Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Study of semiconductor super thin heterostructures with synchrotron radiation X-ray standing wave technique
Autore:
Jiang, XM; Jia, QJ; Hu, TD; Huang, YY; Zheng, WL; He, W; Xian, DC; Shi, B; Jiang, ZM; Wang, X;
Indirizzi:
Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China Chinese Acad Sci Beijing Peoples R China 100039 100039, Peoples R China Fudan Univ, Surface Phys Natl Key Lab, Shanghai 200433, Peoples R China Fudan Univ Shanghai Peoples R China 200433 nghai 200433, Peoples R China
Titolo Testata:
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
fascicolo: 6, volume: 25, anno: 2001,
pagine: 588 - 594
SICI:
0254-3052(200106)25:6<588:SOSSTH>2.0.ZU;2-H
Fonte:
ISI
Lingua:
CHI
Soggetto:
SURFACE;
Keywords:
X-ray standing wave; heterostructure; segregation; atomic position;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
9
Recensione:
Indirizzi per estratti:
Indirizzo: Jiang, XM Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, PeoplesR China Chinese Acad Sci Beijing Peoples R China 100039 eoples R China
Citazione:
X.M. Jiang et al., "Study of semiconductor super thin heterostructures with synchrotron radiation X-ray standing wave technique", HIGH EN P N, 25(6), 2001, pp. 588-594

Abstract

The X-ray standing wave experiment method is established with the double-crystal monochromator and precision 2-circle goniometer at Beijing Synchrotron Radiation Facility. It is used combined with the X-ray diffraction, to investigate the heterostructure of super thin Ge atomic layer within Si crystals. The results show that the GexSi1-x alloy layer with average x = 0.13 was formed in the Si crystal sample due to the segregation of Ge atoms during the preparation. Due to the diffusion of Ge atoms to the crystal surface, the GexSi1-x alloy layer was disappeared and nearly pure C;e layer was formed on the Si crystal surface after annealing at 650 degreesC.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 04/07/20 alle ore 13:35:46