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La ricerca find articoli where authors phrase all words ' FRIEDBACHER G' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 62 riferimenti
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    1. Basnar, B; Friedbacher, G; Brunner, H; Vallant, T; Mayer, U; Hoffmann, H
      Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces

      APPLIED SURFACE SCIENCE
    2. Hirakuri, KK; Kobayashi, T; Nakamura, E; Matsukura, N; Friedbacher, G; Machi, Y
      Influence of the methane concentration on HF-CVD diamond under atmosphericpressure

      VACUUM
    3. Hirakuri, K; Yokoyama, T; Enomoto, H; Mutsukura, N; Friedbacher, G
      Surface properties and field emission characteristics of chemical vapor deposition diamond grown on Fe/Si substrates

      JOURNAL OF APPLIED PHYSICS
    4. Kranz, C; Friedbacher, G; Mizaikoff, B
      Integrating an ultramicroelectrode in an AFM cantilever: Combined technology for enhanced information

      ANALYTICAL CHEMISTRY
    5. Vallant, T; Brunner, H; Kattner, J; Mayer, U; Hoffmann, H; Leitner, T; Friedbacher, G; Schugerl, G; Svagera, R; Ebel, M
      Monolayer-controlled deposition of silicon oxide films on gold, silicon, and mica substrates by room-temperature adsorption and oxidation of alkylsiloxane monolayers

      JOURNAL OF PHYSICAL CHEMISTRY B
    6. Basnar, B; Schnoller, J; Fottinger, K; Friedbacher, G; Mayer, U; Hoffmann, H; Fabry, L
      Characterization of silicon wafers through deposition of self-assembled monolayers

      FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
    7. Tammeveski, K; Tenno, T; Niinisto, J; Leitner, T; Friedbacher, G; Niinisto, L
      Thermal preparation of thin platinum coatings and their electrochemical and atomic force microscopic characterization

      APPLIED SURFACE SCIENCE
    8. Friedbacher, G; Wegscheider, W
      Editorial: Solid State Analysis Proceedings of the 10th Symposium, Vienna,Austria, July 5-7, 1999

      MIKROCHIMICA ACTA
    9. Dreer, S; Wilhartitz, P; Piplits, K; Hutter, H; Kopnarski, M; Friedbacher, G
      Quantitative sputter depth profiling of silicon- and aluminium oxynitride films

      MIKROCHIMICA ACTA
    10. Utriainen, M; Lattu, H; Viirola, H; Niinisto, L; Resch, R; Friedbacher, G
      Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy

      MIKROCHIMICA ACTA
    11. Basnar, B; Madera, M; Friedbacher, G; Vallant, T; Mayer, U; Hoffmann, H
      Fabrication of nanostructured surfaces using self-assembled monolayers

      MIKROCHIMICA ACTA
    12. Leitner, T; Friedbacher, G; Vallant, T; Brunner, H; Mayer, U; Hoffmann, H
      Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy

      MIKROCHIMICA ACTA
    13. Kanniainen, T; Lindroos, S; Resch, R; Leskela, M; Friedbacher, G; Grasserbauer, M
      Structural and topographical studies of SILAR-grown highly oriented PbS thin films

      MATERIALS RESEARCH BULLETIN
    14. Hirakuri, KK; Kurata, T; Mutsukura, N; Friedbacher, G; Ohuchi, M
      Field-emission properties of diamond grains grown on textured Fe/Si substrates

      JOURNAL OF APPLIED PHYSICS
    15. Kollensperger, G; Friedbacher, G; Kotzick, R; Niessner, R; Grasserbauer, M
      In-situ atomic force microscopy investigation of aerosols exposed to different humidities

      FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
    16. Kollensperger, G; Friedbacher, G; Krammer, A; Grasserbauer, M
      Application of atomic force microscopy to particle sizing

      FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY
    17. Brunner, H; Vallant, T; Mayer, U; Hoffmann, H; Basnar, B; Vallant, M; Friedbacher, G
      Substrate effects on the formation of alkylsiloxane monolayers

      LANGMUIR
    18. Resch, R; Grasserbauer, M; Friedbacher, G; Vallant, T; Brunner, H; Mayer, U; Hoffmann, H
      In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers

