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Titolo:
Magnetic nanoelements for magnetoelectronics made by focused-ion-beam milling
Autore:
Xiong, G; Allwood, DA; Cooke, MD; Cowburn, RP;
Indirizzi:
Univ Durham, Dept Phys, Nanomagnetism Grp, Sci Labs, Durham DH1 3LE, England Univ Durham Durham England DH1 3LE rp, Sci Labs, Durham DH1 3LE, England
Titolo Testata:
APPLIED PHYSICS LETTERS
fascicolo: 21, volume: 79, anno: 2001,
pagine: 3461 - 3463
SICI:
0003-6951(20011119)79:21<3461:MNFMMB>2.0.ZU;2-D
Fonte:
ISI
Lingua:
ENG
Soggetto:
NANOMAGNETS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
12
Recensione:
Indirizzi per estratti:
Indirizzo: Xiong, G Univ Durham, Dept Phys, Nanomagnetism Grp, Sci Labs, Rochester Bldg,South Rd, Durham DH1 3LE, England Univ Durham Rochester Bldg,South Rd Durham England DH1 3LE gland
Citazione:
G. Xiong et al., "Magnetic nanoelements for magnetoelectronics made by focused-ion-beam milling", APPL PHYS L, 79(21), 2001, pp. 3461-3463

Abstract

Focused-ion-beam (FIB) milling has been used to structure magnetic nanoelements from 5 nm thick films of permalloy. We have used focused 30-keV Ga+ ions to define small arrays (6 mum x 6 mum) of wires, circles, and elongatedhexagons in the size range 100-500 nm. High-sensitivity magneto-optical measurements combined with atomic force microscopy show that very high quality magnetic nanostructures can be fabricated by FIB milling even in thin films of soft magnetic materials. This finding could be significant for the future commercialization of certain aspects of magnetic nanotechnology and magnetoelectronics. (C) 2001 American Institute of Physics.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/11/20 alle ore 00:01:39