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Titolo:
Mechanism of a-c oriented crystal growth of YBCO thin films by ion beam sputtering
Autore:
Endo, T; Itoh, KI; Hashizume, A; Kohmoto, H; Takahashi, E; Morimoto, D; Srinivasu, VV; Masui, T; Niwano, K; Nakanishi, H;
Indirizzi:
Mie Univ, Fac Engn, Tsu, Mie 5148507, Japan Mie Univ Tsu Mie Japan 5148507 ie Univ, Fac Engn, Tsu, Mie 5148507, Japan Mie Prefectural Ind Res Inst, Tsu, Mie 5140819, Japan Mie Prefectural Ind Res Inst Tsu Mie Japan 5140819 su, Mie 5140819, Japan Tateho Chem Ind, Ako, Hyogo 6780239, Japan Tateho Chem Ind Ako Hyogo Japan 6780239 em Ind, Ako, Hyogo 6780239, Japan Tateho Denyu, Ako, Hyogo 6780239, Japan Tateho Denyu Ako Hyogo Japan 6780239 eho Denyu, Ako, Hyogo 6780239, Japan
Titolo Testata:
JOURNAL OF CRYSTAL GROWTH
fascicolo: 1, volume: 229, anno: 2001,
pagine: 321 - 324
SICI:
0022-0248(200107)229:1<321:MOAOCG>2.0.ZU;2-6
Fonte:
ISI
Lingua:
ENG
Soggetto:
PLASMA;
Keywords:
nucleation; surface processes; migration enhanced epitaxy; physical vapor deposition processes; perovskites; oxide superconducting materials;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
12
Recensione:
Indirizzi per estratti:
Indirizzo: Endo, T Mie Univ, Fac Engn, 1515 Kamihama, Tsu, Mie 5148507, Japan Mie Univ 1515 Kamihama Tsu Mie Japan 5148507 u, Mie 5148507, Japan
Citazione:
T. Endo et al., "Mechanism of a-c oriented crystal growth of YBCO thin films by ion beam sputtering", J CRYST GR, 229(1), 2001, pp. 321-324

Abstract

In order to verify the critical factor of surface migration on a-c orientations of YBCO thin film growth, the surface roughness of MgO substrates wascontrolled by plasma cleaning. Then the films were deposited on these substrates at 600 degreesC by ion beam sputtering. The a-phase ratio increases with increasing surface roughness. This strongly supports the surface migration mechanism because the migration is retarded by surface barriers, and then the a-phase growth is enhanced. (C) 2001 Elsevier Science B.V. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 22/09/20 alle ore 20:00:29