      APPLIED SURFACE SCIENCE
    19. Dreer, S; Krismer, R; Wilhartitz, P; Friedbacher, G
      Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films

      THIN SOLID FILMS
    20. Friedbacher, G; Fuchs, H
      Classification of scanning probe microscopies - (Technical report)

      PURE AND APPLIED CHEMISTRY
    21. Dreer, S; Wilhartitz, P; Mersdorf, E; Piplits, K; Friedbacher, G
      Quantitative analysis of thin aluminium-oxynitride films by EPMA

      MIKROCHIMICA ACTA
    22. Dreer, S; Wilhartitz, P; Mersdorf, E; Friedbacher, G
      Quantitative analysis of silicon-oxynitride films by EPMA

      MIKROCHIMICA ACTA
    23. VALIANT T; BRUNNER H; MAYER U; HOFFMANN H; LEITNER T; RESCH R; FRIEDBACHER G
      FORMATION OF SELF-ASSEMBLED OCTADECYLSILOXANE MONOLAYERS ON MICA AND SILICON SURFACES STUDIED BY ATOMIC-FORCE MICROSCOPY AND INFRARED-SPECTROSCOPY

      JOURNAL OF PHYSICAL CHEMISTRY B
    24. RESCH R; EHN R; TICHY H; FRIEDBACHER G
      IN-SITU INVESTIGATION OF HUMIDITY-INDUCED CHANGES ON HUMAN HAIR AND ANTENNAE OF THE HONEY-BEE, APIS-MELLIFERA L., BY SCANNING FORCE MICROSCOPY

      Applied physics A: Materials science & processing
    25. RESCH R; FRIEDBACHER G; GRASSERBANER M; LINDROOS S; KANNIAINEN T; VALKONEN MP; LESKELA M
      INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY

      Fresenius' journal of analytical chemistry
    26. KOLLENSPERGER G; FRIEDBACHER G; GRASSERBAUER M
      IN-SITU INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    27. VALKONEN MP; LINDROOS S; KANNIAINEN T; LESKELA M; RESCH R; FRIEDBACHER G; GRASSERBAUER M
      ATOMIC-FORCE MICROSCOPY STUDIES OF ZNS FILMS GROWN ON (100)GAAS BY THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD

      Journal of materials research
    28. VALKONEN MP; LINDROOS S; RESCH R; LESKELA M; FRIEDBACHER G; GRASSERBAUER M
      GROWTH OF ZINC-SULFIDE THIN-FILMS ON (100)SI WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD STUDIED BY ATOMIC-FORCE MICROSCOPY

      Applied surface science
    29. GRASSBAUER M; FRIEDBACHER G
      KELLNER,ROBERT - OBITUARY

      TrAC. Trends in analytical chemistry
    30. ALI A; HIRAKURI KK; FRIEDBACHER G
      ROUGHNESS AND DEPOSITION MECHANISM OF DLC FILMS PREPARED BY RF PLASMAGLOW-DISCHARGE

      Vacuum
    31. ASCHAUER E; FASCHING R; VARAHRAM M; JOBST G; URBAN G; NICOLUSSI G; HUSINSKY W; FRIEDBACHER G; GRASSERBAUER M
      SURFACE MODIFICATION OF PLATINUM THIN-FILM ELECTRODES TOWARDS A DEFINED ROUGHNESS AND MICROPOROSITY

      Journal of electroanalytical chemistry [1992]
    32. RESCH R; FRIEDBACHER G; GRASSERBAUER M; KANNIAINEN T; LINDROOS S; LESKELA M; NIINISTO L
      IN-SITU INVESTIGATIONS ON THE SILAR-GROWTH OF ZNS FILMS AS STUDIED BYTAPPING MODE ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    33. KOLLENSPERGER G; FRIEDBACHER G; GRASSERBAUER M; DORFFNER L
      INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    34. RESCH R; FRIEDBACHER G; GRASSERBAUER M
      INVESTIGATION OF SURFACE CHANGES ON MICA INDUCED BY ATOMIC-FORCE MICROSCOPY IMAGING UNDER LIQUIDS

      Fresenius' journal of analytical chemistry
    35. KENJI KH; YOSHII M; FRIEDBACHER G; GRASSERBAUER M
      THE EFFECT OF ULTRASONIC VIBRATION ON CVD DIAMOND NUCLEATION

