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Titolo:
Probing solid-solution interfacial chemistry with ATR-IR spectroscopy of particle films
Autore:
McQuillan, AJ;
Indirizzi:
Univ Otago, Dept Chem, Dunedin, New Zealand Univ Otago Dunedin New Zealand v Otago, Dept Chem, Dunedin, New Zealand
Titolo Testata:
ADVANCED MATERIALS
fascicolo: 12-13, volume: 13, anno: 2001,
pagine: 1034 -
SICI:
0935-9648(20010704)13:12-13<1034:PSICWA>2.0.ZU;2-0
Fonte:
ISI
Lingua:
ENG
Soggetto:
SITU INFRARED-SPECTROSCOPY; METAL-OXIDE SURFACES; AQUEOUS-SOLUTIONS; REFLECTION SPECTROSCOPY; ADSORPTION; TIO2; TITANIUM; OXALATE; DIOXIDE; ACID;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
Citazioni:
20
Recensione:
Indirizzi per estratti:
Indirizzo: McQuillan, AJ Univ Otago, Dept Chem, POB 56, Dunedin, New Zealand Univ Otago POB 56 Dunedin New Zealand Dunedin, New Zealand
Citazione:
A.J. McQuillan, "Probing solid-solution interfacial chemistry with ATR-IR spectroscopy of particle films", ADVAN MATER, 13(12-13), 2001, pp. 1034

Abstract

Infrared (IR) spectroscopy of thin particle films, deposited on an attenuated total reflection (ATR) crystal and immersed in solution, has high potential for investigating the chemistry of solid-solution interfaces. Phenomena that can be studied include pH-dependent adsorption, photosensitization, photocatalysis, and biocompatibility of prosthetic materials. With films a few micrometers thick, the penetration depth of the evanescent IR wave is sufficient to monitor surface reactions throughout the high surface area particle film.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/07/20 alle ore 09:59:08