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Titolo:
SELF-ABSORPTION EFFECTS IN GRAZING-INCIDENCE TOTAL ELECTRON-YIELD XAS
Autore:
SCHROEDER SLM; MOGGRIDGE GD; LAMBERT RM; RAYMENT T;
Indirizzi:
UNIV CAMBRIDGE,DEPT CHEM,LENSFIELD RD CAMBRIDGE CB2 1EW ENGLAND UNIV CAMBRIDGE,DEPT CHEM ENGN CAMBRIDGE CB2 3RA ENGLAND MAX PLANCK GESELL,FRITZ HABER INST D-14195 BERLIN GERMANY
Titolo Testata:
Journal de physique. IV
fascicolo: C2, volume: 7, anno: 1997,
parte:, 1
pagine: 91 - 96
SICI:
1155-4339(1997)7:C2<91:SEIGTE>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Soggetto:
X-RAY-DIFFRACTION; FINE-STRUCTURE; EXAFS; FILMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
29
Recensione:
Indirizzi per estratti:
Citazione:
S.L.M. Schroeder et al., "SELF-ABSORPTION EFFECTS IN GRAZING-INCIDENCE TOTAL ELECTRON-YIELD XAS", Journal de physique. IV, 7(C2), 1997, pp. 91-96

Abstract

Uniformly reduced amplitudes of the extended X-ray absorption fine-structure (EXAFS) detected by total electron-yield (TEY) methods have repeatedly been reported in the literature. Some authors ascribed them to the presence of a 'disordered' near-surface layer on the sample, butin situ TEY EXAFS investigations of the annealing behaviour of Ni provide experimental evidence against this hypothesis. It is shown that an amplitude reduction previously observed for metallic Ni can be corrected by taking account of a 'self-absorption' effect which occurs in TEY measurements at grazing X-ray incidence. Furthermore, the TEY also contains contributions excited by fluorescent photons which are another source of distorted EXAFS amplitudes. Using results of Monte-Carlo electron-trajectory simulations, the magnitude of the 'self-absorption'distortions is calculated and compared to the results of TEY measurements of Cr, Ni and ZnO samples as a function of incidence angle.

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Documento generato il 01/12/20 alle ore 15:39:39