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Titolo:
Characterization of strain distribution in quantum dots by X-ray diffraction
Autore:
Uragami, T; Acosta, AS; Fujioka, H; Mano, T; Ohta, J; Ofuchi, H; Oshima, M; Takagi, Y; Kimura, M; Suzuki, T;
Indirizzi:
Univ Tokyo, Dept Appl Chem, Bunkyo Ku, Tokyo 1138656, Japan Univ Tokyo Tokyo Japan 1138656 ppl Chem, Bunkyo Ku, Tokyo 1138656, Japan Nippon Steel Corp Ltd, Adv Technol Res Labs, Futtsu 2938511, Japan Nippon Steel Corp Ltd Futtsu Japan 2938511 s Labs, Futtsu 2938511, Japan
Titolo Testata:
JOURNAL OF CRYSTAL GROWTH
fascicolo: 1, volume: 234, anno: 2002,
pagine: 197 - 201
SICI:
0022-0248(200201)234:1<197:COSDIQ>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
AXIS 4-CIRCLE DIFFRACTOMETER;
Keywords:
computer simulation; FEM; GIXD; peak broadening; quantum dot; strain distribution;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
12
Recensione:
Indirizzi per estratti:
Indirizzo: Fujioka, H Univ Tokyo, Dept Appl Chem, Bunkyo Ku, 7-3-1 HOngo, Tokyo 1138656, Japan Univ Tokyo 7-3-1 HOngo Tokyo Japan 1138656 okyo 1138656, Japan
Citazione:
T. Uragami et al., "Characterization of strain distribution in quantum dots by X-ray diffraction", J CRYST GR, 234(1), 2002, pp. 197-201

Abstract

Structural properties of InAs quantum dots grown on Si (100) substrate have been investigated with G-GIXD reciprocal space mapping. Although both thevolume (37 nm in diameter) and the surface coverage (about 11 %) of the InAs dots are small, strong diffraction spots have been observed. To investigate the origin of the peak broadening, we compared the experimental data with structural factors calculated with FEM. We have found that the size of diffraction spots from the InAs dots is determined not only by their size and within-a-dot strain distribution, but also by the dot-to-dot strain distribution. (C) 2002 Published by Elsevier Science B.V.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 18/01/20 alle ore 07:30:04