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Titolo:
Thick films of X-ray polycrystalline mercuric iodide detectors
Autore:
Schieber, M; Hermon, H; Zuck, A; Vilensky, A; Melekhov, L; Shatunovsky, R; Meerson, E; Saado, Y; Lukach, M; Pinkhasy, E; Ready, SE; Street, RA;
Indirizzi:
Hebrew Univ Jerusalem, Grad Sch Appl Sci, IL-91904 Jerusalem, Israel Hebrew Univ Jerusalem Jerusalem Israel IL-91904 -91904 Jerusalem, Israel Sandia Natl Labs, Livermore, CA 94550 USA Sandia Natl Labs Livermore CA USA 94550 atl Labs, Livermore, CA 94550 USA Real time Radiog Readout, IL-91487 Jerusalem, Israel Real time Radiog Readout Jerusalem Israel IL-91487 487 Jerusalem, Israel Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA Xerox Corp Palo Alto CA USA 94304 o Alto Res Ctr, Palo Alto, CA 94304 USA
Titolo Testata:
JOURNAL OF CRYSTAL GROWTH
fascicolo: 2-4, volume: 225, anno: 2001,
pagine: 118 - 123
SICI:
0022-0248(200105)225:2-4<118:TFOXPM>2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Soggetto:
VLSI READOUT;
Keywords:
physical vapor deposition processes; polycrystalline deposition; semiconducting mercury compounds;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
19
Recensione:
Indirizzi per estratti:
Indirizzo: Schieber, M Hebrew Univ Jerusalem, Grad Sch Appl Sci, IL-91904 Jerusalem, Israel Hebrew Univ Jerusalem Jerusalem Israel IL-91904 alem, Israel
Citazione:
M. Schieber et al., "Thick films of X-ray polycrystalline mercuric iodide detectors", J CRYST GR, 225(2-4), 2001, pp. 118-123

Abstract

Polycrystalline HgI2 thick film detectors are among the leading semiconductor materials to be used as direct converters in X-ray digital radiography. Their properties along with a survey of the properties of alternative materials, such as PbI2 or A-Se, will be given. The preparation of HgI detectorplates, both by direct evaporation (Physical vapor deposition, (PVD)) and by binding the individual crystallites with polymeric glue, forming screen-printed (SP) detector plates, will be described. The microstructure of the PVD thick films showing a columnar morphology, as determined by SEM measurements, will be shown. The X-ray response to radiological X-ray generator of85 kVp using the current integration mode will be reported for both PVD and SP films. Finally, some X-ray images taken at Xerox-Parc using HgI, polycrystalline detectors will be shown. (C) 2001 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/09/20 alle ore 19:37:41