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Titolo:
Photoelectrochemical properties of sol-gel processed Ag-TiO2 nanocompositethin films
Autore:
Traversa, E; Di Vona, ML; Nunziante, P; Licoccia, S; Yoon, JW; Sasaki, T; Koshizaki, N;
Indirizzi:
Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, INSTM, I-00133 Rome, Italy Univ Roma Tor Vergata Rome Italy I-00133 him, INSTM, I-00133 Rome, Italy Natl Inst Adv Ind Sci & Technol, AIST Tsukuba Cent 5, Tsukuba, Ibaraki 3058565, Japan Natl Inst Adv Ind Sci & Technol Tsukuba Ibaraki Japan 3058565 8565, Japan
Titolo Testata:
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
fascicolo: 1-2, volume: 22, anno: 2001,
pagine: 115 - 123
SICI:
0928-0707(200109)22:1-2<115:PPOSPA>2.0.ZU;2-J
Fonte:
ISI
Lingua:
ENG
Soggetto:
TIO2 FILMS; OPTICAL-PROPERTIES; METAL PARTICLES; PHOTOLUMINESCENCE; ANATASE; SIO2; AU;
Keywords:
nanocomposite; Ag-TiO2; thin films; photoelectrochemical properties; XPS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Engineering, Computing & Technology
Citazioni:
30
Recensione:
Indirizzi per estratti:
Indirizzo: Traversa, E Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, INSTM, Via Ric Sci,I-00133 Rome, Italy Univ Roma Tor Vergata Via Ric Sci Rome Italy I-00133 e, Italy
Citazione:
E. Traversa et al., "Photoelectrochemical properties of sol-gel processed Ag-TiO2 nanocompositethin films", J SOL-GEL S, 22(1-2), 2001, pp. 115-123

Abstract

Ag-TiO2 thin films were prepared with a sol-gel route, using titanium isopropoxide and silver nitrate as precursors, at 0, 0.03 and 0.06 Ag/Ti nominal atomic ratios. After drying at 80 degreesC, the films were fired at 300 degreesC, 500 degreesC, and 600 degreesC for 30 min and 5 h. Glancing angle X-ray diffraction (XRD) analysis and X-ray photoelectron spectroscopy (XPS), with depth profiling of the concentration, were used to study the films. XPS analysis showed the presence of C and N as impurities in the nanocomposite films. Their concentration decreased with increasing the firing temperature. Chemical state analysis showed that Ag was present in metallic state,except for the outer layer where it was present as Ag+. For the films prepared with a Ag/Ti concentration of 0.06, depth profiling measurements of the film fired at 300 degreesC showed a strong Ag enrichment at the outer surface, while composition remained almost constant within the rest of the film, at Ag/Ti atomic ratio of 0.02. Two layers were found for the films heated to 500 degreesC, where the Ag/Ti ratios were 0.015 near the surface and 0.03 near the substrate. The photoelectrochemical properties of Ag-TiO2 werestudied for thin films deposited on ITO substrates. Photocurrents of Ag-TiO2 nanocomposite electrodes fired at 300 degreesC were observed even at visible light, for wavelengths longer than 400 nm.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 16/07/20 alle ore 16:03:26