Catalogo Articoli (Spogli Riviste)

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La ricerca find articoli where authors phrase all words ' Balk, LJ' sort by level,fasc_key/DESCEND, pagina_ini_num/ASCEND ha restituito 37 riferimenti
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    1. Meincken, M; Balk, LJ; Sanderson, RD
      Improved sensitivity in the thermal investigation of polymeric nanophases by measuring the resonance frequency shift using an atomic force microscope

      MACROMOLECULAR MATERIALS AND ENGINEERING
    2. Heiderhoff, R; Cramer, RM; Sergeev, OV; Balk, LJ
      Near-field cathodoluminescence of nanoscopic diamond properties

      DIAMOND AND RELATED MATERIALS
    3. Liu, XX; Heiderhoff, R; Abicht, HP; Balk, LJ
      Characterization of ferroelectric domains by the use of scanning near-field acoustic microscopies

      ANALYTICAL SCIENCES
    4. Gaponenko, NV; Sergeev, OV; Stepanova, EA; Parkun, VM; Mudryi, AV; Gnaser, H; Misiewicz, J; Heiderhoff, R; Balk, LJ; Thompson, GE
      Optical and structural characterization of erbium-doped TiO2 xerogel filmsprocessed on porous anodic alumina

      JOURNAL OF THE ELECTROCHEMICAL SOCIETY
    5. Schulz, H; Korbes, AS; Scheer, HC; Balk, LJ
      Combination of Nanoimprint and Scanning Force Lithography for local tailoring of sidewalls of nanometer devices

      MICROELECTRONIC ENGINEERING
    6. Balk, LJ; Wolfgang, E; Gerling, WH
      Special issue - 11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2000)

      MICROELECTRONICS RELIABILITY
    7. Heiderhoff, R; Palaniappan, M; Phang, JCH; Balk, LJ
      Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

      MICROELECTRONICS RELIABILITY
    8. Heiderhoff, R; Sergeev, OV; Liu, YY; Phang, JCH; Balk, LJ
      Comparison between standard and near-field cathodoluminescence

      JOURNAL OF CRYSTAL GROWTH
    9. Cramer, RM; Heiderhoff, R; Balk, LJ
      Nanoscopic investigations of diamond properties by scanning probe microscopy techniques

      DIAMOND AND RELATED MATERIALS
    10. Balk, LJ; Cramer, RM
      Nanoscale reliability assessment of electronic devices

      MICROELECTRONIC ENGINEERING
    11. Lepidis, P; Joachimsthaler, I; Balk, LJ
      A PC-based scan control unit for fast view scanning electron microscopic imaging

      SCANNING
    12. Fiege, GBM; Schade, W; Palaniappan, M; Ng, V; Phang, JCH; Balk, LJ
      Front- and backside investigations of thermal and electronic properties ofsemiconducting devices

      MICROELECTRONICS RELIABILITY
    13. Cramer, RM; Biletzki, V; Lepidis, P; Balk, LJ
      Sub-surface analyses of defects in integrated devices by scanning probe acoustic microscopy

      MICROELECTRONICS RELIABILITY
    14. Fiege, GBM; Niedernostheide, FJ; Schulze, HJ; Barthelmess, R; Balk, LJ
      Thermal characterization of power devices by scanning thermal microscopy techniques

      MICROELECTRONICS RELIABILITY
    15. Fiege, GBM; Altes, A; Heiderhoff, B; Balk, LJ
      Quantitative thermal conductivity measurements with nanometre resolution

      JOURNAL OF PHYSICS D-APPLIED PHYSICS
    16. Cramer, RM; Sergeev, OV; Heiderhoff, R; Balk, LJ
      Spectrally resolved cathodoluminescence analyses in the optical near-field

      JOURNAL OF MICROSCOPY-OXFORD
    17. Cramer, RM; Chin, R; Balk, LJ
      Reflection mode scanning near-field optical microscopy analyses of integrated devices

      JOURNAL OF MICROSCOPY-OXFORD
    18. CRAMER RM; HEIDERHOFF R; BALK LJ
      SCANNING NEAR-FIELD CATHODOLUMINESCENCE INVESTIGATIONS

      Scanning
    19. FIEGE GBM; FEIGE V; PHANG JCH; MAYWALD M; GORLICH S; BALK LJ
      FAILURE ANALYSIS OF INTEGRATED DEVICES BY SCANNING THERMAL MICROSCOPY(STHM)

