Le informazioni sugli articoli di fonte ISI sono coperte da copyright

Per ulteriori informazioni selezionare i riferimenti di interesse.

1. Chason, E; Erlebacher, J; Aziz, MJ; Floro, JA; Sinclair, MB
   Dynamics of pattern formation during low-energy ion bombardment of Si(001)
   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
   
   E. Chason et al., "Dynamics of pattern formation during low-energy ion bombardment of Si(001)", NUCL INST B, 178, 2001, pp. 55-61
2. Floro, JA; Hearne, SJ; Hunter, JA; Kotula, P; Chason, E; Seel, SC; Thompson, CV
   The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films
   JOURNAL OF APPLIED PHYSICS
   
   J.A. Floro et al., "The dynamic competition between stress generation and relaxation mechanisms during coalescence of Volmer-Weber thin films", J APPL PHYS, 89(9), 2001, pp. 4886-4897
3. Erlebacher, J; Aziz, MJ; Chason, E; Sinclair, MB; Floro, JA
   Nonlinear amplitude evolution during spontaneous patterning of ion-bombarded Si(001)
   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
   
   J. Erlebacher et al., "Nonlinear amplitude evolution during spontaneous patterning of ion-bombarded Si(001)", J VAC SCI A, 18(1), 2000, pp. 115-120
4. Floro, JA; Sinclair, MB; Chason, E; Freund, LB; Twesten, RD; Hwang, RQ; Lucadamo, GA
   Novel SiGe island coarsening kinetics: Ostwald ripening and elastic interactions
   PHYSICAL REVIEW LETTERS
   
   J.A. Floro et al., "Novel SiGe island coarsening kinetics: Ostwald ripening and elastic interactions", PHYS REV L, 84(4), 2000, pp. 701-704
5. Erlebacher, J; Aziz, MJ; Chason, E; Sinclair, MB; Floro, JA
   Nonclassical smoothening of nanoscale surface corrugations
   PHYSICAL REVIEW LETTERS
   
   J. Erlebacher et al., "Nonclassical smoothening of nanoscale surface corrugations", PHYS REV L, 84(25), 2000, pp. 5800-5803
6. Seel, SC; Thompson, CV; Hearne, SJ; Floro, JA
   Tensile stress evolution during deposition of Volmer-Weber thin films
   JOURNAL OF APPLIED PHYSICS
   
   S.C. Seel et al., "Tensile stress evolution during deposition of Volmer-Weber thin films", J APPL PHYS, 88(12), 2000, pp. 7079-7088
7. Hearne, SJ; Han, J; Lee, SR; Floro, JA; Follstaedt, DM; Chason, E; Tsong, IST
   Brittle-ductile relaxation kinetics of strained AlGaN/GaN heterostructures
   APPLIED PHYSICS LETTERS
   
   S.J. Hearne et al., "Brittle-ductile relaxation kinetics of strained AlGaN/GaN heterostructures", APPL PHYS L, 76(12), 2000, pp. 1534-1536
8. Floro, JA; Chason, E; Freund, LB; Twesten, RD; Hwang, RQ; Lucadamo, GA
   Evolution of coherent islands in Si1-xGex/Si(001)
   PHYSICAL REVIEW B-CONDENSED MATTER
   
   J.A. Floro et al., "Evolution of coherent islands in Si1-xGex/Si(001)", PHYS REV B, 59(3), 1999, pp. 1990-1998
9. Erlebacher, J; Aziz, MJ; Chason, E; Sinclair, MB; Floro, JA
   Spontaneous pattern formation on ion bombarded Si(001)
   PHYSICAL REVIEW LETTERS
   
   J. Erlebacher et al., "Spontaneous pattern formation on ion bombarded Si(001)", PHYS REV L, 82(11), 1999, pp. 2330-2333
10. Venezuela, P; Tersoff, J; Floro, JA; Chason, E; Follstaedt, DM; Liu, F; Lagally, MG
    Self-organized growth of alloy superlattices
    NATURE
    
