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Titolo:
Quantitative modelling in scanning probe microscopy
Autore:
Foster, AS; Hofer, WA; Shluger, AL;
Indirizzi:
Helsinki Univ Technol, Phys Lab, FIN-02015 Helsinki, Finland Helsinki UnivTechnol Helsinki Finland FIN-02015 02015 Helsinki, Finland Univ Coll London, Dept Phys & Astron, London WC1E 6BT, England Univ Coll London London England WC1E 6BT stron, London WC1E 6BT, England
Titolo Testata:
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
fascicolo: 5, volume: 5, anno: 2001,
pagine: 427 - 434
SICI:
1359-0286(200110)5:5<427:QMISPM>2.0.ZU;2-G
Fonte:
ISI
Lingua:
ENG
Soggetto:
ATOMIC-FORCE MICROSCOPY; MOLECULE VIBRATIONAL SPECTROSCOPY; FIRST-PRINCIPLES CALCULATION; TIP-SURFACE INTERACTIONS; TUNNELING-MICROSCOPY; TIO2(110) SURFACE; REACTIVE SURFACES; IONIC SURFACES; STM IMAGES; RESOLUTION;
Keywords:
quantitative modelling; scanning probe microscopy; scanning tunneling microscopy; scanning force microscopy;
Tipo documento:
Review
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Engineering, Computing & Technology
--discip_EC--
Citazioni:
54
Recensione:
Indirizzi per estratti:
Indirizzo: Foster, AS Helsinki Univ Technol, Phys Lab, POB 1100, FIN-02015 Helsinki, Finland Helsinki Univ Technol POB 1100 Helsinki Finland FIN-02015 land
Citazione:
A.S. Foster et al., "Quantitative modelling in scanning probe microscopy", CURR OP SOL, 5(5), 2001, pp. 427-434

Abstract

Significant progress has been made in the theoretical modelling of scanning probe microscopy. The models available now are sufficiently refined to provide information not only about the surface, but also the probe tip, and the physical changes occurring during the scanning process. This has significantly improved the quantitative analysis of experimental and theoretical results. Scanning probe microscopes can now be reliably used to analyse events on the level of single atoms and single electrons. (C) 2001 Elsevier Science Ltd. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 20/09/20 alle ore 07:23:52