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Titolo:
Critical dimension of the transition from single switching to an exchange spring process in hard/soft exchange-coupled bilayers - art. no. 184403
Autore:
Yan, SS; Barnard, JA; Xu, FT; Weston, JL; Zangari, G;
Indirizzi:
Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA Univ Alabama Tuscaloosa AL USA 35487 at Technol, Tuscaloosa, AL 35487 USA Univ Pittsburgh, Dept Mat Sci & Engn, Pittsburgh, PA 15261 USA Univ Pittsburgh Pittsburgh PA USA 15261 & Engn, Pittsburgh, PA 15261 USA
Titolo Testata:
PHYSICAL REVIEW B
fascicolo: 18, volume: 6418, anno: 2001,
pagine: 4403 -
SICI:
0163-1829(20011101)6418:18<4403:CDOTTF>2.0.ZU;2-R
Fonte:
ISI
Lingua:
ENG
Soggetto:
MULTILAYERS; BEHAVIOR; SYSTEMS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
12
Recensione:
Indirizzi per estratti:
Indirizzo: Yan, SS Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA Univ Alabama Tuscaloosa AL USA 35487 ol, Tuscaloosa, AL 35487 USA
Citazione:
S.S. Yan et al., "Critical dimension of the transition from single switching to an exchange spring process in hard/soft exchange-coupled bilayers - art. no. 184403", PHYS REV B, 6418(18), 2001, pp. 4403

Abstract

Hard/soft exchange-coupled Ni80Fe20/Sm40Fe60 bilayers with well-defined induced in-plane uniaxial anisotropy were deposited on (100) Si and glass substrates by dc magnetron sputtering. The magnetization-reversal process was systematically studied by analyzing the magnetic hysteresis loops measured by the alternating-gradient magnetometer and surface-sensitive magneto-optic Kerr effect. The coercivity in the single-switching process and the nucleation field in the exchange spring process are quantitatively described by theoretical models. As a result, a critical dimension equation describing the transition from a single-switching, process to an exchange spring process is developed. Different magnetization-reversal processes are essentially determined by the exchange length (or domain wall width) of the soft layer under an external field and the pinning energy exerted on the domain wall of the hard layer near the interface.

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Documento generato il 20/01/20 alle ore 11:18:01