Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
CALIBRATION OF THE PROBING DEPTH BY TOTAL ELECTRON YIELD OF EXAFS SPECTRA IN OXIDE OVERLAYERS (TA2O5, TIO2, ZRO2)
Autore:
JIMENEZ VM; CABALLERO A; FERNANDEZ A; SANCHEZLOPEZ JC; GONZALEZELIPE AR; TRIGO JF; SANZ JM;
Indirizzi:
CTR INVEST CIENT ISLA CARTUJA,DPTO Q INORGAN,AVDA AMER VESPUCIO S-N SEVILLE 41092 SPAIN CTR INVEST CIENT ISLA CARTUJA,DPTO Q INORGAN SEVILLE 41092 SPAIN UNIV SEVILLA,CSIC,INST CIENCIA MAT SEVILLA SEVILLE 41092 SPAIN UNIV AUTONOMA MADRID,FAC CIENCIAS,DPTO FIS APLICADA E-28049 MADRID SPAIN
Titolo Testata:
Surface and interface analysis
fascicolo: 9, volume: 25, anno: 1997,
pagine: 707 - 714
SICI:
0142-2421(1997)25:9<707:COTPDB>2.0.ZU;2-5
Fonte:
ISI
Lingua:
ENG
Soggetto:
X-RAY-ABSORPTION; FINE-STRUCTURE; SURFACE; SPECTROSCOPY; AUGER;
Keywords:
X-RAY ABSORPTION SPECTROSCOPY; TOTAL ELECTRON YIELD; OXIDES; EXAFS PROBING DEPTH;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
26
Recensione:
Indirizzi per estratti:
Citazione:
V.M. Jimenez et al., "CALIBRATION OF THE PROBING DEPTH BY TOTAL ELECTRON YIELD OF EXAFS SPECTRA IN OXIDE OVERLAYERS (TA2O5, TIO2, ZRO2)", Surface and interface analysis, 25(9), 1997, pp. 707-714

Abstract

Calibration of the probing depth by x-ray absorption spectroscopy (XAS) in oxide materials is intended by measurement of the total electronyield (TEY) of electrons ejected by absorption of the radiation. Measurements have been carried out for three series of electrolytic metal oxide overlayers with different thickness. The experiments have been conducted at the Ti K, Ta L-III and Zr It edges. Analysis of the XAS spectra is carried out by factor analysis and conventional Fourier transformation and fitting analysis. The data showed that the information depth by XAS follows the order ZrO2 > TiO2 > Ta2O5 at the Ti It, Ta L-III and Zr It edges. As an alternative, tbe absorption spectra of the same samples were measured in the conversion electron yield (CEY) mode:i.e. by measuring the current of He+ ions produced by the ejected electrons in an atmosphere of He in contact with the sample. Here, the information depth is slightly different from that obtained by TEY. (C) 1997 by John Whey & Sons, Ltd.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 28/11/20 alle ore 21:36:34