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Titolo:
Microstructure and magnetic properties of sputtered spin valve systems
Autore:
Langer, J; Mattheis, R; Ocker, B; Maass, W; Senz, S; Hesse, D; Krausslich, J;
Indirizzi:
Inst Phys Hochtechnol Jena EV, D-07745 Jena, Germany Inst Phys HochtechnolJena EV Jena Germany D-07745 D-07745 Jena, Germany Unaxis Deutschland GmbH, D-63755 Alzenau, Germany Unaxis Deutschland GmbHAlzenau Germany D-63755 D-63755 Alzenau, Germany Max Planck Inst Mikrostrukturphys, D-06120 Halle Saale, Germany Max PlanckInst Mikrostrukturphys Halle Saale Germany D-06120 e, Germany Univ Jena, Inst Opt & Quantenelekt, D-07743 Jena, Germany Univ Jena JenaGermany D-07743 Opt & Quantenelekt, D-07743 Jena, Germany
Titolo Testata:
JOURNAL OF APPLIED PHYSICS
fascicolo: 10, volume: 90, anno: 2001,
pagine: 5126 - 5134
SICI:
0021-8979(20011115)90:10<5126:MAMPOS>2.0.ZU;2-R
Fonte:
ISI
Lingua:
ENG
Soggetto:
ELECTRON-DIFFRACTION PATTERNS; POLYCRYSTALLINE THIN-FILMS; GIANT-MAGNETORESISTANCE; ION-BEAM; MULTILAYERS; EXCHANGE; DEPOSITION; TEXTURE; SILICON; CR;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
24
Recensione:
Indirizzi per estratti:
Indirizzo: Langer, J Singulus Technol AG, Hanauer Landstr 103, D-63796 Kahl, Germany Singulus Technol AG Hanauer Landstr 103 Kahl Germany D-63796 ny
Citazione:
J. Langer et al., "Microstructure and magnetic properties of sputtered spin valve systems", J APPL PHYS, 90(10), 2001, pp. 5126-5134

Abstract

Different sputtering methods, viz. rf-diode, rf-magnetron, and dc-magnetron sputtering, have been used to increase the sensitivity of Co/Cu/Co/FeMn top spin valve systems by more than a factor of 2. This improvement is due to an enhanced magnetoresistive effect DeltaR/R and a reduced anisotropy field H-k for the best sample. In the present paper the transport and magneticproperties are discussed in the context of microstructure and interfacial quality of the multilayers evaluated by comprehensive transmission electronmicroscopy and x-ray reflectometry investigations. The sample with the highest sensitivity (dc-magnetron sputtered) shows less structural defects andlocally smoother interfaces than the other samples. Additionally it is shown that the ferromagnetic interlayer exchange field is not affected by the applied sputtering methods and can be well understood in terms of orange peel coupling. (C) 2001 American Institute of Physics.

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Documento generato il 18/09/20 alle ore 16:35:05