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La ricerca find articoli where authors phrase all words ' KAMARINOS G' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 44 riferimenti
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    1. Dimitriadis, CA; Kamarinos, G; Brini, J
      Model of low frequency noise in polycrystalline silicon thin-film transistors

      IEEE ELECTRON DEVICE LETTERS
    2. Farmakis, FV; Brini, J; Kamarinos, G; Dimitriadis, CA
      Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

      IEEE ELECTRON DEVICE LETTERS
    3. Farmakis, FV; Dimitriadis, CA; Brini, J; Kamarinos, G
      Effects of hydrogenation on the performance and hot-carrier endurance of polysilicon thin-film transistors

      IEEE ELECTRON DEVICE LETTERS
    4. Farmakis, FV; Tsamados, DM; Brini, J; Kamarinos, G; Dimitriadis, CA; Miyasaka, M
      Hydrogenation in laser annealed polysilicon thin-film transistors (TFTs)

      THIN SOLID FILMS
    5. Dimitriadis, CA; Kamarinos, G; Brini, J
      Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors

      SOLID-STATE ELECTRONICS
    6. Farmakis, FV; Brini, J; Kamarinos, G; Angelis, CT; Dimitriadis, CA; Miyasaka, M
      On-current modeling of large-grain polycrystalline silicon thin-film transistors

      IEEE TRANSACTIONS ON ELECTRON DEVICES
    7. Dozsa, L; Horvath, ZJ; Molnar, GL; Peto, G; Dimitriadis, CA; Papadimitriou, L; Brini, J; Kamarinos, G
      Electrical and low frequency noise properties of Gd and GdCo silicide contacts on n-type Si

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    8. Farmakis, FV; Brini, J; Kamarinos, G; Angelis, CT; Dimitriadis, CA; Miyasaka, M; Ouisse, T
      Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors

      SOLID-STATE ELECTRONICS
    9. Angelis, CT; Dimitriadis, CA; Farmakis, FV; Brini, J; Kamarinos, G; Miyasaka, M; Stoemenos, I
      Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors

      SOLID-STATE ELECTRONICS
    10. Dimitriadis, CA; Kimura, M; Miyasaka, M; Inoue, S; Farmakis, FV; Brini, J; Kamarinos, G
      Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors

      SOLID-STATE ELECTRONICS
    11. Dimitriadis, CA; Farmakis, FV; Brini, J; Kamarinos, G
      Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors

      JOURNAL OF APPLIED PHYSICS
    12. Angelis, CT; Dimitriadis, CA; Miyasaka, M; Farmakis, FV; Kamarinos, G; Brini, J; Stoemenos, J
      Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors (vol 86, pg 4600, 1999)

      JOURNAL OF APPLIED PHYSICS
    13. Angelis, CT; Dimitriadis, CA; Farmakis, FV; Brini, J; Kamarinos, G; Miyasaka, M
      Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

      APPLIED PHYSICS LETTERS
    14. Angelis, CT; Dimitriadis, CA; Farmakis, FV; Brini, J; Kamarinos, G; Gueorguiev, VK; Ivanov, TE
      Empirical relationship between low-frequency drain current noise and grain-boundary potential barrier height in high-temperature-processed polycrystalline silicon thin-film transistors

      APPLIED PHYSICS LETTERS
    15. Danel, A; Tardif, F; Kamarinos, G
      Surface dopant concentration measurement using the Surface Charge Profiler(SCP) method: characterization of hydrogen and metallic contamination in silicon

      MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
    16. Tassis, DH; Dimitriadis, CA; Polychroniadis, EK; Brini, J; Kamarinos, G
      Structural and trap properties of polycrystalline semiconducting FeSi2 thin films

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    17. Lee, JI; Brini, J; Kamarinos, G; Dimitriadis, CA; Logothetidis, S; Patsalas, P
      Low frequency noise measurements on TiN/n-Si Schottky diodes

      APPLIED SURFACE SCIENCE
    18. Farmakis, FV; Brini, J; Kamarinos, G; Mathieu, N; Dimitriadis, CA
      A new method for the determination of the channel length reduction in polysilicon thin film transistors (TFTs)

      THIN SOLID FILMS
    19. Farmakis, FV; Dimitriadis, CA; Brini, J; Kamarinos, G; Gueorguiev, VK; Ivanov, TE
      Hot-carrier phenomena in high temperature processed undoped-hydrogenated n-channel polysilicon thin film transistors (TFTs)

      SOLID-STATE ELECTRONICS
    20. Dimitriadis, CA; Karakostas, T; Logothetidis, S; Kamarinos, G; Brini, J; Nouet, G
      Contacts of titanium nitride to n- and p-type gallium nitride films

      SOLID-STATE ELECTRONICS
    21. Farmakis, FV; Brini, J; Kamarinos, G; Dimitriadis, CA; Gueorguiev, VK; Ivanov, TE
      Leakage current variation during two different modes of electrical stressing in undoped hydrogenated n-channel polysilicon thin film transistors (TFTs)

      MICROELECTRONICS RELIABILITY
    22. Angelis, CT; Dimitriadis, CA; Miyasaka, M; Farmakis, FV; Kamarinos, G; Brini, J; Stoemenos, J
      Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors

      JOURNAL OF APPLIED PHYSICS
    23. Angelis, CT; Dimitriadis, CA; Farmakis, FV; Brini, J; Kamarinos, G; Miyasaka, M
      Dimension scaling of low frequency noise in the drain current of polycrystalline silicon thin-film transistors

      JOURNAL OF APPLIED PHYSICS
    24. Farmakis, FV; Dimitriadis, CA; Brini, J; Kamarinos, G; Gueorguiev, VK; Ivanov, TE
      Photon emission and related hot-carrier effects in polycrystalline siliconthin-film transistors