      DIAMOND AND RELATED MATERIALS
    36. IHANUS J; RITALA M; LESKELA M; PROHASKA T; RESCH R; FRIEDBACHER G; GRASSERBAUER M
      AFM STUDIES ON ZNS THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY

      Applied surface science
    37. RESCH R; FRIEDBACHER G; GRASSERBAUER M; KANNIAINEN T; LINDROOS S; LESKELA M; NIINISTO L
      LATERAL FORCE MICROSCOPY AND FORCE MODULATION MICROSCOPY ON SILAR-GROWN LEAD SULFIDE SAMPLES

      Applied surface science
    38. SCHMITZ I; SCHREINER M; FRIEDBACHER G; GRASSERBAUER M
      PHASE IMAGING AS AN EXTENSION TO TAPPING MODE AFM FOR THE IDENTIFICATION OF MATERIAL PROPERTIES ON HUMIDITY-SENSITIVE SURFACES

      Applied surface science
    39. FRIEDBACHER G; FUCHS H; GUNTHERODT HJ
      PAPERS PRESENTED AT THE SXM-2 WORKSHOP - VIENNA, AUSTRIA - 16-18 SEPTEMBER 1996 - PREFACE

      Surface and interface analysis
    40. HIRAKURI KK; MINORIKAWA T; FRIEDBACHER G; GRASSERBAUER M
      THIN-FILM CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS PREPARED BY RF PLASMA CHEMICAL-VAPOR-DEPOSITION

      Thin solid films
    41. WEGSCHEIDER W; FRIEDBACHER G; GRASSERBAUER M
      PROCEEDINGS OF THE 8TH SYMPOSIUM ON SOLID-STATE ANALYSIS, HELD IN VIENNA, AUSTRIA, JULY 3-5, 1995

      Mikrochimica acta
    42. WANZENBOCK HD; EDLMIZAIKOFF B; FRIEDBACHER G; GRASSERBAUER M; KELLNER R; ARNTZEN M; LUYVEN T; THEISS W; GROSSE P
      SURFACE-ENHANCED INFRARED-ABSORPTION SPECTROSCOPY (SEIRA) USING MULTIREFLECTION ATR-ELEMENTS

      Mikrochimica acta
    43. FRIEDBACHER G; RESCH R; SCHMITZ I; KOLLENSPERGER G; SCHREINER M; GRASSERBAUER M
      ANALYTICAL CHARACTERIZATION OF SURFACES BY SCANNING FORCE MICROSCOPY

      Annali di chimica
    44. SCHMITZ I; SCHREINER M; FRIEDBACHER G; GRASSERBAUER M
      TAPPING-MODE AFM IN COMPARISON TO CONTACT-MODE AFM AS A TOOL FOR IN-SITU INVESTIGATIONS OF SURFACE-REACTIONS WITH REFERENCE TO GLASS CORROSION

      Analytical chemistry
    45. ASIKAINEN T; RITALA M; LESKELA R; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M
      AFM AND STM STUDIES ON IN2O3 AND ITO THIN-FILMS DEPOSITED BY ATOMIC LAYER EPITAXY

      Applied surface science
    46. RITALA M; SALONIEMI H; LESKELA M; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M
      STUDIES ON THE MORPHOLOGY OF AL2O3 THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY

      Thin solid films
    47. KANNIAINEN T; LINDROOS S; PROHASKA T; FRIEDBACHER G; LESKELA M; GRASSERBAUER M; NIINISTO L
      GROWTH OF ZINC-SULFIDE THIN-FILMS WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED BY ATOMIC-FORCE MICROSCOPY

      Journal of materials chemistry
    48. SCHMITZ I; PROHASKA T; FRIEDBACHER G; SCHREINER M; GRASSERBAUER M
      INVESTIGATION OF CORROSION PROCESSES ON CLEAVAGE EDGES OF POTASH-LIME-SILICA GLASSES BY ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    49. PROHASKA T; FRIEDBACHER G; GRASSERBAUER M; NICKEL H; LOSCH R; SCHLAPP W
      IN-SITU INVESTIGATION OF SURFACE PROCESSES ON ALGAAS GAAS CLEAVAGE EDGES AS STUDIED BY ATOMIC-FORCE MICROSCOPY/

