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Titolo:
Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes
Autore:
Inoue, T; Ogletree, DF; Salmeron, M;
Indirizzi:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA Univ Calif Berkeley Berkeley CA USA 94720 Mat Sci, Berkeley, CA 94720 USA
Titolo Testata:
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
fascicolo: 3, volume: 19, anno: 2001,
pagine: 675 - 682
SICI:
1071-1023(200105/06)19:3<675:SFFMAS>2.0.ZU;2-2
Fonte:
ISI
Lingua:
ENG
Soggetto:
CVD DIAMOND FILMS; ELECTRON-EMISSION; COLD-CATHODE; THIN-FILMS; EMITTERS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
--discip_EC--
Citazioni:
24
Recensione:
Indirizzi per estratti:
Indirizzo: Inoue, T Electrotech Lab, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan Electrotech Lab 1-1-4 Umezono Tsukuba Ibaraki Japan 305 05, Japan
Citazione:
T. Inoue et al., "Scanning field-emission force microscopy and spectroscopy of chemical-vapor-deposited carbon field-emission cathodes", J VAC SCI B, 19(3), 2001, pp. 675-682

Abstract

A scanning-force microscope with an electrically conducting tip was used in both contact and noncontact scanning-polarization force microscopy modes to study the field-emission properties of diamond-like carbon chemical-vapor-deposited films in vacuum. Using the tip as an anode, the emission current and work function were measured with 100 nm lateral resolution. Emission was detected from individual micron-size grains. Large current fluctuationson a ms time scale were observed, correlated with large changes in surfacepotential, possibly due to charge trapping. There were no significant differences in work function between emitting and nonemitting regions, but the emitting regions showed low conductivity and large band gaps, while the nonemitting regions were either insulating or highly conductive. No asperitieswere observed at the film-vacuum interface. The current dependence on tip-sample separation suggests that emission occurs below, and not at, the film-vacuum interface. (C) 2001 American Vacuum Society.

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Documento generato il 15/07/20 alle ore 04:49:38