Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces
Autore:
Moore, KT; Stach, EA; Howe, JM; Elbert, DC; Veblen, DR;
Indirizzi:
Johns Hopkins Univ, Dept Earth & Planetary Sci, Baltimore, MD 21218 USA Johns Hopkins Univ Baltimore MD USA 21218 ry Sci, Baltimore, MD 21218 USA Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA Univ Calif Berkeley Berkeley CA USA 94720 roscopy, Berkeley, CA 94720 USA Univ Virginia, Dept Mat Sci & Engn, Charlottesville, VA 22903 USA Univ Virginia Charlottesville VA USA 22903 Charlottesville, VA 22903 USA
Titolo Testata:
MICRON
fascicolo: 1, volume: 33, anno: 2002,
pagine: 39 - 51
SICI:
0968-4328(2002)33:1<39:ATPTEC>2.0.ZU;2-M
Fonte:
ISI
Lingua:
ENG
Soggetto:
TRANSMISSION ELECTRON-MICROSCOPE; PHASES; SOLIDS;
Keywords:
energy-filtered transmission electron microscopy (EFTEM); electron energy-loss spectroscopy (EELS); signal-to-noise ratio (SNR); energy-filtered image (EFI); elemental map; jump-ratio image; semiconductor interfaces;
Tipo documento:
Review
Natura:
Periodico
Settore Disciplinare:
Life Sciences
Citazioni:
31
Recensione:
Indirizzi per estratti:
Indirizzo: Moore, KT Johns Hopkins Univ, Dept Earth & Planetary Sci, Baltimore, MD 21218 USA Johns Hopkins Univ Baltimore MD USA 21218 ltimore, MD 21218 USA
Citazione:
K.T. Moore et al., "A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces", MICRON, 33(1), 2002, pp. 39-51

Abstract

This paper systematically demonstrates that energy-filtered transmission electron microscope (EFTEM) images of a planar interface between two single crystals have increased compositional contrast and decreased residual diffraction contrast when the sample is oriented so that the electron beam is parallel to the interface, but not directly on a zone axis. This off-axis orientation reduces diffraction contrast in the unfiltered (and zero-loss) image, which in turn, reduces residual diffraction contrast in single energy-filtered TEM (EFTEM) images, thickness maps, jump-ratio images, and elemental maps. Most importantly, this procedure produces EFTEM images that are more directly interpretable and, in most cases, possess superior spatial resolution compared to EFTEM images acquired directly on a zone axis. (C) 2001 Elsevier Science Ltd. All rights reserved.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 21/09/20 alle ore 12:47:15