      Microelectronics and reliability
    20. CRAMER RM; SCHADE WR; HEIDERHOFF R; BALK LJ; CHIN R
      SCANNING NEAR-FIELD OPTICAL MICROSCOPY ANALYSES OF ELECTRONIC DEVICES

      Microelectronics and reliability
    21. CRAMER RM; EBINGHAUS V; HEIDERHOFF R; BALK LJ
      NEAR-FIELD DETECTION CATHODOLUMINESCENCE INVESTIGATIONS

      Journal of physics. D, Applied physics
    22. Liu, XX; Balk, LJ; Zhang, BY; Yin, QR
      Scanning electron acoustic microscopy for the evaluation of domain structures in BaTiO3 single crystal and ceramics

      JOURNAL OF MATERIALS SCIENCE
    23. LIU X; ZHANG BY; YIN QR; BALK LJ
      ACOUSTIC NEAR-FIELD MICROSCOPY OF POLYCRYSTALLINE MATERIALS

      European journal of cell biology
    24. CRAMER RM; BRUCHHAUS L; BALK LJ
      CHARACTERIZATION OF THERMAL DEVICE PROPERTIES WITH NANOMETER RESOLUTION

      Microelectronics and reliability
    25. MAYWALD M; PYLKKI RJ; REINEKE FJ; BALK LJ
      MODULATED THERMAL PROFILING ON DEVICES

      Progress in Natural Science
    26. MAYWALD M; BALK LJ
      EVALUATION OF LOCAL THERMOELASTIC FEATURES BY MEANS OF SCANNING FORCEMICROSCOPY BASED TECHNIQUES

      Progress in Natural Science
    27. WOLFGANG E; COURTOIS B; BALK LJ
      ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - PROCEEDINGSOF THE 5TH EUROPEAN CONFERENCE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - AUGUST 27-30, 1995, WUPPERTAL, GERMANY - PREFACE

      Microelectronic engineering
    28. BALK LJ; HEIDERHOFF R; KOSCHINSKI P; MAYWALD M
      NANOSCOPIC EVALUATION OF SEMICONDUCTOR PROPERTIES BY SCANNING PROBE MICROSCOPIES

      Microelectronics and reliability
    29. HEIDERHOFF R; KOSCHINSKI P; MAYWALD M; BALK LJ; BACHMANN PK
      CORRELATION OF THE ELECTRICAL, THERMAL, AND OPTICAL-PROPERTIES OF CVDDIAMOND FILMS BY SCANNING MICROSCOPY TECHNIQUES

      DIAMOND AND RELATED MATERIALS
    30. KAUFMANN K; BALK LJ
      NUMERICAL-SIMULATION OF ELECTRON-BEAM-INDUCED GATE CURRENTS IN A GAAS-MESFET .1. THEORY AND MODEL

      Journal of physics. D, Applied physics
    31. KAUFMANN K; BALK LJ
      NUMERICAL-SIMULATION OF ELECTRON-BEAM-INDUCED GATE CURRENTS IN A GAAS-MESFET .2. NUMERICAL AND EXPERIMENTAL RESULTS

      Journal of physics. D, Applied physics
    32. BALK LJ; MAYWALD M
      SCANNING FORCE MICROSCOPY OF SEMICONDUCTOR-MATERIALS AND DEVICES

      Materials science & engineering. B, Solid-state materials for advanced technology
    33. KOSCHINSKI P; DWORAK V; BALK LJ
      HIGH-RESOLUTION ELECTRON-BEAM-INDUCED CURRENT MEASUREMENTS IN AN SCANNING TUNNELING MICROSCOPE ON GAAS-MESFET

      Scanning microscopy
    34. MAYWALD M; PYLKKI RJ; BALK LJ
      IMAGING OF LOCAL THERMAL AND ELECTRICAL-CONDUCTIVITY WITH SCANNING FORCE MICROSCOPY

      Scanning microscopy
    35. MAYWALD M; STEPHAN RE; BALK LJ
      EVALUATION OF AN EPITAXIAL LAYER STRUCTURE BY LATERAL FORCE AND CONTACT CURRENT MEASUREMENTS IN A SCANNING FORCE MICROSCOPE

      Microelectronic engineering
    36. KAUFMANN K; ORSECH K; DOMNIK M; BALK LJ
      EVALUATION OF THE ELECTRON-ACOUSTIC SIGNAL GENERATION IN GAAS

      Journal of physics. D, Applied physics
    37. DOMNIK M; BALK LJ
      QUANTITATIVE SCANNING ELECTRON ACOUSTIC MICROSCOPY OF SILICON

      Scanning microscopy


ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/06/20 alle ore 07:58:31