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Titolo:
Background noise in a Cauchois-type high-resolution Compton scattering spectrometer at SPring-8
Autore:
Sakurai, Y; Hiraoka, N; Itou, M; Mizumaki, M; Ohata, T; Deb, A; Toyokawa, H; Suzuki, M; Sakai, N;
Indirizzi:
Japan Synchrotron Radiat Res Inst, JASRI, Mikazuki, Hyogo 6795198, Japan Japan Synchrotron Radiat Res Inst Mikazuki Hyogo Japan 6795198 198, Japan Himeji Inst Technol, Ako, Hyogo 6781297, Japan Himeji Inst Technol Ako Hyogo Japan 6781297 ol, Ako, Hyogo 6781297, Japan
Titolo Testata:
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
fascicolo: 12, volume: 62, anno: 2001,
pagine: 2099 - 2102
SICI:
0022-3697(200112)62:12<2099:BNIACH>2.0.ZU;2-U
Fonte:
ISI
Lingua:
ENG
Soggetto:
X-RAY SPECTROMETER; SYNCHROTRON RADIATION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
Citazioni:
11
Recensione:
Indirizzi per estratti:
Indirizzo: Sakurai, Y Japan Synchrotron Radiat Res Inst, JASRI, SPring 8,Kouto 1-1-1,Mikazuki, Hyogo 6795198, Japan Japan Synchrotron Radiat Res Inst SPring 8,Kouto 1-1-1 Mikazuki Hyogo Japan 6795198
Citazione:
Y. Sakurai et al., "Background noise in a Cauchois-type high-resolution Compton scattering spectrometer at SPring-8", J PHYS CH S, 62(12), 2001, pp. 2099-2102

Abstract

We have experimentally evaluated the background noise in a Cauchois-type high-resolution Compton scattering spectrometer at SPring-8. The signal-to-noise ratio (SIN) in the energy profile of Compton scattered X-rays from 3 mm thick Cu was found to be 78 at the Compton peak for the incident X-ray energy of 115 keV. The experimental S/N is in good agreement with the value of 80 estimated from simple considerations. The achieved S/N in the spectrometer is high enough for most Compton scattering experiments. (C) 2001 Elsevier Science Ltd. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 03/07/20 alle ore 22:17:08