    P. Venezuela et al., "Self-organized growth of alloy superlattices", NATURE, 397(6721), 1999, pp. 678-681
11. Hearne, S; Chason, E; Han, J; Floro, JA; Figiel, J; Hunter, J; Amano, H; Tsong, IST
    Stress evolution during metalorganic chemical vapor deposition of GaN
    APPLIED PHYSICS LETTERS
    
    S. Hearne et al., "Stress evolution during metalorganic chemical vapor deposition of GaN", APPL PHYS L, 74(3), 1999, pp. 356-358
12. Freund, LB; Floro, JA; Chason, E
    Extensions of the Stoney formula for substrate curvature to configurationswith thin substrates or large deformations
    APPLIED PHYSICS LETTERS
    
    L.B. Freund et al., "Extensions of the Stoney formula for substrate curvature to configurationswith thin substrates or large deformations", APPL PHYS L, 74(14), 1999, pp. 1987-1989
13. FLORO JA; LUCADAMO GA; CHASON E; FREUND LB; SINCLAIR M; TWESTEN RD; HWANG RQ
    SIGE ISLAND SHAPE TRANSITIONS INDUCED BY ELASTIC REPULSION
    Physical review letters
    
    J.A. Floro et al., "SIGE ISLAND SHAPE TRANSITIONS INDUCED BY ELASTIC REPULSION", Physical review letters, 80(21), 1998, pp. 4717-4720
14. FLORO JA; CHASON E; SINCLAIR MB; FREUND LB; LUCADAMO GA
    DYNAMIC SELF-ORGANIZATION OF STRAINED ISLANDS DURING SIGE EPITAXIAL-GROWTH
    Applied physics letters
    
    J.A. Floro et al., "DYNAMIC SELF-ORGANIZATION OF STRAINED ISLANDS DURING SIGE EPITAXIAL-GROWTH", Applied physics letters, 73(7), 1998, pp. 951-953
15. CHASON E; SINCLAIR MB; FLORO JA; HUNTER JA; HWANG RQ
    SPECTROSCOPIC LIGHT-SCATTERING FOR REAL-TIME MEASUREMENTS OF THIN-FILM AND SURFACE EVOLUTION
    Applied physics letters
    
    E. Chason et al., "SPECTROSCOPIC LIGHT-SCATTERING FOR REAL-TIME MEASUREMENTS OF THIN-FILM AND SURFACE EVOLUTION", Applied physics letters, 72(25), 1998, pp. 3276-3278
16. Amano, H; Iwaya, M; Kashima, T; Katsuragawa, M; Akasaki, I; Han, J; Hearne, S; Floro, JA; Chason, E; Figiel, J
    Stress and defect control in GaN using low temperature interlayers
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    
    H. Amano et al., "Stress and defect control in GaN using low temperature interlayers", JPN J A P 2, 37(12B), 1998, pp. L1540-L1542
17. FLORO JA; CHASON E; LEE SR; TWESTEN RD; HWANG RQ; FREUND LB
    REAL-TIME STRESS EVOLUTION DURING SI1-XGEX HETEROEPITAXY - DISLOCATIONS, ISLANDING, AND SEGREGATION
    Journal of electronic materials
    
    J.A. Floro et al., "REAL-TIME STRESS EVOLUTION DURING SI1-XGEX HETEROEPITAXY - DISLOCATIONS, ISLANDING, AND SEGREGATION", Journal of electronic materials, 26(9), 1997, pp. 969-979
18. FOLLSTAEDT DM; MYERS SM; FLORO JA; LEE SR
    INTERACTION OF CAVITIES WITH MISFIT DISLOCATIONS IN SIGE SI HETEROSTRUCTURES/
    Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
    
