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Titolo:
Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging
Autore:
Zhu, Y; Egerton, RF; Malac, M;
Indirizzi:
Brookhaven Natl Lab, Dept Appl Sci, Div Mat Sci, Upton, NY 11973 USA Brookhaven Natl Lab Upton NY USA 11973 , Div Mat Sci, Upton, NY 11973 USA Univ Alberta, Dept Phys, Edmonton, AB T6G 2J1, Canada Univ Alberta Edmonton AB Canada T6G 2J1 hys, Edmonton, AB T6G 2J1, Canada
Titolo Testata:
ULTRAMICROSCOPY
fascicolo: 3, volume: 87, anno: 2001,
pagine: 135 - 145
SICI:
0304-3991(200104)87:3<135:CLFTMO>2.0.ZU;2-V
Fonte:
ISI
Lingua:
ENG
Soggetto:
NEUTRON-CAPTURE THERAPY;
Keywords:
electron energy-loss spectroscopy; boron; detection limit; elemental mapping;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Life Sciences
Physical, Chemical & Earth Sciences
Citazioni:
14
Recensione:
Indirizzi per estratti:
Indirizzo: Zhu, Y Brookhaven Natl Lab, Dept Appl Sci, Div Mat Sci, Bldg 480,POB 5000,Upton,NY 11973 USA Brookhaven Natl Lab Bldg 480,POB 5000 Upton NY USA 11973 11973 USA
Citazione:
Y. Zhu et al., "Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging", ULTRAMICROS, 87(3), 2001, pp. 135-145

Abstract

We have shown that energy-loss spectroscopy in a medium-voltage transmission electron microscope can measure concentrations of boron tin a carbon matrix) down to 0.2 %, with 10% accuracy. The detection limit is determined byelectron-beam shot-noise statistics and by gain variations in the photodiode or charge-coupled-diode array. (C) 2001 Elsevier Science B.V. All rightsreserved.

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Documento generato il 19/09/20 alle ore 19:52:37