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Titolo:
Phase stabilization in cinnarizine complexes using X-ray profile analysis
Autore:
Nagendrappa, G; Urs, SSR; Madhava, MS; Somashekar, R;
Indirizzi:
Univ Mysore, Dept Studies Chem, Mysore 570006, Karnataka, India Univ Mysore Mysore Karnataka India 570006 Mysore 570006, Karnataka, India
Titolo Testata:
PRAMANA-JOURNAL OF PHYSICS
fascicolo: 6, volume: 56, anno: 2001,
pagine: 797 - 808
SICI:
0304-4289(200106)56:6<797:PSICCU>2.0.ZU;2-B
Fonte:
ISI
Lingua:
ENG
Soggetto:
SPECTROPHOTOMETRY; CADMIUM; ANIONS; IONS;
Keywords:
crystallite shape; strain; cinnarizine; WAXS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
37
Recensione:
Indirizzi per estratti:
Indirizzo: Nagendrappa, G Univ Mysore, Dept Studies Chem, Mysore 570006, Karnataka, India Univ Mysore Mysore Karnataka India 570006 Karnataka, India
Citazione:
G. Nagendrappa et al., "Phase stabilization in cinnarizine complexes using X-ray profile analysis", PRAMANA-J P, 56(6), 2001, pp. 797-808

Abstract

Characterization of cobalt(II), cadmium(II), copper(II) and tin(II) cinnarizine complexes have been carried out using conductivity, electronic spectra, infrared, nmr, thermogravimetric and Xray analyses to establish the nature of phase stabilization in these materials. Also, the intrinsic strain components present in these materials during the formation have been computedusing wide-angle X-ray scattering analysis. The variation of the crystallite shape ellipsoid in these materials has been discussed on the basis of Hosemann's paracrystalline model.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 14/11/18 alle ore 03:38:12