    D.M. Follstaedt et al., "INTERACTION OF CAVITIES WITH MISFIT DISLOCATIONS IN SIGE SI HETEROSTRUCTURES/", Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 375-378
19. FLORO JA; CHASON E; TWESTEN RD; HWANG RQ; FREUND LB
    SIGE COHERENT ISLANDING AND STRESS-RELAXATION IN THE HIGH-MOBILITY REGIME
    Physical review letters
    
    J.A. Floro et al., "SIGE COHERENT ISLANDING AND STRESS-RELAXATION IN THE HIGH-MOBILITY REGIME", Physical review letters, 79(20), 1997, pp. 3946-3949
20. FLORO JA; CHASON E; LEE SR; PETERSEN GA
    BIAXIAL MODULI OF COHERENT SI1-XGEX FILMS ON SI(001)
    Applied physics letters
    
    J.A. Floro et al., "BIAXIAL MODULI OF COHERENT SI1-XGEX FILMS ON SI(001)", Applied physics letters, 71(12), 1997, pp. 1694-1696
21. FLORO JA; CHASON E
    MEASURING GE SEGREGATION BY REAL-TIME STRESS MONITORING DURING SI1-XGEX MOLECULAR-BEAM EPITAXY
    Applied physics letters
    
    J.A. Floro e E. Chason, "MEASURING GE SEGREGATION BY REAL-TIME STRESS MONITORING DURING SI1-XGEX MOLECULAR-BEAM EPITAXY", Applied physics letters, 69(25), 1996, pp. 3830-3832
22. KELLERMAN BK; FLORO JA; CHASON E; BRICE DK; PICRAUX ST; WHITE JM
    DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING
    Journal of vacuum science & technology. A. Vacuum, surfaces, and films
    
    B.K. Kellerman et al., "DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 972-978
23. FLORO JA; KELLERMAN BK; CHASON E; PICRAUX ST; BRICE DK; HORN KM
    SURFACE DEFECT PRODUCTION ON GE(001) DURING LOW-ENERGY ION-BOMBARDMENT
    Journal of applied physics
    
    J.A. Floro et al., "SURFACE DEFECT PRODUCTION ON GE(001) DURING LOW-ENERGY ION-BOMBARDMENT", Journal of applied physics, 77(6), 1995, pp. 2351-2357
24. KELLERMAN BK; CHASON E; FLORO JA; PICRAUX ST; WHITE JM
    THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH
    Applied physics letters
    
    B.K. Kellerman et al., "THE ROLE OF TRANSIENT ION-INDUCED DEFECTS IN ION-BEAM-ASSISTED GROWTH", Applied physics letters, 67(12), 1995, pp. 1703-1705
25. LEE HS; KURTZ SR; FLORO JA; STRANE J; SEAGER CH; LEE SR; JONES ED; NELSON JF; MAYER T; PICRAUX ST
    OPTICAL CHARACTERIZATION OF SI1-XCX SS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.014) SEMICONDUCTOR ALLOYS/
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS
    
    H.S. Lee et al., "OPTICAL CHARACTERIZATION OF SI1-XCX SS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.014) SEMICONDUCTOR ALLOYS/", JPN J A P 2, 34(10B), 1995, pp. 1340-1343
26. FLORO JA; THOMPSON CV; CAREL R; BRISTOWE PD
    COMPETITION BETWEEN STRAIN AND INTERFACE ENERGY DURING EPITAXIAL GRAIN-GROWTH IN AG FILMS ON NI(001)
    Journal of materials research
    
    J.A. Floro et al., "COMPETITION BETWEEN STRAIN AND INTERFACE ENERGY DURING EPITAXIAL GRAIN-GROWTH IN AG FILMS ON NI(001)", Journal of materials research, 9(9), 1994, pp. 2411-2424
27. HORN KM; CHASON E; TSAO JY; FLORO JA; PICRAUX ST
    OXYGEN ROUGHENING OF GE(001) SURFACES
    Surface science
    
    K.M. Horn et al., "OXYGEN ROUGHENING OF GE(001) SURFACES", Surface science, 320(1-2), 1994, pp. 174-184