      Fresenius' journal of analytical chemistry
    50. FUCHS GM; FRIEDBACHER G; SCHWARZBACH D; BOUVERESSE E; PROHASKA T; GRASSERBAUER M; HAUBNER R; LUX B
      AFM INVESTIGATION OF SILICON SUBSTRATES FOR CHEMICAL-VAPOR-DEPOSITIONOF DIAMOND FILMS

      Fresenius' journal of analytical chemistry
    51. RESCH R; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M; KANNIAINEN T; LINDROOS S; LESKELA M; NIINISTO L; BROEKAERT JAC
      IN-SITU INVESTIGATION OF ZNS DEPOSITION ON MICA BY SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED WITH ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    52. FUCHS GM; PROHASKA T; FRIEDBACHER G; HUTTER H; GRASSERBAUER M
      MAXIMUM-ENTROPY DECONVOLUTION OF AFM AND STM IMAGES

      Fresenius' journal of analytical chemistry
    53. HABICHT J; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M; ORTNER HM
      NANOTOPOGRAPHICAL CHANGES ON GRAPHITE TUBE SURFACES IN ELECTROTHERMALATOMIC-ABSORPTION SPECTROMETRY EXPERIMENTS AS STUDIED BY ATOMIC-FORCEMICROSCOPY

      Spectrochimica acta, Part B: Atomic spectroscopy
    54. FRIEDBACHER G; BOUVERESSE E; FUCHS G; GRASSERBAUER M; SCHWARZBACH D; HAUBNER R; LUX B
      PRETREATMENT OF SILICON SUBSTRATES FOR CVD DIAMOND DEPOSITION STUDIEDBY ATOMIC-FORCE MICROSCOPY

      Applied surface science
    55. PROHASKA T; FRIEDBACHER G; GRASSERBAUER M; NICKEL H; LOSCH R; SCHLAPP W
      IN-SITU INVESTIGATION OF ALUMINUM GALLIUM ARSENIDE GALLIUM ARSENIDE MULTILAYER STRUCTURES UNDER INERT AND REACTIVE MEDIA BY ATOMIC-FORCE MICROSCOPY/

      Analytical chemistry
    56. FRIEDBACHER G; GRASSERBAUER M; MESLMANI Y; KLAUS N; HIGATSBERGER MJ
      INVESTIGATION OF ENVIRONMENTAL AEROSOL BY ATOMIC-FORCE MICROSCOPY

      Analytical chemistry
    57. PROHASKA T; FRIEDBACHER G; GRASSERBAUER M
      IN-SITU INVESTIGATION OF SURFACE-REACTIONS ON ALKALI-HALIDES BY ATOMIC-FORCE MICROSCOPY

      Fresenius' journal of analytical chemistry
    58. RITALA M; LESKELA M; NIINISTO L; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M
      DEVELOPMENT OF CRYSTALLINITY AND MORPHOLOGY IN HAFNIUM DIOXIDE THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY

      Thin solid films
    59. RITALA M; LESKELA M; NIINISTO L; PROHASKA T; FRIEDBACHER G; GRASSERBAUER M
      SURFACE-ROUGHNESS REDUCTION IN ATOMIC LAYER EPITAXY GROWTH OF TITANIUM-DIOXIDE THIN-FILMS

      Thin solid films
    60. FRIEDBACHER G; PROHASKA T; GRASSERBAUER M
      SURFACE-ANALYSIS WITH ATOMIC-FORCE MICROSCOPY THROUGH MEASUREMENT IN AIR AND UNDER LIQUIDS

      Mikrochimica acta
    61. GRASSERBAUER M; FRIEDBACHER G; HUTTER H; STINGEDER G
      TRENDS IN SURFACE AND INTERFACE ANALYSIS

      Fresenius' journal of analytical chemistry
    62. FRIEDBACHER G; GRASSERBAUER M
      ATOMIC-FORCE MICROSCOPY OF TECHNOLOGICAL AND BIOLOGICAL SAMPLES

      Fresenius' journal of analytical chemistry


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/10/20 alle ore 03:34:21