Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
Erasing and jitter variation mechanisms of Ag-In-Sb-Te compact disk-rewritable at double and quadruple compact disk velocities
Autore:
Chou, LH; Chang, YY;
Indirizzi:
Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan Natl Tsing Hua Univ Hsinchu Taiwan 300 t Sci & Engn, Hsinchu 300, Taiwan
Titolo Testata:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
fascicolo: 3A, volume: 40, anno: 2001,
pagine: 1272 - 1278
SICI:
0021-4922(200103)40:3A<1272:EAJVMO>2.0.ZU;2-P
Fonte:
ISI
Lingua:
ENG
Soggetto:
CHANGE OPTICAL DISKS; CHANGE RECORDING MATERIAL; SYSTEM;
Keywords:
Ag-In-Sb-Te; CD-RW; CD linear velocity; erasing mechanism; overwrite jitter; erasability; laser-induced crystallization;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Physical, Chemical & Earth Sciences
--discip_EC--
Citazioni:
11
Recensione:
Indirizzi per estratti:
Indirizzo: Chou, LH Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan Natl Tsing Hua Univ Hsinchu Taiwan 300 ngn, Hsinchu 300, Taiwan
Citazione:
L.H. Chou e Y.Y. Chang, "Erasing and jitter variation mechanisms of Ag-In-Sb-Te compact disk-rewritable at double and quadruple compact disk velocities", JPN J A P 1, 40(3A), 2001, pp. 1272-1278

Abstract

The erasing mechanisms of Ag-In-Sb-Te compact disk rewritable (CD-RNV) at CD 2x and CD 4x are studied by employing transmission electron microscopy (TEM). The mechanisms of laser-induced crystallization vary with linear velocity as well as erase power. Under CD 2x recording, erasing proceeds with nucleation and grain growth at low erase laser power. However, it is the direct grain growth that controls the mechanism of erasing at high erase laserpower. Under CID 4x recording, erasing is dominated by direct grain growthoriginating from the interface between amorphous marks and their neighboring crystalline region, and the erase power determines the location where grain growth begins. In addition, a sharp increase in jitter after overwriting at CD 4x was observed as a result of the existence of two different amorphous marks. One of them has a normal shape and the other is extended with atail in the trailing part. For over-writing more than 50 times, only one type of amorphous mark with a tiny sharp tail was observed, This single typeof amorphous mark gives rise to a decrease in jitter.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 19/09/20 alle ore 15:27:17