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Titolo:
IN-SITU X-RAY-INVESTIGATION OF HYDROGEN CHARGING IN THIN-FILM BIMETALLIC ELECTRODES
Autore:
JISRAWI NM; WIESMANN H; RUCKMAN MW; THURSTON TR; REISFELD G; OCKO BM; STRONGIN M;
Indirizzi:
BROOKHAVEN NATL LAB,DEPT PHYS UPTON NY 11973
Titolo Testata:
Journal of materials research
fascicolo: 8, volume: 12, anno: 1997,
pagine: 2091 - 2098
SICI:
0884-2914(1997)12:8<2091:IXOHCI>2.0.ZU;2-N
Fonte:
ISI
Lingua:
ENG
Soggetto:
DIFFRACTION; PALLADIUM; MONOLAYERS; DEUTERIUM; NIOBIUM; SYSTEM; ACID;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
40
Recensione:
Indirizzi per estratti:
Citazione:
N.M. Jisrawi et al., "IN-SITU X-RAY-INVESTIGATION OF HYDROGEN CHARGING IN THIN-FILM BIMETALLIC ELECTRODES", Journal of materials research, 12(8), 1997, pp. 2091-2098

Abstract

Hydrogen uptake and discharge by thin metallic films under potentiostatic control was studied using x-ray diffraction at the National Synchroton Light Source (NSLS), The formation of metal-hydrogen phases in Pd, Pd-capped Nb, and Pd/Nb multilayer electrode structures was deducedfrom x-ray diffraction data and correlated with the cyclic voltammetry (CV) peaks. The x-ray data were also used to construct a plot of thehydrogen concentration as a function of cell potential for a multilayered thin film.

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Documento generato il 04/07/20 alle ore 17:37:31