      JOURNAL OF APPLIED PHYSICS
    25. Tassis, DH; Dimitriadis, CA; Brini, J; Kamarinos, G; Birbas, A
      Low-frequency noise in polycrystalline semiconducting FeSi2 thin films

      JOURNAL OF APPLIED PHYSICS
    26. Dimitriadis, CA; Lee, JI; Patsalas, P; Logothetidis, S; Tassis, DH; Brini, J; Kamarinos, G
      Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering

      JOURNAL OF APPLIED PHYSICS
    27. Dimitriadis, CA; Brini, J; Lee, JI; Farmakis, FV; Kamarinos, G
      1/f(gamma) noise in polycrystalline silicon thin-film transistors

      JOURNAL OF APPLIED PHYSICS
    28. Angelis, CT; Dimitriadis, CA; Brini, J; Kamarinos, G; Gueorguiev, VK; Ivanov, TE
      Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

      IEEE TRANSACTIONS ON ELECTRON DEVICES
    29. Angelis, CT; Dimitriadis, CA; Farmakis, FV; Kamarinos, G; Brini, J; Miyasaka, M
      Electrical and noise properties of thin-film transistors on very thin excimer laser annealed polycrystalline silicon films

      APPLIED PHYSICS LETTERS
    30. Dimitriadis, CA; Kamarinos, G; Brini, J; Evangelou, EK; Gueorguiev, VK
      Avalanche-induced excess noise in polycrystalline silicon thin-film transistors

      APPLIED PHYSICS LETTERS
    31. DIMITRIADIS CA; BRINI J; KAMARINOS G
      LOW-FREQUENCY NOISE IN INTRINSIC LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED POLYSILICON RESISTORS

      EPJ. Applied physics ( EPJ. Applied physics (Print))
    32. FARMAKIS FV; BRINI J; MATHIEU N; KAMARINOS G; DIMITRIADIS CA; LOGOTHETIDIS S
      LOW-FREQUENCY NOISE IN SCHOTTKY-BARRIER CONTACTS OF TITANIUM NITRIDE ON N-TYPE SILICON

      Semiconductor science and technology (Print)
    33. DIMITRIADIS CA; BRINI J; KAMARINOS G; GUEORGUIEV VK; IVANOV TE
      CONDUCTION AND LOW-FREQUENCY NOISE IN HIGH-TEMPERATURE PROCESSED POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS

      Journal of applied physics
    34. Farmakis, FV; Dimitriadis, CA; Brini, J; Kamarinos, G; Gueorguiev, VK; Ivanov, TE
      Interface state generation during electrical stress in n-channel undoped hydrogenated polysilicon thin-film transistors

      ELECTRONICS LETTERS
    35. TASSIS DH; DIMITRIADIS CA; BRINI J; KAMARINOS G; ANGELAKERIS M; FLEVARIS N
      LOW-FREQUENCY NOISE IN BETA-FESI2 N-SI HETEROJUNCTIONS/

      Applied physics letters
    36. DIMITRIADIS CA; BRINI J; KAMARINOS G; GHIBAUDO G
      CHARACTERIZATION OF LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS BY LOW-FREQUENCY NOISE MEASUREMENTS

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
    37. MINONDO M; BOUSSEY J; KAMARINOS G
      THE IMPACT OF THE SUBSTRATE PREAMORPHISATION ON THE ELECTRICAL PERFORMANCES OF P+ N SILICON JUNCTION DIODES/

      Microelectronics and reliability
    38. ANGELIS CT; DIMITRIADIS CA; SAMARAS I; BRINI J; KAMARINOS G; GUEORGUIEV VK; IVANOV TE
      STUDY OF LEAKAGE CURRENT IN N-CHANNEL AND P-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS BY CONDUCTION AND LOW-FREQUENCY NOISE MEASUREMENTS

      Journal of applied physics
    39. DIMITRIADIS CA; BRINI J; KAMARINOS G
      LOW-FREQUENCY NOISE OF THE LEAKAGE CURRENT IN UNDOPED LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS

      Applied physics letters
    40. WALZ D; JOLY JP; KAMARINOS G
      ON THE RECOMBINATION BEHAVIOR OF IRON IN MODERATELY BORON-DOPED P-TYPE SILICON

      Applied physics A: Materials science & processing
    41. KAMARINOS G; FELIX P
      HOW WILL PHYSICS BE INVOLVED IN SILICON MICROELECTRONICS

      Journal of physics. D, Applied physics
    42. KAMARINOS G
      FOR A NEW EDUCATIONAL STRATEGY FOR ULSI MICROELECTRONICS

      Materials science & engineering. A, Structural materials: properties, microstructure and processing
    43. WALZ D; LECARVAL G; JOLY JP; KAMARINOS G
      AN IN-DEPTH ANALYSIS OF THE ELYMAT TECHNIQUE FOR CHARACTERIZING METALLIC MICROCONTAMINATION IN SILICON - EXPERIMENTAL VALIDATION FOR IRON CONTAMINATION IN P-TYPE WAFERS

      Semiconductor science and technology
    44. WALZ D; JOLY JP; FALSTER R; KAMARINOS G
      CHARACTERIZATION OF NICKEL CONTAMINATION IN FLOAT-ZONE AND CZOCHRALSKY SILICON-WAFERS BY USING ELECTROLYTIC METAL TRACER OR MICROWAVE PHOTOCONDUCTIVITY DECAY MEASUREMENT

      JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS


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Documento generato il 11/08/20 alle ore 19:02:52