Catalogo Articoli (Spogli Riviste)

HELP
ATTENZIONE: attualmente gli articoli Current Contents (fonte ISI) a partire dall'anno 2002 sono consultabili sulla Risorsa On-Line

Le informazioni sugli articoli di fonte ISI sono coperte da copyright

La ricerca find articoli where authors phrase all words ' Helen, Y' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 8 riferimenti
Selezionare un intervallo

Per ulteriori informazioni selezionare i riferimenti di interesse.

    1. Helen, Y; Dassow, R; Nerding, M; Mourgues, K; Raoult, F; Kohler, JR; Mohammed-Brahim, T; Rogel, R; Bonnaud, O; Werner, JH; Strunk, HP
      High mobility thin film transistors by Nd : YVO4-laser crystallization

      THIN SOLID FILMS
    2. Toutah, H; Tala-Ighil, B; Llibre, JF; Rahal, A; Mourgues, K; Helen, Y; Brahim, TM; Dassow, R; Kohler, JR
      Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material

      THIN SOLID FILMS
    3. Toutah, H; Llibre, JF; Tala-Ighil, B; Mohammed-Brahim, T; Helen, Y; Gautier, G; Bonnaud, O
      Improved stability of large area excimer laser crystallised polysilicon thin film transistors under DC and AC operating

      MICROELECTRONICS RELIABILITY
    4. Dassow, R; Kohler, JR; Helen, Y; Mourgues, K; Bonnaud, O; Mohammed-Brahim, T; Werner, JH
      Laser crystallization of silicon for high-performance thin-film transistors

      SEMICONDUCTOR SCIENCE AND TECHNOLOGY
    5. Toutah, H; Llibre, JF; Tala-Ighil, B; Mohammed-Brahim, T; Mourgues, K; Helen, Y; Raoult, F; Bonnaud, O
      Stability of polysilicon thin film transistors under switch operating

      MICROELECTRONICS RELIABILITY
    6. Pichon, L; Mercha, A; Carin, R; Bonnaud, O; Mohammed-Brahim, T; Helen, Y; Rogel, R
      Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors

      APPLIED PHYSICS LETTERS
    7. Helen, Y; Mourgues, K; Raoult, F; Mohammed-Brahim, T; Bonnaud, O; Rogel, R; Prochasson, S; Boher, P; Zahorski, D
      Single shot excimer laser crystallization and LPCVD silicon TFTs

      THIN SOLID FILMS
    8. Rahal, A; Mohammed-Brahim, T; Toutah, H; Tala-Ighil, B; Helen, Y; Prat, C; Raoult, F
      Ageing of laser crystallized and unhydrogenated polysilicon thin film transistors

      MICROELECTRONICS RELIABILITY


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 28/01/21 alle ore 00:01:41