, K; Schroter, B; Schulz, J; Richter, W
      Epitaxial growth of SiC-heterostructures on alpha-SiC(0001) by solid-source MBE

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    9. Bauer, A; Krausslich, J; Kocher, B; Goetz, K; Fissel, A; Richter, W
      X-ray investigations of MBE-grown heteroepitaxial SiC layers on 6H-SiC substrates

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    10. Bauer, A; Krausslich, J; Kuschnerus, P; Goetz, K; Kackell, P; Bechstedt, F
      High-precision determination of atomic positions in 4H- and 6H-SiC crystals

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    11. Schenk, HPD; Kaiser, U; Kipshidze, GD; Fissel, A; Krausslich, J; Hobert, H; Schulze, J; Richter, W
      Growth of atomically smooth AlN films with a 5 : 4 coincidence interface on Si(111) by MBE

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    12. Schmidt, F; Boschetto, D; Linzen, S; Krausslich, J; Matthes, A; Schmidl, F; Seidel, P
      Combined sputter and pulsed laser deposition for preparation of thin YBa2Cu3O7-delta films on buffered silicon substrates

      PHYSICA C
    13. Langer, J; Krausslich, J; Mattheis, R; Senz, S; Hesse, D
      Characterisation of interfacial properties in sputtered Co Cu multilayers:X-ray reflectometry compared with TEM and AFM

      JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
    14. Schenk, HPD; Kipshidze, GD; Lebedev, VB; Shokhovets, S; Goldhahn, R; Krausslich, J; Fissel, A; Richter, W
      Epitaxial growth of AlN and GaN on Si(111) by plasma-assisted molecular beam epitaxy

      JOURNAL OF CRYSTAL GROWTH
    15. Schenk, HPD; Kipshidze, GD; Kaiser, U; Fissel, A; Krausslich, J; Schulze, J; Richter, W
      Investigation of two-dimensional growth of AlN(0 0 0 1) on Si(1 1 1) by plasma-assisted molecular beam epitaxy

      JOURNAL OF CRYSTAL GROWTH
    16. BAUER A; KRAUSSLICH J; DRESSLER L; KUSCHNERUS P; WOLF J; GOETZ K; KACKELL P; FURTHMULLER J; BECHSTEDT F
      HIGH-PRECISION DETERMINATION OF ATOMIC POSITIONS IN CRYSTALS - THE CASE OF 6H-SIC AND 4H-SIC

      Physical review. B, Condensed matter
    17. LANGER J; MATTHEIS R; KRAUSSLICH J; SENZ S; HESSE D; SCHUHRKE T; ZWECK J
      DETERMINATION OF INTERFACIAL ROUGHNESS AND ITS CORRELATION IN SPUTTERED COZR CU MULTILAYERS/

      Thin solid films
    18. PFENNIGHAUS K; FISSEL A; KAISER U; WENDT M; KRAUSSLICH J; PEITER G; SCHROTER B; RICHTER W
      INVESTIGATION OF GROWTH-CONDITIONS FOR EPITAXIAL-GROWTH OF SIC ON SI IN THE SOLID-SOURCE MOLECULAR-BEAM EPITAXY

      Materials science & engineering. B, Solid-state materials for advanced technology
    19. LINZEN S; KRAUSSLICH J; KOHLER A; SEIDEL P; FREITAG B; MADER W
      UNUSUAL CRYSTAL-STRUCTURE OF NONSUPERCONDUCTING Y1BA2CU3O7-X FILMS ONBUFFERED SILICON SUBSTRATES

      Physica. C, Superconductivity
    20. KOHLER A; LINZEN S; KRAUSSLICH J; SEIDEL P; FREITAG B; MADER W
      CRYSTAL-STRUCTURE OF YBCO THIN-FILMS GROWN AT SUBSTRATE TEMPERATURES OF ABOUT 500-DEGREES-C

      Physica. C, Superconductivity
    21. DRESSLER L; GOETZ K; KRAUSSLICH J
      X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS

      Physica status solidi. b, Basic research
    22. DRESSLER L; GOETZ K; KRAUSSLICH J
      X-RAY POLYTYPE EXAMINATION OF SIC BULK CRYSTALS IN BACK-REFLECTION GEOMETRY

      Journal of applied crystallography
    23. FISSEL A; SCHROTER B; KRAUSSLICH J; RICHTER W
      PREPARATION OF SIC FILMS BY SOLID-STATE SOURCE EVAPORATION

      Thin solid films
    24. DRESSLER L; GOETZ K; KRAUSSLICH J
      X-RAY-EXAMINATION OF SIC MONOCRYSTALS

      Physica status solidi. a, Applied research
    25. KRAUSSLICH J; FISSEL A; KAISER U; GOETZ K; DRESSLER L
      X-RAY, TRANSMISSION ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF SIC THIN-FILMS ON SI(111)

      Journal of physics. D, Applied physics
    26. ZACH K; BORCK J; LINZEN S; KRAUSSLICH J; SCHMIDL F; SCHNEIDEWIND H; SEIDEL P
      LASER-ABLATED YBCO THIN-FILMS - RELATIONS BETWEEN STRUCTURAL AND ELECTRICAL-PROPERTIES

      Journal of alloys and compounds


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 03/08/20 alle ore 15:25:15